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   Home > People > Schubert
Prof. Dr. Mathias Schubert
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Conferences

2017   2017   2016   2015   2014   2013   2012   2011   2010   2009   2008   2007   2006   2005   2004   2003   2002   2001   2000   1999   1998   1997   1996   1995   1994   1993  


   

2018:

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2017:

    517. Responsive Biomaterials by using nanostructured polymer brush films
P. Uhlman, A. Revzin, M. Schubert, and A. Pannier
5th International Conference on Multifunctional, Hybrid and Nanomaterials 2017, Lisbon, Portugal, March 2017


    516. Invited
Anisotropy Contrast Optical Microscopy using ordered metal-nanostructure surfaces for novel high-resolution biomaterial imaging

M. Schubert
First EU-Japan Symposium: “Current trends in Optical and X-Ray Metrologies of Key enabling Nanomaterials/Devices for the Ubiquitous Society, Renewable Energy and Health, Okayama, Japan, November 2017


    515. UNL Graduate Student Competition Best Poster Award Winner
Adsorption and Decontamination of Alpha-synuclein From Medically and Environmentally-Relevant Surfaces

T. M. Hanh Phan , S. L. Bartelt-Hunt, J. C. Bartz, J. Ayers, B. Giasson, M. Schubert, K. B. Rodenhausen, and N. Kananizadeh
UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017


    514. ECE Graduate Student Competition Best Poster Award Winner
Atomic Layer Deposition of WO3 Ultra Thin Films: In situ Ellipsometry Growth Monitoring and Ex situ Optical Characterization

U. Kilic, D. Sekora, A. Mock, C. Argyropoulos, N. Ianno, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017


    513. ECE Graduate Student Competition Best Poster Award Winner
In-situ Terahertz optical Hall effeect measurement of ambient doping effects in epitaxial graphene

S. Knight, T. Hofmann, C. Bouhafs, N. Armakavicious, P. Kuehne, M. Schubert, and V. Darakchieva
UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017


    512. Terahertz Cavity-enhancd optical Hall effect reveals anistropic mobility in epitaxial graphene
P. Kuehne, C. Bouhafs, V. Stanishev, T. Hofmann, M. Schubert, R. Yakimova, C. Coletti, and V. Darakchieva
MRS Spring Meeting, Pheonix, Arizona, U.S.A., April 2017


    511. In-situ Terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P. Kuehne, V. Stanishev, I. Ivanov, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
MRS Spring Meeting, Pheonix, Arizona, U.S.A., April 2017


    510. Spectroscopic ellipsometry of WO3 thin films from ALD: In-situ layer-by-layer growth monitoring and ex-situ optical characterization
U. Kilic, D. Sekora, A. Mock, C. Argyropoulos, N. Ianno, R. Feder, E. Schubert, and M. Schubert
17th International Conference on Atomic Layer Deposition, Denver, Colorado, U.S.A., July 2017


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2016:

    509. Generalized spectroscopic ellipsometry: determination of orthorhombic optical properties of bi-layer Co-FeNi slanted columnar thin films
D. Sekora, C. Briley, T. Hofmann, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June 2016


    508. Invited
The eigen polarization model for monoclinic and triclinic symmetries: Generalized ellipsometry analysis from the far infrared to the deep ultra violet for single crystalline beta gallium oxide

A. Mock, R. Korlacki, C. Briley, S. Knight, S. Schoche, T. Hofmann, V. Darakchieva, E. Janzen, B. Monemar, D. Gogova, Q.-T. Thieu, R. Togashi, H. Murakami, Y. Kumagai, K. Goto, A. Kuramata, S. Yamakoshi, M. Higashiwaki, E. Schubert, and M. Schubert
ICSE-7, Berlin, Germany, June 2016


    507. Hydrogen intercalation induced anisotropy of free charge carrier mobility in epitaxial graphene revealed by THz Optical Hall effect measurements
P. Kuhne, N. Armakavicius, C. Bouhafs, V. Stanishev, T. Hofmann, R. Yakimova, C. Colleti, M. Schubert, and V. Darakchieva
ICSE-7, Berlin, Germany, June 2016


    506. Tribrid EC-GSE-QCMD Analysis: Surface topography effects on the electrochromic behavior of methylene blue
D. Sekora, A. J. Zaitouna, U. Kilic, T. Hofmann, R. Y. Lai, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June 2016


    505. Vector magneto-optical generalized ellipsometry on nanostructured magnetic thin films of complex anisotropy
C. Briley, A. Mock, R. Korlacki, T. Hofmann, E. Schubert, R. Skomski, and M. Schubert
ICSE-7, Berlin, Germany, June 2016


    504. In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P.Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
ICSE-7, Berlin, Germany, June 2016


    503. THz-MIR ellipsometry characterization of chromia thin films
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, C.M. Herzinger, J.A. Woollam, M. Schubert, C. Binek, M. Street, P. Dowben, and T. Hofmann
Nebraska MRSEC Review, Lincoln, NE, March 2016


    502. Imaging Ellipsometry of Cells Cultured on Optically Anisotropic Nanostructured Surfaces
T. Kasputis, D. Peev, A. Nguyen, A. Mantz, E. Franke-Schubert, A. K. Pannier, and M. Schubert
ICSE-7, Berlin, Germany, June 2016


    501. Invited
Anisotropy: A key to detection and separation in physical, chemical and biological investigations using linear optical spectroscopy and imaging

M. Schubert
Advanced Functional Materials Workshop, Linkoping University, Linkoping, Sweden, August 2016


    500. Invited Plenary talk
Electronic materials with monoclinic and triclinic symmetries, and the anisotropy contrast microscopy imaging concept

M. Schubert
ICSE-7, Berlin, Germany, June 2016


    499. Invited Institute Colloquium
Nebraska Center for Nanohybrid Functional Materials

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, January 2016


    498. Invited Seminar (Prof. Olle Inganas)
Promoting a revolution in power electronics: Characterizing anisotropy, phonons, band-to-band transitions and free charge carriers in monoclinic metaloxides

M. Schubert
Linkoping University, Linkoping, Sweden, May 2016


    497. Invited
Ellipsometry and Nanostructures: A new paradigm in microscopy – The anisotropy contrast microscopy using glancing angle deposited nanostructured thin films

M. Schubert
Optical Interference Coatings (OIC), Loews Ventana Canyon, Tucson, Arizona, USA, June 2016


    496. Functionalized Three-Dimensional Spatially Coherent Thin Films for Biomaterial Applications
M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, A. Pannier, D. Sekora, C. Rice, E. Schubert, M. Schubert, K.-J. Eichhorn, M. Stamm, and P. Uhlmann
MRS Fall Meeting, Boston, MA, November-December 2016


    495. Combined Quartz Crystal Microbalance with Dissipation and Generalized Ellipsometry to Characterize the Deposition of Titanium
K. B. Rodenhausen, N. Kananizadeh, C. Rice, J. Lee, D. Sekora, M. Schubert, E. Schubert, S. Bartelt-Hunt, and Y. Li
AIChE Annual Meeting, San Francisco, C, November 2016


    494. Invited 12th IPF Colloquium
Anisotropic Optical Contrast Microscopy and functionalized nanostructured surfaces: A new imaging modality for small molecule detection and cell-surface interactions

M. Schubert
Leibniz Institute for Polymer Research (IPF), Dresden, November 2016


    493. In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, and T. Hofmann
SPIE Optics+Photonics, San Diego, CA, August-September 2016


    492. Invited
New developments for in-situ and imaging ellipsometry applications in biology and life sciences

M. Schubert
First Northern Ellipsometry Workshop Sweden (NEWS), Linkoping, Sweden, November 2016


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2015:

    491. Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies
S. Knight, S. Schoeche, V. Darakchieva, P. Kuehne, C.M. Herzinger, M. Schubert, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 11 2015


    490. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015


    489. Transmission Mueller Matrix Imaging Microscope
D. Peev, C. Rice, M. Schubert, and T. Hofmann
J. A. Woollam Symposium, Lincoln, NE, June 6 2015


    488. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 14 2015


    487. Optical Anisotropy of Porous Polymer Film with Inverse Slanted Nanocolumnar Structure Revealed via Generalized Ellipsometry
D. Liang, D. Sekora, C. Rice, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 14 2015


    486. Mueller Matrix Birefringence Microscopy of Mouse Fibroblasts using Anisotropic Nanostructured Surfaces
T. Kasputis, C. Rice, D. Peev, T. Hofmann, E. Schubert, A.K. Pannier, and M. Schubert
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015


    485. Nanostructured Columnar Thin Films Enhance Protein Adsorption and Cell-Material Interactions
T. Kasputis, A. Pieper, E. Schubert, M. Schubert, and A.K. Pannier
American Institute of Chemical Engineers Annual Meeting, Atlanta, GA, Month 2015


    484. Direct Band Structure Based Modeling of Graphene: from the THz to the UV
A. Boosalis, W. Li, N. Nguyen, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, M. Schubert, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015


    483. 1st PLACE WINNER
Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-Dimensional Nanostructured Surfaces Studied by in-situ EC and Generalized Ellipsometry

