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Prof. Dr. Mathias Schubert
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Publications
Books |
Bookchapters | Journal articles:
submission
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
1996
1995
h-index
Electronic documents are intended for internal use only. Corrections are added for misprints where known.
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Books |
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Infrared Ellipsometry on Semiconductor Layer Structures:
Phonons, Plasmons and Polaritons
M. Schubert
Springer Tracts in Modern Physics, Vol 209 (Springer, Heidelberg, 2004)
ISBN 3-540-23249-4 [View PDF (11903kB)] |
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Bookchapters |
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Anisotropic phonons in non-polar nitrides
V. Darakchieva, T. Paskova, M. Schubert et al.
In Non-polar nitrides: Growth, properties and devices edited by T. Paskova et. al
(?, 200?)
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Optical Properties of Zinc Oxide and related Compounds
C. Bundesmann, R. Schmidt-Grund, M. Schubert
In Zinc Oxide as Transparent Electronic Material and its Application in Thin Film Solar Cells edited by A. Klein and K. Ellmer
Springer Series in Materials Science, Vol 104 (Springer, Berlin, 2007)
ISBN-10: 3540736115 [View all pdf (63191kB)];[Chap 1],
[Chap 2],
[Chap 3],
[Chap 4],
[Chap 5],
[Chap 6],
[Chap 7],
[Chap 8],
[Chap 9] |
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Theory and Application of Generalized Ellipsometry
M. Schubert
In Handbook of Ellipsometry edited by G.E. Irene and H.G. Tompkins
(William Andrew Publishing, Norwich, N.Y., 2005) ISBN: 0-8155-1499-9
(Springer-Verlag GmbH Co. KG, Heidelberg, 2004) ISBN: 3-540-22293-6 [View PDF (2374kB)]
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Phonons and Free-Carrier Properties of Binary, Ternary, and Quaternary Group-III Nitride Layers Measured by Infrared Spectroscopic Ellipsometry
A. Kasic, M. Schubert, J. Off, B. Kuhn, F. Scholz, S. Einfeldt, T. Böttcher, D. Hommel, D. J. As, U. Koehler, A. Dadgar, A. Krost, Y. Saito, Y. Nanishi, M. R. Correia, S. Pereira, V. Darakchieva, B. Monemar, H. Amano, I. Akasaki, G. Wagner
In Group III-Nitrides and Their Heterostructures: Growth, Characterization and Applications edited by F. Bechstedt, B. K. Meyer and M. Stutzmann (Wiley-VCH, Berlin, 2003) ISBN 3-527-40475-9
[View PDF (1328kB)]
also in: phys. stat. sol. c 0, 1750 - 1769 (2003)
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Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon
A. Dadgar, A. Strittmatter, J. Blasing, M. Poschenrieder, O. Contreras, P. Veit, T. Riemann, F. Bertram, A. Reiher, A. Krtschil, A. Diez, T. Hempel,
T. Finger, A. Kasic, M. Schubert, D. Bimberg, F. A. Ponce, J. Christen, A. Krost
In Group III-Nitrides and Their Heterostructures: Growth, Characterization and Applications edited by F. Bechstedt, B. K. Meyer and M. Stutzmann (Wiley-VCH, Berlin, 2003) ISBN 3-527-40475-9
[View PDF (2183kB)]
also in: phys. stat. sol. c 0, 1583 - 1606 (2003)
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Generalized Ellipsometry
M. Schubert
In Introduction to Complex Mediums for Optics and Electromagnetics edited by W. S. Weiglhofer and A. Lakhtakia
(SPIE, Bellingham, WA, 2003) ISBN 0819449474 [View PDF (852kB)]
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MOVPE growth, Phonons, Band-to-Band Transitions and Dielectric Functions of InGaNAs/GaAs Superlattices and Quantum Wells
G. Leibiger, V. Gottschalch, G. Benndorf, J. Šik, M. Schubert
In Compound semiconductor heterojunctions: physics and applications edited by W. Cay and others
(Research Signpost, Kerala, 2003) ISBN 8177361708
[View PDF part 1 (2049kB)]
[View PDF part 2 (1946kB)]
[View PDF part 3 (1842kB)]
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Journal articles in submission |
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Journal articles in submission may be transferred upon
request |
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157. |
Infrared and farinfrared dielectric functions of barium titanite
T. Hofmann, C. M. Herzinger, D. W. Thompson, M. Schubert
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156. |
Generalized Muller matrix ellipsometry study with 3-D spherical photonic bandgap structures
H. Wang, D. Schmidt, M. Saenger, M. Schubert, Y.F. Lu
phys. stat. sol.
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155. |
Investigation of the free charge carrier properties at the ZnO-sapphire interface in a-plane ZnO films by generalized infrared ellipsometry
T. Chavdarov, Ch. Sturm, R. Schmidt-Grund, B. Rheinlander, H. Hochmuth, M. Schubert, C. Bundesmann, and M. Grundmann
phys. stat. sol.
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154. |
Skew crystal optics: Optical properties of pentacene probed by generalized spectroscopic ellipsometry
M. Schubert, B. Gompf, D. Faltermeier, M. Dressel, A.K. Tripathi, J. Pflaum,
phys. stat. sol.
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153. |
The optical-Hall effect
T. Hofmann, M. Schubert
phys. stat. sol.
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152. |
Terahertz ellipsometry using electron-beam based sources
T. Hofmann, U. Schade, M. Mross, T. Iowell, M. Schubert
phys. stat. sol.
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151. |
Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and non-chiral silicon sculptured thin films
D. Schmidt, E. Schubert, M. Schubert
phys. stat. sol.
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150. |
Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric BaTiO3-ZnO heterostructures
Venkata Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, M. Schubert
phys. stat. sol.
