The winners of the 2011 Topical Focus Ellipsometry Session Best Young Scientist Paper Awards at the 58th AVS International Symposium in Nashville, TN on Friday November 04, 2011. From left: Daniel Schmidt (UNL), Noemi Leick-Marius (Technische Universiteit Eindhoven, The Netherlands), and Keith Brian Rodenhausen (UNL).
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Keith Brian Rodenhausen and
Daniel Schmidt are winner of the 2011
Topical Focus Ellipsometry Session Best Young Scientist Paper Awards, together with Noemi Leick-Marius from the Technische Universiteit Eindhoven, The Netherlands.
The awardees were chosen by the Focus Topic Programm Committee for the three best contributed papers given by a graduate student or young post-doc researcher.
Brian was awarded for his talk on "Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films".
Daniel gave a presentation about "Vector-Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films".
The Ellipsometry student awards are sponsored by the J.A.Woollam Co., Inc. of Lincoln, Nebraska.
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