D. Sekora, A. J. Zaituna, T. Hofmann, R. Y. L. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2015


    482. Observation of a Reversible Phase Transition in the Dielectric Function Response of Si Nanostructures upon Li Intercalation using Generalized Ellipsometry
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April 2015


    481. Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-dimensional Nanostructured Surfaces Studied by in-situ EC, QCM-D and Generalized Spectroscopic Ellipsometry
D. Sekora, A. J. Zaituna, T. Hofmann, R. L. Y. Lai, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April 2015


    480. 3rd Place Winner (ECE Dept.) & Commendation Award (College of Engineering)
Enhanced Temperature Stability of Slanted Columnar Thin Films by ALD Overcoating

Alyssa Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2015


    479. Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
11th ICNS, Beijing, China, August 2015


    478. Spectroscopic Ellipsometry FT Student award winner
Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies

S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015


    477. Vector magneto-optical generalized ellipsometry on heat treated sculptured think films: A study of the effects of Al2O3 passivation coatings on magneto-optical properties
C. Briley, A. Mock, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015


    476. The Effect of Annealing and Alumina Passivation on Structural and Optical Properties of Cobalt-Oxide Core-Shell Slanted Columnar Thin Films
A. Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015


    475. 2nd Place Winner (ECE Dept.)
Anisotropic Plasmon Resonances in Nanostructured Thin Films: An Optical Model Approach

C. Briley, D. Sekora, T. Hofmann, E. Schubert, and and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2015


    474. Anisotropic Magneo-Optical Hysteresis of Permalloy Slanted Columnar Thin Films Determined by Vector Magneto-Optical Generalized Ellipsometry
C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and and M. Schubert
WSE-9, Twente, Netherlands, February 2015


    473. VMOGE on annealed Cobalt slanted columnar thin films (Co-SCTF)
C. Briley, A. Mock, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, August 2015


    472. Cavity-enhanced THz optical Hall effect and graphene-based environmental sensing
S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
J.A. Woollam Symposium, Lincoln, NE, August 2015


    471. Invited Seminar (Prof. M. Stamm)
The Invisible Light

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, May 2015


    470. Invited (hedersdoctor ceremony)
The Invisible Light

M. Schubert
Linkoping University, Linkoping, Sweden, May 2015


    469. Anisotropy, Phonon Modes and Band-to-Band Transitions in Single-Crystal Monoclinic Beta-Ga2O3 Determined by THz to VUV Generalized Ellipsometry
M. Schubert, R. Korlacki, S. Schoeche, V. Darakchieva, B. Monemar, K. Goto, K. Nomura, H. Murakami, Q.-T. Thieu, R. Togashi, Y. Kumagai, A. Kuramata, M. Higashiwaki, A. Koukitu, S. Yamakoshi, E. Janzén, D. Gogova, M. Schmidbauer, and Z. Galazka
International Workshop on Gallium Oxide and Related Materials 2015 (IWGO 2015), Kyoto, Japan, November 2015


    468. Invited
The Invisible Light

M. Schubert
The International Conference on Optics of Surfaces and Interfaces (OSI-11), Austin TX, USA, June-July 2015


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2014:

    467. Combinatorial QCM-D/GE-Study of Swelling of and Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces
M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
8th Workshop Ellipsometry, Dresden, Germany, March 2014


    466. Talk
Phonon mode behavior and free-charge carrier parameters in high-Al content AlGaN determined by IR spectroscopic Ellipsometry and optical Hall effect

S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A. Kakanakova-Georgieva, E. Janzén, and V. Darakchieva
8th Workshop Ellipsometry, Dresden, Germany, March 2014


    465. Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations
S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzén, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann
8th Workshop Ellipsometry, Dresden, Germany, March 2014


    464. Permanent Magnet Based THz Optical Hall Effect on AlInN/GaN High Electron Mobility Transistor Structures
S. Knight, S. Schöche, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 2014


    463. Instrument Development: 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 2014


    462. Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer
D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2014


    461. Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer
D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert
EPSCoR External Review Panel, Lincoln, NE, August 19 2014


    460. 2nd PLACE WINNER
In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation

D. Sekora, D. Schmidt, R. Y. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2014


    459. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August 2014


    458. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
61st AVS Symposium, Baltimore, Maryland, November 2014


    457. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I.G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
4th Graphene, Toulouse, France, May 2014


    456. Spectroscopic Ellipsometry FT Student award winner
Vector Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films with Forward Calculated Uniaxial Response Simulation

C. Briley, T. Hofmann, D. Schmidt, E. Schubert, and M. Schubert
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014


    455. Dielectric Tensor Model for Inter Landau-level Transitions in Highly Oriented Pyrolytic Graphite and Epitaxial Graphene – Symmetry Properties, Energy Conservation and Plasma Coupling
P. Kühne, T. Hofmann, M. Schubert, C.M. Herzinger, and V. Darakchieva
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014


    454. The Development Of Highly-Oriented 3D Nanostructures For Use With Ultra-Thin Layer Chromatography And Ellipsometry
Erika L. Pfaunmiller, Sandya Beeram, C. Rice, D. Peev, T. Hofmann, M. Schubert, and D. S. Hage
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014


    453. Improved Design for Highly Efficient Hybrid Photovoltaic Devices
Alyssa Mock, Cesar Rodriquez, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August 2014


    452. Low Temperature Atomic Layer Deposition and RF Magnetron Sputtering of ZnO for use as Transparent Conductive Oxides
Cesar Rodriguez, Alyssa Mock, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August 2014


    451. Improved Design for Highly Efficient Hybrid Photovoltaic Devices
Alyssa Mock, D. Schmidt, D. Sekora, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2014


    450. Invited Institute Colloquium
Generalized Ellipsometry and the Optical Hall effect: Characterization of Anisotropic Materials from single crystalline to complex-structured Mediums

M. Schubert
Leibniz Institute for Crystal Growth IKZ, Berlin, Germany, March 2014


    449. From QCM(D)-Ellipsometry combination to Birefringence Imaging Chromatography and Birefringence Microscopy using Sculptured Columnar Thin Films (SCTF)
M. Schubert
7th Workshop Ellipsometry (WSE-7), Dresden, Germany, March 2014


    448. Infrared optical Hall effect in epitaxial graphene on 3C- and 4H-SiC
V. Stanishev, P. Kühne, T. Hofmann, M. Schubert, A. Zakharov, T. Iakimov, J. ul Hassan, E. Janzén, R. Yakimova, and V. Darakchieva
Graphene 2014, Lanzarote, Spain, February 18 – 21 2014


    447. Shedding light on the nature of epitaxial graphene on C-face SiC
V. Darakchieva, P. Kühne, V. Stanishev, I. G. Ivanov, C. Bouhafs, T. Iakimov, A. Zakharov, T. Hofmann, M. Schubert, and R. Yakimova
International Conference on Nanoscience + Technology , Veil, Colorado, July 2014


    446. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I. G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
Graphene week, Gothenburg, Sweden, June 23-27 2014


    445. Capture of macromolecules by polymeric brushes anchored on three-dimensional spatially coherent thin films
K.B. Rodenhausen, D. Sekora, K.-J. Eichhorn, E. Schubert, M. Schubert, M. Stamm, and P. Uhlmann
8th ECNP International Conference on Nanostructured Polymers and Nanocomposites, Dresden, Germany, Sep. 16-19 2014


    444. Adaptive Optics
S. Knight, C. Rice, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, June 2014


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2013:

    443. Fabrication and optical modeling of nanohybrid functional slanted columnar thin films
D. Schmidt, M. Junige, J.W. Bartha, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    442. Vector Magneto-Optical Generalized Ellipsometry Magnetization Mapping of Sculptured Thin Films
C. Briley, D. Schmidt, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    441. Talk
Sub-10 nm Cobalt Nanowires Building via Phase Separation: Synthesis, Simulation, and Characterization

Y. Tian, Z. Xu, D. Schmidt, T. Jayaraman, C. Briley, J. Shield, M. Schubert, and E. Schubert
2013 TMS Annual Meeting & Exhibition, San Antonio, TX, March 2013


    440. Biomolecule Loading within Nanostructured Thin Films as Cell-Instructive Surfaces for Drug and Gene Delivery
T. Kasputis, D. Schmidt, K.B. Rodenhausen, D. Sekora, M. Koenig, K.-J. Eichhorn, P. Uhlmann, M. Stamm, E. Schubert, M. Schubert, and A.K. Pannier
ICSE-VI, Kyoto, Japan, May 2013


    439. Talk
Detection of organic adsorption onto three-dimensional nanostructure layers with generalized ellipsometry

K.B. Rodenhausen, D. Schmidt, R.S. Davis, D. Sekora, R. Neupane, T. Kasputis, A.K. Pannier, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    438. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    437. Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4
S. Schöche, W. Dollase, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    436. Poster Award Winner
Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations

S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzen, N.B. Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
UNL Graduate Research Fair and Symposium, Lincoln, Nebraska, April 2013


    435. Talk
Evaluation of a metal-organic precursor with regard to a gold ALD process by utilizing in-situ spectroscopic ellipsometry