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149. |
Polaron transitions in charge intercalated amorphous tung-sten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, M. Schubert
phys. stat. sol.
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148. |
Optical Hall-effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, H. Lu, W. J. Schaff, M. Schubert
J. Electronic Materials (Springer)
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147. |
Interface-charge-coupled polarization response of Pt-ZnO-BaTiO_3-Pt heterojunctions: A physical model approach
Venkata Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, M. Schubert
J. Electronic Materials (Springer)
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146. |
Optical Hall effect studies on modulation-doped Al(x)Ga(1-x)As:Si/GaAs quantum wells
T. Hofmann, C. von Middendorf, V. Gottschalch, M. Schubert
phys. stat. sol.
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145. |
Smith-Purcell-effect cell terahertz ellipsometry
T. Hofmann, C. M. Herzinger, D. W. Thompson, M. Schubert, T. Iowell, M. Mross
Rev. Sci. Instr.
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144. |
Polaron and phonon properties in electrochemically colored tungsten oxide films
M. Saenger, T. Hofmann, T. Hoeing, M. Schubert
Phys. Rev. B
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143. |
Bulk and surface electron-induced infrared magnetooptic response in InN: A possible evidence for a new defect-related doping mechanism
T. Hofmann, H. Lu, W. Schaff, M. Schubert, V. Darakchieva
Phys. Rev. Lett., in revision.
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142. |
Vacuum ultraviolet generalized spectroscopic ellipsometry and band-structure calculations of wurtzite ZnO
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C.M. Herzinger, M. Grundmann
J. Appl. Phys., in revision.
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141. |
Polarization disentanglement of electronic transitions and unit cell orientations in Pentacene single crystals by generalized ellipsometry
D. Faltermeier, B. Gompf, M. Dressel, M. Schubert, A. K. Tripathi, J. Baum
Phys. Rev. Lett., in revision.
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2007 |
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140. |
Demonstration of an ultraviolet ZnO-based optically pumped third order distributed feedback laser
D. Hofstetter, Y. Bonetti, F. R. Giorgetta, A.-H. El-Shaer, A. Bakim. A. Waag, R. Schmidt-Grund, M. Schubert, M. Grundmann
Appl. Phys. Lett. 91, 111108 (2007) [View PDF (414kB)].
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139. |
Dielectric anisotropy and phonon modes of ordered indirect-gap Al0:52In0:48P studied by far-infrared ellipsometry
T. Hofmann, V. Gottschalch, M. Schubert
Appl. Phys. Lett. 91, 121908 (2007) [View PDF (211kB)].
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138. |
Dielectric constants and phonon modes of amorphous hafnium aluminate deposited by metal organic chemical vapor deposition
C. Bundesmann, O. Buiu, S. Hall, M. Schubert
Appl. Phys. Lett. 91, 121916 (2007) [View PDF (137kB)].
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137. |
Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, G. Leibiger,
N. Ashkenov, V. Gottschalch, M. Schubert
Appl. Phys. Lett. 90, 182110 (2007) [View PDF (95kB)]
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136. |
Polarization coupling in epitaxial ZnO / BaTiO3 thin film heterostructures on SrTiO3 (100) substrates
M. Lorenz, M. Brandt, J. Schubert, H. Hochmuth, H. von Wenckstern, M. Schubert, M. Grundmann
Proc. SPIE 6474, 64741S (2007)
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135. |
Anisotropic strain and phonon deformation potentials in GaN
V. Darakchieva, T. Paskova, M. Schubert, P. P. Paskov, D. Hommel, M. Heuken, J. Off, B. A. Haskell, P. T. Fini, J. S. Speck, S. Nakamura
Phys. Rev. B 75, 195217 (2007) [View PDF (831kB)]
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134. |
Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints
E. Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, B. Gallas, M. Schubert
Advances in Solid State Physics, Volume 46, pages XXX-XXX, September 2007 (ISSN: 1617-5034, Springer, Berlin/Heidelberg)
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133. |
Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers
V. Darakehieva, T. Paskova, M. Schubert, P. P. Paskov, H. Arwin, B. Monemar, D. Hommel, M. Heuken, J. Off, B. A. Haskell, P. T. Fini, J. S. Speck, S. Nakamura
J. Cryst. Growth 300, 233-238 (2007) [View PDF (XXXkB)]
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132. |
MOVPE growth investigations of doping and ordering in AlGaAs and GaInP with reflectance anisotropy spectroscopy
C. Krahmer, M. Philippens, M. Schubert, K. Streubel
J. Cryst. Growth 289, 18-22 (2007) [View PDF (XXXkB)]
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2006 |
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131. |
Phonon modes, dielectric constants, and exciton mass parameters in ternary MgxZn1-xO
C. Bundesmann, M. Lorenz, M. Grundmann, and M. Schubert
Mat. Res. Soc. Symp. Proc. 928E, GG05-03 (2006)
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130. |
Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P. P. Paskov, H. Arwin, M. Schubert, B. Monemar, S. Figge, D. Hommel, B. A. Haskell, P. T. Fini, S. Nakamura
phys. stat. sol. b 243, 1594-1598 (2006) [View PDF (239kB)]
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129. |
Refractive indices and band-gap properties of rocksalt MgxZn1-xO (0.68 .. x .. 1)
R. Schmidt-Grund, A. Carstens, B. Rheinländer, D. Spemann,
H. Hochmut, G. Zimmermann, M. Lorenz, M. Grundmann, C. M. Herzinger, M. Schubert,
J. Appl. Phys. 99, 123701 (2006) [View PDF (332kB)]
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128. |
Terahertz magnetooptic generalized ellipsometry using synchrotron and black-body radiation
T. Hofmann, U. Schade, W. Eberhardt, C. M. Herzinger, P. Esquinazi, M. Schubert
Rev. Sci. Inst. 77, 063902 (2006) [View PDF (307kB)]
