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Prof. Dr. Mathias Schubert
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Conferences
2025
2024
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2022
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2020
2019
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2025:> |
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2024:> |
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705. |
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Terahertz Electron Paramagnetic Resonance Ellipsometry: A new tool to characterize defect spins in materials with extreme properties M. Schubert 2024 Materials with Extreme Properties and Condensed Matter Physics Joint Review, Washington D.C., May 2024
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704. |
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Nanocolumnar Heterostructure Metamaterial Platforms for Advanced Magnetic and Optical Applications U. Kilic, C. Briley, R. Feder, D. Sekora, A. Ullah, A. Mock, C. Binek, H. Schmidt, C. Argyropoulos, E. Schubert, and M. Schubert American Physical Society Meeting, Minneapolis, MS, March 2024
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703. |
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Universal structural dependence of optical properties in 3D nanocolumnar metamaterial platforms U. Kilic, Y. Traouli, M. Hilfiker, K. Bryant, S. Schoeche, R. Federand C. Argyropoulos, and E. Schubert American Physical Society Meeting, Minneapolis, MS, March 2024
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702. |
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Frequency and magnetic field scanning THz and high-field electron paramagnetic resonance generalized spectroscopic ellipsometry M. Schubert, V. Rindert, S. Richter, S. Knight, A. Ruder, P. Kuehne, and V. Darakchieva American Physical Society Meeting, Minneapolis, MS, March 2024
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701. |
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Tailoring nonreciprocal topological edge states with all-dielectric nonlinear metasurfaces S. G. Kilic, U. Kilic, M. Schubert, E. Schubert, and C. Argyropoulos American Physical Society Meeting, Minneapolis, MS, March 2024
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700. |
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The Monoclinic Beer-Lambert Law in Beta Gallium Oxide M. M. R. Adnan, C. Sturm, M. Schubert, and R. C. Myers 66th Electronic Materials Conference (EMC 2024), College Park, MD, June 2024
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699. |
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Effective uniaxial dielectric function tensor and optical phonons in (-201)-plane oriented beta-Ga2O3 films with equally-distributed six-fold rotation domains P. Sorensen, A. Mock, S. Richter, A. Papamichail, V. Stanishev, M. Ghezellou, J. Ul-Hassan, A. Popp, S. B. Anooz, D. Gogova, P. Ranga, S. Krishnamoorthy, R. Korlacki, M. Schubert, and V. Darakchieva 7th U.S. Workshop on Gallium Oxide (GOX 2024), Columbus, OH, August 2024
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698. |
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Electric Field and Polarization Sensing with Photocurrents in beta-Ga2O3 Md. Adnan, D. Verma, S. Dhara, C. Sturm, M. Schubert, S. Rajan, and R. C. Myers 7th U.S. Workshop on Gallium Oxide (GOX 2024), Columbus, OH, August 2024
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697. |
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The strain and stress relationships for phonon and electronic properties of the rhombohedral alpha-(Al,Ga)2O3 M. Schubert, R. Korlacki, M. Stokey, A. Mock, and V. Darakchieva 7th U.S. Workshop on Gallium Oxide (GOX 2024), Columbus, OH, August 2024
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696. |
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Frequency-swept high-frequency EPR of Cr-doped Ga2O3 V. Rindert, Z. Galazka, M. Schubert, and V. Darakchieva 7th U.S. Workshop on Gallium Oxide (GOX 2024), Columbus, OH, August 2024
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695. |
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Invited Webinar THz electron paramagnetic resonance generalized spectroscopic ellipsometry: Bloch equations, and LST relations in the frequency-dependent magnetic susceptibility M. Schubert Henri Poincare Webinar Series on Optical Polarization and related Phenomena, SPIE, Online, January 2024
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694. |
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Institute Seminar THz electron paramagnetic resonance generalized spectroscopic ellipsometry, Bloch equations and superconvergence rules in the frequency-dependent magnetic susceptibility M. Schubert Technical University Ilmenau, Institute of Professor Krischok, Ilmenau, Germany, February 2024
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693. |
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The epitaxial strain and stress relationships in the alpha and beta phases of (Al,Ga)2O3 and their effects onto phonon and electronic properties M. Schubert, R. Korlacki, M. Stokey, A. Mock, and V. Darakchieva International Workshop on Gallium Oxide IWGO, Berlin, Germany, May 2024
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692. |
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The epitaxial strain and stress relationships in the alpha and beta phases of (Al,Ga)2O3 and their effects onto phonon and electronic properties M. Schubert, R. Korlacki, and V. Darakchieva Compound Semiconductor Week 2024, Lund, Sweden, June 2024
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691. |
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THz electron paramagnetic resonance ellipsometry for defect characterization in semiconductor materials: Bloch equations and superconvergence rules in the frequency-dependent magnetic susceptibility V. Rindert, V. Darakchieva, and M. Schubert Compound Semiconductor Week 2024, Lund, Sweden, June 2024
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690. |
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Institute Seminar THz electron paramagnetic resonance generalized spectroscopic ellipsometry, Bloch equations and superconvergence rules in the frequency-dependent magnetic susceptibility M. Schubert University Stuttgart, 1. Physikalische Institut Professor Martin Dressel, Stuttgart, Germany, February 2024
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689. |
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Physics Colloquium THz electron paramagnetic resonance generalized spectroscopic ellipsometry: Bloch equations, and LST relations in the frequency-dependent magnetic susceptibility M. Schubert Norwegian University of Science and Technology Trondheim, Professor Morten Kildemo, Trondheim, Norway, February 2024
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688. |
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Terahertz Electron Paramagnetic Resonance Ellipsometry with Field Flattened Split-Coil Magnet I. Green, P. Sorensen, A. Ruder, R. Korlacki, and M. Schubert UNL Student Research Days 2024, Lincoln, NE, March 2024
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687. |
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The Broadband Enhanced Chirality Revealed by Broken L-Shape Metamaterial Platform U. Kilic, M. Hilfiker, S. Wimer, A. Ruder, S. G. Kilic, C. Argyropoulos, E. Schubert, and M. Schubert CLEO 2024, Charlotte, NC, May 2024
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686. |
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Elevated Temperature model dielectric function of InAs determined by Spectroscopic Ellipsometry P. Sorensen, U. Kilic, Y. Traouli, R. Korlacki, E. Schubert, and M. Schubert 2024 Nebraska Research and Innovation Conference: Quantum Sensing Challenges and Opportunities, Lincoln, NE, March 2024
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685. |
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In-situ Spectroscopic Ellipsometry based real time ALD recipe optimization and critical point model dielectric function analysis of atomic layer deposited ZnO ultrathin film Y. Traouli, U. Kilic, S. G. Kilic, M. Hilfiker, A. Mock, D. Sekora, G. Melendez, D. Schmidt, E. Schubert, and M. Schubert 2024 Nebraska Research and Innovation Conference: Quantum Sensing Challenges and Opportunities, Lincoln, NE, March 2024
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684. |
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Ion energy distributions in broad beam Kaufman Ion Sources R. Smith, U. Kilic, D. Kalanov, E. Rohkamm, C. Bundesmamn, F. Frost, M. Schubert, and E. Schubert 2024 Nebraska Research and Innovation Conference: Quantum Sensing Challenges and Opportunities, Lincoln, NE, March 2024
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683. |
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Chirality Enhancement of Helical metamaterials through topologically protected resonance reveled by 1D photonic crystal S. G. Kilic, U. Kilic, E. Schubert, M. Schubert, and C. Argyropoulos 2024 Nebraska Research and Innovation Conference: Quantum Sensing Challenges and Opportunities, Lincoln, NE, March 2024
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682. |
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Engineering the topological chiral edge mode from 2D checkerboard metasurface design S. G. Kilic, U. Kilic, E. Schubert, M. Schubert, and C. Argyropoulos 2024-UNL Research Days, Lincoln, NE, April 2024
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681. |
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Invited Bottom-up Fabricated Tunable Metamaterials Exhibiting Broadband Enhanced Chirality U. Kilic, M. Hilfiker, S. Wimer, A. Ruder, E. Schubert, M. Schubert, and C. Argyropoulos Materials Research Society (MRS) Spring Meeting, San Francisco, CA, April 2024
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680. |
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Enhancing the Chirality via topologically protected resonance mode S. G. Kilic, U. Kilic, E. Schubert, M. Schubert, and C. Argyropoulos 2024-College of Engineering-Graduate Student Symposium, Lincoln, NE, April 2024
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679. |
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Invited Institute Seminar THz electron paramagnetic resonance generalized spectroscopic ellipsometry, Bloch equations and superconvergence rules in the frequency-dependent magnetic susceptibility M. Schubert University of Nebraska-Lincoln Physics Colloquium and EQUATE Seminar series, Lincoln, NE, February 2024
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678. |
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Terahertz EPR ellipsometry V. Rindert, S. Richter, A. Ruder, Philipp Kuhne, Zbigniew Galazka, V. Darakchieva, and M. Schubert 63RD ROCKY MOUNTAIN CONFERENCE ON MAGNETIC RESONANCE, Copper Mountain, Co, August 2024
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677. |
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THz spectroscopic EPR ellipsometry V. Rindert, S. Richter, A. Ruder, Philipp Kuhne, Zbigniew Galazka, V. Darakchieva, and M. Schubert CMD-General Conference of the Condensed Matter Division 31, Braga, Portugal, September 2024
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676. |
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Terahertz Electron Paramagnetic Resonance Ellipsometry with Field Flattened Split-Coil Magnet I. Green, P. Sorensen, A. Ruder, R. Korlacki, and M. Schubert Diamond Quantum Sensing: Challenges and Opportunities, Lincoln, NE, March 2024
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675. |
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THz electron paramagnetic resonance generalized spectroscopic ellipsometry: A new method for optical detection on defects in semiconductor materials and heterostructures M. Schubert, V. Rindert, and V. Darakchieva Opto-X-Nano, Okayama, Japan, November 2024
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674. |
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Institute Seminar THz electron paramagnetic resonance generalized spectroscopic ellipsometry, Bloch equations and superconvergence rules in the frequency-dependent magnetic susceptibility M. Schubert, V. Rindert, and V. Darakchieva Otto-von-Guericke University, Magdeburg, Germany, May 2024
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673. |
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Verification of Time-Domain Frequency-Resolved THz Spectroscopic Ellipsometry I. Green, A. Ruder, P. Sorensen, V. Rindert, V. Darakchieva, and M. Schubert 28th NSF EPSCoR National Conference, Omaha, NE, October 2024
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672. |
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Elevated Temperature Spectroscopic Ellipsometry Analysis of Bulk Single-Crystal In2O3 S. G. Kilic, U. Kilic, M. Hilfiker, Z. Galazka, and M. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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671. |
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Infrared-Active Phonon Modes in Variably Alloyed Bulk Beta(AlXGa1-X)2O3 Determined by Mueller-Matrix Spectroscopic Ellipsometry P. Sorensen, I. Green, M. Stokey, Y. Zhang, J. Speck, V. Stanishev, D. Darakchieva, Z. Galazka, and M. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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670. |
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The Optical Constants of Calcium Fluoride from 0.03 to 9 eV J. R. Love, C. Armenta, M. Stokey, M. Schubert, and S. Zollner AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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669. |
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Spectrally Resolved Absorption Based Kuhn's Dissymmetry Factor from Mueller Matrix Polarimetry U. Kilic, A. Ruder, M. Hilfiker, S. Wimer, E. Schubert, and M. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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668. |
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Unraveling the Dynamics of Platinum Plasma-Enhanced Atomic Layer Deposition: Real-time Monitoring, Nonlinear Growth, and ALD Recipe Optimization using in-Situ Spectroscopic Ellipsometry Y. Traouli, U. Kilic, E. Schubert, and M. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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667. |
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Ion Energy Distributions in a Kaufman-type Ion Beam Source Operated with Ar and O2 R. Smith, E. Rohkamm, P. irtel, D. Kalanov, F. Frost, U. Kilic, and E. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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666. |
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The Incorporation of Nanohelical Metamaterial Into 1D Photonic Topological Insulator System: A Route to the Generation of Strong Chiral Response S. G. Kilic, U. Kilic, M. Schubert, E. Schubert, and C. Argyropolous AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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665. |
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Thz Electron Paramagnetic Resonance Generalized Spectroscopic Ellipsometry, Bloch Equations and Superconvergence Rules in the Frequency Dependent Magnetic Susceptibility M. Schubert, V. Rindert, and V. Darakchieva AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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664. |
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Engineering the Hybrid Nanocolumnar Metamaterial Platforms for Advanced Optical and Magnetic Applications U. Kilic, C. Briley, R. Feder, D. Sekora, A. Ullah, A. Mock, C. Binek, H. Schmidt, C. Argyropolous, E. Schubert, and M. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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663. |
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Temperature-Dependent Dielectric Function of PlasmaEnhanced ZnO Atomic Layer Deposition using in-Situ Spectroscopic Ellipsometry Y. Traouli, U. Kilic, M. Schubert, and E. Schubert AVS 70 International Symposium and Exhibition, Tampa, FL, November 2024
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662. |
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Real-time growth monitoring of oxygen plasma enhanced ZnO atomic layer deposition using in-situ spectroscopic ellipsometry Y. Traouli, U. Kilic, S. G, Kilic, M. Hilfiker, A. Mock, D. Sekora, G. Melendez, D. Schmidt, M. Schubert, and E. Schubert Americam Physical Society March Meeting, Minneapolis, MN, March 2024
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661. |
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Evolution of the near-infrared-to-ultraviolet model dielectric function of InAs from room temperature to 250 C determined by spectroscopic ellipsometry P. Sorensen, U. Kilic, Y. Traouli, R. Korlacki, E. Schubert, and M. Schubert 28th NSF EPSCoR National Conference, Lincoln, NE, October 2024
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2023:> |
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660. |
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Defect and dopant characterization using Terahertz Electron Paramagnetic Resonance Ellipsometry: Fe in Ga2O3 M. Schubert, S. Richter, S. Knight, P. Kuehne, V. Stanishev, M. Stokey, R. Korlacki, Z. Galazka, K. Irmscher, and V. Darakchieva American Physical Society Meeting, Las Vegas, NV, March 2023
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659. |
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THz-VUV Ellipsometry and THz Electron Paramagnetic Resonance Ellipsometry Characterization of defects and electronic properties in semiconductor materials M. Schubert Tri-Service Workshop on GeSn and GeSiSn, Dayton, OH, January 2023
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658. |
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Invited Bottom-up Fabricated Tunable Metamaterials Exhibiting Broadband Enhanced Chirality U. Kilic, M. Hilfiker, S. Wimer, A. Ruder, E. Schubert, M. Schubert, and C. Argyropoulos MRS Spring Meeting, San Francisco, CA, March 2023
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657. |
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Plenary Talk Spectroscopic ellipsometry based optical analysis of hybrid metamaterial platforms U. Kilic, M. Hilfiker, R. Feder, S. Wimer, A. Ruder, E. Schubert, M. Schubert, and C. Argyropoulos 12th Workshop on Spectroscopic Ellipsometry (WSE-12), Prague, Czech Republic, September 2023
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656. |
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The Effect of Strain on the Band Offsets in Monoclinic ?-(AlxGa1-x)2O3 Alloys R. Korlacki, T. Gramer, M. Stokey, V. Darakchieva, and M. Schubert American Physical Society Meeting, Las Vegas, NV, March 2023
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655. |
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Hauptvortrag (Invited) The physics of low symmetry semiconductors: Gallium oxide for the future of green energy as example M. Schubert, R. Korlacki, and V. Darakchieva German Physical Society Spring Meeting, Dresden, Germany, March 2023
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654. |
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Invited Strain and defects in Gallium Oxide and related compounds M. Schubert, R. Korlacki, and V. Darakchieva 6th U.S. Workshop on Gallium Oxide (GOX 2023), Buffalo, NY, August 2023
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653. |
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Electronic and optical properties of monoclinic gallium oxide under strain: the full picture M. Stokey, R. Korlacki, M. Hilfiker, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Papamichail, A. Mock, A. Mauze, Y. Zhang, J. Speck, K. Irmscher, Z. Galazka, J. Jesenovec, J. McCloy, V. Darakchieva, and M. Schubert Nebraska Research and Innovation Conference 2023, Lincoln, NE, March 2023
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652. |
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Strain and Composition Dependencies in (AlxGa1-x)2O3 Alloys R. Korlacki, J. Knudtson, M. Stokey, M. Hilfiker, V. Darakchieva, and M. Schubert 6th U.S. Workshop on Gallium Oxide (GOX 2023), Buffalo, NY, August 2023
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651. |
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THz Spectroscopic Electron Paramagnetic Resonance Of The Fe3+ Defect In GaN V. Rindert, S. Richter, S. Knight, V. Darakchieva, and M. Schubert 48th International Conference on Infrared, Millimeter and Terahertz Waves, Montreal, Quebec, Canada, September 2023
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650. |
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Terahertz Electron Paramagnetic Resonance Ellipsometry: A new tool to characterize defect spins in materials with extreme properties M. Schubert 2023 Materials with Extreme Properties and Condensed Matter Physics Joint Review, Washington D.C., May 2023
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649. |
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Frequency Domain THz-EPR of the Fe3+Defect in GaN V. Rindert, S. Richter, S. Knight , P. Kuehne, A. Ruder , M. Sedrpooshan amd M. Schubert , and V. Darakchieva 14th International Conference on Nitridie Semiconductors (ICNS-14), Fukuoka, Japan, November 2023
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648. |
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Frequency Domain THz-EPR of the Fe3+Defect in GaN V. Rindert, S. Richter, S. Knight , P. Kuehne, A. Ruder , M. Sedrpooshan amd M. Schubert , and V. Darakchieva 6th Tri-Service Workshop on GeSn and GeSiSn, Colorado Springs, CO, October 2023
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647. |
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Strain Calculations for Semiconductors Including Narrow Gap group IV Materials as Demonstrated for Ultrawide Bandgap Metal Oxides R. Korlacki, A. Mock, M. Stokey, and M. Schubert 6th Tri-Service Workshop on GeSn and GeSiSn, Colorado Springs, CO, October 2023
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646. |
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Institute Seminar Heterostructure nanowires for nanoscale chemical and biological sensing and topological quantum optical applications M. Schubert, U. Lilic, and E. Schubert NanoLund Seminar Series, Lund University, Sweden, December 2023