M. Junige, D. Schmidt, S.T. Barry, J.W. Bartha, and M. Schubert
ALD 2013, San Diego, CA, July 2013


    434. Invited
Periodic nanostructured thin films

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
2013 MRS Fall Meeting, Boston, MA, December 2013


    433. Talk
Detection of temperature dependent electron confinement in AlGaN/GaN heterostructures by THz optical Hall-effect measurements

T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva
ICSE-VI, Kyoto, Japan, May 2013


    432. Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide
P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C. R. Eddy, Jr., D. K. Gaskill, M. Schubert, and T. Hofmann
ICSE-VI, Kyoto, Japan, May 2013


    431. Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on SiC: Influence of Growth, SiC Polymorph, and H-Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, V. Darakchieva, R. Yakimova, and M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    430. THz dielectric anisotropy of metal slanted columnar thin films: Ellipsometric characterization and Sensor applications
T. Hofmann, D. Schmidt, P. Kühne, C. M. Herzinger, J. A. Woollam, M. Schubert, and E. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    429. Talk
Recent progress in understanding free-charge carrier and structural properties of InN:Mg

M.-Y. Xie, S. Schöche, N. Ben Sedrine, F. Tasnadi, B. Monemar, T. Hofmann, M. Schubert, X. Wang, A. Yoshikawa, K. Wang, Y. Nanishi, and V. Darakchieva
E-MRS 2013 SPRING MEETING, Strasbourg, France, May 2013


    428. Combinatorial QCM-D/GE-Study of Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces
M. Koenig, T. Kasputis, D. Schmidt, K. B. Rodenhausen, K.-J. Eichhorn, A. K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
ICSE-VI, Kyoto, Japan, May 2013


    427. Talk
Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 60th Annual International Symposium, Long Beach, CA, October 2013


    426. Talk
Protein-Loaded Slanted Columnar Thin Films As Novel Biomaterials for Enhancing Cell-Surface Interactions

T. Kasputis, K.B. Rodenhausen, A. Pieper, D. Schmidt, D. Sekora, E. Schubert, M. Schubert, and A.K. Pannier
2013 AIChE Annual Meeting, San Francisco, CA, November 2013


    425. Talk
Direct Band Structure Based Modeling of Graphene: from the THz to the UV

A. Boosalis, W. Li, N. Nguyen, M. Real, R. Elmquist, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, R. Myers-Ward, V. Wheeler, C. Eddy, D. Gaskill, M. Schubert, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October 2013


    424. Talk
Optical Hall effect – Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC

P. Kühne, M. Schubert, V. Darakchieva, R. Yakimova, D.K. Gaskill, R.L. Myers-Ward, C.R. Eddy Jr., J.D. Tedesco, C.M. Herzinger, J.A. Woollam, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October 2013


    423. Optical Properties of Graphene-Coated Cobalt GLAD Structures
P. Wilson, D. Schmidt, E. Schubert, M. Schubert, T. Hofmann, and A. Sinitskii1
2013 MRS Fall Meeting, Boston, MA, November 2013


    422. In-situ Quantification of Cetyltrimethylammonium Bromide Adsorption Within Metal Nanorod Arrays by Generalized Transmission Ellipsometry
C. Rice, T. Hofmann, K.B. Rodenhausen, D. Sekora, D. Schmidt, E. Pfaunmiller, D. Hage, E. Schubert, and M. Schubert
23rd National NSF EPSCoR Conference, Nashville, TN, November 2013


    421. In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries
D. Sekora, D. Schmidt, R. L. Y. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 2013


    420. In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries
D. Sekora, D. Schmidt, R. Y Lai, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August 2013


    419. Invited Tutorial in honor of Professor Manuel Cardona
The influence on optical spectra by phonons, plasmons, excitons, i.e., polaritons

M. Schubert
ICSE-VI, Kyoto, Japan, May 2013


    418. ALD von dünnen, konformen Metall- und Metalloxidschichten an GLAD Dünnfilmen
M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, Marcel Junige, and Johann W. Bartha
XX. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Vogtland, Germany, March 2013


    417. Invited Institute Colloquium
Generalized Ellipsometry – from birefringence chromatography to the Optical Hall effect in epitaxial graphene

M. Schubert
Johannes Kepler University, Linz, Austria, March 2013


    416. Invited Institute Colloquium
New Sensing and Separation Principles based on Nanohybrid Functional Materials

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, September 2013


    415. Invited Industry Seminar
Novel concepts in Generalized Ellipsometry, Plasmonics, and Sensing Principles using anisotropic nanostructures

M. Schubert
Seagate Technologies, Minneapolis, MS , December 2013


    414. Invited Institute Colloquium
The Optical Hall effect in epitaxial graphene and semiconductor heterostructures

M. Schubert, and T. Hofmann
College of Nanoscale Science, Center for Nanoscale Metrology, SUNY at Albany, Albany, NY, October 2013


    413. Invited Institute Colloquium
New Sensing and Separation Principles based on Glancing Angle Deposited Nanohybrid Functional Materials and Birefringent THz-VUV Plasmonics

M. Schubert
University of Utah, Salt Lake City, UA, November 2013


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2012:

    412. Changes in Graphene Optical Properties Induced by Hydrogen Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November 2012


    411. Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November 2012


    410. Control and switching of the interaction of model proteins with polymer brushes
P. Uhlmann, E. Bittrich, K.-J. Eichhorn, M. Müller, K. B. Rodenhausen, M. Schubert, and M. Stamm
American Chemical Society Spring Meeting, Symposium Proteins at Interfaces, San Diego, CA, March 2012


    409. Fabrication and Characterization of GLAD Sculptured Thin Films Functionalized with Grafted-To Polymer Brushes
T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, P. Uhlmann, A. K. Pannier, M. Schubert, and M. Stamm
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    408. Talk
Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films

D. Schmidt, C. Briley, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    407. Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films
D. Schmidt, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    406. Talk
Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films

K. B. Rodenhausen, D. Schmidt, T. Kasputis, A. K. Pannier, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    405. Metal slanted columnar thin film THz optical sensors
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C.M. Herzinger, J.A. Woollam, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    404. GLAD Sculptured Thin Films Functionalized with Polymer Brushes
T. Kasputis, M. König, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    403. The Optical-Hall Effect
P. Kühne, T. Hofmann, A. Boosalis, S. Schöche, D. Schmidt, C. M. Herzinger, J.A. Woollam, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    402. Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4
S. Schöche, W. Dollase, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    401. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    400. Poster Award Winner
Spectroscopic Ellipsometry and optical Hall-Effect study of free-charge carriers in InN:Mg - Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012


    399. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012


    398. Talk
Slanted columnar thin films functionalized with polymer brushes

T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
AIChE Annual Meeting, Pittsburg, PA, October 2012


    397. GLAD sculptured thin films functionalized with polymer brushes
T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012


    396. Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films

M. Schubert
65th IUVSTA Workshop, Peckforton Castle, UK, May 2012


    395. Invited
Ellipsometry for magnetics, metamaterials, chiral structures, and photonic crystals

M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March 2012


    394. Spectroscopic Ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg - Indications for succesful p-type doping
S. Schöche, T. Hofmann, V. Darakchieva, N.B. Sedrine, X.~Wang, A. Yoshikawa, and M. Schubert
International Workshop on Nitride Semiconductors 2012, Sapporo, Japan, October 2012


    393. Talk
Biochemical Optical Sensors Based on Highly-Ordered Slanted Columnar Thin Films

D. Schmidt, K.B. Rodenhausen, J. VanDerslice, T.E. Tiwald, E. Schubert, and M. Schubert
AVS 59th Annual International Symposium, Tampa, FL, October 2012


    392. Fano Interference Effects in Hydrogen Intercalated Graphene
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, and M. Schubert
AVS 59th International Symposium, Tampa, FL, October 2012


    391. Smart polymer brushes investigated with combined ellipsometry and quartz crystal microbalance
M. Koenig, K. B. Rodenhausen, D. Schmidt, K.-J. Eichhorn, M. Stamm, M. Schubert, and P. Uhlmann
Makro 2012 - Smart Polymers, Mainz, Germany, October 2012


    390. Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films
K. B. Rodenhausen, D. Schmidt, T. Kasputis, A.K. Pannier, E. Schubert,, and M. Schubert
Physical Chemistry of Biointerfaces II, San Sebastian, Spain, July 9-14, 2012


    389. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August 2012


    388. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
Nanoscience Symposium, Lincoln, NE, October 2012


    387. Invited Institute Seminar
Nebraska Center for Nanohybrid Functional Materials - Progress report 2012

M. Schubert
Leibniz Institute for Polymer Research (IPF), Dresden, September 2012


    386. Invited Industry Seminar
Nebraska Center for Nanohybrid Functional Materials - Progress report 2012

M. Schubert
LiCOR Biosciences, Lincoln, NE, December 2012


    385. Invited Institute Seminar
New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films

M. Schubert
Linkoping University, Linkoping, Sweden, December 2012


    384. Invited
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
NSF-MRSEC QSPIN Industry Workshop, Lincoln, NE, March 2012


