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2011
| Nov 21, 2011: |
Mathias Schubert is elected to Fellowship of the American Physical Society. more...
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| Nov 18, 2011: |
Our article "Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit," published in Review of Scientific Instruments 82, 103111 (2011), has been selected for the November 1, 2011 issue of Virtual Journal of Biological Physics Research. Link
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| Nov 11, 2011: |
Our article "Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit," published in Review of Scientific Instruments 82, 103111 (2011), has been selected for the November 14, 2011 issue of Virtual Journal of Nanoscale Science & Technology. Link
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| Nov 04, 2011: |
Stefan Schöche receives the 2011 Applied Surface Science Division Student Award at the 58th AVS meeting in Nashville, Tennessee. more ...
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| Nov 04, 2011: |
Keith Brian Rodenhausen and Daniel Schmidt are winners of the 2011 Topical Focus Ellipsometry Session Best Young Scientist Paper Awards, together with Noemi Leick-Marius, Technische Universiteit Eindhoven, The Netherlands. The Ellipsometry student awards are sponsored by the J.A.Woollam Co., Inc. of Lincoln, Nebraska. more ...
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| Sept 20, 2011: |
Tino Hofmann and Mathias Schubert receive a 3 year award from the U.S. Department of Commerce - National Institute of Standards and Technology (NIST) on "Ellipsometric Materials Characterization of Electronic Thin Film Heterostructures". The research will establish a database for selected contemporary semiconductor materials over an extremely wide energy range from the terahertz to the VUV using the world unique instrumentation at UNL and at NIST.
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| Apr 22, 2011: |
Prof. Mathias Schubert receives an Outstanding Reviewer recognition award from the Elsevier editors of Acta Materialia.
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| Apr 21, 2011: |
Congratulations to Brian Rodenhausen and Stefan Schöche for their award winning presentations. Brian won the College of Engineering's Graduate Research Symposium "Outstanding Presentation" award with his talk entiteled "Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic ultra-thin films". Stefan won a poster prize at the UNL Gradutate Research Fair with the poster THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures.
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| Apr 20, 2011: |
The new atomic layer deposition (ALD) tool from Cambridge NanoTech is installed and operational.
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| Feb 24, 2011: |
Daniel Schmidt is the recipient of the 2011 Paul Drude Medal. The Paul Drude Medal is given at each Workshop Ellipsometry to a young scientist for exceptional contributions to the field of ellipsometric metrology or spectroscopy. more ...
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| Feb 04, 2011: |
Our article, "Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry," published in Appl. Phys. Lett. 98, 041906 (2011), has been selected for the February 7, 2011 issue of Virtual Journal of Nanoscale Science and Technology.
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