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Prof. Dr. Mathias Schubert
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Invited Conference Talks

2006   2005   2004   2003   2002   2001   2000   1999   1997   1996  

Electronic documents are intended for internal use only. Corrections are added for misprints where known.


21. Terhertz Magnetooptic Ellipsometry on graphite in quantum regimes - Landau level transitions and cyclotron mass
M. Schubert et al.
LEES, Tallin, July 2006
20. Ion beam assisted growth of chiral sculptured thin films
E. Schubert, F. Frost, B. Fuhrmann, F. Heyroth, M. Schubert, H. Neumann, B. Rauschenbach
German Physical Society Spring Meeting, Hauptvortrag, Dresden, March 2006

19. ZnO-based thin films and nanostructures: Phonons, plasmons, band gap energies, magnetism and electric polarization exchange: A Leipzig review
M. Schubert, C. Bundesmann, N. Ashkenov, H. v. Wenckstern, H. Schmidt, M. Lorenz, T. Nobis, H. Hochmuth, M. Diaconu, D. Fritsch, A. Rahm, R. Schmidt-Grund, M. Grundmann
SPIE, Photonics West, San Jose, January 2006



18. Optical in-situ and in-line characterization of functional layers
M. Schubert
Fraunhofer FEP, Workshop Advanced Process Control for future oriented manufacturing, Dresden, September 22 - 23, 2005

17. Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting, Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May 31 - June 3, 2005



16. Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Swedish Optical Society Annual Meeting, Linkoping, November 2004

15. In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung
M. Schubert
Transparent Conducting Oxide (TCO) Workshop Leipzig, March 2004

14. Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2004

13. Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen
M. Schubert, T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004



12. Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films
M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, H. Neumann
Optical System Design 2003, St. Etienne, France, September 2003

11. Generalized magneto-optic ellipsometry
M. Schubert, T. Hofmann, C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003 [View PDF (7761kB)]



10. Generalized ellipsometry of complex mediums in layered systems
M. Schubert
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002

9. Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, J. A. Woollam
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002 [View PDF (9803kB)]

8. Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures
M. Schubert, A. Kasic, G. Leibiger, T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002



7. Ellipsometry on anisotropic materials- treatment of surface and interface layers
M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May 2001 [View PDF (10267kB)]



6. Generalized Ellipsometry for novel optical materials
M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000

5. Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie
M. Schubert
German Physical Society Spring Meeting, Hauptvortrag, Regensburg, March 2000

4. Ellipsometry of anisotropic materials
M. Schubert
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000



3. Spectroscopic ellipsometry
J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, S. Zollner
Centennial Meeting of the American Physical Society, Atlanta, U.S.A , April, 1999



2. Generalized ellipsometry and complex optical systems
M. Schubert
2. International Conference on Spectroscopic Ellipsometry, Charleston, U.S.A., Mai 1997



1. Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert, B. Rheinländer,B. Johs, J.A. Woollam
German Physical Society Spring Meeting, Hauptvortrag, Regensburg, March 1996


back to People last update 9. March 2008