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127. |
Infrared optical properties of MgxZn1xO thin Flms (0..x..1): Long-wavelength optical phonons, dielectric constants, and effective mass parameters
C. Bundesmann, A. Rahm, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
J. Appl. Phys. 99, 113504 (2006) [View PDF (179kB)]
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126. |
Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magneto-optic ellipsometry
T. Hofmann, U. Schade, K. C. Agarwal, B. Daniel, C. Klingshirn, M. Hetterich, C. M. Herzinger, M. Schubert
Appl. Phys. Lett. 88, 043105 (2006) [View PDF (82kB)]
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125. |
Anisotropy of the Gamma-point effective mass and mobility in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W. J. Schaff, M. Schubert
phys. stat. sol. c 3, 1854-1857 (2006) [View PDF (247kB)]
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124. |
Phonon properties and doping of ZnMnSe epilayers grown by molecular beam epitaxy
K. C. Agarwal, B. Daniel, T. Hofmann, M. Schubert, C. Klingshirn, M. Hetterich
phys. stat. sol. b 243, 914 (2006) [View PDF (82kB)]
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123. |
Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high-pressure annealing
T. Paskova, V. Darakchieva, P. P. Paskov, B. Monemar, M. Bukowski, T. Suski, N. Ashkenov, M. Schubert, D. Hommel
phys. stat. sol. c 3, 914 (2006) [View PDF (234kB)]
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122. |
Recrystallization behavior in chiral sculptured thin films from silicon
E. Schubert, J. Fahlteich, B. Rauschenbach, M. Schubert, M. Lorenz, M. Grundmann, G. Wagner
J. Appl. Phys. 100, 016107 (2006) [View PDF 213kB)]
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121. |
Effect of high-temperature annealing on the residual strain and bending of freestanding GaN films grown by hydride vapor phase epitaxy
T. Paskova, D. Hommel, P. P. Paskov, V. Darakchieva, B. Monemar, M. Bockowski, T. .Suski, I. Grzegory, F. Tuomisto, K. Saarinen, N. Ashkenov, M. Schubert
Appl. Phys. Lett. 88, 141909 (2006) [View PDF (181kB)]
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120. |
In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy in an industrial used multi wafer reactor
C. Krahmer, M. Philippens, M. Schubert, K. Streubel
phys. stat. sol. c 3, 655-658 (2006) [View PDF (387kB)]
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119. |
A Century of Ellipsometry
M. Schubert
Annalen der Physik 15, 480-497 (2006), Special issue on Paul Karl Ludwig Drude, M. Dressel (Guest editor) [View PDF (1828kB)]
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118. |
Low temperature photoluminescence and infrared dielectric functions of pulsed laser deposited ZnO thin films on silicon
S. Heitsch, C. Bundesmann, G. Wagner, G. Zimmermann, A. Rahm, H. Hochmuth, G. Benndorf, H. Schmidt, M. Schubert, M. Lorenz, and M. Grundmann
Thin Solid Films 496, 234 - 239 (2006) [View PDF (343kB)] |
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2005 |
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117. |
Composition and properties of ZnS thin films prepared by chemical bath deposition from acid and basic solutions
L. V. Mahkova, I. Konovalov, R. Szargan, N. Ashkenov, M. Schubert, T. Chassé
phys. stat. sol. c 3, 1206 - 1211 (2005) [View PDF (275kB)] |
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116. |
Adsorption of human serum albumin in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
phys. stat. sol. c2, 3293 - 3297 (2005) [View PDF (225kB)] |
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115. |
Rectifying semiconductor-ferroelectric polarization loops and offsets in Pt-BaTiO3-ZnO-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, M. Grundmann
Thin Solid Films 486, 153 (2005) [View PDF (278kB)]
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114. |
High pressure annealing of HVPE GaN free-standing films: redistribution of defects and stress
T. Paskova, T. Suski, M. Bockowski, P.P. Paskov, V. Darakchieva, B. Monemar, F. Tuomisto, K. Saarinen, N. Ashkenov, M. Schubert, C. Roder, D. Hommel
Mat. Res. Soc. Symp. Proc. Vol. 831, E8.18.1 [View PDF (268kB)]
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113. |
Phonon mode behavior of wurtzite AlN/GaN superlattices
V. Darakchieva, E. Valcheva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, H. Amano, and I. Akasaki
Phys. Rev. B 71, 115329 (2005) [View PDF (206kB)]
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112. |
Temperature-dependent dielectric and electro-optic properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
B. N. Mbenkum, N. Ashkenov, M. Schubert, M. Lorenz, H. Hochmuth, D. Michel, M. Grundmann
Appl. Phys. Lett. 86, 091904 (2005) [View PDF (120kB)]
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111. |
Structural characteristics and lattice parameters of HVPE-GaN free-standing quasi-substrates
V. Darakchieva, T. Paskova, P. P. Paskov, B. Monemar, N. Ashkenov, M. Schubert
J. Appl. Phys. 97, 013517 (2005) [View PDF (97kB)]
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110. |
Long-wavelength interface modes in semiconductor layer structures
M. Schubert, T. Hofmann, J. Sik
Phys. Rev. B 71, 035324 (2005) [View PDF (353kB)]
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109. |
The inertial-mass scale for free-charge-carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, C. von Middendorff, G. Leibiger, V. Gottschalch, C.M. Herzinger, A. Lindsay and E. O’Reily
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 455-456 [View PDF (XXXkB)]
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108. |
Electro-optic Raman observation of low temperature phase transitions in ZnO-BaTiO3-ZnO heterostructures
B. N. Mbenkum, N. Ashkenov, M. Schubert, M. Lorenz
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 401-402 [View PDF (XXXkB)]
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107. |
Combined Raman scattering, X-ray fluorescence and ellipsometry in-situ growth monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, M. Grundmann, G. Lippold, and J. Piltz