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645. |
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Best Poster Presentation, 1st Place Engineering the broadband enhanced chiral response of L-shaped metamaterials U. Kilic, S. Wimer, A. Ruder, E. Schubert, M. Schubert, and C. Argyropoulos 2023 NRIC Conference on Topology and Valley Driven Quantum Phenomena,, Lincoln, NE, March 2023
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644. |
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Unraveling the aspect-ratio driven evolution of anisotropic homogenization parameters of slanted columnar nanostructures from a wide variety of materials U. Kilic, Y. Traouli, M. Hilfiker, K. Bryant, S. Schoeche, R. Feder, C. Argyropoulos, E. Schubert, and M. Schubert 2023 NRIC Conference on Topology and Valley Driven Quantum Phenomena, EQUATE Symposium, Lincoln, NE, March 2023
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643. |
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Nonreciprocal topological edge states unveiled by all-dielectric metasurface platform S. G. Kilic, U. Kilic, E. Schubert, M. Schubert, and C. Argyropoulos 2023 NRIC Conference on Topology and Valley Driven Quantum Phenomena, EQUATE Symposium, Lincoln, NE, March 2023
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642. |
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AVS Ellipsometry Technical Group Best Graduate Student Presentation award Fast Spectroscopic Mueller Matrix Ellipsometry in the THz Range A. Ruder, S. Richter, P. Kuhne, V. Rindert, V. Stanishev, R. Korlacki, J. Olander, V. Darakchieva, and M. Schubert AVS 69 International Symposium and Exhibition (AVS-69), Portland, OR, November 2023
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641. |
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AVS Ellipsometry Technical Group Best Undergraduate Student Presentation award Elevated Temperature Model Dielectric Function of InAs Determined by Spectroscopic Ellipsometry P. Sorensen, U. Kilic, R. Korlacki, and M. Schubert AVS 69 International Symposium and Exhibition (AVS-69), Portland, OR, November 2023
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640. |
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Combined Density Functional Theory and Spectroscopic Ellipsometry Studies of Anisotropic Materials R. Korlacki, M. Hilfiker, M. Stokey, and M. Schubert AVS 69 International Symposium and Exhibition (AVS-69), Portland, OR, November 2023
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639. |
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Invited Enhancement of Electron Effective Mass in Semiconductor Materials and 2DEGs Revealed by THz Optical Hall Effect N. Armakavicius, S. Knight, P. Kuhne, H. Zhang, R. Carrascon, S. Richter, V. Stanishev, M. Schubert, P. Paskov, and V. Darakchieva AVS 69 International Symposium and Exhibition (AVS-69), Portland, OR, November 2023
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2022:> |
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638. |
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Invited Exploring extreme wide bandgap metal-oxides for a carbon-emission-free power infrastructure M. Schubert, and V. Darakchieva Leibniz Institute for Polymer Research, Dresden, Germany, December 2022
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637. |
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Terahertz Electron Paramagnetic Resonance Ellipsometry: A new tool to characterize defect spins in materials with extreme properties M. Schubert 2022 Materials with Extreme Properties and Condensed Matter Physics Joint Review, Washington, D.C., June 2022
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636. |
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Infrared-Active Phonon Modes and Static Dielectric Constants of Orthorhombic LiGaO2 T. Gramer, M. Stokey, R. Korlacki, and M. Schubert The 5th U.S. Gallium Oxide Workshop (GOX 2022), Washington, D.C., August 2022
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635. |
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Defect Characterization in Gallium Oxide and Related Materials Using Terahertz Electron Paramagnetic Resonance Ellipsometry: Fe in Ga2O3 M. Schubert, S. Richter, S. Knight, P. Kuehne, M. Stokey, R. Korlacki, V. Stanishev, Z. Galazka, K. Irmscher, S. Mu, C. Van de Walle, V. Ivády, O. Bulancea-Lindvall, I. Abrikosov, and V. Darakchieva The 5th U.S. Gallium Oxide Workshop (GOX 2022), Washington, D.C., August 2022
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634. |
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Invited Defect Characterization in Gallium Oxide and Related Materials Using Terahertz Electron Paramagnetic Resonance Ellipsometry: Fe in Ga2O3 M. Schubert, S. Richter, S. Knight, P. Kuehne, M. Stokey, R. Korlacki, V. Stanishev, Z. Galazka, K. Irmscher, S. Mu, C. Van de Walle, V. Ivady, O. Bulancea-Lindvall, I. Abrikosov, and V. Darakchieva SiC 2022 Workshop, Cleveland, OH, August 2022
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633. |
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Spectroscopic Ellipsometry Optical Analysis of Zinc Gallate at Elevated Temperatures E. Williams, M. Hilfiker, U. Kilic, Y. Traouli, N. Koeppe, J. Rivera, A. Abakar, M. Stokey, R. Korlacki, Z. Galazka, and M. Schubert The 5th U.S. Gallium Oxide Workshop (GOX 2022), Washington, D.C., August 2022
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632. |
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The Electron Spin Hamiltonian for Fe3+ in Monoclinic beta-Ga2O3 S. Richter, S. Knight, P. Kuehne, M. Schubert, and V. Darakchieva The 5th U.S. Gallium Oxide Workshop (GOX 2022), Washington, D.C., August 2022
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631. |
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Evolution of Anisotropy and Order of Band-to-Band Transitions, Excitons, Phonons, Static and High Frequency Dielectric Constants Including Strain Dependencies in Alpha and Beta Phase (AlxGa1-x)2O3 M. Stokey, R. Korlacki, M. Hilfiker, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Mock, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, H. Xing, D. Jena, Y. Oshima, E. Ahmadi, V. Darakchieva, and M. Schubert The 5th U.S. Gallium Oxide Workshop (GOX 2022), Washington, D.C., August 2022
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630. |
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The electron spin Hamiltonian for Fe3+ in monoclinic beta-Ga2O3 S. Richter, S. Knight, P. Kuehne, M. Schubert, and V. Darakchieva Defects in solids for quantum technologies (CECAM 2022), Stockholm, Sweden, June 2022
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629. |
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Invited Terahertz Electron Paramagnetic Resonance ellipsometry for interrogating point defects in ultrawide bandgap semiconductors V. Darakchieva, S. Richter, S. Knight, P. Kuehne, V. Stanishev, A. Ruder, and M. Schubert Defects in solids for quantum technologies (CECAM 2022), Stockholm, Sweden, June 2022
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628. |
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Invited Tutorial Generalized Ellipsometry analysis of low-symmetry materials using a generalized polarizability model: A tutorial M. Schubert International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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627. |
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A high frequency, high field, field and frequency domain, cavity-free, EPR ellipsometry instrument P. Kuehne, S. Richter, A. Ruder, S. Knight, M. Schubert, and V. Darakchieva International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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626. |
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Phonons and band-to-band transitions in zinc gallate - A combined density functional theory and ellipsometry approach M. Hilfiker, R. Korlacki, E. Williams, U. Kilic, Y. Traouli, N. Koeppe, J. Rivera, A. Abakar, M. Stokey, Z. Galazka, and M. Schubert International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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625. |
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The influence of strain and alloying onto the exciton and band-to-band transitions in (AlxGa1-x)2O3 M. Hilfiker, M. Stokey, R. Korlacki, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Mock, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, H. Xing, D. Jena, Y. Oshima, E. Ahmadi, V. Darakchieva, and M. Schubert International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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624. |
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Mueller matrix imaging using slatned columnar thin film mirrors A. Ruder, B. Wright, R. Feder, U. Kiic, M. Hilfiker, C. M. Herzinger, E. Schubert, and M. Schubert International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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623. |
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Institute Seminar Exploring extreme wide bandgap metal-oxides for a carbon-emission-free power infrastructureStrain, stress, alloying and defects in monoclinic gallium oxide and related compounds: Determination of phonon, free charge carrier, band gap and defect properties with THz Electron Paramagnetic Resonance, Optical Hall effect and ultra-wideband generalized ellipsometry M. Schubert Leibniz Institute for Surface Modification Leipzig e.V., Leipzig, Germany, January 2022
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622. |
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Ellipsometry and density functional theory characterization of gallium aluminum oxide: Effects of strain and alloying onto band gaps, excitons and phonons, and the Fe3+ defect M. Schubert, and R. Korlacki University of Utah, Salt Lake City, UT, April 2022
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621. |
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Far-infrared and mid-infrared analysis of the dielectric function tensor of alpha and beta phase (AlxGa1-x)2O3 by combined density functional theory and generalized spectroscopic ellipsometry M. Stokey, R. Korlacki, J. Knudtson, T. Gramer, M. Hilfiker, S. Knight, S. Richter, A. Papamichail, A. Mock, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, G. Xing, D. Jena, Y. Oshima, K. Khan, E. Ahmadi, K. Irmscher, Z. Galazka, V. Darakchieva, and M. Schubert International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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620. |
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Dual Box model based In-situ Ellipsometry growth characterization: Oxygen Plasma Enhanced Atomic Layer Deposition of metal Oxide Ultra-thin Films U. Kilic, S. G. Kilic, M. Hilfiker, G. Melendez, D. Sekora, A. Mock, N. Ianno, C. Argyropoulos, E. Schubert, and M. Schubert 48th The International Conference on Metallurgical Coatings and Thin Films (ICMCTF), San Diego, May 2022
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619. |
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Unravelingthe Bisignate and Broadband Chiroptical Response from All-Dielectric Distorted L-Shape Metamaterials U. Kilic, M. Hilfiker, A. Ruder, S. Wimer, E. Schubert, C. Argyropoulos, and M. Schubert 48th The International Conference on Metallurgical Coatings and Thin Films (ICMCTF), San Diego, May 2022
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618. |
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Invited Design, fabrication and optical characterization of glancing angle deposited quantum metamaterials U. Kilic, M. Hilfiker, R. Feder, R. Korlacki, E. Schubert, M. Schubert, and C. Argyropoulos The world networking event Humbolt meets Leibniz - Metamaterials, Hannover, Germany, May 2022
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617. |
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Invited Extremely broadband plasmonic chiroptical activity revealed by heterostructure helical metamaterials U. Kilic, M. Hilfiker, R. Korlacki, E. Schubert, M. Schubert, and C. Argyropoulos International Conference on Spectroscopic Ellipsometry 9, Beijing, China, May 2022
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616. |
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Mueller matrix generalized spectroscopic ellipsometry based chiroptical characterization of glancing angle deposited all-dielectric distorted L-shape metamaterials U. Kilic, M. Hilfiker, A. Ruder, Shawn Wimer, S. G. Kilic, C. Argyropoulos, M. Schubert, and E. Schubert Nebraska EPSCoR NRIC: Commercializing Quantum Technologies in Nebraska, Lincoln, NE, March 2022
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615. |
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Invited Engineering the broadband enhanced chirality revealed by glancing angle deposited metamaterial platforms U. Kilic, M. Hilfiker, A. Ruder, R. Feder, S. Wimer, S. G. Kilic, R. Korlacki, M. Schubert, E. Schubert, and C. Argyropoulos Seminar Series hosted by UNL’s Physics and Astronomy Department, Lincoln, NE, February 2022
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614. |
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Terahertz to Vacuum Ultraviolet Ellipsometry characterization of lattice, strain, free charge carrier, dielectric constants, exciton and band-to-band transition properties in ultrawideband gap alpha and beta aluminum gallium oxide semiconductor alloys M. Schubert, M. Stokey, R. Korlacki, U. Kilic, J. Knudsen, S. Richter, S. Knight, P. Kuehne, V. Stanishev, Z. Galazka, K. Irmscher, P. Neugebauer, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, H. G. Xing, D. Jena, Y. Oshima, K. Khan, E. Ahmadi, and Vanya Darakchieva SPIE Photonics West, San Francisco, CA, February 2022
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613. |
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Temperature-dependent electron effective mass in bulk GaN revealed by terahertz optical Hall effect N. Armakavicius, S. Knight, R. D. Carrascon, P. Kuehne, V. Stanishev, S. Richter, A. Papamichail, M. Schubert, P. P. Paskov, and V. Darakchieva International Workshop on Nitride Semiconductors (IWN), Berlin, Germany, September 2022
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612. |
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The strain deformation potentials for phonons, band-to-band transitions, dielectric constants, effective mass, and band-offsets in beta-gallium oxide and related materials and evolutions in heteroepitaxial beta-(aluminum-gallium) oxide M. Stokey, R. Korlacki, M. Hilfiker, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Papamichail, A. Mock, A. Mauze, Y. Zhang, J. Speck, K. Irmscher, Z. Galazka, V. Darakchieva, and M. Schubert The International Workshop on Gallium Oxide and Related Materials (IWGO), Nagano, Japan, October 2022
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611. |
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THz Electron paramagnetic resonance ellipsometry – a new high precision tool to identify defects in gallium oxide: The case of iron doping S. Richter, M. Schubert, S. Knight, P. Kuehne, V. Stanishev, M. Stokey, R. Korlacki, Z. Galazka, K. Irmscher, S. Mu, C. van de Walle, V. Ivady, O. Bulancea-Lindvall, I. Abrikosov, and V. Darakchieva The International Workshop on Gallium Oxide and Related Materials (IWGO), Nagano, Japan, October 2022
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610. |
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Institute Seminar Oxide based high power electronic materials research for the future of green energy M. Schubert Fritz Haber Institute Max Planck Society, Berlin, Germany, September 2022
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609. |
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Invited Oxide based high power electronic materials research for the future of green energy M. Schubert Advanced Functional Material Workshop, Kolmarden, Sweden, August 2022
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608. |
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Best Student Paper Award Winner Evolution of Anisotropy and Order of Band-to-Band Transitions, Excitons, Phonons, Static and High Frequency Dielectric Constants Including Strain Dependencies in Alpha and Beta Phase (AlXGa1-X)2O3 M. Stokey, R. Korlacki, M. Hilfiker, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Mock, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, H. G. Xing, D. Jena, E. Ahmadi, V. Darakchieva, and M Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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607. |
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Engineering the Bi-Signate Broadband Enhanced Chirality Revealed by All Dielectric Nanoboomerang Structure U. Kilic, M. Hilfiker, A. Ruder, S. Wimer, S. G. Kilic, E. Schubert, C. Argyropoulos, and M. Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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606. |
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Optical Properties of Orthorhombic LiGa02 from Far-Infrared to Vacuum Ultraviolet T. Gramer, E. Williams, M. Stokey, R. Korlacki, U. Kilic, M. Hilfiker, and M. Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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605. |
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Invited Terahertz to Vacuum Ultraviolet Ellipsometry Characterization of Spin, Lattice, Strain, Free Charge Carrier, Dielectric Constants, Exciton and Band-to-Band Transition Properties in Ultrawideband Gap Alpha and Beta Aluminum Gallium Oxide Semiconductor Alloys M. Schubert, R. Korlacki, M. Stokey, A. Mock, M. Hilfiker, J. Knudtson, U. Kilic, S. Richter, S. Knight, P. Kuehne, and V. Darakchieva AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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604. |
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Unraveling the Ultra-Violet Active Chiroptical Response by ZrO2 Helical Nanostructures U. Kilic, M. Hilfiker, S. Wimer, S. G. Kilic, C. Argyropoulos, E. Schubert, and M. Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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603. |
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Numerical Ellipsometry: Examination of monoclinic ?-Ga2O3 LO Phonon Modes using Data Selection Procedures and Inverse Permittivity Solution Methods F. Urban, and M. Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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602. |
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Bottom-up fabricated metamaterials with extreme chiral responses U. Kilic, M. Hilfiker, S. Wimer, A. Ruder, E. Schubert, M. Schubert, and C. Argyropoulos CUNY Advanced Science Research Center for the Satellite Workshop and Simons Collaboration on Extreme Wave Phenomena Based on Symmetries Annual Meeting, New York, NY, October 2022
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601. |
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Combined Density Functional Theory and Spectroscopic Ellipsometry Studies of Anisotropic Materials R. Korlacki, T. Gramer, M. Stokey, V. Darakchieva, and M. Schubert AVS 68 International Symposium and Exhibition (AVS-68), Pittsburgh, PA, November 2022
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600. |
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Evolution of Anisotropy and Order of Band-to-Band Transitions, Excitons, Phonons, Static and High Frequency Dielectric Constants Including Strain Dependencies in Alpha and Beta Phase (AlXGa1-X)2O3 M. Stokey, R. Korlacki, M. Hilfiker, T. Gramer, J. Knudtson, S. Richter, S. Knight, A. Mock, A. Mauze, Y. Zhang, J. Speck, R. Jinno, Y. Cho, H. Xing, D. Jena, Y. Oshima, E. Ahmadi, V. Darakchieva, and M. Schubert EQUATE External Review Meeting, Lincoln, NE, August 2022
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2021:> |
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599. |
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Tunable plasmonic chirality revealed by helical heteterostructure metamaterials U. Kilic, M. Hilfiker, R. Feder, R. Korlacki, E. Schubert, M. Schubert, and C. Argyropoulos UNL Research Days, World Wide Web, April 2021
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598. |
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Plasma enhanced atomic layer deposition of ZnO ultra-thin films monitored by in-situ spectroscopic ellipsometry U.Kilic, D. Schmidt, M. Hilfiker, G. Melendez, R. Korlacki, E. Schubert, and M. Schubert SVC TechCon-21, World Wide Web, May 2021
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597. |
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Tunable broadband enhanced chirality with hybrid helical metamaterials U. Kilic, M. Hilfiker, R. Feder, R. Korlacki, E. Schubert, M. Schubert, and C. Argyropoulos International Congress on Artificial Materials for Novel Wave Phenomena – Metamaterials, World Wide Web, August 2021
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596. |
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Tailoring the chiro-optical response of Si-Ag/Au chiral heterostructure thin films fabricated by glancing angle deposition technique U. Kilic, M. Hilfiker, R. Feder, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert SPIE Photonics West, World Wide Web, March 2021
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595. |
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Mueller Matrix Imaging Microscope Using Nanostructured Thin Film Mirrors A. Ruder, U. Kilic, M. Hilfiker, B. Wright, D. Peev, R. Feder, C. M. Herzinger, E. Schubert, and M. Schubert UNL Student Research Days, World Wide Web, April 2021
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594. |
|
Exploring extreme wide bandgap metal-oxides for a carbon-emission-free power infrastructure M. Schubert CEITEC BUT Brno University of Technology, World Wide Web, January 2021
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593. |
|
The strain-stress and alloying relationships for band gap, phonon and plasmon energies in monoclinic Ga2O3 and related materials M. Schubert 2021 Materials with Extreme Properties and Condensed Matter Physics Joint Review, Washington, D.C., 2021
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592. |