    383. Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered 3-D nanohybrid materials thin films

M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, K. Rodenhausen, and J. Gerasimov
Leibniz Institute for Surface Modification - Erfahrungsaustausch: Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Erzgebirge, March 2012


    382. Invited Institute Colloquium
Generalized Ellipsometry: Principles and Applications

M. Schubert
Naval Research Laboratories, Washington DC, May 2012


    381. Invited Tutorial
In-situ Ellipsometry

M. Schubert
Naval Research Laboratories, Washington DC, May 2012


    380. Invited Institute Colloquium
Generalized Ellipsometry: Principles and Applications

M. Schubert
United States Department of Commerce - National Institute of Standards and Technology, Gaithersburg, Maryland, May 2012


    379. Invited
Generalized Ellipsometry: Principles and Applications

M. Schubert
Physics Department, University of Nebraska-Kearney, Kearney, NE, April 2012


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2011:

    378. Talk
THz Optical Hall Effect in Epitaxial Graphene

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
NCMN Grapnene Colloquium, Lincoln, NE, March 2011


    377. Talk
THz dielectric anisotropy of metal slanted columnar thin films

T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
AVS 58th International Symposium, Nashville, TN, October 2011


    376. Optical properties of graphene on SiC polytypes determined by spectroscopic ellipsometry from the terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
Nano-DDS, New York, NY, August 2011


    375. Optical Properties of Graphene on SiC polytypes Determined by Spectroscopic Ellipsometry
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
International conference on SiC and related materials, Cleveland,OH, September 2011


    374. Spectroscopic Ellipsometry and Optical Hall-Effect Studies of Free-Charge Carriers in P-Type InN:Mg.
S. Schöche, T. Hofmann, N.B. Sedrine, V. Darakchieva, B. Monemar, X.~Wang, A. Yoshikawa, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November 2011


    373. Optical Properties of Graphene on Multiple Substrates Determined by Spectroscopic Ellipsometry from the Terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, R. Yakimova, V. Darakchieva, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, D. K. Gaskill, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November 2011


    372. THz Dielectric Anisotropy of Metal Slanted Columnar Thin Films
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
2011 MRS Fall Meeting, Boston, MA, November 2011


    371. Invited
Epitaxial graphene grown by high temperature sublimation

R. Yakimova, V. Darakchieva, R. Yazdi, J. Jenssen, A. Boosalis, T. Hofmann, and M. Schubert
3rd International Symposium on the Science and Technology of Epitaxial Graphene, St. Augustine, FL, October 2011


    370. Talk
Application of spectroscopic ellipsometry techniques to the studies of epitaxial graphene grown by high-temperature sublimation

V. Darakchieva, A. Boosalis, T. Hofmann, M. Schubert, T. Iakimov, and R. Yakimova
Workshop for Graphene Synthesis and Characterisation for Applications, Lake Windermere, UK, November 2011


    369. Paul Drude Medal Winner
Generalized Ellipsometry on Sculptured Thin Films made by Glancing Angle Deposition

D. Schmidt, E. Schubert, and M. Schubert
Workshop Ellipsometry, Berlin, Germany, February 2011


    368. Talk
Hole-channel conductivity in epitaxial graphene determined by terahertz optical Hall-effect and midinfrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
APS, Dallas, March 2011


    367. Talk
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
APS, Dallas, March 2011


    366. Talk
Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films

D. Schmidt, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert
APS, Dallas, March 2011


    365. THz optical Hall effect in multi valley band materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger, and M. Schubert
6th Workshop Ellipsometry, Berlin, Feb 2011


    364. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
6th Workshop Ellipsometry, Berlin Germany, February 2011


    363. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
6th Workshop Ellipsometry, Berlin Germany, February 2011


    362. Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution
K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert
6th Workshop Ellipsometry, Berlin Germany, February 2011


    361. Poster Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
UNL Graduate Research Symposium, Lincoln, NE, April 2011


    360. Outstanding Presentation Award
Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic, ultra-thin films

K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, T. Hofmann, A. K. Pannier, R. Y. Lai, T. E. Tiwald, and M. Schubert
UNL E-Week Graduate Student Research Symposium, Lincoln, NE, April 2011


    359. Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution
K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2011


    358. 2nd Prize Topical Focus Ellipsometry Session
Vector-Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films

D. Schmidt, C. Briley, E. Schubert, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October 2011


    357. Talk
Manipulating the Optical Properties of Metals: Sculptured Thin Films coated by Atomic Layer Deposition

D. Schmidt, N. Ianno, E. Schubert, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October 2011


    356. Talk
Optical Properties of Graphene on MgO and SiC Polytypes Determined by Spectroscopic Ellipsometry

A. Boosalis, T. Hofmann, S. Schöche, P.A. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, D.K. Gaskill, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October 2011


    355. Applied Surface Science Division Student Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
AVS 58th International Symposium, Nashville, TN, October 2011


    354. Functionalization of Sculptured Thin Films with Atomic Layer Deposition
D. Schmidt, N. Ianno, E. Schubert, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November 2011


    353. Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films
D. Schmidt, C. Briley, E. Schubert, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November 2011


    352. 1st Prize Topical Focus Ellipsometry Session
Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films

T. Kasputis, D. Schmidt, K.B. Rodenhausen, H. Wang, A.K. Pannier, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October 2011


    351. Talk
Real-time SE/QCM-D Characterization of Biomolecule Adsorption within Sculptured Thin Films

T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert
AIChE Annual Meeting, Minneapolis, MN, October 2011


    350. Real-time SE/QCM-D characterization of protein adsorption within sculptured thin films
T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2011


    349. Invited Institute Colloquium
Sensing and separation principles using 3D nanostructures

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, October 2011


    348. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in a HfO2 passivated AlGaN/GaN HEMT structure
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
9th International Conference on Nitride Semiconductors (ICNS-IV), Glasgow, Scotland, July 2011


    347. Invited Department Seminar
The Optical Hall-effect in semiconductor heterostructures

M. Schubert
Physics Department, University of Nebraska-Kearney, Kearney, NE, April 2011


    346. Invited Department Seminar
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, December 2011


    345. Invited Institute Colloquium
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
Linkoping University, Linkoping, Sweden, December 2011


    344. Invited Tutorial
Generalized Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, December 2011


    343. Invited Institute Seminar
The Optical Hall-effect in semiconductor heterostructures

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, C.M. Herzinger, J.A. Woollam, V. Darakchieva, and B. Monemar
United States Department of Engery - Sandia National Laboratories, Albuquerque, New Mexico, March 2011


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2010:

    342. Talk
The influence of the SiC substrate on the free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry and optical Hall-effect

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ISSSR, Springfield, MO, June 2010


    341. Invited
Terahertz Ellipsoometry and the Optical Hall effect in Materials Science, M. Schubert

M. Schubert
European Winterschool on Ellipsometry NanoCharm3, Bad Hofgastein, Austria, February 2010


    340. Invited
Generalized THz to Ultraviolet ellipsometry in contemporary Semiconductor and Nanostructure research: Sculptured hybrid nanostructure thin films and sheet carrier characterization in InN and graphene

M. Schubert
Mini-workshop on Advanced Characterization technqiues in Materials Science, Instituto Technologico e Nuclear, Lisbon, Portugal, March 2010


    339. Talk
Free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October 2010


    338. Invited
Optical Coatings from Sculptured Thin Films: Art and Promise

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, and M. Schubert
SVC 2010, Orlando, FL, April 2010


    337. Spectroscopic Ellipsometry for Metamaterials by Glancing Angle Deposition
D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May 2010


    336. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May 2010


    335. Research Presentation Winner "Best of Show"
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, M. Schubert, and E. Schubert
E-Week, Lincoln, NE, April 2010


    334. Optical Properties of Hybridized Nanostructures
D. Schmidt, C. Müller, K. B. Rodenhausen, T. Hofmann, O. Inganäs, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May 2010


    333. Free-Charge Carrier Profiles of Iso- and Aniso-type Si Homojunctions
A. Boosalis, T. Hofmann, J. Sik, and M. Schubert
ICSE-V, Albany, NY, May 2010


    332. Free-charge carrier properties of graphene layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May 2010


    331. THz optical Hall effect in multivalley band materials
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, and M. Schubert
ICSE-V, Albany, NY, May 2010


    330. Temperature dependent dielectric function of Al0.52In0.48P and Ga0.52In0.48P
E. Montgomery, M. Schubert, T. Hofmann, C. Krahmer, and K. Streubel
ICSE-V, Albany, NY, May 2010


    329. Monitoring Protein Deposition on Self-Assembled Monolayers of Alkanethiols on Gold in-situ With Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May 2010


    328. Micelle-Assisted Bilayer Formation of CTAB Thin Films Studied with Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Techniques
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May 2010


    327. Spectroscopic Ellipsometry Analysis of Silicon Nitride Thin Films on Textured Silicon for Solar Cells
M. F. Saenger, C. M. Herzinger, M. Schädel, J. Hilfiker, J. Sun, T. Hofmann, M. Schubert, and J. A. Woollam
ICSE-V, Albany, NY, May 2010