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 165-166 [View PDF (XXXkB)]
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106. |
Band-to-band transitions and optical properties of MgxZn1-xO (0..x..1) films
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer,
H. Schmidt, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 201-202 [View PDF (XXXkB)]
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2004 |
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105. |
Infrared Ellipsometry and Raman Studies of hexagonal InN films: correlation between strain and vibrational properties
V. Darakchieva, P. Paskov, E. Valcheva, T. Paskova, M. Schubert, C. Bundesmann, H. Lu, W. J. Schaff, B. Monemar
Superlattices and Microstructures 36, 573 - 580 (2004)
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104. |
Micro-Raman scattering profiles studies on HVPE-grown free-standing GaN
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Momenar,
C. Bundesmann, M. Schubert
phys. stat. sol. (a) 201 2773 - 2775 (2004) [View PDF (249kB)]
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103. |
Infrared dielectric function and phonon modes of Mg-rich cubic MgZnO thin films on sapphire
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, M. Lorenz, M. Grundmann
Appl. Phys. Lett. 85, 905 (2004) [View PDF (73kB)]
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102. |
Strain related structural and vibrational properties of thin epitaxial AlN layers
V. Darakchieva, J. Birch, M. Schubert, A. Kasic, S. Tungasmita, T. Paskova, B. Monemar
Phys. Rev. B 70, 045511 (2004) [View PDF (330kB)]
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101. |
Near-band-gap dielectric function of Zn1-xMnxSe thin films determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, D. Litvinov, D. Gerthsen
Phys. Rev. B 70, 045316 (2004) [View PDF (164kB)]
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100. |
Deformation potentials of the E1(TO) and E2 modes of InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, B. Monemar, M. Schubert, H. Lu, W. J. Schaff
Appl. Phys. Lett. 84, 3636 (2004) [View PDF (58kB)]
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99. |
Optical modelling of a layered photovoltaic device with a polyfluorene-copolymer as the active layer
Nils-Krister Persson, M. Schubert, O. Inganäs
Solar Energy Materials and Solar Cells 83, 169 - 186 (2004)
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98. |
Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and D. Gerthsen
Thin Solid Films 455-456, 228 - 230 (2004) [View PDF (133kB)]
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97. |
Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, K. Järrendahl
Thin Solid Films 455-456, 235 - 238 (2004) [View PDF (116kB)]
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96. |
Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
Thin Solid Films 455-456, 726 - 730 (2004) [View PDF (386kB)]
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95. |
Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, M. Schubert
Thin Solid Films 455-456, 231 - 234 (2004) [View PDF (106kB)]
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94. |
UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
Thin Solid Films 455-456, 500 - 504 (2004) [View PDF (259kB)]
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93. |
Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, V. Gottschalch
Thin Solid Films 455-456, 601 - 604 (2004) [View PDF (154kB)]
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92. |
Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, W. Dollase
Thin Solid Films 455-456, 619 - 623 (2004) View PDF (282kB)]
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91. |
Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, M. Grundmann
Thin Solid Films 455-456, 161 - 166 (2004) [View PDF (158kB)]
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90. |
Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
Thin Solid Films 455-456, 295 - 300 (2004) View PDF (136kB)]
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89. |
Far-infrared magnetooptic generalized ellipsometry: Determination of free-charge-carrier parameters in semiconductor thin film structures
M. Schubert, T. Hofmann, C. M. Herzinger
Thin Solid Films 455-456, 563 - 570 (2004) [View PDF (239kB)]
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88. |
Optical and structural characteristics of virtually unstrained bulk-like GaN
D. Gogova, A. Kasic, H. Larsson, B. Pécz, R. Yakimova, B. Magnusson, B. Monemar, F. Tuomisto, K. Saarinen, C. R. Miskys, M. Stutzmann, C. Bundesmann, M. Schubert
Jpn. J. Appl. Phys. 43, 1264 - 1268 (2004) [View PDF (162kB)]
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87. |
Carrier redistribution in organic/inorganic (PEDOT/PSS - Si) heterojunction
M. Schubert, C. Bundesmann, H. v. Weckstern, G. Jakopic, A. Haase, N.-K. Persson, F. Zhang, H. Arwin, O. Inganäs
Appl. Phys. Lett. 84, 1311 - 1313 (2004) [View PDF (230kB)]
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86. |
Strain evolution and phonons in AlN/GaN superlattices
V. Darakchieva, P. P. Paskov, M. Schubert, E. Valcheva, T. Paskova, H. Arwin, B. Monemar, H. Amano, I. Akasaki
Mat. Res. Soc. Symp. 798, Y5.60 (2004) [View PDF (133kB)]
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85. |
Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, G. Wagner
Ann. Phys. 13, 61 - 62 (2004) [View PDF (205kB)]
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84. |
Infrared dielectric function and vibrational modes of pentacene thin films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin
Appl. Phys. Lett. 84, 200 - 202 (2004) [View PDF (54kB)]
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2003 |
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83. |
Generalized infrared ellipsometry study of thin epitaxial AlN layers with complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, A. Kasic, S. Tungasmita, T. Paskova, B. Monemar