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Electron Paramagnetic Resonance measured in the Terahertz spectral region using generalized Mueller matrix ellipsometry M. Schubert J. A. Woollam Co. Inc., Lincoln, NE, June 2021
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591. |
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Extraction of Thin Film Dielectric Functions using Ex-situ Spectroscopic Ellipsometry based Multi-sample Analysis Approach J. Rittenhouse, U. Kilic, M. Hilfiker, S. Wimer, E. Schubert, and M. Schubert UNL Summer Research Symposium, Lincoln, NE, August 2021
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590. |
|
Invited Exploring extreme wide bandgap metal-oxides for a carbon-emission-free power infrastructure M. Schubert, and V. Darakchieva University of Naples Physics Colloquium, Naples, Italy, December 2021
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589. |
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Spatially coherent helical and non-helical nano-heterostructures with tuneable plasmonic response U. Kilic, M. Hilfiker, R. Korlacki, R. Feder, F. Frost, C. Argyropoulos, M. Schubert, and E. Schubert The European Optical Society Annual meeting (EOSAM), Rome, Italy, September 2021
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2020:> |
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588. |
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Tuning the chiro-optical response of plasmonic Si-Ag chiral metamaterials U. Kilic, M. Hilfiker, R. Feder, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert UNL College of Engineering Graduate Student Symposium, World Wide Web, March 2020
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587. |
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Exploring extreme wide bandgap metal-oxides for a carbon-emission-free power infrastructure M. Schubert Advanced Functional Materials Seminar, World Wide Web, October 2020
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586. |
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The strain-stress and alloying relationships for band gap, phonon and plasmon energies in monoclinic Ga2O3 and related materials M. Schubert Joint AFOSR NSF Program Review of Aerospace Materials for Extreme Environments, World Wide Web, October 2020
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2019:> |
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585. |
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Invited Phonons, free charge carriers, excitons and band-to-band transitions in β Ga2O3 and related alloys determined by ellipsometry and optical Hall effect M. Schubert, A. Mock, R. Korlacki, S. Knight, V. Darakchieva, S. Galazka, G. Wagner, H. Murakami, Y. Kumagai, K. Goto, M. Higashiwaki, and J. Speck APWS 2019, Okinawa, Japan, November 2019
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584. |
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Electromagnon Excitation in Cupric Oxide Measured by Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry M. Schubert, S. Knight, C. Binek, D. Prabhakaran, A. Lipatov, and A. Sinitskii NSF MRSEC Site Review, Lincoln, Nebraska, U.S.A., March 2019
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583. |
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Invited Phonon-plasmon coupling in monoclinic symmetry Ga2O3 M. Schubert, A. Mock, R. Korlacki, S. Knight, V. Darakchieva, S. Galazka, G. Wagner, H. Murakami, Y. Kumagai, K. Goto, M. Higashiwaki, and J. Speck SPIE Opto Photonics West 2019, San Francisco, California, U.S.A., February 2019
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582. |
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Physics Colloquium Reduction of Symmetry and the return of the War of Currents M. Schubert Colorado School of Mines, Golden, Colorado, U.S.A., March 2019
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581. |
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Dual Box Model based In situ Ellipsometry Growth Characterization: Oxygen Plasma Enhanced Atomic Layer Deposition of Metal Oxide Ultra-thin Films U. Kilic, A. Mock, D. Sekora, N. Ianno, E. Schubert, and M. Schubert 46th ICMCTF, San Diego, California, U.S.A., May 2019
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580. |
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Tailoring the Optical Properties of Highly Porous Superlattice-type Si-Au Slanted Columnar Heterostructure Thin Films U. Kilic, A. Mock, R. Feder, D. Sekora, M. Hilfiker, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert 46th ICMCTF, San Diego, California, U.S.A., May 2019
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579. |
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Free Charge Carrier Properties in Quasi-1D TiS3 Determined by Fabry-Pérot Enhanced THz Mueller Matrix Ellipsometry S. Knight, A. Lipatov, A. Sinitskii, and M. Schubert Nebraska NSF MRSEC Review, Lincoln, Nebraska, U.S.A., March 2019
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578. |
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Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry for Materials Characterization S. Knight, M. Schubert, C. Binek, D. Prabhakaran, A. Lipatov, and A. Sinitskii 2nd Swedish Terahertz workshop, Linköping, Sweden, March 2019
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577. |
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Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry for Materials Characterization S. Knight, M. Schubert, C. Binek, D. Prabhakaran, A. Lipatov, and A. Sinitskii J.A. Woollam Symposium, Lincoln, Nebraska, U.S.A., April 2019
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576. |
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Invited Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry for Materials Characterization S. Knight, M. Schubert, C. Binek, D. Prabhakaran, A. Lipatov, and A. Sinitskii International Conference on Spectroscopic Ellipsometrie 8, Barcelona, Spain, May 2019
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575. |
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Band-to-Band Transitions, Selection Rules, and Excitonic Contributions in Monoclinic beta-(AlxGa1-x)2O3 M. Hilfiker, U. Kilic, A. Mock, S. Knight, R. Korlacki, A. Mauze, Y. Zhang, J. Speck, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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574. |
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In-situ Monitoring Oxygen Plasma Enhanced Atomic Layer Deposition of metal Oxide Ultra-thin Films using Dual Box model based Spectroscopic Ellipsometry U. Kilic, A. Mock, D. Sekora, N. Ianno, E. Schubert, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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573. |
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Lattice dynamics of orthorhombic NdGaO3 A. Mock, R. Korlacki, S. Knight, M. Stokey, A. Fritz, V. Darakchieva, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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572. |
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Mueller Matrix Spectroscopic Ellipsometry Investigation of Aspect Ratio in Glancing Angle Deposition Thin Films M. Hilfiker, U. Kilic, K. Bryant, R. Feder, E. Schubert, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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571. |
|
Unraveling The Dynamics of Circular Dichroism in Highly-Coherent Si-Au Nanoplasmonic Chiral Heterostructures U. Kilic, M. Hilfiker, R. Feder, D. Sekora, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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570. |
|
Optical Hall Effect in Te-doped GaSb and undoped InAs F. Abadizaman, C. Emminger, S. Knight, M. Schubert, and S. Zollner International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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569. |
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Invited Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry for Materials Characterization S. Knight, D. Prabhakaran, C. Binek, N. Armakavicius, V. Stanishev, P. Kuehne, T. Hofmann, V. Darakchieva, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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568. |
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Field- and temperature-dependent optical Hall effect in group-III nitrides P. Kuehne, N. Armakavicius, V. Stanishev, Jr-Tai Chen, O. Kordina, M. Schubert, and V. Darakchieva International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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567. |
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Invited Stealth Technology-Based Terahertz Frequency-Domain Ellipsometry for In-situ and Exsitu Applications N. Armakavicius, P. Kuehne, V. Stanishev, S. Knight, T. Hofmann, C.M. Herzinger, M. Schubert, and V. Darakchieva International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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566. |
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Electromagnon Excitation in Cupric Oxide Measured by Fabry-Pérot Enhanced Terahertz Mueller Matrix Ellipsometry S. Knight, D. Prabhakaran, C. Binek, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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565. |
|
The generalized intensity contrast in birefringent microscopy S. Nazari, E. Bittrich, L. Bittrich, A. Ruder, U. Kilic, N. Kananizadeh, M. Hilfiker, R. Korlacki, P. Uhlmann, K.-J. Eichhorn, A. Fery, E. Franke-Schubert, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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564. |
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Analysis of the dielectric function tensor and the inverse dielectric function tensor of monoclinic lutetium orthosilicate A. Mock, R. Korlacki, S. Knight, M. Stokey, V. Darakchieva, S. Schoeche, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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563. |
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DFT Calculations of Infrared-Active Phonons in Monoclinic Oxides R. Korlacki, A. Mock, S. Knight, M. Schubert, and V. Darakchieva International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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562. |
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Opto-plasmonic Properties of Spatially Coherent Superlattice-type Si-Au Slanted Columnar Heterostructure Thin Films U. Kilic, A. Mock, R. Feder, D. Sekora, M. Hilfiker, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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561. |
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Longitudinal phonon plasmon mode coupling and the strain-stress relationships in beta-Ga2O3 M. Schubert, A. Mock, R. Korlacki, S. Knight, Z. Galazka, G. Wagner, V. Wheeler, M. Tadjer, K. Goto, and V. Darakchieva International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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560. |
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Invited Generalized Ellipsometry on Low Symmetry Materials A. Mock, R. Korlacki, S. Knight, M. Tadjer, V. Darakchieva, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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559. |
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Mueller matrix ellipsometry using rotating anisotropic mirrors A. Ruder, B. Wright, D. Peev, M. Hilfiker, C. M. Herzinger, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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558. |
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Optical conductivity of PEDOT:Tos from the THz to the UV spectral range determined by spectroscopic ellipsometry S. Chen, P. Kuhne, V. Stanishev, R. Brooke, I. Petsagkourakis, X. Crispin, M. Schubert, V. Darakchieva, and M. P. Jonsson International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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557. |
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Magnetic properties of nanostructured hard-soft magnetic heterostructured thin films determined with vector magneto-optical generalized ellipsometry C. Briley, D. Sekora, A. Mock, E. Schubert, C. Binek, H. Schmidt, and M. Schubert International Conference on Spectroscopic Ellipsometry 8, Barcelona, Spain, May 2019
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556. |
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Generalized ellipsometry on low-symmetry materials A. Mock, R. Korlacki, S. Knight, M. Tadjer, V. Darakchieva, and M. Schubert 2nd Swedish Terahertz workshop, Linköping, Sweden, March 2019
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555. |
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Invited The Physics of Low Symmetry Metal Oxides: Applications of Ellipsometry A. Mock, S. Knight, M. Hilfiker, R. Korlacki, A. Papamichail, M.J. Tadjer, V. Darakchieva, and M. Schubert 66th AVS conference, Columbus, Ohio, U.S.A., October 2019
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554. |
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Physics Seminar Phonons, free charge carriers, excitons and band-to-band transitions in monoclinic symmetry semiconductors M. Schubert CASE Western, Cleveland, Ohio, U.S.A., October 2019
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553. |
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Institute Seminar Strain, stress, alloying and defects in monoclinic gallium oxide and related compounds: Determination of phonon, free charge carrier, band gap and defect properties with THz Electron Paramagnetic Resonance, Optical Hall effect and ultra-wideband generalized ellipsometry M. Schubert Leibniz Institute for Crystal Growth, Berlin, Germany, December 2019
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552. |
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Institute Seminar Strain, stress, alloying and defects in monoclinic gallium oxide and related compounds: Determination of phonon, free charge carrier, band gap and defect properties with THz Electron Paramagnetic Resonance, Optical Hall effect and ultra-wideband generalized ellipsometry M. Schubert Leibniz Institute for Crystal Growth, Berlin, Germany, December 2019
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551. |
|
Examination of dielectric function tensor (1.5 eV to 9.0 eV), anisotropy, and band-to-band transitions for monoclinic ?-(AlxGa1-x)2O3 (x ? 0.21) films using generalized spectroscopic ellipsometry M. Hilfiker, U. Kilic, A. Mock, V. Darakchieva, S. Knight, R. Korlacki, A. Mauze, Y. Zhang, J. Speck, and M. Schubert International Workshop on Gallium Oxide and other related materials, Columbus, Ohio, August 2019
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550. |
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Phonon order and longitudinal-optical phonon plasmon coupling in beta-Ga2O3 M. Schubert, A. Mock, R. Korlacki, S. Knight, Z. Galazka, G. Wagner, V. Wheeler, M. Tadjer, K. Goto, and V. Darakchieva International Workshop on Gallium Oxide and other related materials, Columbus, Ohio, August 2019
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549. |
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Stress/Strain Behavior of Infrared-Active Phonons and Phonon Deformation Potentionals in beta-Ga2O3 R. Korlacki, A. Mock, S. Knight, M. Schubert, and V. Darakchieva International Workshop on Gallium Oxide and other related materials, Columbus, Ohio, August 2019
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548. |
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Properties of beta-Ga2O3 films determined by long-wavelength spectroscopic ellipsometry and their relation to strain A. Mock, S. Knight, R. Korlacki, A. Papamichail, A. Kuramata, Z. Galazka, G. Wagner, N. Blumenschein, M.J. Tadjer, V. Darakchieva, and M. Schubert International Workshop on Gallium Oxide and other related materials, Columbus, Ohio, August 2019
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2018:> |
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547. |
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Spectroscopic Ellipsometry Based Growth Monitoring During Plasma Enhanced Atomic Layer Deposition of Metal Oxide Ultra-thin Films U. Kilic, D. Sekora, A. Mock, N. Ianno, E. Schubert, and M. Schubert IANR&CoE Graduate Recruitment Meeting, Lincoln, Nebraska, U.S.A., 2018
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546. |
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Distinguished Poster Award Winner Atomic Layer Deposition of Ultra-thin Films: In Situ Ellipsometry Growth Characterization G. M. Gonzalez, U. Kilic, D. Sekora, A. Mock, M. Hilfiker, E. Schubert, and M. Schubert MRSEC REU summer poster fair, Lincoln, Nebraska, U.S.A., July 2018
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545. |
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Invited Spectroscopic ellipsometry of Metal Oxide Ultra-Thin Films from ALD: In-situ layer-by-layer growth monitoring G. M. Gonzalez, U. Kilic, D. Sekora, A. Mock, M. Hilfiker, E. Schubert, and M. Schubert Women in Physical Sciences Conference, Lincoln, Nebraska, U.S.A., July 2018
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544. |
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Best Presentation Award Spectroscopic Ellipsometry and Finite Element Modeling based Optical Characterization of Highly Coherent Au-Si Slanted Columnar Periodic Nanostructures U. Kilic, A. Mock, R. Feder, D. Sekora, M. Hilfiker, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert 65th AVS conference, Long Beach, California, U.S.A., October 2018
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543. |
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Graduate Student Award Winner Tailoring the optical properties of highly coherent Au-Si nano-bamboo plasmonic resonators U. Kilic, A. Mock, R. Feder, D. Sekora, M. Hilfiker, R. Korlacki, E. Schubert, C. Argyropoulos, and M. Schubert UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2018
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542. |
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Tailoring the optical properties of spatially coherent, super lattice type Si-Au slanted columnar heterostructure thin films U. Kilic, D. Sekora, A. Mock, N. Ianno, E. Schubert, and M. Schubert
Nebraska MRSEC Review, Lincoln, Nebraska, U.S.A., March 2018
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541. |
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Optical and Electronic Properties of Monoclinic Ga2O3 Unraveled M. Schubert 45th ICMCTF, San Diego, California, U.S.A., April 2018
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540. |
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Invited Phonons and excitons in beta-Ga2O3 A. Mock, M. Schubert, R. Korlacki, Sean Knight, V. Darakchieva, B. Monemar, H. Murakami, Y. Kumagai, K. Goto, and M. Higashiwaki SPIE Photonics West|OPTO, San Francisco, California, U.S.A., February 2018
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539. |
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The physics of low symmetry metal oxides with special attention to phonons, plasmons and excitons and their potential for uses in power electronics and quantum technologies A. Mock, R. Korlacki, S. Knight, V. Darakchieva, B. Monemar, H. Murakami, Y. Kumagai, K. Goto, M. Higashiwaki, and M. Schubert Epioptics 15, Sicily, Italy, July 2018
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538. |
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The strain-stress Relationships for Band Gap, Phonon and Plasmon Energies in Monoclinic Ga2O3 and Related Materials M. Schubert AFOSR Program Review, Doolittle Institute, Niceville, Florida, U.S.A., May 2018
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537. |
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Institute Seminar Optical and Electronic Properties of Low-Symmetry Materials M. Schubert Leibniz Institut fuer Kristallzucht Berlin e.V., Berlin, Adlershof, Germany, March 2018
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536. |
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Invited Optical and Electronic Properties of Monoclinic Ga2O3 Unraveled M. Schubert Les Eastman Conference, GOX 2018, 3rd US Workshop on Gallium Oxide, The Ohio State University, Ohio, U.S.A., August 2018
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535. |
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Fortschritte mit ionenstrahlbasiertem GLAD: In-situ Ellipsometrie und Heterostrukturwachstum und Gallium Oxide und Verbindungen als neuartige Halbleitermaterialien fuer Hochleistungselektronik M. Schubert, A. Mock, R. Feder, R. Korlacki, C. Briley, S. Knight, D. Sekora, and E. Franke-Schubert XXV. Erfahrungsaustausch, Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Muehlleithen, Vogtland, Germany, March 2018
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534. |
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Invited The physics of low symmetry metal oxides with special attention to phonons, plasmons and excitons and their potential for uses in power electronics and quantum technologies M. Schubert, A. Mock, R. Korlacki, S. Knight, V. Darakchieva, B. Monemar, H. Murakami, Y. Kumagai, K. Goto, and M. Higashiwaki 65th AVS conference, Long Beach, California, U.S.A., October 2018
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533. |
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Electron effective mass in Sn-doped monoclinic single crystal ?-gallium oxide determined by mid-infrared optical Hall effect S. Knight, A. Mock, R. Korlacki, V. Darakchieva, B. Monemar, Y. Kumagai, K. Goto, M. Higashiwaki, and M. Schubert Nebraska NSF MRSEC Review, Lincoln, Nebraska, U.S.A., March 2018
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532. |
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Electromagnon excitation in CuO measured by THz Mueller matrix ellipsometry S. Knight, D. Prabhakaran, J. Lloyd-Hughes, C. Binek, and M. Schubert Nebraska NSF MRSEC Review, Lincoln, Nebraska, U.S.A., March 2018
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531. |
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Impacts of Particle Surface Charge Heterogeneity on the Deposition T. Delon, I. Giancarlo, M. Schubert, and Y. Li American Geophysical Union Fall Meeting Abstracts, Washington, D.C., U.S.A., December 2018
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530. |
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Sensing and Visualizing Nanoparticle Distribution and Flow on Model Rough Surfaces Y. Li, N. Kananizadeh, D. Peev, M. Schubert, and E. Schubert American Geophysical Union Fall Meeting Abstracts, Washington, D.C., U.S.A., December 2018
