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	Books
			4th International Conference on Spectroscopic Ellipsometry: H. Arwin, U. Beck, and M. Schubert (Wiley, Berlin, 2008)
			Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons M. Schubert Springer Tracts in Modern Physics, Vol 209 (Springer, Heidelberg, 2004) ISBN 3-540-23249-4 [View PDF (11903kB)]
	Bookchapters
			Detection of organic attachment onto highly ordered three-dimensional nanostructure thin films by generalized ellipsometry and quartz crystal microbalance with dissipation techniques K.B. Rodenhausen, D. Schmidt, C. Rice, T. Hofmann, E. Schubert, M. Schubert Coupling spectroscopic ellipsometry and quartz crystal microbalance to study organic films at the solid-liquid interface R.P. Richter, K.B. Rodenhausen, N.B. Eisele, M. Schubert In Ellipsometry of Functional Organic Surfaces and Films edited by K. Hinrichs and K.-J. Eichhorn (Springer, Berlin, 2014) ISBN 978-3-642-40127-5
			Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition D. Schmidt, E. Schubert, M. Schubert [View PDF (3 MB)] THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures T. Hofmann, D. Schmidt, M. Schubert [View PDF (1 MB)] In Ellipsometry at the Nanoscale edited by M. Losurdo and K. Hingerl (Springer, Berlin, 2013) ISBN 978-3-642-33955-4
			Optical phonons in a-plane GaN under anisotropic strain V. Darakchieva, T. Paskova and M. Schubert Book Chapter N9 in Group-III nitrides with nonpolar surfaces: growth, properties and devices edited by T. Paskova (Wiley (Eds.), Berlin, pp.219-253 2008) ISBN: 978-3-527-40768-2
			Optical Properties of Zinc Oxide and related Compounds C. Bundesmann, R. Schmidt-Grund, M. Schubert In Zinc Oxide as Transparent Electronic Material and its Application in Thin Film Solar Cells edited by A. Klein and K. Ellmer Springer Series in Materials Science, Vol 104 (Springer, Berlin, 2007) ISBN-10: 3540736115 [View all pdf (63191kB)];[Chap 1], [Chap 2], [Chap 3], [Chap 4], [Chap 5], [Chap 6], [Chap 7], [Chap 8], [Chap 9]
			Theory and Application of Generalized Ellipsometry M. Schubert In Handbook of Ellipsometry edited by G.E. Irene and H.G. Tompkins (William Andrew Publishing, Norwich, N.Y., 2005) ISBN: 0-8155-1499-9 (Springer-Verlag GmbH Co. KG, Heidelberg, 2004) ISBN: 3-540-22293-6 [View PDF (2374kB)]
			Phonons and Free-Carrier Properties of Binary, Ternary, and Quaternary Group-III Nitride Layers Measured by Infrared Spectroscopic Ellipsometry A. Kasic, M. Schubert, J. Off, B. Kuhn, F. Scholz, S. Einfeldt, T. Böttcher, D. Hommel, D. J. As, U. Koehler, A. Dadgar, A. Krost, Y. Saito, Y. Nanishi, M. R. Correia, S. Pereira, V. Darakchieva, B. Monemar, H. Amano, I. Akasaki, G. Wagner In Group III-Nitrides and Their Heterostructures: Growth, Characterization and Applications edited by F. Bechstedt, B. K. Meyer and M. Stutzmann (Wiley-VCH, Berlin, 2003) ISBN 3-527-40475-9 [View PDF (1328kB)] also in: phys. stat. sol. c 0, 1750 - 1769 (2003)
			Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon A. Dadgar, A. Strittmatter, J. Blasing, M. Poschenrieder, O. Contreras, P. Veit, T. Riemann, F. Bertram, A. Reiher, A. Krtschil, A. Diez, T. Hempel, T. Finger, A. Kasic, M. Schubert, D. Bimberg, F. A. Ponce, J. Christen, A. Krost In Group III-Nitrides and Their Heterostructures: Growth, Characterization and Applications edited by F. Bechstedt, B. K. Meyer and M. Stutzmann (Wiley-VCH, Berlin, 2003) ISBN 3-527-40475-9 [View PDF (2183kB)] also in: phys. stat. sol. c 0, 1583 - 1606 (2003)