    326. Spectroscopic Ellipsometry Analysis of GaAs0.9-xNxSb0.1 Alloy Films Grown on GaAs
N. B. Sedrine, C. Bouhafs, V. Darakchieva, J. C. Harmand, R. Chtourou, and M. Schubert
ICSE-V, Albany, NY, May 2010


    325. Invited
Terahertz Ellipsometry

T. Hofmann, C.M. Herzinger, and M.Schubert
ICSE-V, Albany, NY, May 2010


    324. Talk
Three Dimensional Aberration Corrected Lorentz Microscopy of Magnetic Structures

C. Phatak, A. Petford-Long, E. Schubert, M. Schubert, D. Schmidt, and M. de Graef
IMC17, Rio de Janeiro, BR, September 2010


    323. Talk
Agent-free bio-chemical sensing with sculptured thin films

D. Schmidt, K. B. Rodenhausen, S. Schöche, E. Schubert, and M. Schubert
ISSSR, Springfield, MO, June 2010


    322. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May 2010


    321. Free-Charge Carrier Profiles of Iso- and Anisotype Si Homojunctions
A. Boosalis, T. Hofmann, J. Šik, and M. Schubert
ICSE-V, Albany, NY, May 2010


    320. Applied Surface Science Division Student Award Winner
Agent-Free Bio-Chemical Sensing With Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, E. Schubert, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October 2010


    319. Talk
Optical, Magnetic, Magneto-Optical and Electrochemical Properties of Sculptured Thin Films

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, E. Montgomery, S. Schöche, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October 2010


    318. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
ICSE-V, Albany, NY, May 2010


    317. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
AVS 57th International Symposium, Albuquerque, NM, October 2010


    316. Talk
Monitoring protein deposition on self-assembled monolayers of alkanethiols on gold in-situ with combined quartz crystal microbalance and spectroscopic ellipsometry

K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, and M. Schubert
ICMCTF, San Diego, CA, April 2010


    315. Talk
Monitoring Ultra-Thin Organic Film Growth, in-situ, with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry

K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, M. Schubert, M. Solinsky, and T. E. Tiwald
AVS Fall Meeting, Albuquerque, NM, October 2010


    314. Free-charge Carrier Properties of Epitaxial Graphene Grown on SiC Investigated by THz and Infrared Ellipsometry and THz Optical-hall Effect.
T. Hofmann, A. Boosalis, J. T. Tedesco, R. L. Myers-Ward, P. M. Campbell, C. R. Eddy, D. K. Gaskill, V. Shields, S. Shivaraman, M. G. Spencer, W. J. Schaff, and M. Schubert
MRS Fall Meeting, Boston, December 2010


    313. Talk
Combinatorial SE/QCM-D Approach for Studying Porous Organic Ultra-thin Film Evolution

K. B. Rodenhausen, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, M. Solinsky, and M. Wagner
MRS Fall Meeting, Boston, MA, December 2010


    312. THz Optical Hall-Effect in Multi-Valley Band Materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-Week, Lincoln, April 2010


    311. Invited
Generalized THz Ellipsometry characterization of novel materials towards THz electronics

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, and W.J. Schaff
THz Workshop and User Meeting, BESSY-II, Berlin, GE, December 2010


    310. Talk
Development of Combinatorial, in-situ Spectroscopic Ellipsometry and Quartz Crystal Microbalance

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May 2010


    309. Talk
THz Optical Hall-Effect in Multi-Valley Band Materials

P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-week, Lincoln, April 2010


    308. The corrugated interface strain coupled magnetostrictive-ferroelectric piezoelectric semiconductor device
V. M. Voora, T. Hofmann, and M. Schubert
Nebraska MRSEC Symposium, Lincoln, NE, October 2010


    307. Invited
Developments in Spectroscopic Ellipsometry for Characterization of Organic and Inorganic Surfaces, Interfaces and Complex Layered Materials

M. Schubert
AVS 57th International Symposium, Albuquerque, New Mexico, October 2010


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2009:

    306. Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
F. Saenger, C. M. Herzinger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, USA, December 2009


    305. ZnO-BaTiO3-ZnO: Unipolar ferroelectric transistor structures with spontaneous interface charge coupling for non-volatile switching applications
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
MRS Fall Meeting, Boston, USA, December 2009


    304. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E.Tiwald, M. Solinsky, and M. Wagner
AVS 56th International Symposium, San Jose, CA, November 2009


    303. Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry
T. Hofmann, C. M. Herzinger, J. A. Woollam, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November 2009


    302. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
NSF-MRSEC QSPIN Symposium, Lincoln, NE, October 2009


    301. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
Nano-DDS Army Research Office conference, Fort Lauderdale, FL, October 2009


    300. Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
5th Workshop Ellipsometry, Zweibrucken, March 2009


    299. Monoclinic Optical Properties of Slanted Columnar Thin Films
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009


    298. Talk
Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
ICMCTF 2009, San Diego, CA, April 2009


    297. THz Ellipsometry Materials Characterization
T. Hofmann, C.M. Herzinger, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009


    296. IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009


    295. Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009


    294. Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Graduate Student Poster Session, UNL, NE, April 2009


    293. Materials Characterization using THz Ellipsometry.
T. Hofmann, M. Schubert, and C. M. Herzinger
MRS Spring Meeting, San Francisco, April 2009


    292. Hybridized Nanostructures
E. Montgomery, D. Schmidt, E. Schubert, and M. Schubert
E-Week, UNL, NE, April 2009


    291. Characterizing AntiReflection Coatings on Textured Mono-Crystalline Silicon with Spectroscopic Ellipsometry
J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam
34th IEEE Photovoltaic Specialists Conference, Philadelphia, PA, June 2009


    290. Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
51st Electronic Materials Conference, University Park, Pennsylvania, June 2009


    289. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November 2009


    288. Research Presentation Winner
Optical and Structural Properties of Sculptured Thin Films

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
E-Week, UNL, NE, April 2009


    287. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
MRS Fall Meeting, Boston, MA, November 2009


    286. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
AVS 56th International Symposium, San Jose, CA, November 2009


    285. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M. Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
3rd South African Conference on Photonic Materials, Mabula, South Africa, March 2009


    284. Structural anisotropy and free electron properties of a-plane InN
V. Darakchieva, N. Franco, M. Schubert, C.L. Hsiao, L. C. Chen, Y. Takagi, and Y. Nanishi
E-MRS Spring Meeting, Strasbourg, France, June 2009


    283. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M.-Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
E-MRS Spring Meeting, Strasbourg, France, June 2009


    282. Structural and free-electron properties of zinc-blende InN
M.-Y. Xie, V. Darakchieva, F. Giuliani, B. Monemar, C.L. Hsiao, L.C. Chen, and M. Schubert
E-MRS Spring Meeting, Strasbourg, France, June 2009


    281. Hydrogen in InN
V. Darakchieva, K. Lorenz, N. Barradas, E. Alves, M. Schubert, M.-Y. Xie, B. Monemar, W.J. Schaff, C.L. Hsiao, L.C. Chen, L.W. Tu, and Y. Nanishi
8th International Conference on Nitride Semiconductors, Jeju, Korea, October 2009


    280. Influence of defects, dopants and surface orientation on free carrier properties of InN
V. Darakchieva, M. Schubert, K. Lorenz, E. Alves, M.-Y. Xie, T. Hofmann, W. J. Schaff, L. C. Chen, L. W. Tu, and Y. Nanishi
MRS Fall Meeting, Boston, USA, December 2009


    279. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
QCM-D Scientific Conference, USA, New York City Metro Area, NJ, November 2009


    278. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
UNL SE/QCM-D Mini-Symposium, Lincoln, NE, November 2009


    277. Invited Institute Seminar
Exploring the science of hybrid nanostructure materials by terahertz to ultraviolet genberalized ellipsometry

M. Schubert
Forschungszentrum Rossendorf, Dresden, August 2009


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2008:

    276. Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann
2008 MRS Spring Meeting, San Francisco, March 25 2008


    275. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
M. Schubert, and T. Hofmann
American Physical Society Meeting, New Orleans, Lousiana, March 2008


    274. Magnetism of Undoped and Co-Doped TiO2 Clusters
X. Wei, R. Skomski, M. Schubert, and D. Sellmyer
American Physical Society Meeting, New Orleans, Lousiana, March 2008


    273. THz resonances in chiral aluminum nanowires
T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
2008 MRS Spring Meeting, San Francisco, March 2008


    272. Ferroelectric thin film field-effect transistors based on ZnO/BaTiO3 heterostructures
M. Brandt, H. Frenzel, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann
5th International Workshop on ZnO and related materials, Michigan, September 2008


    271. Poster Award Winner
THz Resonances in Chiral Aluminum Nanowires

D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 2008


    270. Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT
M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 2008


    269. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
E-Week Graduate Poster Session, Lincoln, NE, April 25 2008


    268. Epitaxial ferroelectric BTO/ZnO heterostructures
M. Brandt, H. Hochmuth, M. Lorenz, M. Schubert, V. Voora, and M. Grundmann
2nd International Symposium On Transparent Conductive Oxides, Hersonissos, Greece, October 2008