Physica B: Condensed Matter 340-340, 416 - 420 (2003) [View PDF (555kB)]
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82. |
Optical properties of undoped AlN/GaN superlattices grown by metal orgaic vapor phase epitaxy
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Kamiyama, M. Iwaya, H. Amano, I. Akasaki
phys. stat. sol. c 0, 1 - 4 (2003) [View PDF (211kB)]
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81. |
Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga and Li
C. Bundesmann, N. Ashkenov, M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, M. Grundmann
Appl. Phys. Lett.83, 1974 - 1976 (2003) [View PDF (59kB)]
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80. |
Interband transitions and phonon modes in GaBxAs1-x (0 <= x < 0.33) and GaNxAs1-x (0 <= x < 0.29)
G. Leibiger, V. Gottschalch, V. Riede, M. Schubert, J. N. Hilfiger, T. E. Tiwald
Phys. Rev. B 67, 195205 (2003) [View PDF (442kB)]
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79. |
Optical properties of ternary MgZnO thin films
R. Schmidt,
C. Bundesmann,
N. Ashkenov,
B. Rheinländer, M. Schubert,
M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, J. Lenzner, M. Grundmann
Proceedings of the International Conference on the Physics of Semiconductors (ICPS) 2002
[View preprint PDF (285kB)]
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78. |
Far-infrared magneto-optical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, M. Grundmann, C. M. Herzinger, M. Schubert, W. Grill
Mat. Res. Soc. Symp. 744, M5.32.1 (2003) [View PDF (152kB)]
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77. |
Far-infrared dielectric functions and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, M. Schubert
Mat. Res. Soc. Symp. 744, M5.33.1 (2003) [View PDF (127kB)]
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76. |
Far-infrared-magneto-optic Ellipsometry characterization of free-charge-carrier properties in highly-disordered n-type Al0.19Ga0.33In0.48P
T. Hofmann, M. Schubert, C. M. Herzinger, I. Pietzonka
Appl. Phys. Lett. 82, 3463 - 3465 (2003) [View PDF (55kB)]
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75. |
Residual strain in HVPE GaN free-standing and re-grown homoepitaxial layers
V. Darakchieva, T. Paskova, P.P. Paskov, B. Monemar, N. Ashkenov, M. Schubert
phys. stat. sol. (a) 195 516 - 522 (2003) [View PDF (473kB)]
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74. |
Dielectric functions (1 eV to 5 eV) of wurtzite MgxZn1-xO (0 <= x < 0.29) thin films
R. Schmidt, B. Rheinländer, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, M. Grundmann
Appl. Phys. Lett. 82, 2260 - 2262 (2003) [ View PDF (74kB)]
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73. |
Infrared dielectric functions and phonon modes of high-quality ZnO films
N. Ashkenov, G. Wagner, H. Neumann, B. N. Mbenkum,
C. Bundesmann, V. Riede, M. Lorenz, E. M. Kaidashev,
A. Kasic, M. Schubert, M. Grundmann, V. Darakchieva, H. Arwin, B. Monemar
J. Appl. Phys. 93, 126 - 133 (2003) [View PDF (186kB)]
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72. |
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: Determination of free-carrier effective mass, mobility and concentration parameters in n-type GaAs
M. Schubert, T. Hofmann, C. M. Herzinger
J. Opt. Soc. Am. A 20, 347 - 356 (2003) [View PDF (252kB)]
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2002 |
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71. |
Optical phonons in hexagonal AlxInyGa1-x-yN (y ~ 0.12)
A. Kasic, M. Schubert, J. Off, F. Scholz, S. Einfeldt, D. Hommel
phys. stat. sol. 234, 970 - 974 (2002) [View PDF (235kB)]
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70. |
Far-infrared dielectric anisotropy and phonon modes in spontaneously CuPt ordered Ga0.52In0.48P
T. Hofmann, V. Gottschalch, M. Schubert
Phys. Rev. B 66, 195204 1-10 (2002) [View PDF (249kB)]
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69. |
Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb2S3
M. Schubert, W. Dollase
Opt. Lett. 27, 2073 - 2075 (2002) [View PDF (113kB)]
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68. |
Infrared dielectric functions and phonon modes of wurtzite MgxZn1-xO (x <= 0.2)
C. Bundesmann,
M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, M. Grundmann, N. Ashkenov, H. Neumann, G. Wagner
Appl. Phys. Lett. 81, 2376 - 2378 (2002) [View PDF (139kB)]
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67. |
Far-infrared Magneto-Optical Generalized Ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann,
M. Schubert, C. M. Herzinger
In Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components (A. Duparré and B. Singh, eds.) Proc SPIE 4779, SPIE Bellingham, WA, USA, 2003, 90-97 [View PDF (717kB)]
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66. |
Evolution of the optical properties of III-V Nitride alloys: Band-to-Band transitions in GaPN
G. Leibiger,
M. Schubert, V. Gottschalch, G. Benndorf, R. Schwabe
Phys. Rev. B 65, 245207 1 - 6 (2002)
[View PDF (96kB)]
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65. |
Generalized ellipsometry of complex mediums in layered systems
M. Schubert, A. Kasic,
T. Hofmann, V. Gottschalch, J. Off,
F. Scholz, E. Schubert, H. Neumann, I. Hodgkinson, M. Arnold, W. Dollase, C. M. Herzinger
In Complex Mediums III: Beyond linear isotropic Dielectrics (A. Lakhtakia, G. Dewar and M. W. McCall, eds.), Proc SPIE 4806, SPIE, Bellingham, WA, U.S.A., 2002, 264-276 [View PDF (590kB)]
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64. |
Optical phonon modes and interband transitions in cubic AlGaN
A. Kasic, M. Schubert,
T. Frey, U. Köhler, D. J. As, C. M. Herzinger
Phys. Rev. B 65, 184302 1 - 13 (2002)
[View PDF (207kB)]
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63. |
Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices
E. Franke, H. Neumann, M. Schubert, C. L. Trimble, J. A. Woollam
Surf. Coat. & Techn. 151-152, 285 - 288 (2002)
[View PDF (66kB)]
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62. |
Infrared spectroscopic ellipsometry - a new tool for characterization of semiconductor heterostructures