			Generalized Ellipsometry M. Schubert In Introduction to Complex Mediums for Optics and Electromagnetics edited by W. S. Weiglhofer and A. Lakhtakia (SPIE, Bellingham, WA, 2003) ISBN 0819449474 [View PDF (852kB)]
			MOVPE growth, Phonons, Band-to-Band Transitions and Dielectric Functions of InGaNAs/GaAs Superlattices and Quantum Wells G. Leibiger, V. Gottschalch, G. Benndorf, J. Å ik, M. Schubert In Compound semiconductor heterojunctions: physics and applications edited by W. Cay and others (Research Signpost, Kerala, 2003) ISBN 8177361708 [View PDF part 1 (2049kB)] [View PDF part 2 (1946kB)] [View PDF part 3 (1842kB)]
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	Articles in submission:
	404.		The optical Hall effect - Experiment M. Schubert, P. Kuehne, V. Darakchieva, S. Schoeche, S. Knight, and C. M. Herzinger J. Opt. Soc. Am. A , (2020)
	403.		The influence of strain and composition on the infrared active phonons in epitaxial β-(AlxGa1-x)2O3 deposited onto (010) β-Ga2O3 M. Stokey, R. Korlacki, S. Knight, M. Hilfiker, V. Darakchieva, A. Mauze, Y. Zhang, J. Speck, and M. Schubert TBA XXX, (2021)
	402.		Strain and stress relationships for longitudinal optical phonon modes in β-Ga2O3 R. Korlacki, J. Knudtson, M. Stokey, A. Mock, S. Knight, A. Papamichail, V. Darakchieva, and M. Schubert TBA XX, XX (2022)
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	2013:
	401.		Infrared dielectric anisotropy and phonon modes of rutile TiO2 S. Schöche, T. Hofmann, R. Korlacki, T. E. Tiwald, and M. Schubert J. Appl. Phys. 113, 164102 (2013) [View PDF (2.9 MB)] [DOI-link]
	400.		Generalized ellipsometry effective medium approximation analysis approach for the porous slanted columnar thin films infiltrated with polymer D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert Appl. Phys. Lett. 103, 111906 (2013) [View PDF (1.4 MB)] [DOI-link]
	399.		Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert J. Appl. Phys. 113, 013502 (2013) [View PDF (2.3 MB)] [DOI-link]
	398.		A Model Dielectric Function for Graphene from the Infrared to the Ultraviolet A. Boosalis, R. Elmquist, M. Real, N. Nguyen, M. Schubert, and T. Hofmann Mat. Res. Soc. Symp. Proc. 1505, (2013) [View PDF (838 kB)] [DOI-link]
	397.		Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide - coupled phonon mode P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, M. Schubert, and T. Hofmann Mat. Res. Soc. Symp. Proc. 1505, w07-44 (2013) [DOI-link]
	396.		Slanted Columnar Thin Films Prepared by Glancing Angle Deposition Functionalized with Polyacrylic Acid Guiselin Polymer Brushes T. Kasputis, M. Koenig, D. Schmidt, D. Sekora, K. B. Rodenhausen, K.-J. Eichhorn, P. Uhlmann, E. Schubert, A. K. Pannier, M. Schubert, and M. Stamm J. Phys. Chem. C 117, 13971 (2013) [View PDF (3.8 MB)] [DOI-link]
	395.		Vector Magneto-Optical Generalized Ellipsometry for Sculptured Thin Films D. Schmidt, C. Briley, E. Schubert, and M. Schubert Appl. Phys. Lett. 102, 123109 (2013) [View PDF (842 kB)] [DOI-link]
	394.		Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC (111) V. Darakchieva, A. Boosalis, A. A. Zakharov, T. Hofmann, M. Schubert, T. E. Tiwald, T. Iakimov, R. Vasiliauskas, and R. Yakimova App. Phys. Lett. 102, 213116 (2013) [View PDF (1.8 MB)] [DOI-link]