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529. |
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Aspect Ratio Driven Optical Properties of Glancing Angle Deposited Thin Films K. Bryant, M. Hilfiker, U. Kilic, E. Schubert, and M. Schubert UNL Summer Research Symposium, Lincoln, Nebraska, U.S.A., August 2018
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528. |
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ELECTRON EFFECTIVE MASS IN In0.33Ga0.67N DETERMINED BY INFRARED OPTICAL HALL EFFECT N. Armakavicius, V. Stanishev, S. Knight, P. Kuehne, M. Schubert, and V. Darakchieva WSE 10: Workshop Ellipsometry, Technical University Chemnitz, Germany, March 2018
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527. |
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STEALTH TECHNOLOGY-BASED TERAHERTZ FREQUENCY-DOMAIN ELLIPSOMETRY INSTRUMENTATION P. Kuehne, V. Stanishev, N. Armakavicius, C. M. Herzinger, M. Schubert, and V. Darakchieva WSE 10: Workshop Ellipsometry, Technical University Chemnitz, Germany, March 2018
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526. |
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Optical and Electronic Properties of Low-Symmetry Materials A. Mock, R. Korlacki, S. Knight, V. Darakchieva, and M. Schubert WSE 10: Workshop Ellipsometry, Technical University Chemnitz, Germany, March 2018
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525. |
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Study of anisotropic mobility in as-grown and quasi-free-standing epitaxial graphene by terahertz optical Hall effect N. Armakavicius, P. Kuehne, C. Bouhafs, V. Stanishev, J. Eriksson, R. Yakimova, A. Zakharov, C. Colleti, M. Schubert, and V. Darakchieva EMRS Spring Meeting, Strasbourg, France, June 2018
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2017:> |
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524. |
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Responsive Biomaterials by using nanostructured polymer brush films P. Uhlman, A. Revzin, M. Schubert, and A. Pannier 5th International Conference on Multifunctional, Hybrid and Nanomaterials 2017, Lisbon, Portugal, March 2017
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523. |
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UNL Graduate Student Competition Best Poster Award Winner Adsorption and Decontamination of Alpha-synuclein From Medically and Environmentally-Relevant Surfaces T. M. Hanh Phan , S. L. Bartelt-Hunt, J. C. Bartz, J. Ayers, B. Giasson, M. Schubert, K. B. Rodenhausen, and N. Kananizadeh UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017
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522. |
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ECE Graduate Student Competition Best Poster Award Winner Atomic Layer Deposition of WO3 Ultra Thin Films: In situ Ellipsometry Growth Monitoring and Ex situ Optical Characterization U. Kilic, D. Sekora, A. Mock, C. Argyropoulos, N. Ianno, E. Schubert, and M. Schubert UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017
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521. |
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ECE Graduate Student Competition Best Poster Award Winner In-situ Terahertz optical Hall effeect measurement of ambient doping effects in epitaxial graphene S. Knight, T. Hofmann, C. Bouhafs, N. Armakavicious, P. Kuehne, M. Schubert, and V. Darakchieva UNL Graduate Research Fair, Lincoln, Nebraska, U.S.A., April 2017
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520. |
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Terahertz Cavity-enhancd optical Hall effect reveals anistropic mobility in epitaxial graphene P. Kuehne, C. Bouhafs, V. Stanishev, T. Hofmann, M. Schubert, R. Yakimova, C. Coletti, and V. Darakchieva MRS Spring Meeting, Pheonix, Arizona, U.S.A., April 2017
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519. |
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In-situ Terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene S. Knight, C. Bouhafs, N. Armakavicius, P. Kuehne, V. Stanishev, I. Ivanov, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann MRS Spring Meeting, Pheonix, Arizona, U.S.A., April 2017
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518. |
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Spectroscopic ellipsometry of WO3 thin films from ALD: In-situ layer-by-layer growth monitoring and ex-situ optical characterization U. Kilic, D. Sekora, A. Mock, C. Argyropoulos, N. Ianno, R. Feder, E. Schubert, and M. Schubert 17th International Conference on Atomic Layer Deposition, Denver, Colorado, U.S.A., July 2017
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517. |
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Hybrid Materials from Sculptured Thin Films and Applications E. Schubert, D. Sekora, C. Briley, D. Peev, U. Kilic, A. Mock, R. Korlacki, R. Feder, A. Matz, A. Nguyen, A. Pannier, and M. Schubert TNT Workshop 2017, Technical University Dresden, Germany, June 2017
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516. |
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Invited The physics of low symmetry metal oxides with special attention to phonons, plasmons and excitons and their potential uses in power electronics and quantum technologies M. Schubert Advanced Functional Material colloquium, Linkoping University, Vadstena, Sweden, December 2017
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515. |
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Optical and electronic properties of monoclinic Ga2O3 unravelled M. Schubert, A. Mock, R. Korlacki, S. Knight, V. Darakchieva, B. Monemar, H. Murakami, Y. Kumagai, K. Goto, and M. Higashiwaki 2nd International Workshop on Ga2O3 and Related Materials, Parma, Italy, September 2017
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514. |
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Invited Ellipsometry on and with anisotropic materials M. Schubert, A. Mock, R. Korlacki, C. Briley, and S. Knight Ellips User Workshop, Prague, Dolni Brezany, Czech Republic, October 2017
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513. |
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Band-to-band transitions and hole effective mass anisotropy in ?-Ga2O3 R. Korlacki, A. Mock, and M. Schubert 2nd International Workshop on Ga2O3 and Related Materials, Parma, Italy, September 2017
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512. |
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Magneto-optical response of slanted columnar heterostructured thin films C. Briley, D. Sekora, A. Mock, R. Skomski, E. Schubert, and M. Schubert Magnetism and Magnetic Materials Conference, Pittsburgh, Pennsylvania, U.S.A., November 2017
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511. |
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Nanofabrication of GLAD Structures: A Comparison of Ion and Electron Beam Deposition Methods J. Tran, R. Feder, M. Hilfiker, and E. Schubert UNL Summer Research Symposium, Lincoln, Nebraska, U.S.A., August 2017
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510. |
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Terahertz frequency-domain ellipsometry P. Kuehne, N. Armakavicius, V. Stanishev, C.M. Herzinger, M. Schubert, and V. Darakchieva OptoX NANO, Okayama, Japan, November 2017
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2016:> |
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509. |
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Generalized spectroscopic ellipsometry: determination of orthorhombic optical properties of bi-layer Co-FeNi slanted columnar thin films
D. Sekora, C. Briley, T. Hofmann, M. Schubert, and E. Schubert ICSE-7, Berlin, Germany, June 2016
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508. |
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Invited The eigen polarization model for monoclinic and triclinic symmetries: Generalized ellipsometry analysis from the far infrared to the deep ultra violet for single crystalline beta gallium oxide A. Mock, R. Korlacki, C. Briley, S. Knight, S. Schoche, T. Hofmann, V. Darakchieva, E. Janzen, B. Monemar, D. Gogova, Q.-T. Thieu, R. Togashi, H. Murakami, Y. Kumagai, K. Goto, A. Kuramata, S. Yamakoshi, M. Higashiwaki, E. Schubert, and M. Schubert ICSE-7, Berlin, Germany, June 2016
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507. |
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Hydrogen intercalation induced anisotropy of free charge carrier mobility in epitaxial graphene revealed by THz Optical Hall effect measurements P. Kuhne, N. Armakavicius, C. Bouhafs, V. Stanishev, T. Hofmann, R. Yakimova, C. Colleti, M. Schubert, and V. Darakchieva ICSE-7, Berlin, Germany, June 2016
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506. |
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Tribrid EC-GSE-QCMD Analysis: Surface topography effects on the electrochromic behavior of methylene blue
D. Sekora, A. J. Zaitouna, U. Kilic, T. Hofmann, R. Y. Lai, M. Schubert, and E. Schubert ICSE-7, Berlin, Germany, June 2016
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505. |
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Vector magneto-optical generalized ellipsometry on nanostructured magnetic thin films of complex anisotropy C. Briley, A. Mock, R. Korlacki, T. Hofmann, E. Schubert, R. Skomski, and M. Schubert ICSE-7, Berlin, Germany, June 2016
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504. |
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In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene S. Knight, C. Bouhafs, N. Armakavicius, P.Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann ICSE-7, Berlin, Germany, June 2016
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503. |
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THz-MIR ellipsometry characterization of chromia thin films S. Knight, S. Schöche, V. Darakchieva, P. Kühne, C.M. Herzinger, J.A. Woollam, M. Schubert, C. Binek, M. Street, P. Dowben, and T. Hofmann Nebraska MRSEC Review, Lincoln, NE, March 2016
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502. |
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Imaging Ellipsometry of Cells Cultured on Optically Anisotropic
Nanostructured Surfaces T. Kasputis, D. Peev, A. Nguyen, A. Mantz, E. Franke-Schubert, A. K. Pannier, and M. Schubert ICSE-7, Berlin, Germany, June 2016
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501. |
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Invited Anisotropy: A key to detection and separation in physical, chemical and biological investigations using linear optical spectroscopy and imaging M. Schubert Advanced Functional Materials Workshop, Linkoping University, Linkoping, Sweden, August 2016
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500. |
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Invited Plenary talk Electronic materials with monoclinic and triclinic symmetries, and the anisotropy contrast microscopy imaging concept M. Schubert ICSE-7, Berlin, Germany, June 2016
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499. |
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Invited Institute Colloquium Nebraska Center for Nanohybrid Functional Materials M. Schubert Leibniz Institute for Polymer Research IPF, Dresden, Germany, January 2016
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498. |
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Invited Seminar (Prof. Olle Inganas) Promoting a revolution in power electronics: Characterizing anisotropy, phonons, band-to-band transitions and free charge carriers in monoclinic metaloxides M. Schubert Linkoping University, Linkoping, Sweden, May 2016
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497. |
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Invited Ellipsometry and Nanostructures: A new paradigm in microscopy – The anisotropy contrast microscopy using glancing angle deposited nanostructured thin films M. Schubert Optical Interference Coatings (OIC), Loews Ventana Canyon, Tucson, Arizona, USA, June 2016
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496. |
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Functionalized Three-Dimensional Spatially Coherent Thin Films for Biomaterial Applications M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, A. Pannier, D. Sekora, C. Rice, E. Schubert, M. Schubert, K.-J. Eichhorn, M. Stamm, and P. Uhlmann MRS Fall Meeting, Boston, MA, November-December 2016
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495. |
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Combined Quartz Crystal Microbalance with Dissipation and Generalized Ellipsometry to Characterize the Deposition of Titanium K. B. Rodenhausen, N. Kananizadeh, C. Rice, J. Lee, D. Sekora, M. Schubert, E. Schubert, S. Bartelt-Hunt, and Y. Li AIChE Annual Meeting, San Francisco, C, November 2016
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494. |
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Invited 12th IPF Colloquium Anisotropic Optical Contrast Microscopy and functionalized nanostructured surfaces: A new imaging modality for small molecule detection and cell-surface interactions M. Schubert Leibniz Institute for Polymer Research (IPF), Dresden, November 2016
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493. |
|
In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, and T. Hofmann SPIE Optics+Photonics, San Diego, CA, August-September 2016
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492. |
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Invited New developments for in-situ and imaging ellipsometry applications in biology and life sciences M. Schubert First Northern Ellipsometry Workshop Sweden (NEWS), Linkoping, Sweden, November 2016
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2015:> |
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491. |
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Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies S. Knight, S. Schoeche, V. Darakchieva, P. Kuehne, C.M. Herzinger, M. Schubert, and T. Hofmann UNL Graduate Research Fair, Lincoln, NE, April 11 2015
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490. |
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3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann 9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015
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489. |
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Transmission Mueller Matrix Imaging Microscope D. Peev, C. Rice, M. Schubert, and T. Hofmann J. A. Woollam Symposium, Lincoln, NE, June 6 2015
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488. |
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3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann UNL Graduate Research Fair, Lincoln, NE, April 14 2015
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487. |
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Optical Anisotropy of Porous Polymer Film with Inverse Slanted Nanocolumnar Structure Revealed via Generalized Ellipsometry D. Liang, D. Sekora, C. Rice, E. Schubert, and M. Schubert UNL Graduate Research Fair, Lincoln, NE, April 14 2015
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486. |
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Mueller Matrix Birefringence Microscopy of Mouse Fibroblasts using Anisotropic Nanostructured Surfaces T. Kasputis, C. Rice, D. Peev, T. Hofmann, E. Schubert, A.K. Pannier, and M. Schubert 9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015
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485. |
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Nanostructured Columnar Thin Films Enhance Protein Adsorption and Cell-Material Interactions T. Kasputis, A. Pieper, E. Schubert, M. Schubert, and A.K. Pannier American Institute of Chemical Engineers Annual Meeting, Atlanta, GA, Month 2015
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484. |
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Direct Band Structure Based Modeling of Graphene: from the THz to the UV A. Boosalis, W. Li, N. Nguyen, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, M. Schubert, and T. Hofmann 9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th 2015
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483. |
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1st PLACE WINNER Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-Dimensional Nanostructured Surfaces Studied by in-situ EC and Generalized Ellipsometry D. Sekora, A. J. Zaituna, T. Hofmann, R. Y. L. Lai, M. Schubert, and E. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2015
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482. |
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Observation of a Reversible Phase Transition in the Dielectric Function Response of Si Nanostructures upon Li Intercalation using Generalized Ellipsometry D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert 42nd ICMCTF, San Diego, CA, April 2015
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481. |
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Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-dimensional Nanostructured Surfaces Studied by in-situ EC, QCM-D and Generalized Spectroscopic Ellipsometry D. Sekora, A. J. Zaituna, T. Hofmann, R. L. Y. Lai, M. Schubert, and E. Schubert 42nd ICMCTF, San Diego, CA, April 2015
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480. |
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3rd Place Winner (ECE Dept.) & Commendation Award (College of Engineering) Enhanced Temperature Stability of Slanted Columnar Thin Films by ALD Overcoating Alyssa Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2015
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479. |
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Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann 11th ICNS, Beijing, China, August 2015
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478. |
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Spectroscopic Ellipsometry FT Student award winner Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015
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477. |
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Vector magneto-optical generalized ellipsometry on heat treated sculptured think films: A study of the effects of Al2O3 passivation coatings on magneto-optical properties C. Briley, A. Mock, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015
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476. |
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The Effect of Annealing and Alumina Passivation on Structural and Optical Properties of Cobalt-Oxide Core-Shell Slanted Columnar Thin Films A. Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October 2015
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475. |
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2nd Place Winner (ECE Dept.) Anisotropic Plasmon Resonances in Nanostructured Thin Films: An Optical Model Approach C. Briley, D. Sekora, T. Hofmann, E. Schubert, and and M. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2015
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474. |
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Anisotropic Magneo-Optical Hysteresis of Permalloy Slanted Columnar Thin Films Determined by Vector Magneto-Optical Generalized Ellipsometry C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and and M. Schubert WSE-9, Twente, Netherlands, February 2015
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473. |
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VMOGE on annealed Cobalt slanted columnar thin films (Co-SCTF) C. Briley, A. Mock, T. Hofmann, E. Schubert, and M. Schubert J.A. Woollam Symposium, Lincoln, NE, August 2015
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472. |
|
Cavity-enhanced THz optical Hall effect and graphene-based environmental sensing S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann J.A. Woollam Symposium, Lincoln, NE, August 2015
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471. |
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Invited Seminar (Prof. M. Stamm) The Invisible Light M. Schubert Leibniz Institute for Polymer Research IPF, Dresden, Germany, May 2015
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470. |
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Invited (hedersdoctor ceremony) The Invisible Light M. Schubert Linkoping University, Linkoping, Sweden, May 2015
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469. |
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Anisotropy, Phonon Modes and Band-to-Band Transitions in Single-Crystal Monoclinic Beta-Ga2O3 Determined by THz to VUV Generalized Ellipsometry M. Schubert, R. Korlacki, S. Schoeche, V. Darakchieva, B. Monemar, K. Goto, K. Nomura, H. Murakami, Q.-T. Thieu, R. Togashi, Y. Kumagai, A. Kuramata, M. Higashiwaki, A. Koukitu, S. Yamakoshi, E. Janzén, D. Gogova, M. Schmidbauer, and Z. Galazka International Workshop on Gallium Oxide and Related Materials 2015 (IWGO 2015), Kyoto, Japan, November 2015
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468. |
|
Invited The Invisible Light M. Schubert The International Conference on Optics of Surfaces and Interfaces (OSI-11), Austin TX, USA, June-July 2015
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2014:> |
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467. |
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Combinatorial QCM-D/GE-Study of Swelling of and Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann 8th Workshop Ellipsometry, Dresden, Germany, March 2014
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466. |
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Talk Phonon mode behavior and free-charge carrier parameters in high-Al content AlGaN determined by IR spectroscopic Ellipsometry and optical Hall effect S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A.
Kakanakova-Georgieva, E. Janzén, and V. Darakchieva
8th Workshop Ellipsometry, Dresden, Germany, March 2014
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465. |
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Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E.
Janzén, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and T.