A. Kasic, M. Schubert,
S. Einfeldt, D. Hommel
Vibrational Spectroscopy 179, 121 - 124 (2002) [View PDF (98kB)]
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61. |
Effective carrier mass and phonon mode behavior in n-type hexagonal InN
A. Kasic, M. Schubert,
Y. Saito, Y. Nanishi, G. Wagner
Phys. Rev. B 65, 115206 1 - 7 (2002) [View PDF (153kB)]
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60. |
Interband transitions in [001]-(GaP)1(InP)m superlattices
M. Schubert, H. Schmidt, J. Šik, T. Hofmann,
V. Gottschalch, W. Grill, G. Böhm, G. Wagner
Mat. Sci. & Eng. B 88, 125 - 128 (2002) [View PDF (298kB)]
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2001 |
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59. |
Phonon modes of GaP1-yNy measured by mid-infrared spectroscopic ellipsometry
G. Leibiger,
V. Gottschalch, A. Kasic, M. Schubert
Appl. Phys. Lett. 79, 3407 - 3409 (2001) [View PDF (59kB)]
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58. |
Optical functions, phonon properties, and composition of InGaAsN single layers derived from far - and near - infrared spectroscopic
ellipsometry
G. Leibiger,
V. Gottschalch, M. Schubert
J. Appl. Phys. 90, 5951 - 5958 (2001)
[View PDF (125kB)]
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57. |
Ellipsometry on anisotropic materials: Bragg conditions and phonons in dielectric helical thin films
M. Schubert, C. M. Herzinger
phys. stat. sol.(a) 188, 1563 - 1575 (2001) [View PDF (339kB)]
[Corrections]
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56. |
Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single
layers and GaAsN/InAs/GaAs superlattices
G. Leibiger,
V. Gottschalch,
B. Rheinländer,
A. Kasic,
M. Schubert, J. Sik
Proceedings of the 27th International Symposium on Compound Semiconductors (Piscataway, NJ, 2001), ISBN 0-7803-6285-6 [View PDF (1.217kB)]
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55. |
Optical properties of AlxIn1-xN thin films determined by
spectroscopic ellipsometry
A. Kasic,
M. Schubert, B. Rheinländer, J. Off,
F. Scholz, C. M. Herzinger
Proceedings of the 27th International Symposium on Compound Semiconductors (Piscataway, NJ, 2001), ISBN 0-7803-6285-6 [View PDF (931kB)]
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54. |
Phonon modes and critical points of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, M. Schubert
phys. stat. sol.(a) 228, 279 - 282 (2001) [View PDF (78kB)]
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53. |
Phonon modes of InGaAsN measured by far infrared spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, M. Schubert
phys. stat. sol.(a) 228, 259 - 262 (2001) [View PDF (87kB)]
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52. |
Infrared Ellipsometry- a novel tool for characterization of group-III-Nitride Heterostructrues
for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, U. Köhler, J. D. As, B. Kuhn, J. Off, F. Scholz, and J. A. Woollam
phys. stat. sol.(a) 228, 437 - 440 (2001) [View PDF (339kB)]
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51. |
Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures
M. Schubert, A. Kasic, S. Figge, M. Diesselberg, S. Einfeldt, D. Hommel,
U. Köhler, J. D. As, B. Kuhn, J. Off, F. Scholz, J. A. Woollam, and C. M. Herzinger
In Optical Metrology Roadmap for the Semiconductor, Optical and Data storage Industries II (A. Duparré and B. Singh, eds), Proc SPIE 4449, SPIE, Bellingham, WA, U.S.A., 2001, 48-58 [View PDF (881kB)]
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50. |
Infrared dielectric function and phonon modes of highly disordered
(AlxGa1-x)0.52In0.48P
T. Hofmann,
G. Leibiger, I. Pietzonka, V. Gottschalch, M. Schubert
Phys. Rev. B 64, 155206 1-11 (2001)
[View PDF (291kB)]
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49. |
Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN
A. Kasic, M. Schubert, B. Kuhn, F. Scholz, S. Einfeldt, D. Hommel
J. Appl. Phys. 87, 3720 - 3734 (2001) [View PDF (84kB)]
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48. |
Infrared Ellipsometry characterization of porous silicon Bragg reflectors
S. Zangooie, M. Schubert, C. Trimble, D. W. Thompson, J. A. Woollam
Appl. Opt. 40, 906 - 912 (2001) [View PDF (296kB)]
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47. |
Optical properties of amorphous and crystalline tantalum oxide thin films measured by IR-VIS-VUV (0.03eV-8.5eV) spectroscopic ellipsometry
E. Franke, M. Schubert, C.L. Trimble, J.A. Woollam
Thin Solid Films 388, 283 - 289 (2001) [View PDF (197kB)]
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46. |
Band-gap energies, optical constants, phonons and free carrier properties in GaNAs/InAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry
J. Sik, M. Schubert, G. Leibiger, V. Gottschalch
J. Appl. Phys. 89, 294 - 305 (2001) [View PDF (298kB)]
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45. |
Anisotropic dielectric function spectra from single crystal CuInSe2with orientation domains
A. Kreuter, K. Otte, G. Lippold, G. Wagner, A. Schindler, M. Schubert
Appl. Phys. Lett. 78, 195 - 197 (2001) [View PDF (108kB)]
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44. |
IR-VUV Dielectric Function of Al1-xInxN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, C. M. Herzinger
Mat. Res. Soc. Symp. 639, G6.13 (2001) [View PDF (105kB)]
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43. |
Optical Constants, Critical Points, and Phonon Modes of GaAsN Single Layers
G. Leibiger,
V. Gottschalch, A. Kasic,
B. Rheinländer, J. Sik, M. Schubert
Mat. Res. Soc. Symp. 639, G6.35 (2001) [View PDF (159kB)]
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42. |
Strain and composition dependence of the E1(TO) mode in hexagonal
AlxIn1-xN thin films
A. Kasic,
M. Schubert, J. Off, F. Scholz
Appl. Phys. Lett. 78, 1526 - 1528 (2001) [View PDF (61kB)]
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41. |
Model dielectric function spectra of GaAsN for far-infrared and near-infrared to ultra violet wavelengths
