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2011

Nov 21, 2011:

Mathias Schubert is elected to Fellowship of the American Physical Society. more...

Nov 18, 2011:

Our article "Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit," published in Review of Scientific Instruments 82, 103111 (2011), has been selected for the November 1, 2011 issue of Virtual Journal of Biological Physics Research. Link

Nov 11, 2011:

Our article "Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit," published in Review of Scientific Instruments 82, 103111 (2011), has been selected for the November 14, 2011 issue of Virtual Journal of Nanoscale Science & Technology. Link

Nov 04, 2011:

Stefan Schöche receives the 2011 Applied Surface Science Division Student Award at the 58th AVS meeting in Nashville, Tennessee. more ...

Nov 04, 2011:

Keith Brian Rodenhausen and Daniel Schmidt are winners of the 2011 Topical Focus Ellipsometry Session Best Young Scientist Paper Awards, together with Noemi Leick-Marius, Technische Universiteit Eindhoven, The Netherlands. The Ellipsometry student awards are sponsored by the J.A.Woollam Co., Inc. of Lincoln, Nebraska. more ...

Sept 20, 2011:

Tino Hofmann and Mathias Schubert receive a 3 year award from the U.S. Department of Commerce - National Institute of Standards and Technology (NIST) on "Ellipsometric Materials Characterization of Electronic Thin Film Heterostructures". The research will establish a database for selected contemporary semiconductor materials over an extremely wide energy range from the terahertz to the VUV using the world unique instrumentation at UNL and at NIST.

Apr 22, 2011:

Prof. Mathias Schubert receives an Outstanding Reviewer recognition award from the Elsevier editors of Acta Materialia.

Apr 21, 2011:

Congratulations to Brian Rodenhausen and Stefan Schöche for their award winning presentations. Brian won the College of Engineering's Graduate Research Symposium "Outstanding Presentation" award with his talk entiteled "Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic ultra-thin films". Stefan won a poster prize at the UNL Gradutate Research Fair with the poster THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures.

Apr 20, 2011:

The new atomic layer deposition (ALD) tool from Cambridge NanoTech is installed and operational.

Feb 24, 2011:

Daniel Schmidt is the recipient of the 2011 Paul Drude Medal. The Paul Drude Medal is given at each Workshop Ellipsometry to a young scientist for exceptional contributions to the field of ellipsometric metrology or spectroscopy. more ...

Feb 04, 2011:

Our article, "Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry," published in Appl. Phys. Lett. 98, 041906 (2011), has been selected for the February 7, 2011 issue of Virtual Journal of Nanoscale Science and Technology.