Hofmann
8th Workshop Ellipsometry, Dresden, Germany, March 2014
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464. |
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Permanent Magnet Based THz Optical Hall Effect on AlInN/GaN High Electron Mobility Transistor Structures S. Knight, S. Schöche, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann EPSCoR External Review Panel, Lincoln, NE, August 19 2014
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463. |
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Instrument Development: 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann EPSCoR External Review Panel, Lincoln, NE, August 19 2014
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462. |
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Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2014
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461. |
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Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert EPSCoR External Review Panel, Lincoln, NE, August 19 2014
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460. |
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2nd PLACE WINNER In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation D. Sekora, D. Schmidt, R. Y. Lai, M. Schubert, and E. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2014
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459. |
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In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation D. Sekora, R. L. Y. Lai, D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert EPSCoR External Review Panel, Lincoln, NE, August 2014
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458. |
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In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert 61st AVS Symposium, Baltimore, Maryland, November 2014
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457. |
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Infrared Optical Hall effect in epitaxial graphene V. Darakchieva, V. Stanishev, I.G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann 4th Graphene, Toulouse, France, May 2014
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456. |
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Spectroscopic Ellipsometry FT Student award winner Vector Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films with Forward Calculated Uniaxial Response Simulation C. Briley, T. Hofmann, D. Schmidt, E. Schubert, and M. Schubert AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014
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455. |
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Dielectric Tensor Model for Inter Landau-level Transitions in Highly Oriented Pyrolytic Graphite and Epitaxial Graphene – Symmetry Properties, Energy Conservation and Plasma Coupling P. Kühne, T. Hofmann, M. Schubert, C.M. Herzinger, and V. Darakchieva AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014
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454. |
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The Development Of Highly-Oriented 3D Nanostructures For Use With Ultra-Thin Layer Chromatography And Ellipsometry Erika L. Pfaunmiller, Sandya Beeram, C. Rice, D. Peev, T. Hofmann, M. Schubert, and D. S. Hage AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November 2014
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453. |
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Improved Design for Highly Efficient Hybrid Photovoltaic Devices Alyssa Mock, Cesar Rodriquez, T. Hofmann, E. Schubert, and M. Schubert EPSCoR External Review Panel Visit, Lincoln, NE, August 2014
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452. |
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Low Temperature Atomic Layer Deposition and RF Magnetron Sputtering of ZnO for use as Transparent Conductive Oxides Cesar Rodriguez, Alyssa Mock, T. Hofmann, E. Schubert, and M. Schubert EPSCoR External Review Panel Visit, Lincoln, NE, August 2014
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451. |
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Improved Design for Highly Efficient Hybrid Photovoltaic Devices Alyssa Mock, D. Schmidt, D. Sekora, E. Schubert, and M. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2014
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450. |
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Invited Institute Colloquium Generalized Ellipsometry and the Optical Hall effect: Characterization of Anisotropic Materials from single crystalline to complex-structured Mediums M. Schubert Leibniz Institute for Crystal Growth IKZ, Berlin, Germany, March 2014
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449. |
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From QCM(D)-Ellipsometry combination to Birefringence Imaging Chromatography and Birefringence Microscopy using Sculptured Columnar Thin Films (SCTF) M. Schubert 7th Workshop Ellipsometry (WSE-7), Dresden, Germany, March 2014
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448. |
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Infrared optical Hall effect in epitaxial graphene on 3C- and 4H-SiC V. Stanishev, P. Kühne, T. Hofmann, M. Schubert, A. Zakharov, T. Iakimov, J. ul Hassan, E. Janzén, R. Yakimova, and V. Darakchieva Graphene 2014, Lanzarote, Spain, February 18 – 21 2014
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447. |
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Shedding light on the nature of epitaxial graphene on C-face SiC V. Darakchieva, P. Kühne, V. Stanishev, I. G. Ivanov, C. Bouhafs, T. Iakimov, A. Zakharov, T. Hofmann, M. Schubert, and R. Yakimova International Conference on Nanoscience + Technology , Veil, Colorado, July 2014
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446. |
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Infrared Optical Hall effect in epitaxial graphene V. Darakchieva, V. Stanishev, I. G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann Graphene week, Gothenburg, Sweden, June 23-27 2014
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445. |
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Capture of macromolecules by polymeric brushes anchored on three-dimensional spatially coherent thin films K.B. Rodenhausen, D. Sekora, K.-J. Eichhorn, E. Schubert, M. Schubert, M. Stamm, and P. Uhlmann 8th ECNP International Conference on Nanostructured Polymers and Nanocomposites, Dresden, Germany, Sep. 16-19 2014
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444. |
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Adaptive Optics S. Knight, C. Rice, T. Hofmann, E. Schubert, and M. Schubert J.A. Woollam Symposium, Lincoln, NE, June 2014
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2013:> |
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443. |
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Fabrication and optical modeling of nanohybrid functional slanted columnar thin films D. Schmidt, M. Junige, J.W. Bartha, E. Schubert, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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442. |
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Vector Magneto-Optical Generalized Ellipsometry Magnetization Mapping of Sculptured Thin Films C. Briley, D. Schmidt, E. Schubert, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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441. |
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Talk Sub-10 nm Cobalt Nanowires Building via Phase Separation: Synthesis, Simulation, and Characterization
Y. Tian, Z. Xu, D. Schmidt, T. Jayaraman, C. Briley, J. Shield, M. Schubert, and E. Schubert 2013 TMS Annual Meeting & Exhibition, San Antonio, TX, March 2013
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440. |
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Biomolecule Loading within Nanostructured Thin Films as Cell-Instructive Surfaces for Drug and Gene Delivery T. Kasputis, D. Schmidt, K.B. Rodenhausen, D. Sekora, M. Koenig, K.-J. Eichhorn, P. Uhlmann, M. Stamm, E. Schubert, M. Schubert, and A.K. Pannier ICSE-VI, Kyoto, Japan, May 2013
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439. |
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Talk Detection of organic adsorption onto three-dimensional nanostructure layers with generalized ellipsometry K.B. Rodenhausen, D. Schmidt, R.S. Davis, D. Sekora, R. Neupane, T. Kasputis, A.K. Pannier, E. Schubert, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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438. |
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Talk Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping
S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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437. |
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Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4 S. Schöche, W. Dollase, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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436. |
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Poster Award Winner Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzen, N.B. Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann UNL Graduate Research Fair and Symposium, Lincoln, Nebraska, April 2013
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435. |
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Talk Evaluation of a metal-organic precursor with regard to a gold ALD process by utilizing in-situ spectroscopic ellipsometry
M. Junige, D. Schmidt, S.T. Barry, J.W. Bartha, and M. Schubert
ALD 2013, San Diego, CA, July 2013
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434. |
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Invited Periodic nanostructured thin films E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert 2013 MRS Fall Meeting, Boston, MA, December 2013
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433. |
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Talk Detection of temperature dependent electron confinement in AlGaN/GaN heterostructures by THz optical Hall-effect measurements T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva ICSE-VI, Kyoto, Japan, May 2013
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432. |
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Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C. R. Eddy, Jr., D. K. Gaskill, M. Schubert, and T. Hofmann ICSE-VI, Kyoto, Japan, May 2013
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431. |
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Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on SiC: Influence of Growth, SiC Polymorph, and H-Intercalation A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, V. Darakchieva, R. Yakimova, and M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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430. |
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THz dielectric anisotropy of metal slanted columnar thin films: Ellipsometric characterization and Sensor applications T. Hofmann, D. Schmidt, P. Kühne, C. M. Herzinger, J. A. Woollam, M. Schubert, and E. Schubert ICSE-VI, Kyoto, Japan, May 2013
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429. |
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Talk Recent progress in understanding free-charge carrier and structural properties of InN:Mg
M.-Y. Xie, S. Schöche, N. Ben Sedrine, F. Tasnadi, B. Monemar, T. Hofmann, M. Schubert, X. Wang, A. Yoshikawa, K. Wang, Y. Nanishi, and V. Darakchieva
E-MRS 2013 SPRING MEETING, Strasbourg, France, May 2013
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428. |
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Combinatorial QCM-D/GE-Study of Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces M. Koenig, T. Kasputis, D. Schmidt, K. B. Rodenhausen, K.-J. Eichhorn, A. K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann ICSE-VI, Kyoto, Japan, May 2013
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427. |
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Talk Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert AVS 60th Annual International Symposium, Long Beach, CA, October 2013
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426. |
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Talk Protein-Loaded Slanted Columnar Thin Films As Novel Biomaterials for Enhancing Cell-Surface Interactions T. Kasputis, K.B. Rodenhausen, A. Pieper, D. Schmidt, D. Sekora, E. Schubert, M. Schubert, and A.K. Pannier 2013 AIChE Annual Meeting, San Francisco, CA, November 2013
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425. |
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Talk Direct Band Structure Based Modeling of Graphene: from the THz to the UV A. Boosalis, W. Li, N. Nguyen, M. Real, R. Elmquist, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, R. Myers-Ward, V. Wheeler, C. Eddy, D. Gaskill, M. Schubert, and T. Hofmann AVS 60th Annual International Symposium, Long Beach, CA, October 2013
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424. |
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Talk Optical Hall effect – Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC P. Kühne, M. Schubert, V. Darakchieva, R. Yakimova, D.K. Gaskill, R.L. Myers-Ward, C.R. Eddy Jr., J.D. Tedesco, C.M. Herzinger, J.A. Woollam, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October 2013
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423. |
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Optical Properties of Graphene-Coated Cobalt GLAD Structures
P. Wilson, D. Schmidt, E. Schubert, M. Schubert, T. Hofmann, and A. Sinitskii1
2013 MRS Fall Meeting, Boston, MA, November 2013
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422. |
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In-situ Quantification of Cetyltrimethylammonium Bromide Adsorption Within Metal Nanorod Arrays by Generalized Transmission Ellipsometry
C. Rice, T. Hofmann, K.B. Rodenhausen, D. Sekora, D. Schmidt, E. Pfaunmiller, D. Hage, E. Schubert, and M. Schubert 23rd National NSF EPSCoR Conference, Nashville, TN, November 2013
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421. |
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In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries D. Sekora, D. Schmidt, R. L. Y. Lai, M. Schubert, and E. Schubert UNL Graduate Research Fair, Lincoln, NE, April 2013
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420. |
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In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries D. Sekora, D. Schmidt, R. Y Lai, M. Schubert, and E. Schubert EPSCoR External Review Panel, Lincoln, NE, August 2013
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419. |
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Invited Tutorial in honor of Professor Manuel Cardona The influence on optical spectra by phonons, plasmons, excitons, i.e., polaritons M. Schubert ICSE-VI, Kyoto, Japan, May 2013
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418. |
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ALD von dünnen, konformen Metall- und Metalloxidschichten an GLAD Dünnfilmen M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, Marcel Junige, and Johann W. Bartha XX. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Vogtland, Germany, March 2013
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417. |
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Invited Institute Colloquium Generalized Ellipsometry – from birefringence chromatography to the Optical Hall effect in epitaxial graphene M. Schubert Johannes Kepler University, Linz, Austria, March 2013
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416. |
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Invited Institute Colloquium New Sensing and Separation Principles based on Nanohybrid Functional Materials M. Schubert Leibniz Institute for Polymer Research IPF, Dresden, Germany, September 2013
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415. |
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Invited Industry Seminar Novel concepts in Generalized Ellipsometry, Plasmonics, and Sensing Principles using anisotropic nanostructures M. Schubert Seagate Technologies, Minneapolis, MS , December 2013
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414. |
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Invited Institute Colloquium The Optical Hall effect in epitaxial graphene and semiconductor heterostructures M. Schubert, and T. Hofmann College of Nanoscale Science, Center for Nanoscale Metrology, SUNY at Albany, Albany, NY, October 2013
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413. |
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Invited Institute Colloquium New Sensing and Separation Principles based on Glancing Angle Deposited Nanohybrid Functional Materials and Birefringent THz-VUV Plasmonics
M. Schubert University of Utah, Salt Lake City, UA, November 2013
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2012:> |
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412. |
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Changes in Graphene Optical Properties Induced by Hydrogen Intercalation A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, and M. Schubert 2012 MRS Fall Meeting, Boston, MA, November 2012
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411. |
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Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert 2012 MRS Fall Meeting, Boston, MA, November 2012
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410. |
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Control and switching of the interaction of model proteins with polymer brushes P. Uhlmann, E. Bittrich, K.-J. Eichhorn, M. Müller, K. B. Rodenhausen, M. Schubert, and M. Stamm American Chemical Society Spring Meeting, Symposium Proteins at Interfaces, San Diego, CA, March 2012
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409. |
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Fabrication and Characterization of GLAD Sculptured Thin Films Functionalized with Grafted-To Polymer Brushes T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, P. Uhlmann, A. K. Pannier, M. Schubert, and M. Stamm 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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408. |
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Talk Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films D. Schmidt, C. Briley, E. Schubert, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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407. |
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Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films D. Schmidt, E. Schubert, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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406. |
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Talk Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films K. B. Rodenhausen, D. Schmidt, T. Kasputis, A. K. Pannier, E. Schubert, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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405. |
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Metal slanted columnar thin film THz optical sensors T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C.M. Herzinger, J.A. Woollam, E. Schubert, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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404. |
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GLAD Sculptured Thin Films Functionalized with Polymer Brushes T. Kasputis, M. König, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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403. |
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The Optical-Hall Effect P. Kühne, T. Hofmann, A. Boosalis, S. Schöche, D. Schmidt, C. M. Herzinger, J.A. Woollam, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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402. |
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Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4 S. Schöche, W. Dollase, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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401. |
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Talk Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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400. |
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Poster Award Winner Spectroscopic Ellipsometry and optical Hall-Effect study of free-charge carriers in InN:Mg - Indications for successful p-type doping S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012
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399. |
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Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012
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398. |
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Talk Slanted columnar thin films functionalized with polymer brushes T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann AIChE Annual Meeting, Pittsburg, PA, October 2012
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397. |
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GLAD sculptured thin films functionalized with polymer brushes T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2012
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396. |
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Invited New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films M. Schubert 65th IUVSTA Workshop, Peckforton Castle, UK, May 2012
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395. |
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Invited Ellipsometry for magnetics, metamaterials, chiral structures, and photonic crystals M. Schubert 7th Workshop Ellipsometry, Leipzig, Germany, March 2012
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394. |
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Spectroscopic Ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg - Indications for succesful p-type doping S. Schöche, T. Hofmann, V. Darakchieva, N.B. Sedrine, X.~Wang, A. Yoshikawa, and M. Schubert International Workshop on Nitride Semiconductors 2012, Sapporo, Japan, October 2012
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393. |
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Talk Biochemical Optical Sensors Based on Highly-Ordered Slanted Columnar Thin Films D. Schmidt, K.B. Rodenhausen, J. VanDerslice, T.E. Tiwald, E. Schubert, and M. Schubert AVS 59th Annual International Symposium, Tampa, FL, October 2012
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392. |
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Fano Interference Effects in Hydrogen Intercalated Graphene A. Boosalis, T. Hofmann, R. Elmquist, M. Real, and M. Schubert AVS 59th International Symposium, Tampa, FL, October 2012
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391. |
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Smart polymer brushes investigated with combined ellipsometry and quartz crystal microbalance M. Koenig, K. B. Rodenhausen, D. Schmidt, K.-J. Eichhorn, M. Stamm, M. Schubert, and P. Uhlmann Makro 2012 - Smart Polymers, Mainz, Germany, October 2012
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390. |
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Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films K. B. Rodenhausen, D. Schmidt, T. Kasputis, A.K. Pannier, E. Schubert,, and M. Schubert Physical Chemistry of Biointerfaces II, San Sebastian, Spain, July 9-14, 2012
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389. |
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Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert EPSCoR External Review Panel, Lincoln, NE, August 2012
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388. |
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Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert Nanoscience Symposium, Lincoln, NE, October 2012
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387. |
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Invited Institute Seminar Nebraska Center for Nanohybrid Functional Materials - Progress report 2012 M. Schubert Leibniz Institute for Polymer Research (IPF), Dresden, September 2012
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386. |
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Invited Industry Seminar Nebraska Center for Nanohybrid Functional Materials - Progress report 2012 M. Schubert LiCOR Biosciences, Lincoln, NE, December 2012
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385. |
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Invited Institute Seminar New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films M. Schubert Linkoping University, Linkoping, Sweden, December 2012
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384. |
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Invited New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials M. Schubert NSF-MRSEC QSPIN Industry Workshop, Lincoln, NE, March 2012
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383. |
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Invited New chemical, biochemical and biological sensing and separation principles based on highly ordered 3-D nanohybrid materials thin films M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, K. Rodenhausen, and J. Gerasimov Leibniz Institute for Surface Modification - Erfahrungsaustausch: Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Erzgebirge, March 2012
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382. |
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Invited Institute Colloquium Generalized Ellipsometry: Principles and Applications M. Schubert Naval Research Laboratories, Washington DC, May 2012
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381. |
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Invited Tutorial In-situ Ellipsometry M. Schubert Naval Research Laboratories, Washington DC, May 2012
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380. |
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Invited Institute Colloquium Generalized Ellipsometry: Principles and Applications M. Schubert United States Department of Commerce - National Institute of Standards and Technology, Gaithersburg, Maryland, May 2012
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379. |
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Invited Generalized Ellipsometry: Principles and Applications M. Schubert Physics Department, University of Nebraska-Kearney, Kearney, NE, April 2012
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2011:> |
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378. |
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Talk THz Optical Hall Effect in Epitaxial Graphene
T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
NCMN Grapnene Colloquium, Lincoln, NE, March 2011
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377. |
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Talk THz dielectric anisotropy of metal slanted columnar thin films T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert AVS 58th International Symposium, Nashville, TN, October 2011
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376. |
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Optical properties of graphene on SiC polytypes determined by spectroscopic ellipsometry from the terahertz to the VUV A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr.,
D.K. Gaskill, and M. Schubert Nano-DDS, New York, NY, August 2011
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375. |
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Optical Properties of Graphene on SiC polytypes Determined by Spectroscopic Ellipsometry
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
International conference on SiC and related materials, Cleveland,OH, September 2011
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374. |
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Spectroscopic Ellipsometry and Optical Hall-Effect Studies of Free-Charge Carriers in P-Type InN:Mg. S. Schöche, T. Hofmann, N.B. Sedrine, V. Darakchieva, B. Monemar, X.~Wang, A. Yoshikawa, and M. Schubert 2011 MRS Fall Meeting, Boston, MA, November 2011
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373. |
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Optical Properties of Graphene on Multiple Substrates Determined by Spectroscopic Ellipsometry from the Terahertz to the VUV A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, R. Yakimova, V. Darakchieva, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, D. K. Gaskill, and M. Schubert 2011 MRS Fall Meeting, Boston, MA, November 2011
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372. |
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THz Dielectric Anisotropy of Metal Slanted Columnar Thin Films T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert 2011 MRS Fall Meeting, Boston, MA, November 2011
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371. |
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Invited Epitaxial graphene grown by high temperature sublimation R. Yakimova, V. Darakchieva, R. Yazdi, J. Jenssen, A. Boosalis, T. Hofmann, and M. Schubert 3rd International Symposium on the Science and Technology of Epitaxial Graphene, St. Augustine, FL, October 2011
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370. |
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Talk Application of spectroscopic ellipsometry techniques to the studies of epitaxial graphene grown by high-temperature sublimation V. Darakchieva, A. Boosalis, T. Hofmann, M. Schubert, T. Iakimov, and R. Yakimova Workshop for Graphene Synthesis and Characterisation for Applications, Lake Windermere, UK, November 2011
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369. |
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Paul Drude Medal Winner Generalized Ellipsometry on Sculptured Thin Films made by Glancing Angle Deposition D. Schmidt, E. Schubert, and M. Schubert Workshop Ellipsometry, Berlin, Germany, February 2011
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368. |
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Talk Hole-channel conductivity in epitaxial graphene determined by terahertz optical Hall-effect and midinfrared ellipsometry T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert APS, Dallas, March 2011
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367. |
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Talk THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann APS, Dallas, March 2011
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366. |
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Talk Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films D. Schmidt, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert APS, Dallas, March 2011
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365. |
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THz optical Hall effect in multi valley band materials P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger, and M. Schubert 6th Workshop Ellipsometry, Berlin, Feb 2011
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364. |
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Free-Charge Carrier Properties of Graphene Layers on SiC T. Hofmann, A. Boosalis, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert 6th Workshop Ellipsometry, Berlin Germany, February 2011
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363. |
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THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann 6th Workshop Ellipsometry, Berlin Germany, February 2011
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362. |
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Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert 6th Workshop Ellipsometry, Berlin Germany, February 2011
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361. |
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Poster Award Winner THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann UNL Graduate Research Symposium, Lincoln, NE, April 2011
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360. |
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Outstanding Presentation Award Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic, ultra-thin films K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, T. Hofmann, A. K. Pannier, R. Y. Lai, T. E. Tiwald, and M. Schubert UNL E-Week Graduate Student Research Symposium, Lincoln, NE, April 2011