	393.		Insitu-Synthesis of Palladium Nanoparticles in Polymer Brushes followed by QCM-D coupled with spectroscopic ellipsometry M. Koenig, K. B. Rodenhausen, D. Schmidt, K.-J. Eichhorn, M. Schubert, M. Stamm, and P. Uhlmann Part. Part. Syst. Char. 30, 931 (2013) [View PDF (2.2 MB)] [DOI-link]
	392.		Polarization selection rules for inter-Landau level transitions in epitaxial graphene revealed by infrared optical Hall effect P. Kühne, V. Darakchieva, J.D. Tedesco, R.L. Myers-Ward, C.R. Eddy Jr., D.K. Gaskill, R. Yakimova and C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann Phys. Rev. Lett. 111, 077402 (2013) [View PDF (2.0 MB)] [DOI-link]
	391.		Anisotropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films D. Schmidt, and M. Schubert J. Appl. Phys. 114, 083510 (2013) [View PDF (1.6 MB)] [DOI-link]
	390.		Electron effective mass in Al0.72Ga0.28N alloys determined by mid-infrared optical Hall effect S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A. Kakanakova-Georgieva, E. Janzén, and V. Darakchieva Appl. Phys. Lett. 103, 212107 (2013) [View PDF (605 kB)] [DOI-link]
	389.		Terahertz resonator E. Schubert, M. Schubert, and T. Hofmann U. S. Pat. Grant 8507860, (2013)
	388.		Terahertz-infrared ellipsometer system, and method of use C. M. Herzinger, M. Schubert, T. Hofmann, M. M. Liphardt, and J. A. Woollam U. S. Pat. Grant 8488119, (2013)
	387.		Mass sensor M. Schubert, E. Schubert, T. Hofmann, and D. Schmidt U. S. Pat. Grant 8441635, (2013)
	386.		Terahertz-infrared ellipsometer system, and method of use C. M. Herzinger, M. Schubert, T. Hofmann, M. M. Liphardt, and J. A. Woollam U. S. Pat. Grant 8416408, (2013)
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	2012:
	385.		Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN S. Schöche, T. Hofmann, N. B. Sedrine, V. Darakchieva, B. Monemar, X. Wang, A. Yoshikawa, and M. Schubert Mat. Res. Soc. Symp. Proc. 1396, O07-27 (2012) [DOI-link]
	384.		Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC A. Boosalis, T. Hofmann, V. Darakchieva, R. Yakimova, Tom Tiwald, and M. Schubert Mat. Res. Soc. Symp. Proc. 1407, aa20-43 (2012) [View PDF (531 kB)] [DOI-link]
	383.		Highlighted by IOP Direct graphene growth on Co3O4(111) by molecular beam epitaxy M. Zhou, F. L. Pasquale, P. A. Dowben, A. Boosalis, M. Schubert, V. Darakchieva, R. Yakimova, L. Kong, and J. A. Kelber J. Phys.: Condens. Matter 24, 072201 (2012) [View PDF (542 kB)] [DOI-link]
	382.		Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on 3C and 4H SiC Polytypes Determined by Spectroscopic Ellipsometry A. Boosalis, T. Hofmann, V. Darakchieva, R. Yakimova, and M. Schubert Appl. Phys. Lett. 101, 011912 (2012) [View PDF (669 kB)] [DOI-link]
	381.		Selected for publication in Vir. J. Nan. Sci. & Tech. Vol. 25 (4) (2012) Optical Properties of Cobalt Slanted Columnar Thin Films Passivated by Atomic Layer Deposition D. Schmidt, E. Schubert, and M. Schubert Appl. Phys. Lett. 100, 011912 (2012) [View PDF (1.1 MB)] [DOI-link]
	380.		Selected for publication in Vir. J. Nan. Sci. & Tech. Vol. 25 (10) (2012) Nanomagnetic Skyrmions R. Skomski, Z. Li, R. Zhang, R.D. Kirby, A. Enders, D. Schmidt, T. Hofmann, E. Schubert, and D. J. Sellmyer J. Appl. Phys. 111, 07E116 (2012) [View PDF (503 kB)] [DOI-link]
	379.		Vector Magneto-Optical Generalized Ellipsometry on Passivated Permalloy Slanted Columnar Thin Films D. Schmidt, C. Briley, E. Schubert, and M. Schubert Mat. Res. Soc. Symp. Proc. 1408, BB15-19 (2012) [View PDF (1.4 MB)] [DOI-link]