    267. In-situ monitoring of p- and n-type doping in AlGaInP
C. Krahmer, A. Behres, K. Streubel, and M. Schubert
14th International Conference of Metalorganic Vapor Phase Epitaxy, Metz, France, June 2008


    266. Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
Brookhaven National Laboratory NSLS-CFN User Meeting, Brookhaven, May 2008


    265. Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells
M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam
17th International Materials Research Conference, Cancún, Mexico, August 2008


    264. Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
The 5th International Workshop on ZnO and Related Materials, Michigan, USA, September 2008


    263. Talk
Hybrid Nanocoil Sculptured Thin Films

D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert
2008 MRS Fall Meeting, Boston, MA, December 2008


    262. Talk
Sculptured Thin Films from Aluminum

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
AVS 55th International Symposium, Boston, MA, October 2008


    261. Talk
Magnetically Active Nanospirals

E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November 2008


    260. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, MA, December 2008


    259. Magnetically induced optical chirality in ZnMnSe
M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert
53rd Magnetism and Magnetic Materials Conference, Austin, TX, November 2008


    258. Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
MRS Fall Meeting, Boston, MA, December 2008


    257. Assessment of the Surface Electron Accumulation Properties of Polar and Non-Polar InN Surfaces
W. J. Schaff, L. C. Chen, Y. Nanishi, and M. Schubert
MRS Fall Meeting, Boston, 2008


    256. Terahertz Ellipsometry Using Electron-Beam Based Sources
T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, 2008


    255. Terahertz Ellipsometry Materials Characterization
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
ISSSR, Hoboken, NJ, June 2008


    254. International Conference on Electronic Materials
V. Darakchieva, T. Hofmann, and M. SChubert
IUMRS-ICEM08, Sydney, Australia, 2008


    253. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
T. Hofmann, and M. Schubert
APS Spring Meeting, Denver, 2008


    252. Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November 2008


    251. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, MA, December 2008


    250. THz Resonances in Chiral Al Nanowires
E. Schubert, T. Hofmann, and M. Schubert
ISSSR, Hoboken, NJ, June 2008


    249. Invited Industry Seminar
Terahertz Ellipsometry Materials Characterization

M. Schubert, T. Hofmann, and C. M. Herzinger
Bruker GmbH, Leipzig, August 2008


    248. Invited Industry Seminar
The UNL Ellipsometry group

M. Schubert
Proctor and Gamble, Dayton, OH, October 2008


    247. Invited Department Seminar
Optical Hall effect in semiconductor heterostructures

T. Hofmann, and M. Schubert
Department of Physics, ETH Zurich, Zurich, Switzerland, September 2008


    246. Invited Industry Seminar
Optical Hall effect in semiconductor heterostructures

M. Schubert, T. Hofmann, and C. M. Herzinger
Freiberger Compound Materials GmbH, Freiberg, Sachsen, August 2008


    245. Invited Department Seminar
Funktionale GLAD-Nanoarchitekturen und multiferroische Metalloxid-Heterostrukturen

M. Schubert
Halbleiterphysik, Universitat Leipzig, Leipzig, August 2008


    244. Invited Institute Colloquium
Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency

M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger
National Renewable Energy Laboratory (NREL), Golden, Colorado, June 2008


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2007:

    243. Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Notre Dame, June 2007


    242. Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and achiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
54th Midwest Solid State Conference, Lincoln, October 2007


    241. Dielectric and magnetic birefringence in Zn1-xMnxSe
M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, NE, October 2007


    240. Poster Award Winner
Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P

E. Montgomery, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, October 2007


    239. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, August 2007


    238. Phonon and polaron properties of charge intercalated WO3
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, CA, August 2007


    237. The optical-Hall effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert
Electronic Materials Conference, Notre Dame, June 2007


    236. Generalized Mueller matrix Ellipsometry of 3-D spherical photonic bandgap structures
H. Wang, D. Schmidt, M. Saenger, M. Schubert, and Y.F. Lu
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007


    235. Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and non-chiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007


    234. Polaron-phonon interaction in charge intercalated tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007


    233. THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters
M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
TMS 2007 Electronic Materials Conference, Notre Dame, IN, June 2007


    232. Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
T. Hofmann, C. von Middendorff, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007


    231. Terahertz ellipsometry using electron-beam based sources
T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007


    230. Surface electron accumulation and effective mass anisotropy in wurtzite structure InN
T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007


    229. Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters
M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007


    228. ICSE4 Poster Award Winner
The optical-Hall effect

T. Hofmann, and M.Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007


    227. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007


    226. Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates
L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou
71. German Physical Society Spring Meeting, Regensburg, March 2007


    225. Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry
M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth, M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March 2007


    224. Polaron and phonon properties in WO3 thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March 2007


    223. Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach
V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann
71. German Physical Society Spring Meeting, Regensburg, March 2007


    222. Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy
V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert
2007 E-MRS Spring Meeting, Strasbourg, France, May 2007


    221. Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN: Evidence for a New Defect-Related Doping Mechanism
T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert
7th Int'l Conference of Nitride Semiconductors, Las Vegas, September 2007


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2006:

    220. Conduction band effective mass anisotropy and nonparabolicity of InN
V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar
3. Workshop on Indium Nitride, Brazil, November 2006


    219. Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry
T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June 2006


    218. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June 2006


    217. Anisotropy of the &Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
70. German Physical Society Spring Meeting, Dresden, March 2006


    216. Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert
70. German Physical Society Spring Meeting, Dresden, March 2006


    215. Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
German Physical Society Spring Meeting, Dresden, March 2006


    214. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
German Physical Society Spring Meeting, Dresden, March 2006


    213. Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June 2006


    212. Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Spring MRS Meeting Symposium K: Materials Research for THz Applications, San Francisco, April 2006


    211. Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
Spring MRS Meeting Symposium GG: Current and Future Trends of Functional Oxide Films, San Fracisco, April 2006


    210. Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006


    209. Temperature-dependent band-gap and excitonic properties of ZnO
R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and and M. Grundmann
4. Workshop "Ellipsometrie", Berlin, February 2006


    208. Optical properties of colored tungsten oxide sputtered thin films
M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert
4th Ellipsometry Workshop, Berlin, February 2006


    207. Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006


    206. Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006


    205. Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Photonics West 2006, San Jose, January 2006


    204. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Photonics West 2006, San Jose, January 2006


    203. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert
28th International Conference on the Physics of Semiconductors, Vienna, Austria, July 24-28 2006


    202. Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert
ICPS, , July 2006


    201. Invited Institute Colloquium
Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes

M. Schubert
IBM Research Laboratory, Rüschlikon, Switzerland, September 2006


    200. Invited
Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes

M. Schubert
International Conference on Low Energy Electrodynamics of Solids LEES 06, Tallinn, Estonia, July 2006


    199. Invited
Generalized Ellipsometry on sculptured thin films: Birefringence and chirality

M. Schubert, E. Schubert, H. Wang, Y. Lu, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, J. Rivory, and B. Gallas
Photon06, Manchester, United Kingdom, September 2006


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2005:

    198. Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen
C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert
TCOs für Dünnschichtsolarzellen und andere Anwendungen, Freyburg, April 2005


    197. Phonons in doped ZnO and ZnO based thin films grown by PLD on sapphire
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, M. Lorenz, and M. Grundmann
G/PII.25 E-MRS 2005 Spring Meeting, Strasbourg, May/June 2005


    196. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
A. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Berlin, March 2005


    195. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Workshop on Oxides at the nanoscale, Zaragoza Spain, November 2005


    194. In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy
C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, and K. Streubel
32nd International Symposium of Compound Semiconductors, Rust, Germany, September 2005


    193. Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing
T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005


    192. Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, and S. Nakamura
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005


    191. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005


    190. Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, and U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005


    189. The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005


    188. Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, and et al.
Advanced Process Control for future oriented manufacturing Workshop, FEP Dresden, September 2005


    187. Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May/June 2005


    186. Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie
M. Schubert
XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2005


    185. Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films
N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005


    184. Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005


    183. Brechungsindex von kubischem MgxZn1-xO
Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005


    182. Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005


    181. Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005


    180. Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005


    179. Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005


    178. Nickelsegregation nach Sauerstoff-Ionenimplantation in NiTi
M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, and B. Rauschenbach
69. German Physical Society Spring Meeting, Berlin, March 2005


    177. Invited Institute Seminar
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures

M. Schubert
BESSY Berlin, (Prof. Dr. W. Eberhardt, Dr. U. Schade), April 21 2005


    176. Invited Department Seminar
Advanced polarization spectroscopy in functional materials physics

M. Schubert
University Hamburg, (Prof. Dr. M. Rübhausen), April 18 2005


    175. Invited Industry Seminar
Optical Spectroscopy: old spectacles for new materials and physics

M. Schubert
Laytec GmbH, (Dr. Th. Zettler), February 11 2005


    174. Invited Institute Colloquium
Light and Matter: Advanced polarization spectroscopy in functional materials physics

M. Schubert
Universite Pierre et Marie Curie (Prof. Y. Rivory, Prof. J. Lafait), Paris, February 03 2005


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2004:

    173. Invited
Spectroscopic ellipsometry: From basic materials research to industrial applications

M. Schubert
Swedish Optical Society Meeting, Linkoping, Sweden, November 2004


    172. Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, and M. Grundmann
Int. Workshop on Oxide Electronics WOE-11, Kanagawa, Japan, October 2004


    171. Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano, and I. Akasaki
Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July 2004


    170. Phonon deformation potentials in hexagonal InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and and B. Monemar
Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July 2004


    169. The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, and C. v. Middendorf
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004


    168. Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures
M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, and M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004


    167. Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, and M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004


    166. Invited
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures

M. Schubert, and T. Hofmann
International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July 2004


    165. Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, and W.J. Shaff
E-MRS 2004, Strasbourg, May 2004


    164. Invited
In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung

M. Schubert
Transparent Conducting Oxide (TCO) Workshop, Leipzig, March 2004


    163. HVPE-grown free-standing GaN of high structural and optical quality
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, and M. Heuken
ISBLLED-2004 Gyeongju, Korea, March 2004


    162. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
M. Schubert, N. Ashkenov, C. Bundesmann, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold, and
German Physical Society Spring Meeting, Regensburg, March 2004


    161. Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, and M. Heuken
German Physical Society Spring Meeting, Regensburg, March 2004


    160. Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates
A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, and A. Krost
German Physical Society Spring Meeting, Regensburg, March 2004


    159. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
German Physical Society Spring Meeting, Regensburg, March 2004


    158. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
German Physical Society Spring Meeting, Regensburg, March 2004


    157. Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen
H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004


    156. Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen
S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004


    155. Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth
N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, and B. Johs
German Physical Society Spring Meeting, Regensburg, March 2004


    154. Temperature-dependent band-gap energies and optical constants of ZnO
N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004


    153. Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004


    152. Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004


    151. CuInSe2 flexible solar cell surface-heat-emittance optimization for infrared radiation
C. Bundesmann, F. Dürr, M. Schubert, and K. Otte
German Physical Society Spring Meeting, Regensburg, March 2004


    150. Invited
Optische Analytikverfahren für die Dünnschichtcharakterisierung

M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2004


    149. Optische dielektrische Funktionen im Photonenenergiebereich (0.4 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004


    148. Invited
Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen

M. Schubert, and T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004


    147. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
C. Bundesmann, M. Schubert, N. Ashkenov, G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, and H. Neumann
3. Workshop "Ellipsometrie", Stuttgart, February 2004


    146. Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004


    145. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
3. Workshop "Ellipsometrie", Stuttgart, February 2004


    144. Invited Institute Seminar
Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control

M. Schubert
Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, (Dr. Springer), December 2 2004


    143. Invited Department Seminar
Spectroscopic ellipsometry: From basic materials research to industrial applications

M. Schubert
University Stuttgart, (Prof. Dr. M. Dressel, Dr. B. Gompf), November 30 2004


    142. Invited Department Seminar
Spectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications

M. Schubert
University Tübingen, (Prof. Dr. Th. Chassé), November 17 2004


    141. Invited Department Seminar
Advanced polarization spectroscopy in functional materials physics

M. Schubert
Colorado State University, Fort Collins, (Prof. Hochheimer), May 2004


    140. Invited Institute Seminar
In-situ process monitoring with spectroscopic ellipsometry and Raman scattering

M. Schubert
Technical University Magdeburg, (Prof. Krost, Prof. Christen), May 2004


    139. Invited Industry Seminar
Optische Analytikverfahren für die Dünnschichtcharakterisierung

M. Schubert
OSRAM-OPTO Semiconductors GmbH, Regensburg (Dr. K. Streubel), March 2004


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2003:

    138. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner
10th International Workshop on Oxide Electronics, Augsburg, Germany, September 11-13 2003


    137. Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and and B. Monemar
ICDS, , 2003


    136. Invited
Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films

M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann
Optical System Design 2003, St. Etienne, France, September 2003


    135. The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN
A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, and B. Monear
5. Int. Conf. on Nitride Semiconductor Research, Nara, July 2003


    134. Invited
Generalized magneto-optic ellipsometry

M. Schubert, T. Hofmann, and C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    133. High temperature optical constants and band gap energies of ZnO
N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    132. Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures
A. Kasic, M. Schubert, and B. Monemar
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    131. Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    130. Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and and D. Gerthsen
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    129. UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    128. Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, and K. Järrendahl
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    127. Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    126. Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, and V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    125. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    124. Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, and M. Schubert
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    123. Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase
3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003


    122. Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka
German Physical Society Spring Meeting, Dresden, March 2003


    121. Phonons, band gap and higher interband transitions of hexagonal InGaN
A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, and Y. Nanishi
German Physical Society Spring Meeting, Dresden, March 2003


    120. Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten
B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert, N. Ashkenov, P. Pfundstein, D. Gerthsen, and K. Eichhorn
German Physical Society Spring Meeting, Dresden, March 2003


    119. Optische Übergänge und Brechungsindices von MgZnO
R. Schmidt, B. Rheinländer, M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, Dresden, March 2003


    118. Invited Industry Seminar
Ellipsometry in functional materials physics

M. Schubert
von Ardenne Anlagenbau GmbH, (Hr. M. Kammer), November 2003


    117. Invited Department Seminar
Ellipsometrie und Raman an ZnO Dünnschichten

C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert
Nukleare Festkörperphysik, University Leipzig, Leipzig, April 2003


    116. Invited Applied Optics Lecture
Principles and Application of Infrared Spectroscopic Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, February 2003


    115. Invited Applied Optics Lecture
Principles and Application of Generalized Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, February 2003


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2002:

    114. Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-GaO-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, E.M. Kaidashev, B.Rheinländer, M.Lorenz, H. v. Wenkstern, A. Kasic, M.Schubert, and M.Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002


    113. Phonons, excitons, band-to-band transitions and optical constants of MgZnO
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, and C. M. Herzinger
Materials Research Society Fall Meeting, Boston, U.S.A, December 2002


    112. Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December 2002


    111. Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December 2002


    110. Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition
M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002


    109. Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals
H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002


    108. Critical points and phonons in (B,Ga)(N,As)
G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, and M. Schubert
Physics and Technology of Dilute Nitrides for Optical Communications, Istanbul, September 2002


    107. Critical points and phonons in BxGa1-xAs and GaNyAs1-y: a comparison
G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, and M. Schubert
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002


    106. Optical phonons in AlxInyGa1-x-yN films
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, and M. Stutzmann
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002


    105. Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann
26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July 2002


    104. Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle, U.S.A., July 2002


    103. Invited
Generalized ellipsometry of complex mediums in layered systems

M. Schubert
47. Annual SPIE Meeting, Complex Mediums III, Seattle, U.S.A., July 2002


    102. Invited
Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures

M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle U.S.A., July 2002


    101. Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides
T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, and M. Schubert
11th International Conference on Metal-Organic Vapour Phase Epitaxy, Berlin, June 2002


    100. IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002


    99. Invited
Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures

M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002


    98. Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, and C. M. Herzinger
German Physical Society Spring Meeting, Regensburg, March 2002


    97. Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, A. Kasic, E. M. Kaidashev, B. Rheinländer, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002


    96. Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2002


    95. Kritische Punkte und Phononen in BxGa1-xAs und GaNyAs1-y: Ein Vergleich
G. Leibiger, V. Gottschalch, M. Schubert, and V. Riede
German Physical Society Spring Meeting, Regensburg, March 2002


    94. Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films
N. Ashkenov, C. Bundesmann, A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002


    93. Properties of pulsed-laser-deposited Zn1-x(Al Ga and Mg and Cd)xO compound thin films
C. Bundesmann, N. Ashkenov, A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz, R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002


    92. Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger
L.O.T.-Seminar, Darmstadt, October 2002


    91. Invited Department Seminar
Infrared Spectroscopic Ellipsometry

M. Schubert, V. Darakchieva, H. Arwin, N.-C. Persson, O. Inganäs, Y. Fengling, and B. Monemar
Linkoping University, Linkoping, Sweden, September 2002


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2001:

    90. Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Šik, and M. Schubert
2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 7, 2001


    89. Optical properties of AlxIn1-xN thin films determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 513, 2001


    88. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
M. Schubert, and A. Kasic
1. Int.Conference on Advanced Vibrational Spectroscopy, Turku, Finnland, August 2001


    87. Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization of free-carrier and crystal-structure properties of III-V semiconductor device heterostructures
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam, and C. M. Herzinger
46. Annual SPIE Meeting, San Diego U.S.A., August 2001


    86. Composition determination of InGaAsN using x-ray diffraction and far-infrared ellipsometry
G. Leibiger, V. Gottschalch, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001


    85. Optical properties of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001


    84. Generalized Infrared Ellipsometry- A novel tool for characterization of group -III-Nitride Heterostructrues for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, and J. A. Woollam
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001


    83. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
Spring European MRS-Meeting, Strasbourg, France, June 2001


    82. All-solid state electrochromic multiplayer systems for surface heat radiation control
E. Franke, M. Schubert, C. L. Trimble, and J. A. Woollam
Spring European MRS-Meeting, Strasbourg, France, June 2001


