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Prof. Dr. H. Arwin, University Linkoping, Sweden |
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PD Dr. C. Bernhard, MPI Stuttgart, Germany |
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Dr. R. M. Correia, Universidade de Aveiro, Aveiro, Portugal |
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Prof. Dr. W. Dollase, UCLA, USA |
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PD Dr. N. Esser, ISAS Berlin, Germany |
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Prof. Dr. M. Grundmann, Universität Leipzig, Germany |
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PD Dr. D. Hesse, MPI Halle, Germany |
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Prof. Dr. D. Hommel, Universität Bremen, Germany |
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Prof. Dr. W. Dollase, UCLA, USA |
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Prof. Dr. I. Hodgkinson, University of Otago, New Zealand |
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Prof. Dr. O. Inganäs, University Linkoping, Sweden |
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Dr. G. Jakopic, Joanneum Research, Graz, Austria |
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Dr. G. E. Jellison, Oak Ridge National Laboratory, USA |
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Prof. Dr. B. Monemar, University Linkoping, Sweden |
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Prof. Y. Nanishi, Ritsumeikan University, Kusatsu, Japan |
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Prof. Dr. J. Rivory, Universite Pierre et Marie Curie, Paris, France |
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Dr. U. Schade, IRIS beamline at BESSY II Berlin, Germany |
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Prof. Dr. J. A. Woollam, University of Nebraska-Lincoln, USA |
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Dr. Hagen Bartsch, Fraunhofer FEP Dresden, Germany |
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Dr. C. M. Herzinger, J. A. Woollam Co. Inc., Lincoln, USA |
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W. Häntsch, FHR Anlagenbau Ottendorf-Okrilla, Germany |
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Dr. T. Höing, Flabeg GmbH, Furth im Wald, Germany |
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Dr. P. Lenck, von Ardenne Anlagenbau GmbH Dresden, Germany |
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Dr. G. Lippold, Solarion GmbH Leipzig, Germany |
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Dr. D. Peros, Alanod Aluminium-Veredlung GmbH & Co. KG, Ennepetal, Germany |
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Dr. J. Šik, On Semiconductor Cooperation Terosil, Rožnov pod Radhoštem, Czech Republic |
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Dr. K. Streubel, OSRAM Opto Semiconductors GmbH Regensburg, Germany |
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Dr. T. Wagner, L.O.T.-Oriel GmbH, Darmstadt, Germany |
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H. Neumann, Institut für Oberflächenmodifizierung Leipzig e.V., Germany |
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D. Roth, Roth & Rau AG, Hohenstein-Ernstthal, Germany |