	378.		Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films D. Schmidt, E. Schubert, and M. Schubert Mat. Res. Soc. Symp. Proc. 1409, CC13-17 (2012) [View PDF (147 kB)] [DOI-link]
	377.		Metal slanted columnar thin film THz optical sensors T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C. Herzinger, J. Woollam, E. Schubert, and M. Schubert Mat. Res. Soc. Symp. Proc. 1409, CC13-31 (2012) [View PDF (748 kB)] [DOI-link]
	376.		Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films K. B. Rodenhausen, D. Schmidt, T. Kasputis, A. K. Pannier, E. Schubert, and M. Schubert Opt. Express 20, 5419-5428 (2012) [View PDF (1.5 MB)] [DOI-link]
	375.		Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and V. Darakchieva Appl. Phys. Lett. 101, 192102 (2012) [View PDF (508 kB)] [DOI-link]
	374.		Sensing change M. Schubert International Innovation 11, 91-93 (2012) [View PDF (3.9 MB)]
	373.		Terahertz-infrared ellipsometer system, and method of use C. M. Herzinger, M. Schubert, T. Hofmann, M. M. Liphardt, and J. A. Woollam U. S. Pat. App. Publ. 20120261580, (2012)
	372.		Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfaces C. M. Herzinger, B. D. Johs, M. Schubert, and T. Hofmann U. S. Pat. Grant 8248607, (2012)
	371.		Terahertz-infrared ellipsometer system, and method of use C. M. Herzinger, M. Schubert, T. Hofmann, M. M. Liphardt, and J. A. Woollam U. S. Pat. App. Publ. 20120206724, (2012)
	370.		Polarization-Coupled Ferroelectric Unipolar Junction Memory And Energy Storage Device M. Schubert, T. Hofmann, and V. R. Voora U. S. Pat. App. Publ. 20120081943, (2012)
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	2011:
	369.		Terahertz ellipsometry and terahertz optical-Hall effect T. Hofmann, C.M. Herzinger, J.L. Tedesco, D.K. Gaskill, J.A. Woollam, and M. Schubert Thin Solid Films 519, 2593 (2011) [View PDF (972 kB)] [DOI-link]
	368.		Free-charge carrier profiles of iso- and aniso-type Si homojunctions determined by terahertz and mid-infrared ellipsometry A. Boosalis, T. Hofmann, J. \vSik, and M. Schubert Thin Solid Films 519, 2604 (2011) [View PDF (355 kB)] [DOI-link]
	367.		Terahertz frequency optical-Hall effect in multiple valley band materials P. Kühne, T. Hofmann, C. M. Herzinger, and M. Schubert Thin Solid Films 519, 2613 (2011) [View PDF (582 kB)] [DOI-link]
	366.		THz dielectric anisotropy of metal slanted columnar thin films T. Hofmann, D. Schmidt, A. Boosalis, P. Kuehne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert Appl. Phys. Lett. 99, 081903 (2011) [View PDF (543 kB)] [DOI-link]
	365.		Also selected for publication in Vir. J. Biol. Phys. Res. Vol. 24 (20) (2011) Vir. J. Nan. Sci. & Tech. Vol. 23 (5) (2011) Combined Optical and Acoustical Method for Determination of Thickness and Porosity of Tranparent Organic Layers Below the Ultra-thin Film Limit K. B. Rodenhausen, T. Kasputis, A. K. Pannier, J. Y. Gerasimov, R. Y. Lai, M. Solinsky, T. E. Tiwald, H. Wang, A. Sarkar, T. Hofmann, N. Ianno, and M. Schubert Rev. Sci. Instrum. 82, 103111 (2011) [View PDF (793 kB)] [DOI-link]
	364.		Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer D. Schmidt, C. Müller, T. Hofmann, O. Inganäs, H. Arwin, E. Schubert, and M. Schubert Thin Solid Films 519, 2645 (2011) [View PDF (734 kB)] [DOI-link]