    81. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, and F. Scholz
Spring European MRS-Meeting, Strasbourg, France, June 2001


    80. Invited
Ellipsometry on anisotropic materials- treatment of surface and interface layers

M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May 2001


    79. Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen
A. Kasic, and M. Schubert
German Physical Society Spring Meeting, Hamburg, March 2001


    78. Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten
G. Leibiger, M. Schubert, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001


    77. Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie
T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001


    76. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001


    75. Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien kubischer AlxGa1-xN-Filme
A. Kasic, M. Schubert, and D. J. As
German Physical Society Spring Meeting, Hamburg, March 2001


    74. Invited Department Seminar
The light and the lattice

M. Schubert
Technical University Berlin, (Prof. Richter), September 2001


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2000:

    73. MRS Poster Award Winner
IR-VUV dielectric function of Al1-xInxN determined by spectroscopic ellipsometry

A. Kasic, M. Schubert B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
MRS 2000 Fall Meeting, Boston U.S.A., November/December 2000


    72. Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, and M. Schubert
MRS 2000 Fall Meeting, Boston U.S.A., November/December 2000


    71. Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, and J. Sik
Int. Symposium on Compound Semiconductors, Monterey U.S.A., October 2000


    70. Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C.M. Herzinger
Int. Symposium on Compound Semiconductors, Monterey U.S.A., October 2000


    69. Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer using generalized ellipsometry
T.E.Tiwald, and M. Schubert
45. Annual SPIE Meeting, San Diego U.S.A., August 2000


    68. Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000


    67. Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, and F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000


    66. Invited
Generalized Ellipsometry for novel optical materials

M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000


    65. Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, and J.A. Woollam
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000


    64. Invited Hauptvortrag
Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie

M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000


    63. Phononen in GaN/AlxGa1-xN Übergitterstrukturen
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000


    62. Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000


    61. Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000


    60. Optische Eigenschaften von GaAs1-xNx (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen
G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000


    59. Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000


    58. Invited
Ellipsometry of anisotropic materials

M. Schubert
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000


    57. Optische Eigenschaften von GaNyAs1-y (0 ... y ... 0.37) Einzelschichten und Übergitterstrukturen
G. Leibiger, M. Schubert, B. Rheinländer, and V. Gottschalch
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000


    56. IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen
A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000


    55. Invited Department Seminar
The light and the lattice

M. Schubert
Physics colloquium, University of Leipzig, (Prof. Grundmann), September 2000


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1999:

    54. Invited
Spectroscopic ellipsometry

J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, and S. Zollner
Centennial Meeting of the American Physical Society, Atlanta U.S.A, April 1999


    53. In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl
11. Int. Conf. on Thin Films, Cancun, Mexico, August 1999


    52. Maximum direct-gap reduction in CuPt ordered AlxGa1-xInP (0 ... x ... 1) determined by generalized ellipsometry
M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
41. Electronic Materials Conf., Charlottesville U.S.A., June 1999


    51. Lattice modes and free-carrier response of AlxGa1-xN and InxGa1-xN heterostructures measured by infrared ellipsometry
M. Schubert, T. E. Tiwald, J.A. Woollam, A. Kasic, J. Off, B. Kuhn, and F. Scholz
MRS Fall Meeting, Boston U.S.A., December 1999


    50. Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE
M. Schubert, J.A. Woollam, A. Kasic, B. Rheinländer, J. Off, and F. Scholz
3. Int. Conf. on Nitride Semiconductor Research, Montpellier, France, July 1999


    49. In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie
J.-D. Hecht, E. Franke, M. Schubert, and H. Neumann
German Physical Society Spring Meeting, Münster, March 1999


    48. Bestimmung des Tensors der Dielektrischen Funktion von a-Al2O3 für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie
J.-D. Hecht, M. Schubert, C.M. Herzinger, and J.A. Woollam
German Physical Society Spring Meeting, Münster, March 1999


    47. Optical constants of nearly disordered AlxGa1-xInP2
G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999


    46. Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999


    45. Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie
A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Münster, March 1999


    44. Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry
M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, and F. Scholz
German Physical Society Spring Meeting, Münster, March 1999


    43. Near-band-gap CuPt order-birefringence in AlxGa1-xInP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999


    42. Phonon modes and infrared anisotropy of rutile and sapphire
M. Schubert
L.O.T.-Seminar, Darmstadt, October 1999


    41. Invited Department Seminar
Spectroscopic ellipsometry for novel optical materials

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), September 1999


    40. Invited Department Seminar
Infrared dielectric anisotropy and phonon modes of sappphire

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), May 1999


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1998:

    39. Ordering induced optical properties of AlGaInP alloys
M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
40. Electronic Materials Conf., Charlottesville, U.S.A., June 1998


    38. Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 1998


    37. Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, and G. Krauss V. Krämer
German Physical Society Spring Meeting, Regensburg, March 1998


    36. Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and T. Welzel
German Physical Society Spring Meeting, Regensburg, March 1998


    35. Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren
A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1998


    34. Explicit solutions for magneto-optic materials in generalized ellipsometry
M. Schubert, T. E. Tiwald, and J. A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1998


    33. Invited Institute Seminar
Spectroscopic ellipsometry on complex optical systems

M. Schubert
MPI for Microstructure Physics, Halle (Prof. Gösele), February 1998


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1997:

    32. Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert, and H. Schmidt
Heterostructure Epitaxy and Devices, Smolenice Castle, Slovakia, Oktober 1997


    31. Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry
E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, and J. Hahn
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego U.S.A., April 1997


    30. Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, and J. Hahn
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai 1997


    29. Invited Department Seminar
Verallgemeinerte Ellipsometrie an magnetischen Schichten

M. Schubert
University of Leipzig, (Prof. Esquinazi), December 1997


    28. Invited
Generalized ellipsometry and complex optical systems

M. Schubert
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai 1997


    27. Invited Colloquium
Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen

M. Schubert
Graduiertenkolleg, University of Chemnitz, (Prof. Richter, Dr. Welzel), December 1997


    26. Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
4. c-BN Expertentreffen, Konstanz, Juni 1997


    25. Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry
M. Schubert
L.O.T., Darmstadt, October 1997


    24. Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
German Physical Society Spring Meeting, Münster, March 1997


    23. Invited Department Seminar
Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), June 1997


    22. Direct-gap reduction and valence band splitting of CuPtB-type ordered (AlGa)InP2 studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1997


    21. Invited Institute Colloquium
Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry

M. Schubert
Forschungszentrum Rossendorf, (Prof. Moeller), March 1997


    20. Invited Industry Seminar
Generalized Ellipsometry on chiral liquid crystals

M. Schubert
ROLIC AG Basel, (Dr. Schadt, Dr. Bennecke), February 1997


    19. Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert
University of Leipzig, (Prof. Grill), January 1997


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1996:

    18. Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, and F. Richter
43. Symp. of the American Vacuum Society, Philadelphia U.S.A., Oktober 1996


    17. Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
Int. Conf. on Polarimetry and Ellipsometry, SPIE, Warszaw, Poland, Mai 1996


    16. Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, and J.A. Woollam
23. Int. Conf. on the Physics of Semiconductors, Berlin, Juli 1996


    15. Invited Department Seminar
Atomic order in III-V alloys

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), October 1996


    14. Invited Hauptvortrag
Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen

M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1996


    13. Invited Department Seminar
Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid

M. Schubert
University of Chemnitz, (Prof. Richter), June 1996


    12. Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung
H. Schmidt, B. Rheinländer, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996


    11. Invited Department Seminar
Moderne Ellipsometrie an spontan geordnetem AlGaInP

M. Schubert
University of Stuttgart, (Prof. Pilkuhn), June 1996


    10. Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen
B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996


    9. Invited Industry Seminar
Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen

M. Schubert
Sentech GmbH, Berlin, March 1996


    8. Invited Department Seminar
Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid

M. Schubert
University of Kassel, (Prof. Kassing), April 1996


    7. Generalized Ellipsometry and complex optical systems
M. Schubert
L.O.T.-Seminar, Dresden, February 1996


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1995:

    6. Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO2mittels generalisierter Rotating-Analyzer-Ellipsometry
M. Schubert, B. Johs, C. M. Herzinger, and J. A. Woollam
German Physical Society Spring Meeting, Berlin, March 1995


    5. Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie
M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Berlin, March 1995


    4. Invited Department Seminar
Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium

M. Schubert
Department of Electrical Engineering, University of Lincoln-Nebraska, June 1995


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1994:

    3. Dark-field spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, and V. Gottschalch
Int. Workshop on Optical Charact. of Electronic Materials, Halle/Saale, Oktober 1994


    2. Invited Department Seminar
Polarization-dependent parameters of arbitrarily anisotropic epitaxial systems

M. Schubert
Department of Electrical Engineering, University of Nebraska-Lincoln, October 1994


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1993:

    1. Optical constants of highly excited AlGaAs
B. Rheinländer, M. Schubert, K. Unger, and H. Fieseler
German Physical Society Spring Meeting, Regensburg, March 1993


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