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AVS Focus Session Awards

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The winners of the 2011 Topical Focus Ellipsometry Session Best Young Scientist Paper Awards at the 58th AVS International Symposium in Nashville, TN on Friday November 04, 2011. From left: Daniel Schmidt (UNL), Noemi Leick-Marius (Technische Universiteit Eindhoven, The Netherlands), and Keith Brian Rodenhausen (UNL).



Keith Brian Rodenhausen and Daniel Schmidt are winner of the 2011 Topical Focus Ellipsometry Session Best Young Scientist Paper Awards, together with Noemi Leick-Marius from the Technische Universiteit Eindhoven, The Netherlands. The awardees were chosen by the Focus Topic Programm Committee for the three best contributed papers given by a graduate student or young post-doc researcher. Brian was awarded for his talk on "Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films". Daniel gave a presentation about "Vector-Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films". The Ellipsometry student awards are sponsored by the J.A.Woollam Co., Inc. of Lincoln, Nebraska.



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