	363.		Micelle-assisted bilayer formation of cetyltrimethlyammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques K. B. Rodenhausen, M. Guericke, A. Sarkar, T. Hofmann, N. Ianno, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner Thin Solid Films 519, 2821-2824 (2011) [View PDF (457 kB)] [DOI-link]
	362.		Temperature dependent model dielectric function of highly disordered Ga0.52In0.48P E. Montgomery, C. Krahmer, K. Streubel, T. Hofmann, E. Schubert, and M. Schubert Thin Solid Films 519, 2859 (2011) [View PDF (532 kB)] [DOI-link]
	361.		In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques K. B. Rodenhausen, B. A. Duensing, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner Thin Solid Films 519, 2817-2820 (2011) [View PDF (547 kB)] [DOI-link]
	360.		Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods K. B. Rodenhausen, and M. Schubert Thin Solid Films 519, 2772-2776 (2011) [View PDF (311 kB)] [DOI-link]
	359.		Selected for publication in Vir. J. Nan. Sci. & Tech. Vol. 23 (5) (2011) Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert Appl. Phys. Lett. 98, 041906 (2011) [View PDF (175 kB)] [DOI-link]
	358.		Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam and W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann Appl. Phys. Lett. 98, 092103 (2011) [View PDF (153 kB)] [DOI-link]
	357.		Optical properties of GaAs0.9-xNxSb0.1 alloy films studied by spectroscopic ellipsometry N. B. Sedrine, C. Bouhafs, M. Schubert, J. C. Harmand, R. Chtourou, and V. Darakchieva Thin Solid Films 519, 2838–2842 (2011) [View PDF (733 kB)] [DOI-link]
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	2010:
	356.		Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures V.M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, H. Schmidt, N. Ianno, and M. Schubert Phys. Rev. B 81, 195307 (2010) [View PDF (703 kB)] [DOI-link]
	355.		Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam Thin Solid Films 518, 1830 (2010) [View PDF (582 kB)] [DOI-link]
	354.		Ab-initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4Se3 L. Makinistian, E.A. Albanesi, N.V. Gonzalez Lemus, A.G. Petukhov, D. Schmidt, E. Schubert, M. Schubert, Ya.B. Losovyj, P. Galiy, and P. Dowben Phys. Rev. B 81, 075217 (2010) [View PDF (770 kB)] [DOI-link]
	353.		Magneto-optical Properties of Cobalt Slanted Columnar Thin Films D. Schmidt, T. Hofmann, C. M. Herzinger, E. Schubert, and M. Schubert Appl. Phys. Lett. 96, 091906 (2010) [View PDF (262 kB)] [DOI-link]
	352.		Variable-wavelength frequency-domain THz ellipsometry T. Hofmann, C.M. Herzinger, A. Boosalis, T.E. Tiwald, J.A. Woollam, and M. Schubert Rev. Sci. Instrum. 81, 023101 (2010) [View PDF (303 kB)] [DOI-link]
	351.		Voigt effect measurement on PLD grown NiO thin films C. Scarlat, K. M. Mok, S. Zhou, M. Vinnichenko, M. Lorenz, M. Grundmann, M. Helm, M. Schubert, and H. Schmidt phys. stat. sol. c 7, 334 (2010) [View PDF (223 kB)] [DOI-link]
	350.		Hydrogen in InN: a ubiquitous phenomenon in molecular beam epitaxy grown material V. Darakchieva, K. Lorenz, N.P. Barradas, E. Alves, B. Monemar, M. Schubert, N. Franco, C.L Hsiao and L.C. Chen, W.J. Schaff, L.W. Tu, T. Yamaguchi, and Y. Nanishi Appl. Phys. Lett 96, 081907 (2010) [View PDF (239 kB)] [DOI-link]
	349.		Protein adsorption on and swelling of polyelectrolyte brushes: a simultaneous ellipsometry-quartz crystal microbalance study E. Bittrich, K. B. Rodenhausen, K. Eichhorn, T. Hofmann, M. Schubert, M. Stamm, and P. Uhlmann Biointerphases 5, 159 (2010) [View PDF (761 kB)] [DOI-link]