G. Leibiger,
V. Gottschalch, B.
Rheinländer, J. Sik, M. Schubert
J. Appl. Phys. 89, 4927 - 4938 (2001) [View PDF (191kB)]
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40. |
Infrared optical properties of aged porous GaAs
S. Zangooie, T. E. Tiwald, M. Schubert, J. A. Woollam
J. Mat. Res. 16, 1241 - 1244 (2001) [View Absract (2kB)]
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39. |
Infrared response of multiple component free-carrier plasma in
heavily doped p-type GaAs
S. Zangooie, M. Schubert, D. W. Thompson, J. A. Woollam
Appl. Phys. Lett. 78, 937 - 939 (2001) [View PDF (57kB)]
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38. |
Phonons and free carriers in strained hexagonal GaN/AlGaN
superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Sik, S. Einfeldt,
D. Hommel, V. Haerle, J. Off, F. Scholz
Mat. Sci. & Eng. B 82, 178 - 181 (2001) [View PDF
(200kB)]
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37. |
Effective carrier mass and mobility versus carrier concentration in
p- and n-type GaN determined by infrared ellipsometry and Hall
resistivity measurements
A. Kasic,
M. Schubert, B. Rheinländer,
V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
Mat. Sci. & Eng. B 82, 74 - 76 (2001) [View PDF
(78kB)]
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2000 |
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36. |
Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer
using generalized ellipsometry
T.E.Tiwald, M. Schubert
In Optical Diagnostics Methods for Inorganic Materials II (L. M. Hanssen, ed ), Proc SPIE 4103, SPIE, Bellingham, WA, U.S.A., 2000, 19-29 [View PDF
(662kB)]
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35. |
Optical properties of GaAs1-yNy
G. Leibiger,
B. Rheinländer, V. Gottschalch,
M. Schubert; J. Sik, G. Lippold
Proceedings of the International Conference on Advanced Semiconductor Devices
and Microsystems (ASDAM), 171 - 174 (2000) [View INSPEC
(2kB)]
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34. |
Infrared switching electrochromic devices based on tungsten oxide
E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, J.A. Woollam
J. Appl. Phys. 88, 5777 - 5784 (2000) [View PDF (108kB)]
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33. |
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, J.A. Woollam, F. Frost
J. Appl. Phys. 88, 5166 - 5174 (2000) [View PDF (239kB)]
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32. |
Nitrogen dependence of the GaAsN interband-critical points E1 and E1+D1 determined by spectroscopic ellipsometry
G. Leibiger, B. Rheinländer, M. Schubert, J. Sik, V. Gottschalch, J. Humlicek
Appl. Phys. Lett. 77, 1650 - 1652 (2000) [View PDF (62kB)]
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31. |
All-Solid state electrochromic device for emittance modulation in the infrared spectral region
E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, J. A. Woollam
Appl. Phys. Lett. 77, 930 - 932 (2000) [View PDF (40kB)]
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30. |
Near-band-gap optical functions spectra and band-gap energies of
GaNAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry
J. Sik, M. Schubert, G. Leibiger, G. Kirpal, V. Gottschalch, J. Humlicek
Appl. Phys. Lett. 76, 2859 - 2861 (2000) [View PDF (119kB)]
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29. |
Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry
J. Sik, M. Schubert, T. Hofmann, V. Gottschalch
MRS Internet J. Nitride Semicond. Res. 5, 3 (2000) [View PDF (100kB)]
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28. |
Phonons and free carriers in a strained hexagonal GaN-AlN
superlattice measured by Infrared Ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, T.E. Tiwald, J.A. Woollam, V. Härle, F. Scholz
MRS Internet J. Nitride Semicond. Res. 5, W11.39 (2000) [View PDF (106kB)]
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27. |
Free-carrier and phonon properties of p- and n-type hexagonal GaN films measured by infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, T. E. Tiwald
Phys. Rev. B 62, 7365 - 7377 (2000) [View PDF (183kB)]
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26. |
In-situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J. A. Woollam, J.-D. Hecht, H. Neumann, G. Wagner, F. Bigl
J. Appl. Phys. 87, 2593 - 2599 (2000) [View PDF (618kB)]
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25. |
Infrared dielectric anisotropy and phonon modes of sapphire
M. Schubert, T. E. Tiwald, C. M. Herzinger
Phys. Rev. B 61, 8187 - 8201 (2000) [View PDF (288kB)]
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1999 |
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24. |
Optical phonons and free-carrier effects in MOVPE grown AlxGa1-xN measured by infrared ellipsometry
M. Schubert, A. Kasic,
T. E. Tiwald, J. Off, B. Kuhn, F. Scholz
MRS Internet J. Nitride Semicond. Res. 4, 11 (1999) [View PDF (302kB)]
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23. |
Isotropic optical constants of highly disordered AlxGa1-xInP lattice matched to GaAs
M. Schubert, J.A. Woollam, G. Leibiger, B. Rheinländer,
I. Pietzonka, T. Saß, V. Gottschalch
J. Appl. Phys. 86, 2025 - 2034 (1999) [View PDF (143kB)]
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22. |
Free-carrier response and lattice modes of group III-nitride heterostructures by infrared ellipsometry
M. Schubert, J. A. Woollam, A. Kasic,
B. Rheinländer, J. Off, B. Kuhn, F. Scholz
phys. stat. sol.(b) 216, 655 - 658 (1999) [View PDF (172kB)]
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21. |
Near-band-gap CuPt order birefringence in Al0.48Ga0.52InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch, J. A. Woollam