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359. |
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Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2011
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358. |
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2nd Prize Topical Focus Ellipsometry Session Vector-Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films D. Schmidt, C. Briley, E. Schubert, and M. Schubert AVS 58th International Symposium, Nashville, TN, October 2011
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357. |
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Talk Manipulating the Optical Properties of Metals: Sculptured Thin Films coated by Atomic Layer Deposition D. Schmidt, N. Ianno, E. Schubert, and M. Schubert AVS 58th International Symposium, Nashville, TN, October 2011
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356. |
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Talk Optical Properties of Graphene on MgO and SiC Polytypes Determined by Spectroscopic Ellipsometry A. Boosalis, T. Hofmann, S. Schöche, P.A. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, D.K. Gaskill, and M. Schubert AVS 58th International Symposium, Nashville, TN, October 2011
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355. |
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Applied Surface Science Division Student Award Winner THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann AVS 58th International Symposium, Nashville, TN, October 2011
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354. |
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Functionalization of Sculptured Thin Films with Atomic Layer Deposition D. Schmidt, N. Ianno, E. Schubert, and M. Schubert 2011 MRS Fall Meeting, Boston, MA, November 2011
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353. |
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Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films D. Schmidt, C. Briley, E. Schubert, and M. Schubert 2011 MRS Fall Meeting, Boston, MA, November 2011
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352. |
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1st Prize Topical Focus Ellipsometry Session Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films T. Kasputis, D. Schmidt, K.B. Rodenhausen, H. Wang, A.K. Pannier, and M. Schubert AVS 58th International Symposium, Nashville, TN, October 2011
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351. |
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Talk Real-time SE/QCM-D Characterization of Biomolecule Adsorption within Sculptured Thin Films T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert AIChE Annual Meeting, Minneapolis, MN, October 2011
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350. |
|
Real-time SE/QCM-D characterization of protein adsorption within sculptured thin films T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert UNL Graduate Research Fair and Symposium, Lincoln, NE, April 2011
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349. |
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Invited Institute Colloquium Sensing and separation principles using 3D nanostructures M. Schubert Leibniz Institute for Polymer Research IPF, Dresden, Germany, October 2011
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348. |
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THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in a HfO2 passivated AlGaN/GaN HEMT structure S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann 9th International Conference on Nitride Semiconductors (ICNS-IV), Glasgow, Scotland, July 2011
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347. |
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Invited Department Seminar The Optical Hall-effect in semiconductor heterostructures M. Schubert Physics Department, University of Nebraska-Kearney, Kearney, NE, April 2011
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346. |
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Invited Department Seminar New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials M. Schubert Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, December 2011
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345. |
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Invited Institute Colloquium New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials M. Schubert Linkoping University, Linkoping, Sweden, December 2011
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344. |
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Invited Tutorial Generalized Ellipsometry M. Schubert Linkoping University, Linkoping, Sweden, December 2011
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343. |
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Invited Institute Seminar The Optical Hall-effect in semiconductor heterostructures M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, C.M. Herzinger, J.A. Woollam, V. Darakchieva, and B. Monemar United States Department of Engery - Sandia National Laboratories, Albuquerque, New Mexico, March 2011
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2010:> |
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342. |
|
Talk The influence of the SiC substrate on the free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry and optical Hall-effect T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ISSSR, Springfield, MO, June 2010
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341. |
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Invited Terahertz Ellipsoometry and the Optical Hall effect in Materials Science, M. Schubert M. Schubert European Winterschool on Ellipsometry NanoCharm3, Bad Hofgastein, Austria, February 2010
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340. |
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Invited Generalized THz to Ultraviolet ellipsometry in contemporary Semiconductor and Nanostructure research: Sculptured hybrid nanostructure thin films and sheet carrier characterization in InN and graphene M. Schubert Mini-workshop on Advanced Characterization technqiues in Materials Science, Instituto Technologico e Nuclear, Lisbon, Portugal, March 2010
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339. |
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Talk Free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert AVS 57th International Symposium, Albuquerque, NM, October 2010
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338. |
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Invited Optical Coatings from Sculptured Thin Films: Art and Promise E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, and M. Schubert SVC 2010, Orlando, FL, April 2010
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337. |
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Spectroscopic Ellipsometry for Metamaterials by Glancing Angle Deposition D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert ICSE-V, Albany, NY, May 2010
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336. |
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Talk Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May 2010
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335. |
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Research Presentation Winner "Best of Show"
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, M. Schubert, and E. Schubert E-Week, Lincoln, NE, April 2010
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334. |
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Optical Properties of Hybridized Nanostructures D. Schmidt, C. Müller, K. B. Rodenhausen, T. Hofmann, O. Inganäs, E. Schubert, and M. Schubert ICSE-V, Albany, NY, May 2010
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333. |
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Free-Charge Carrier Profiles of Iso- and Aniso-type Si Homojunctions A. Boosalis, T. Hofmann, J. Sik, and M. Schubert ICSE-V, Albany, NY, May 2010
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332. |
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Free-charge carrier properties of graphene layers on SiC T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert ICSE-V, Albany, NY, May 2010
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331. |
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THz optical Hall effect in multivalley band materials P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, and M. Schubert ICSE-V, Albany, NY, May 2010
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330. |
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Temperature dependent dielectric function of Al0.52In0.48P and Ga0.52In0.48P E. Montgomery, M. Schubert, T. Hofmann, C. Krahmer, and K. Streubel ICSE-V, Albany, NY, May 2010
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329. |
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Monitoring Protein Deposition on Self-Assembled Monolayers of Alkanethiols on Gold in-situ With Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner ICSE-V, Albany, NY, May 2010
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328. |
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Micelle-Assisted Bilayer Formation of CTAB Thin Films Studied with Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Techniques K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner ICSE-V, Albany, NY, May 2010
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327. |
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Spectroscopic Ellipsometry Analysis of Silicon Nitride Thin Films on Textured Silicon for Solar Cells M. F. Saenger, C. M. Herzinger, M. Schädel, J. Hilfiker, J. Sun, T. Hofmann, M. Schubert, and J. A. Woollam ICSE-V, Albany, NY, May 2010
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326. |
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Spectroscopic Ellipsometry Analysis of GaAs0.9-xNxSb0.1 Alloy Films Grown on GaAs N. B. Sedrine, C. Bouhafs, V. Darakchieva, J. C. Harmand, R. Chtourou, and M. Schubert ICSE-V, Albany, NY, May 2010
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325. |
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Invited Terahertz Ellipsometry T. Hofmann, C.M. Herzinger, and M.Schubert ICSE-V, Albany, NY, May 2010
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324. |
|
Talk Three Dimensional Aberration Corrected Lorentz Microscopy of Magnetic Structures C. Phatak, A. Petford-Long, E. Schubert, M. Schubert, D. Schmidt, and M. de Graef IMC17, Rio de Janeiro, BR, September 2010
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323. |
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Talk Agent-free bio-chemical sensing with sculptured thin films D. Schmidt, K. B. Rodenhausen, S. Schöche, E. Schubert, and M. Schubert ISSSR, Springfield, MO, June 2010
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322. |
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Free-Charge Carrier Properties of Graphene Layers on SiC T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert ICSE-V, Albany, NY, May 2010
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321. |
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Free-Charge Carrier Profiles of Iso- and Anisotype Si Homojunctions A. Boosalis, T. Hofmann, J. Šik, and M. Schubert ICSE-V, Albany, NY, May 2010
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320. |
|
Applied Surface Science Division Student Award Winner Agent-Free Bio-Chemical Sensing With Sculptured Thin Films D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, E. Schubert, and M. Schubert AVS 57th International Symposium, Albuquerque, NM, October 2010
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319. |
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Talk Optical, Magnetic, Magneto-Optical and Electrochemical Properties of Sculptured Thin Films E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, E. Montgomery, S. Schöche, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October 2010
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318. |
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In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May ICSE-V, Albany, NY, May 2010
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317. |
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In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May AVS 57th International Symposium, Albuquerque, NM, October 2010
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316. |
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Talk Monitoring protein deposition on self-assembled monolayers of alkanethiols on gold in-situ with combined quartz crystal microbalance and spectroscopic ellipsometry K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, and M. Schubert ICMCTF, San Diego, CA, April 2010
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315. |
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Talk Monitoring Ultra-Thin Organic Film Growth, in-situ, with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, M. Schubert, M. Solinsky, and T. E. Tiwald AVS Fall Meeting, Albuquerque, NM, October 2010
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314. |
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Free-charge Carrier Properties of Epitaxial Graphene Grown on SiC Investigated by THz and Infrared Ellipsometry and THz Optical-hall Effect. T. Hofmann, A. Boosalis, J. T. Tedesco, R. L. Myers-Ward, P. M. Campbell, C. R. Eddy, D. K. Gaskill, V. Shields, S. Shivaraman, M. G. Spencer, W. J. Schaff, and M. Schubert MRS Fall Meeting, Boston, December 2010
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313. |
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Talk Combinatorial SE/QCM-D Approach for Studying Porous Organic Ultra-thin Film Evolution K. B. Rodenhausen, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, M. Solinsky, and M. Wagner MRS Fall Meeting, Boston, MA, December 2010
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312. |
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THz Optical Hall-Effect in Multi-Valley Band Materials P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert E-Week, Lincoln, April 2010
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311. |
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Invited Generalized THz Ellipsometry characterization of novel materials towards THz electronics M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, and W.J. Schaff THz Workshop and User Meeting, BESSY-II, Berlin, GE, December 2010
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310. |
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Talk Development of Combinatorial, in-situ Spectroscopic Ellipsometry and Quartz Crystal Microbalance K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner ICSE-V, Albany, NY, May 2010
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309. |
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Talk THz Optical Hall-Effect in Multi-Valley Band Materials P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert E-week, Lincoln, April 2010
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308. |
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The corrugated interface strain coupled magnetostrictive-ferroelectric piezoelectric semiconductor device V. M. Voora, T. Hofmann, and M. Schubert Nebraska MRSEC Symposium, Lincoln, NE, October 2010
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307. |
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Invited Developments in Spectroscopic Ellipsometry for Characterization of Organic and Inorganic Surfaces, Interfaces and Complex Layered Materials M. Schubert AVS 57th International Symposium, Albuquerque, New Mexico, October 2010
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2009:> |
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306. |
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Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
F. Saenger, C. M. Herzinger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam MRS Fall Meeting, Boston, USA, December 2009
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305. |
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ZnO-BaTiO3-ZnO: Unipolar ferroelectric transistor structures with spontaneous interface charge
coupling for non-volatile switching applications
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
MRS Fall Meeting, Boston, USA, December 2009
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304. |
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Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E.Tiwald, M. Solinsky, and M. Wagner AVS 56th International Symposium, San Jose, CA, November 2009
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303. |
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Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry
T. Hofmann, C. M. Herzinger, J. A. Woollam, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November 2009
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302. |
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Invited Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry M. Schubert, E. Schubert, and T. Hofmann NSF-MRSEC QSPIN Symposium, Lincoln, NE, October 2009
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301. |
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Invited Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry M. Schubert, E. Schubert, and T. Hofmann Nano-DDS Army Research Office conference, Fort Lauderdale, FL, October 2009
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300. |
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Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert 5th Workshop Ellipsometry, Zweibrucken, March 2009
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299. |
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Monoclinic Optical Properties of Slanted Columnar Thin Films D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert 5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009
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298. |
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Talk Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert ICMCTF 2009, San Diego, CA, April 2009
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297. |
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THz Ellipsometry Materials Characterization T. Hofmann, C.M. Herzinger, and M. Schubert 5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009
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296. |
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IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam 5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009
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295. |
|
Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert 5th Workshop Ellipsometry, Zweibrücken, Germany, March 2009
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294. |
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Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann Graduate Student Poster Session, UNL, NE, April 2009
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293. |
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Materials Characterization using THz Ellipsometry. T. Hofmann, M. Schubert, and C. M. Herzinger MRS Spring Meeting, San Francisco, April 2009
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292. |
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Hybridized Nanostructures E. Montgomery, D. Schmidt, E. Schubert, and M. Schubert
E-Week, UNL, NE, April 2009
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291. |
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Characterizing AntiReflection Coatings on Textured Mono-Crystalline Silicon with Spectroscopic Ellipsometry J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam 34th IEEE Photovoltaic Specialists Conference, Philadelphia, PA, June 2009
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290. |
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Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
51st Electronic Materials Conference, University Park, Pennsylvania, June 2009
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289. |
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Talk Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert AVS 56th International Symposium, San Jose, CA, November 2009
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288. |
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Research Presentation Winner Optical and Structural Properties of Sculptured Thin Films D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
E-Week, UNL, NE, April 2009
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287. |
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Talk Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert MRS Fall Meeting, Boston, MA, November 2009
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286. |
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Talk Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert AVS 56th International Symposium, San Jose, CA, November 2009
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285. |
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Role of impurities and dislocations for the unintentional n-type conductivity in InN V. Darakchieva, N. P. Barradas, M. Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff 3rd South African Conference on Photonic Materials, Mabula, South Africa, March 2009
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284. |
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Structural anisotropy and free electron properties of a-plane InN V. Darakchieva, N. Franco, M. Schubert, C.L. Hsiao, L. C. Chen, Y. Takagi, and Y. Nanishi E-MRS Spring Meeting, Strasbourg, France, June 2009
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283. |
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Role of impurities and dislocations for the unintentional n-type conductivity in InN V. Darakchieva, N. P. Barradas, M.-Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff E-MRS Spring Meeting, Strasbourg, France, June 2009
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282. |
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Structural and free-electron properties of zinc-blende InN M.-Y. Xie, V. Darakchieva, F. Giuliani, B. Monemar, C.L. Hsiao, L.C. Chen, and M. Schubert E-MRS Spring Meeting, Strasbourg, France, June 2009
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281. |
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Hydrogen in InN V. Darakchieva, K. Lorenz, N. Barradas, E. Alves, M. Schubert, M.-Y. Xie, B. Monemar, W.J. Schaff, C.L. Hsiao, L.C. Chen, L.W. Tu, and Y. Nanishi 8th International Conference on Nitride Semiconductors, Jeju, Korea, October 2009
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280. |
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Influence of defects, dopants and surface orientation on free carrier properties of InN V. Darakchieva, M. Schubert, K. Lorenz, E. Alves, M.-Y. Xie, T. Hofmann, W. J. Schaff, L. C. Chen, L. W. Tu, and Y. Nanishi MRS Fall Meeting, Boston, USA, December 2009
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279. |
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Talk Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner QCM-D Scientific Conference, USA, New York City Metro Area, NJ, November 2009
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278. |
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Talk Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner UNL SE/QCM-D Mini-Symposium, Lincoln, NE, November 2009
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277. |
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Invited Institute Seminar Exploring the science of hybrid nanostructure materials by terahertz to ultraviolet genberalized ellipsometry M. Schubert Forschungszentrum Rossendorf, Dresden, August 2009
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2008:> |
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276. |
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Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann 2008 MRS Spring Meeting, San Francisco, March 25 2008
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275. |
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Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures M. Schubert, and T. Hofmann American Physical Society Meeting, New Orleans, Lousiana, March 2008
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274. |
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Magnetism of Undoped and Co-Doped TiO2 Clusters X. Wei, R. Skomski, M. Schubert, and D. Sellmyer American Physical Society Meeting, New Orleans, Lousiana, March 2008
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273. |
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THz resonances in chiral aluminum nanowires T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert 2008 MRS Spring Meeting, San Francisco, March 2008
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272. |
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Ferroelectric thin film field-effect transistors based on ZnO/BaTiO3 heterostructures
M. Brandt, H. Frenzel, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann 5th International Workshop on ZnO and related materials, Michigan, September 2008
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271. |
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Poster Award Winner THz Resonances in Chiral Aluminum Nanowires D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert E-Week Graduate Poster Session, Lincoln, NE, April 25 2008
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270. |
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Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert E-Week Graduate Poster Session, Lincoln, NE, April 25 2008
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269. |
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Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
E-Week Graduate Poster Session, Lincoln, NE, April 25 2008
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268. |
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Epitaxial ferroelectric BTO/ZnO heterostructures M. Brandt, H. Hochmuth, M. Lorenz, M. Schubert, V. Voora, and M. Grundmann 2nd International Symposium On Transparent Conductive Oxides, Hersonissos, Greece, October 2008
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267. |
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In-situ monitoring of p- and n-type doping in AlGaInP C. Krahmer, A. Behres, K. Streubel, and M. Schubert 14th International Conference of Metalorganic Vapor Phase Epitaxy, Metz, France, June 2008
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266. |
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Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger Brookhaven National Laboratory NSLS-CFN User Meeting, Brookhaven, May 2008
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265. |
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Spectroscopic ellipsometry characterization of SiNx antireflection films on textured
multicrystalline and monocrystalline silicon solar cells M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam 17th International Materials Research Conference, Cancún, Mexico, August 2008
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264. |
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Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann The 5th International Workshop on ZnO and Related Materials, Michigan, USA, September 2008
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263. |
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Talk Hybrid Nanocoil Sculptured Thin Films D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert 2008 MRS Fall Meeting, Boston, MA, December 2008
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262. |
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Talk Sculptured Thin Films from Aluminum E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert AVS 55th International Symposium, Boston, MA, October 2008
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261. |
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Talk Magnetically Active Nanospirals E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November 2008
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260. |
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Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam MRS Fall Meeting, Boston, MA, December 2008
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259. |
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Magnetically induced optical chirality in ZnMnSe M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert 53rd Magnetism and Magnetic Materials Conference, Austin, TX, November 2008
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258. |
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Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert MRS Fall Meeting, Boston, MA, December 2008
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257. |
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Assessment of the Surface Electron Accumulation Properties of Polar and Non-Polar InN Surfaces W. J. Schaff, L. C. Chen, Y. Nanishi, and M. Schubert MRS Fall Meeting, Boston, 2008
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256. |
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Terahertz Ellipsometry Using Electron-Beam Based Sources T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert MRS Fall Meeting, Boston, 2008
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255. |
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Terahertz Ellipsometry Materials Characterization M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger ISSSR, Hoboken, NJ, June 2008
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254. |
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International Conference on Electronic Materials V. Darakchieva, T. Hofmann, and M. SChubert IUMRS-ICEM08, Sydney, Australia, 2008
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253. |
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Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures T. Hofmann, and M. Schubert APS Spring Meeting, Denver, 2008
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252. |
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Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert 53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November 2008
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251. |
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Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert MRS Fall Meeting, Boston, MA, December 2008
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250. |
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THz Resonances in Chiral Al Nanowires E. Schubert, T. Hofmann, and M. Schubert ISSSR, Hoboken, NJ, June 2008
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249. |
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Invited Industry Seminar Terahertz Ellipsometry Materials Characterization M. Schubert, T. Hofmann, and C. M. Herzinger Bruker GmbH, Leipzig, August 2008
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248. |
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Invited Industry Seminar The UNL Ellipsometry group M. Schubert Proctor and Gamble, Dayton, OH, October 2008
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247. |
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Invited Department Seminar Optical Hall effect in semiconductor heterostructures T. Hofmann, and M. Schubert Department of Physics, ETH Zurich, Zurich, Switzerland, September 2008
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246. |
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Invited Industry Seminar Optical Hall effect in semiconductor heterostructures M. Schubert, T. Hofmann, and C. M. Herzinger Freiberger Compound Materials GmbH, Freiberg, Sachsen, August 2008
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245. |
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Invited Department Seminar Funktionale GLAD-Nanoarchitekturen und multiferroische Metalloxid-Heterostrukturen M. Schubert Halbleiterphysik, Universitat Leipzig, Leipzig, August 2008
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244. |
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Invited Institute Colloquium Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger National Renewable Energy Laboratory (NREL), Golden, Colorado, June 2008