	348.		Terahertz Resonator E. Schubert, M. Schubert, and T. Hofmann U. S. Pat. App. Publ. 20100295635, (2010)
	347.		Mass Sensor M. Schubert, E. Schubert, T. Hofmann, and D. Schmidt U. S. Pat. App. Publ. 20100245820, (2010)
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	2009:
	346.		Free electron behavior in InN: on the role of dislocations and surface electron accumulation V. Darakchieva, T. Hofmann, M. Schubert, B. E. Sernelius, B. Monemar, P. O. A. Persson, F. Giuliani, E. Alves, H. Lu, and W. J. Schaff Appl. Phys. Lett. 94, 022109 (2009) [View PDF (200 kB)] [DOI-link]
	345.		Monitoring Organic Thin Film Growth in Aqueous Solution In-situ with a Combined Quartz Crystal Microbalance and Ellipsometry A. Sarkar, T. Viitala, T. Hofmann, T.E. Tiwald, J.A. Woollam, A. Kjerstad, B. Laderian, and M. Schubert Mat. Res. Soc. Symp. 1146E, 1146-NN09-02 (2009) [View PDF (216 kB)] [DOI-link]
	344.		Hole diffusion profile in a p-p+ Silicon homojunction determined by terahertz and mid-infrared spectroscopic ellipsometry T. Hofmann, C.M. Herzinger, T.E. Tiwald, J.A. Woollam, and M. Schubert Appl. Phys. Lett. 95, 032102 (2009) [View PDF (230 kB)] [DOI-link]
	343.		Annealing effects on the optical properties of semiconducting boron carbide R.B. Billa, T. Hofmann, M. Schubert, and B.W. Robertson J. Appl. Phys. 106, 033515 (2009) [View PDF (239 kB)] [DOI-link]
	342.		Materials Characterization using THz Ellipsometry T. Hofmann, C.M. Herzinger, J.A. Woollam, and M. Schubert Mat. Res. Soc. Symp. Proc. 1163E, 1163-K08-04 (2009) [View PDF (106 kB)] [DOI-link]
	341.		Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam Mat. Res. Soc. Symp. Proc. 1123, P02-02 (2009) [View PDF (245 kB)] [DOI-link]
	340.		Characterizing antireflection coatings on textured mono-crystalline Si with spectroscopic ellipsometry J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam IEEE Photovoltaic Specialists Conference ISBN 978-1-4244-2949-3, 001407-001411 (2009) [View PDF (1.5 MB)] [DOI-link]
	339.		Optical and magnetic properties of Co nanostructure thin films D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert Mat. Res. Soc. Symp. Proc. 1142, 1142-JJ09-04 (2009) [View PDF (502 kB)]
	338.		Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert Appl. Phys. Lett. 94, 011914 (2009) [View PDF (381 kB)] [DOI-link]
	337.		Electrical properties of ZnO-BaTiO3-ZnO heterostructures with asymmetric interface charge distribution V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert Appl. Phys. Lett. 95, 082902 (2009) [View PDF (595 kB)] [DOI-link]
	336.		Terahertz Ellipsometry Using Electron-Beam Based Sources T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert Mat. Res. Soc. Symp. 1108, A08-04 (2009) [View PDF (109 kB)] [DOI-link]
	335.		Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert Opt. Lett. 34, 992 (2009) [View PDF (300 kB)] [DOI-link]
	334.		Interface-charge-coupled polarization response of Pt-ZnO-BaTiO3-ZnO-Pt heterostructures: Three-layer model expansion V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert Mat. Res. Soc. Symp. Proc. 1110, 1110-C06-14 (2009) [View PDF (177 kB)] [DOI-link]