Phys. Rev. B 60, 16618 - 16634 (1999) [View PDF (330kB)]
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20. |
Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
M. Schubert, T.E. Tiwald, J.A. Woollam
Applied Optics 38, 177 - 187 (1999) [View PDF (1569kB)]
[Corrections]
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1998 |
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19. |
Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert,
H. Schmidt
in Heterostructure Epitaxy and Devices - HEAD'97 , P. Kordoš and J. Novák (Eds.),
151 - 154 (Kluwer Academic Publishers, Netherland, 1998)
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18. |
In-situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, H. Yao, J. A. Woollam, J. Hahn
J. Appl. Phys. 84, 526 - 532 (1998) [View PDF (156kB)]
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17. |
Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, A. Eifler, V. Riede, M. Schubert, G. Krauß, V. Krämer
Phys. Rev. B 57, 7037 - 7042 (1998) [View PDF (156kB)]
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16. |
Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, D. Thompson, J. A. Woollam, J. Hahn
Thin Solid Films 313-314, 692 - 696 (1998) [View PDF (241kB)]
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15. |
Generalized Ellipsometry and complex optical systems
M. Schubert
Thin Solid Films 313-314, 323 - 332 (1998) [View PDF (276kB)]
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1997 |
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14. |
Phase and Microstructure investigations of boron nitride thin
films by spectroscopic ellipsometry in the visible and infrared spectral range
E. Franke, M. Schubert, H. Neumann, T.E. Tiwald, D. Thompson, J.A. Woollam, J. Hahn, F. Richter
J. Appl. Phys. 82, 2906 - 2911 (1997) [View PDF (151kB)]
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13. |
Infrared optical properties of mixed-phase thin films studied
by spectroscopic ellipsometry and boron nitride as an example
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, F. Richter
Phys. Rev. B 56, 13306 - 13313 (1997) [View PDF (205kB)]
[Corrections]
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12. |
Infrared-ellipsometry on hexagonal and cubic boron nitride thin films
E. Franke, H. Neumann, M. Schubert, T.E. Tiwald, J.A. Woollam, J. Hahn
Appl. Phys. Lett. 70, 1668 - 1670 (1997) [View PDF (100kB)]
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11. |
Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, F. Richter
Appl. Phys. Lett. 70, 1819 - 1821 (1997) [View PDF (120kB)]
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10. |
Application of generalized ellipsometry to complex optical systems
M. Schubert,
B. Rheinländer, B. Johs, J. A. Woollam
In Polarimetry and Ellipsometry (M. Pluta and T. R. Wolinski, eds.), Proc SPIE 3094, SPIE, Bellingham, WA, U.S.A., 1997, 255-265 [View PDF (528kB)]
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1996 |
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9. |
Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, J. A. Woollam
in The Physics of Semiconductors (M. Scheffler and R. Zimmerman, eds.), Vol. 1, World Scientific, Singapore, 1996, 473
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8. |
Direct-gap reduction and valence-band splitting in
spontaneously ordered indirect-gap AlInP studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, E. Franke, I. Pietzonka,
J. Škriniarová, V. Gottschalch
Phys. Rev. B 54, 17616 -17620 (1996) [View PDF (154kB)]
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7. |
Optical properties of microconfined liquid crystals
C. Cramer, H. Binder, M. Schubert, B. Rheinländer, H. Schmiedel
Mol. Cryst. Liq. Cryst. 282, 395 - 405 (1996)
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6. |
Generalized Transmission Ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals
M. Schubert, B. Rheinländer,C. Cramer, H. Schmiedel, B. Johs, C. M. Herzinger, J.A.Woollam
J. Opt. Soc. Am. A 13, 1930 - 1940 (1996) [View PDF (1648kB)] [Corrections]
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5. |
Extension of Rotating Analyzer Ellipsometry to Generalized
Ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2
M. Schubert, B. Rheinländer, B. Johs, C. M. Herzinger, J. A. Woollam
J. Opt. Soc. Am. A 13, 875 - 883 (1996) [View PDF (1367kB)]
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4. |
Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
M. Schubert
Phys. Rev. B 53, 4265 - 4274 (1996) [View PDF (184kB)]
[Corrections]
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1995 |
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3. |
Dark-field-spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, V. Gottschalch
phys. stat. sol. (a) 152, 287 - 292 (1995)
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2. |
Band-gap reduction and valence band splitting in spontaneously
ordered GaInP2 studied by Dark-field-spectroscopy
M. Schubert, B. Rheinländer, V. Gottschalch
Solid State Commun. 95, 723 - 726 (1995)
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1. |
Optical constants of GaxIn1-xP lattice matched to GaAs
M. Schubert, V. Gottschalch, C. M. Herzinger, H. Yao, P. G. Snyder,
J. A. Woollam
J. Appl. Phys. 77, 3416 - 3419 (1995)
[View PDF (205kB)]
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h-index |
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M. Schubert's scientific output parameter h according to Hirsch
based on ISI (20.09.2005; Defined as the number of papers with citation number higher or equal to h.): 18
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