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2007:> |
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243. |
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Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann Electronic Materials Conference, Notre Dame, June 2007
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242. |
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Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and achiral silicon sculptured thin films D. Schmidt, E. Schubert, and M. Schubert 54th Midwest Solid State Conference, Lincoln, October 2007
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241. |
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Dielectric and magnetic birefringence in Zn1-xMnxSe M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert 54th Midwest Solid State Conference, Lincoln, NE, October 2007
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240. |
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Poster Award Winner Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P E. Montgomery, T. Hofmann, and M. Schubert 54th Midwest Solid State Conference, Lincoln, October 2007
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239. |
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Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, August 2007
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238. |
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Phonon and polaron properties of charge intercalated WO3 M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, CA, August 2007
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237. |
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The optical-Hall effect in hexagonal InN T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert Electronic Materials Conference, Notre Dame, June 2007
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236. |
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Generalized Mueller matrix Ellipsometry of 3-D spherical photonic bandgap structures H. Wang, D. Schmidt, M. Saenger, M. Schubert, and Y.F. Lu 4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007
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235. |
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Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and non-chiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert 4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007
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234. |
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Polaron-phonon interaction in charge intercalated tungsten oxide thin films M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007
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233. |
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THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert TMS 2007 Electronic Materials Conference, Notre Dame, IN, June 2007
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232. |
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Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
T. Hofmann, C. von Middendorff, and M. Schubert 4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007
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231. |
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Terahertz ellipsometry using electron-beam based sources T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell 4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007
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230. |
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Surface electron accumulation and effective mass anisotropy in wurtzite structure InN T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007
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229. |
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Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007
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228. |
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ICSE4 Poster Award Winner The optical-Hall effect T. Hofmann, and M.Schubert 4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June 2007
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227. |
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Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann 4th International Conference on Spectroscopic Ellipsometry, Stockholm, June 2007
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226. |
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Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou 71. German Physical Society Spring Meeting, Regensburg, March 2007
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225. |
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Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth,
M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March 2007
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224. |
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Polaron and phonon properties in WO3 thin films M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert 71. German Physical Society Spring Meeting, Regensburg, March 2007
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223. |
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Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann 71. German Physical Society Spring Meeting, Regensburg, March 2007
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222. |
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Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert 2007 E-MRS Spring Meeting, Strasbourg, France, May 2007
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221. |
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Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN:
Evidence for a New Defect-Related Doping Mechanism T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert 7th Int'l Conference of Nitride Semiconductors, Las Vegas, September 2007
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2006:> |
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220. |
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Conduction band effective mass anisotropy and nonparabolicity of InN V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar 3. Workshop on Indium Nitride, Brazil, November 2006
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219. |
|
Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert Electronic Materials Conference, Pennsylvania State University, June 2006
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218. |
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Anisotropy of the Gamma-point electron effective mass in hexagonal InN T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert Electronic Materials Conference, Pennsylvania State University, June 2006
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217. |
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Anisotropy of the &Gamma-point electron effective mass in hexagonal InN T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert 70. German Physical Society Spring Meeting, Dresden, March 2006
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216. |
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Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert 70. German Physical Society Spring Meeting, Dresden, March 2006
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215. |
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Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
German Physical Society Spring Meeting, Dresden, March 2006
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214. |
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Anisotropy of the Gamma-point electron effective mass in hexagonal InN T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert German Physical Society Spring Meeting, Dresden, March 2006
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213. |
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Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June 2006
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212. |
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Teraherz magnetooptic generalized Mueller-matrix ellipsometry T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert Spring MRS Meeting Symposium K: Materials Research for THz Applications, San Francisco, April 2006
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211. |
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Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert Spring MRS Meeting Symposium GG: Current and Future Trends of Functional Oxide Films, San Fracisco, April 2006
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210. |
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Anisotropy of the G-point electron effective mass in hexagonal InN T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert 4. Workshop "Ellipsometrie", Berlin, February 2006
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209. |
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Temperature-dependent band-gap and excitonic properties of ZnO R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and and M. Grundmann 4. Workshop "Ellipsometrie", Berlin, February 2006
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208. |
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Optical properties of colored tungsten oxide sputtered thin films M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert 4th Ellipsometry Workshop, Berlin, February 2006
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207. |
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Terahertz Ellipsometry T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert 4. Workshop "Ellipsometrie", Berlin, February 2006
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206. |
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Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert 4. Workshop "Ellipsometrie", Berlin, February 2006
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205. |
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Teraherz generalized Mueller-matrix ellipsometry T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert Photonics West 2006, San Jose, January 2006
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204. |
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Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann Photonics West 2006, San Jose, January 2006
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203. |
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Anisotropy of the Gamma-point electron effective mass in hexagonal InN T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert 28th International Conference on the Physics of Semiconductors, Vienna, Austria, July 24-28 2006
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202. |
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Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert ICPS, , July 2006
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201. |
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Invited Institute Colloquium Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes M. Schubert IBM Research Laboratory, Rüschlikon, Switzerland, September 2006
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200. |
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Invited Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes M. Schubert International Conference on Low Energy Electrodynamics of Solids LEES 06, Tallinn, Estonia, July 2006
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199. |
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Invited Generalized Ellipsometry on sculptured thin films: Birefringence and chirality M. Schubert, E. Schubert, H. Wang, Y. Lu, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, J. Rivory, and B. Gallas Photon06, Manchester, United Kingdom, September 2006
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2005:> |
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198. |
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Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert TCOs für Dünnschichtsolarzellen und andere Anwendungen, Freyburg, April 2005
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197. |
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Phonons in doped ZnO and ZnO based thin films grown by PLD on sapphire C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, M. Lorenz, and M. Grundmann G/PII.25 E-MRS 2005 Spring Meeting, Strasbourg, May/June 2005
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196. |
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Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures A. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann German Physical Society Spring Meeting, Berlin, March 2005
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195. |
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Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann Workshop on Oxides at the nanoscale, Zaragoza Spain, November 2005
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194. |
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In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, and K. Streubel 32nd International Symposium of Compound Semiconductors, Rust, Germany, September 2005
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193. |
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Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, and M. Schubert 6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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192. |
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Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, and S. Nakamura 6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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191. |
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Anisotropy of the Gamma-point electron effective mass in hexagonal InN T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert 6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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190. |
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Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems M. Schubert, T. Hofmann, and U. Schade International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005
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189. |
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The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005
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188. |
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Optische in-situ und in-line Charakterisierung funktioneller Schichten M. Schubert, C. Bundesmann, T. Hofmann, and et al. Advanced Process Control for future oriented manufacturing Workshop, FEP Dresden, September 2005
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187. |
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Light and Matter: Advanced polarization spectroscopy in functional materials physics M. Schubert et al. E-MRS 2005 Spring Meeting Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May/June 2005
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186. |
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Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie M. Schubert XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2005
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185. |
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Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, and M. Grundmann 69. German Physical Society Spring Meeting, Berlin, March 2005
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184. |
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Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert 69. German Physical Society Spring Meeting, Berlin, March 2005
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183. |
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Brechungsindex von kubischem MgxZn1-xO Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann 69. German Physical Society Spring Meeting, Berlin, March 2005
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182. |
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Phonon and free-charge-carrier properties in ZnMnSe T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert 69. German Physical Society Spring Meeting, Berlin, March 2005
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181. |
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Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and and M. Grundmann 69. German Physical Society Spring Meeting, Berlin, March 2005
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180. |
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Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann 69. German Physical Society Spring Meeting, Berlin, March 2005
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179. |
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Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, and M. Grundmann 69. German Physical Society Spring Meeting, Berlin, March 2005
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178. |
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Nickelsegregation nach Sauerstoff-Ionenimplantation in NiTi M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, and B. Rauschenbach 69. German Physical Society Spring Meeting, Berlin, March 2005
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177. |
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Invited Institute Seminar Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures M. Schubert BESSY Berlin, (Prof. Dr. W. Eberhardt, Dr. U. Schade), April 21 2005
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176. |
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Invited Department Seminar Advanced polarization spectroscopy in functional materials physics M. Schubert University Hamburg, (Prof. Dr. M. Rübhausen), April 18 2005
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175. |
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Invited Industry Seminar Optical Spectroscopy: old spectacles for new materials and physics M. Schubert Laytec GmbH, (Dr. Th. Zettler), February 11 2005
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174. |
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Invited Institute Colloquium Light and Matter: Advanced polarization spectroscopy in functional materials physics M. Schubert Universite Pierre et Marie Curie (Prof. Y. Rivory, Prof. J. Lafait), Paris, February 03 2005
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2004:> |
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173. |
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Invited Spectroscopic ellipsometry: From basic materials research to industrial applications M. Schubert Swedish Optical Society Meeting, Linkoping, Sweden, November 2004
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172. |
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Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, and M. Grundmann Int. Workshop on Oxide Electronics WOE-11, Kanagawa, Japan, October 2004
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171. |
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Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano, and I. Akasaki Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July 2004
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170. |
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Phonon deformation potentials in hexagonal InN V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and and B. Monemar Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July 2004
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169. |
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The inertial-mass scale for free charge carriers in semiconductor heterostructures T. Hofmann, M. Schubert, and C. v. Middendorf 27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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168. |
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Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, and M. Grundmann 27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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167. |
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Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates C. Bundesmann, M. Schubert, N. Ashkenov, and M. Grundmann 27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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166. |
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Invited Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures M. Schubert, and T. Hofmann International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July 2004
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165. |
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Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, and W.J. Shaff E-MRS 2004, Strasbourg, May 2004
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164. |
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Invited In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung M. Schubert Transparent Conducting Oxide (TCO) Workshop, Leipzig, March 2004
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163. |
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HVPE-grown free-standing GaN of high structural and optical quality A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, and M. Heuken ISBLLED-2004 Gyeongju, Korea, March 2004
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162. |
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In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie M. Schubert, N. Ashkenov, C. Bundesmann, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold, and German Physical Society Spring Meeting, Regensburg, March 2004
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161. |
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Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, and M. Heuken German Physical Society Spring Meeting, Regensburg, March 2004
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160. |
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Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, and A. Krost German Physical Society Spring Meeting, Regensburg, March 2004
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159. |
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Infrared ellipsometry characterization of conducting thin organic films M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs German Physical Society Spring Meeting, Regensburg, March 2004
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158. |
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Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner German Physical Society Spring Meeting, Regensburg, March 2004
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157. |
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Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2004
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156. |
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Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2004
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155. |
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Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, and B. Johs German Physical Society Spring Meeting, Regensburg, March 2004
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154. |
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Temperature-dependent band-gap energies and optical constants of ZnO N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2004
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153. |
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Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 2004
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152. |
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Strong increase of the electron effective mass in GaAs incorporating boron and indium T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 2004
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151. |
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CuInSe2 flexible solar cell surface-heat-emittance optimization for infrared radiation C. Bundesmann, F. Dürr, M. Schubert, and K. Otte German Physical Society Spring Meeting, Regensburg, March 2004
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150. |
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Invited Optische Analytikverfahren für die Dünnschichtcharakterisierung M. Schubert XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2004
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149. |
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Optische dielektrische Funktionen im Photonenenergiebereich (0.4 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2004
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148. |
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Invited Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen M. Schubert, and T. Hofmann 3. Workshop "Ellipsometrie", Stuttgart, February 2004
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147. |
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In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie C. Bundesmann, M. Schubert, N. Ashkenov, G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, and H. Neumann 3. Workshop "Ellipsometrie", Stuttgart, February 2004
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146. |
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Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann 3. Workshop "Ellipsometrie", Stuttgart, February 2004
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145. |
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Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner 3. Workshop "Ellipsometrie", Stuttgart, February 2004
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144. |
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Invited Institute Seminar Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control M. Schubert Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, (Dr. Springer), December 2 2004
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143. |
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Invited Department Seminar Spectroscopic ellipsometry: From basic materials research to industrial applications M. Schubert University Stuttgart, (Prof. Dr. M. Dressel, Dr. B. Gompf), November 30 2004
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142. |
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Invited Department Seminar Spectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications M. Schubert University Tübingen, (Prof. Dr. Th. Chassé), November 17 2004
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141. |
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Invited Department Seminar Advanced polarization spectroscopy in functional materials physics M. Schubert Colorado State University, Fort Collins, (Prof. Hochheimer), May 2004
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140. |
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Invited Institute Seminar In-situ process monitoring with spectroscopic ellipsometry and Raman scattering M. Schubert Technical University Magdeburg, (Prof. Krost, Prof. Christen), May 2004
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139. |
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Invited Industry Seminar Optische Analytikverfahren für die Dünnschichtcharakterisierung M. Schubert OSRAM-OPTO Semiconductors GmbH, Regensburg (Dr. K. Streubel), March 2004
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2003:> |
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138. |
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Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner 10th International Workshop on Oxide Electronics, Augsburg, Germany, September 11-13 2003
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137. |
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Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and and B. Monemar ICDS, , 2003
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136. |
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Invited Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann Optical System Design 2003, St. Etienne, France, September 2003
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135. |
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The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, and B. Monear 5. Int. Conf. on Nitride Semiconductor Research, Nara, July 2003
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134. |
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Invited Generalized magneto-optic ellipsometry M. Schubert, T. Hofmann, and C. M. Herzinger 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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133. |
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High temperature optical constants and band gap energies of ZnO N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, and M. Grundmann 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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132. |
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Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures A. Kasic, M. Schubert, and B. Monemar 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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131. |
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Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, and M. Grundmann 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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130. |
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Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and and D. Gerthsen 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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129. |
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UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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128. |
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Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry O. P. A. Lindquist, M. Schubert, H. Arwin, and K. Järrendahl 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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127. |
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Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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126. |
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Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P T. Hofmann, M. Schubert, and V. Gottschalch 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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125. |
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Infrared ellipsometry characterization of conducting thin organic films M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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124. |
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Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry G. Leibiger, V. Gottschalch, N. Razek, and M. Schubert 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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123. |
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Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3 M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase 3. International Conference on Spectroscopic Ellipsometry, Vienna, July 2003
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122. |
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Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka German Physical Society Spring Meeting, Dresden, March 2003
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121. |
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Phonons, band gap and higher interband transitions of hexagonal InGaN A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, and Y. Nanishi German Physical Society Spring Meeting, Dresden, March 2003
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120. |
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Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert, N. Ashkenov, P. Pfundstein, D. Gerthsen, and K. Eichhorn German Physical Society Spring Meeting, Dresden, March 2003
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119. |
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Optische Übergänge und Brechungsindices von MgZnO R. Schmidt, B. Rheinländer, M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, and M. Grundmann German Physical Society Spring Meeting, Dresden, March 2003
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118. |
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Invited Industry Seminar Ellipsometry in functional materials physics M. Schubert von Ardenne Anlagenbau GmbH, (Hr. M. Kammer), November 2003
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117. |
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Invited Department Seminar Ellipsometrie und Raman an ZnO Dünnschichten C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert Nukleare Festkörperphysik, University Leipzig, Leipzig, April 2003
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116. |
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Invited Applied Optics Lecture Principles and Application of Infrared Spectroscopic Ellipsometry M. Schubert Linkoping University, Linkoping, Sweden, February 2003
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115. |
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Invited Applied Optics Lecture Principles and Application of Generalized Ellipsometry M. Schubert Linkoping University, Linkoping, Sweden, February 2003
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2002:> |
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114. |
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Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und
ZnO-GaO-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie R. Schmidt, C. Bundesmann, E.M. Kaidashev, B.Rheinländer, M.Lorenz, H. v. Wenkstern, A. Kasic, M.Schubert, and M.Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002
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113. |
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Phonons, excitons, band-to-band transitions and optical constants of MgZnO R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, and C. M. Herzinger Materials Research Society Fall Meeting, Boston, U.S.A, December 2002
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112. |
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Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures T. Hofmann, C. M. Herzinger, and M. Schubert Materials Research Society Fall Meeting, Boston, U.S.A, December 2002
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111. |
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Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP T. Hofmann, V. Gottschalch, and M. Schubert Materials Research Society Fall Meeting, Boston, U.S.A, December 2002
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110. |
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Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, and M. Grundmann 2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002
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109. |
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Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, and M. Grundmann 2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002
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108. |
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Critical points and phonons in (B,Ga)(N,As) G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, and M. Schubert Physics and Technology of Dilute Nitrides for Optical Communications, Istanbul, September 2002
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107. |
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Critical points and phonons in BxGa1-xAs and GaNyAs1-y: a comparison G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, and M. Schubert International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002
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106. |
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Optical phonons in AlxInyGa1-x-yN films A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, and M. Stutzmann International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002
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105. |
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Optical properties of ternary MgZnO thin films R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann 26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July 2002
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104. |
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Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures T. Hofmann, C. M. Herzinger, and M. Schubert 47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle, U.S.A., July 2002
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103. |
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Invited Generalized ellipsometry of complex mediums in layered systems M. Schubert 47. Annual SPIE Meeting, Complex Mediums III, Seattle, U.S.A., July 2002
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102. |
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Invited Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam 47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle U.S.A., July 2002
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101. |
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Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, and M. Schubert 11th International Conference on Metal-Organic Vapour Phase Epitaxy, Berlin, June 2002
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100. |
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IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann 2. Workshop "Ellipsometrie", Berlin, Februar 2002
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99. |
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Invited Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann 2. Workshop "Ellipsometrie", Berlin, Februar 2002
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98. |
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Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen T. Hofmann, M. Schubert, and C. M. Herzinger German Physical Society Spring Meeting, Regensburg, March 2002
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97. |
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Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie R. Schmidt, C. Bundesmann, A. Kasic, E. M. Kaidashev, B. Rheinländer, M. Lorenz, M. Schubert, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2002
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96. |
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Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P T. Hofmann, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 2002
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95. |
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Kritische Punkte und Phononen in BxGa1-xAs und GaNyAs1-y: Ein Vergleich G. Leibiger, V. Gottschalch, M. Schubert, and V. Riede German Physical Society Spring Meeting, Regensburg, March 2002
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94. |
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Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films N. Ashkenov, C. Bundesmann, A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2002
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93. |
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Properties of pulsed-laser-deposited Zn1-x(Al Ga and Mg and Cd)xO compound thin films C. Bundesmann, N. Ashkenov, A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz, R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, and M. Grundmann German Physical Society Spring Meeting, Regensburg, March 2002
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92. |
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Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger L.O.T.-Seminar, Darmstadt, October 2002
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91. |
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Invited Department Seminar Infrared Spectroscopic Ellipsometry M. Schubert, V. Darakchieva, H. Arwin, N.-C. Persson, O. Inganäs, Y. Fengling, and B. Monemar Linkoping University, Linkoping, Sweden, September 2002
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2001:> |
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90. |
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Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Šik, and M. Schubert 2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 7, 2001
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89. |
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Optical properties of AlxIn1-xN thin films determined by spectroscopic ellipsometry A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger 2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 513, 2001
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88. |
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Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry M. Schubert, and A. Kasic 1. Int.Conference on Advanced Vibrational Spectroscopy, Turku, Finnland, August 2001
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87. |
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Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization of free-carrier and crystal-structure properties of III-V semiconductor device heterostructures M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam, and C. M. Herzinger 46. Annual SPIE Meeting, San Diego U.S.A., August 2001
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86. |
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Composition determination of InGaAsN using x-ray diffraction and far-infrared ellipsometry G. Leibiger, V. Gottschalch, and M. Schubert 4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001
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85. |
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Optical properties of GaNP G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, and M. Schubert 4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001
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84. |
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Generalized Infrared Ellipsometry- A novel tool for characterization of group -III-Nitride Heterostructrues for electronic and optoelectronic device applications M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, and J. A. Woollam 4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July 2001
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83. |
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Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch Spring European MRS-Meeting, Strasbourg, France, June 2001
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82. |
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All-solid state electrochromic multiplayer systems for surface heat radiation control E. Franke, M. Schubert, C. L. Trimble, and J. A. Woollam Spring European MRS-Meeting, Strasbourg, France, June 2001
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81. |
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Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, and F. Scholz Spring European MRS-Meeting, Strasbourg, France, June 2001
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80. |
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Invited Ellipsometry on anisotropic materials- treatment of surface and interface layers M. Schubert 256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May 2001
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79. |
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Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen A. Kasic, and M. Schubert German Physical Society Spring Meeting, Hamburg, March 2001
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78. |
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Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten G. Leibiger, M. Schubert, and V. Gottschalch German Physical Society Spring Meeting, Hamburg, March 2001
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77. |
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Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch German Physical Society Spring Meeting, Hamburg, March 2001
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76. |
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Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch German Physical Society Spring Meeting, Hamburg, March 2001
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75. |
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Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien kubischer AlxGa1-xN-Filme A. Kasic, M. Schubert, and D. J. As German Physical Society Spring Meeting, Hamburg, March 2001
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74. |
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Invited Department Seminar The light and the lattice M. Schubert Technical University Berlin, (Prof. Richter), September 2001
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2000:> |
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73. |
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MRS Poster Award Winner IR-VUV dielectric function of Al1-xInxN determined by spectroscopic ellipsometry A. Kasic, M. Schubert B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger MRS 2000 Fall Meeting, Boston U.S.A., November/December 2000
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72. |
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Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, and M. Schubert MRS 2000 Fall Meeting, Boston U.S.A., November/December 2000
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71. |
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Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, and J. Sik Int. Symposium on Compound Semiconductors, Monterey U.S.A., October 2000
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70. |
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Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C.M. Herzinger Int. Symposium on Compound Semiconductors, Monterey U.S.A., October 2000
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69. |
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Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer using generalized ellipsometry T.E.Tiwald, and M. Schubert 45. Annual SPIE Meeting, San Diego U.S.A., August 2000
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68. |
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Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz European MRS Spring Meeting, Strasbourg, France, July 2000
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67. |
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Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, and F. Scholz European MRS Spring Meeting, Strasbourg, France, July 2000
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66. |
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Invited Generalized Ellipsometry for novel optical materials M. Schubert Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000
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65. |
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Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, and J.A. Woollam Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000
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64. |
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Invited Hauptvortrag Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie M. Schubert German Physical Society Spring Meeting, Regensburg, March 2000
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63. |
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Phononen in GaN/AlxGa1-xN Übergitterstrukturen M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz German Physical Society Spring Meeting, Regensburg, March 2000
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62. |
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Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch German Physical Society Spring Meeting, Regensburg, March 2000
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61. |
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Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen T. Hofmann, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 2000
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60. |
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Optische Eigenschaften von GaAs1-xNx (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, and V. Gottschalch German Physical Society Spring Meeting, Regensburg, March 2000
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59. |
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Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz German Physical Society Spring Meeting, Regensburg, March 2000
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58. |
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Invited Ellipsometry of anisotropic materials M. Schubert 1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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57. |
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Optische Eigenschaften von GaNyAs1-y (0 ... y ... 0.37) Einzelschichten und Übergitterstrukturen G. Leibiger, M. Schubert, B. Rheinländer, and V. Gottschalch 1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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56. |
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IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz 1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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55. |
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Invited Department Seminar The light and the lattice M. Schubert Physics colloquium, University of Leipzig, (Prof. Grundmann), September 2000
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1999:> |
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54. |
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Invited Spectroscopic ellipsometry J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, and S. Zollner Centennial Meeting of the American Physical Society, Atlanta U.S.A, April 1999
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53. |
|
In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl 11. Int. Conf. on Thin Films, Cancun, Mexico, August 1999
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52. |
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Maximum direct-gap reduction in CuPt ordered AlxGa1-xInP (0 ... x ... 1) determined by generalized ellipsometry M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch 41. Electronic Materials Conf., Charlottesville U.S.A., June 1999
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51. |
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Lattice modes and free-carrier response of AlxGa1-xN and InxGa1-xN heterostructures measured by infrared ellipsometry M. Schubert, T. E. Tiwald, J.A. Woollam, A. Kasic, J. Off, B. Kuhn, and F. Scholz MRS Fall Meeting, Boston U.S.A., December 1999
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50. |
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Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE M. Schubert, J.A. Woollam, A. Kasic, B. Rheinländer, J. Off, and F. Scholz 3. Int. Conf. on Nitride Semiconductor Research, Montpellier, France, July 1999
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49. |
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In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie J.-D. Hecht, E. Franke, M. Schubert, and H. Neumann German Physical Society Spring Meeting, Münster, March 1999
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48. |
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Bestimmung des Tensors der Dielektrischen Funktion von a-Al2O3 für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie J.-D. Hecht, M. Schubert, C.M. Herzinger, and J.A. Woollam German Physical Society Spring Meeting, Münster, March 1999
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47. |
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Optical constants of nearly disordered AlxGa1-xInP2 G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch German Physical Society Spring Meeting, Münster, March 1999
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46. |
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Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2 T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch German Physical Society Spring Meeting, Münster, March 1999
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45. |
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Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Münster, March 1999
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44. |
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Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, and F. Scholz German Physical Society Spring Meeting, Münster, March 1999
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43. |
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Near-band-gap CuPt order-birefringence in AlxGa1-xInP2 M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch German Physical Society Spring Meeting, Münster, March 1999
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42. |
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Phonon modes and infrared anisotropy of rutile and sapphire M. Schubert L.O.T.-Seminar, Darmstadt, October 1999
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41. |
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Invited Department Seminar Spectroscopic ellipsometry for novel optical materials M. Schubert University of Lincoln-Nebraska, (Prof. J.A.Woollam), September 1999
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40. |
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Invited Department Seminar Infrared dielectric anisotropy and phonon modes of sappphire M. Schubert University of Lincoln-Nebraska, (Prof. J.A.Woollam), May 1999
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1998:> |
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39. |
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Ordering induced optical properties of AlGaInP alloys M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch 40. Electronic Materials Conf., Charlottesville, U.S.A., June 1998
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38. |
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Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch German Physical Society Spring Meeting, Regensburg, March 1998
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37. |
|
Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, and G. Krauss V. Krämer German Physical Society Spring Meeting, Regensburg, March 1998
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36. |
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Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and T. Welzel German Physical Society Spring Meeting, Regensburg, March 1998
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35. |
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Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 1998
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34. |
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Explicit solutions for magneto-optic materials in generalized ellipsometry M. Schubert, T. E. Tiwald, and J. A. Woollam German Physical Society Spring Meeting, Regensburg, March 1998
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33. |
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Invited Institute Seminar Spectroscopic ellipsometry on complex optical systems M. Schubert MPI for Microstructure Physics, Halle (Prof. Gösele), February 1998
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1997:> |
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32. |
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Spectroscopic ellipsometry: Application to complex optoelectronic layer systems B. Rheinländer, M. Schubert, and H. Schmidt Heterostructure Epitaxy and Devices, Smolenice Castle, Slovakia, Oktober 1997
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31. |
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Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, and J. Hahn Int. Conf. on Metallurgical Coatings and Thin Films, San Diego U.S.A., April 1997
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30. |
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Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, and J. Hahn 2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai 1997
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29. |
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Invited Department Seminar Verallgemeinerte Ellipsometrie an magnetischen Schichten M. Schubert University of Leipzig, (Prof. Esquinazi), December 1997
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28. |
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Invited Generalized ellipsometry and complex optical systems M. Schubert 2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai 1997
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27. |
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Invited Colloquium Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen M. Schubert Graduiertenkolleg, University of Chemnitz, (Prof. Richter, Dr. Welzel), December 1997
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26. |
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Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter 4. c-BN Expertentreffen, Konstanz, Juni 1997
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25. |
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Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry M. Schubert L.O.T., Darmstadt, October 1997
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24. |
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Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter German Physical Society Spring Meeting, Münster, March 1997
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23. |
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Invited Department Seminar Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry M. Schubert University of Lincoln-Nebraska, (Prof. J.A.Woollam), June 1997
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22. |
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Direct-gap reduction and valence band splitting of CuPtB-type ordered (AlGa)InP2 studied by dark-field spectroscopy M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch German Physical Society Spring Meeting, Münster, March 1997
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21. |
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Invited Institute Colloquium Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry M. Schubert Forschungszentrum Rossendorf, (Prof. Moeller), March 1997
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20. |
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Invited Industry Seminar Generalized Ellipsometry on chiral liquid crystals M. Schubert ROLIC AG Basel, (Dr. Schadt, Dr. Bennecke), February 1997
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19. |
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Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry M. Schubert University of Leipzig, (Prof. Grill), January 1997
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1996:> |
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18. |
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Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, and F. Richter 43. Symp. of the American Vacuum Society, Philadelphia U.S.A., Oktober 1996
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17. |
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Application of generalized ellipsometry to complex optical systems M. Schubert, B. Rheinländer, B. Johs, and J.A. Woollam Int. Conf. on Polarimetry and Ellipsometry, SPIE, Warszaw, Poland, Mai 1996
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16. |
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Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry M. Schubert, B. Rheinländer, V. Gottschalch, and J.A. Woollam 23. Int. Conf. on the Physics of Semiconductors, Berlin, Juli 1996
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15. |
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Invited Department Seminar Atomic order in III-V alloys M. Schubert University of Lincoln-Nebraska, (Prof. J.A.Woollam), October 1996
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14. |
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Invited Hauptvortrag Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam German Physical Society Spring Meeting, Regensburg, March 1996
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13. |
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Invited Department Seminar Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid M. Schubert University of Chemnitz, (Prof. Richter), June 1996
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12. |
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Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung H. Schmidt, B. Rheinländer, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 1996
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11. |
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Invited Department Seminar Moderne Ellipsometrie an spontan geordnetem AlGaInP M. Schubert University of Stuttgart, (Prof. Pilkuhn), June 1996
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10. |
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Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, and M. Schubert German Physical Society Spring Meeting, Regensburg, March 1996
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9. |
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Invited Industry Seminar Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen M. Schubert Sentech GmbH, Berlin, March 1996
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8. |
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Invited Department Seminar Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid M. Schubert University of Kassel, (Prof. Kassing), April 1996
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7. |
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Generalized Ellipsometry and complex optical systems M. Schubert L.O.T.-Seminar, Dresden, February 1996
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1995:> |
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6. |
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Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO2mittels generalisierter Rotating-Analyzer-Ellipsometry M. Schubert, B. Johs, C. M. Herzinger, and J. A. Woollam German Physical Society Spring Meeting, Berlin, March 1995
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5. |
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Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie M. Schubert, B. Rheinländer, and V. Gottschalch German Physical Society Spring Meeting, Berlin, March 1995
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4. |
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Invited Department Seminar Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium M. Schubert Department of Electrical Engineering, University of Lincoln-Nebraska, June 1995
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1994:> |
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3. |
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Dark-field spectroscopy on spontaneously ordered GaInP2 B. Rheinländer, M. Schubert, and V. Gottschalch Int. Workshop on Optical Charact. of Electronic Materials, Halle/Saale, Oktober 1994
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Invited Department Seminar Polarization-dependent parameters of arbitrarily anisotropic epitaxial systems M. Schubert Department of Electrical Engineering, University of Nebraska-Lincoln, October 1994
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1993:> |
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1. |
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Optical constants of highly excited AlGaAs B. Rheinländer, M. Schubert, K. Unger, and H. Fieseler German Physical Society Spring Meeting, Regensburg, March 1993
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generated using Sembib V0.1 © T. Hofmann (2003)
last database entry from 2024-09-30 |
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