	333.		Optical, structural, and magnetic properties of cobalt nanostructure thin films D. Schmidt, A. C. Kjerstad, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert J. Appl. Phys. 105, 113508 (2009) [View PDF (656 kB)] [DOI-link]
	332.		Resistive hysteresis and interface charge coupling in BaTiO3-ZnO heterostructures V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert Appl. Phys. Lett. 94, 142904 (2009) [View PDF (536 kB)] [DOI-link]
	331.		Electron accumulation at nonpolar and semi-polar surfaces of wurtzite InN from generalized infrared ellipsometry V. Darakchieva, M. Schubert, T. Hofmann, B. Monemar, Y. Takagi, and Y. Nanishi Appl. Phys. Lett. 95, 202103 (2009) [View PDF (569 kB)] [DOI-link]
	330.		Role of impurities and dislocations for the unintentional n-type conductivity in InN V. Darakchieva, E. Alves, M.-Y. Xie, N. P. Barradas, K. Lorenz, M. Schubert, P.O.ºA. Persson, F. Giuliani, F. Munnik, C.-L. Hsiao, L.-C. Chen, and W. J. Schaff Physica B 404, 4476 (2009) [View PDF (1.7 MB)] [DOI-link]
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	2008:
	329.		The optical Hall effect T. Hofmann, C.M. Herzinger, C. Krahmer, K. Streubel, and M. Schubert phys. stat. sol. (a) 205, 779 (2008) [View PDF (2.7 MB)] [DOI-link]
	328.		Dielectric and magnetic birefringence in low-chlorine-doped n-type Zn1-xMnxSe M. F. Saenger, M. Hetterich, R. D. Kirby, D. J. Sellmyer, and M. Schubert phys. stat. sol. (c) 5, 1007 (2008) [View PDF (493 kB)] [DOI-link]
	327.		Investigation of the free charge carrier properties at the ZnO sapphire interface in a-plane ZnO films studied by generalized infrared ellipsometry Ch. Sturm, T. Chavdarov, R. Schmidt-Grund, B. Rheinlaeander, C. Bundesmann, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann phys. stat. sol. (c) , (2008) [View PDF (392 kB)] [DOI-link]
	326.		Generalized Ellipsometry Determination of Non-reciprocity in Chiral Silicon Sculptured Thin Films D. Schmidt, E. Schubert, and M. Schubert phys. stat. sol. (a) 205, 748 (2008) [View PDF (1.0 MB)] [DOI-link]
	325.		Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert phys. stat. sol. (c) 5, 1328 (2008) [View PDF (424 kB)] [DOI-link]
	324.		Polaron transitions in charge intercalated amorphous tungsten oxide thin films M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert phys. stat. sol. (a) 205, 914 (2008) [View PDF (580 kB)] [DOI-link]
	323.		Optical Hall-effect in hexagonal InN T. Hofmann, V. Darakchieva, B. Monemar, H. Lu, W. J. Schaff, and M. Schubert J. Electron. Mater 37, 611-615 (2008) [View PDF (420 kB)] [DOI-link]
	322.		Interface-charge-coupled polarization response of Pt-BaTiO3-ZnO-Pt heterojunctions: A physical model approach V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert J. Electron. Mater 37, 1029-1034 (2008) [View PDF (397 kB)] [DOI-link]
	321.		Optical Hall effect studies on modulation-doped AlxGa1-xAs:Si/GaAs quantum wells T. Hofmann, C. von Middendorff, V. Gottschalch, and M. Schubert phys. stat. sol. (c) 5, 1386 - 1390 (2008) [View PDF (400 kB)] [DOI-link]
	320.		Vacuum Ultraviolet Dielectric Function and Band Structure of ZnO R. Schmidt-Grund, B. Rheinländer, E. M. Kaidashev, M. Lorenz, M. Grundmann, D. Fritsch, M. Schubert, H. Schmidt, and C. M. Herzinger Journal of the Korean Physical Society 53, 88-93 (2008) [View PDF (568 kB)]
	319.		Polaron and Phonon properties in proton intercalated amorphous tungsten oxide thin films M. F. Saenger, T. Höing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, and M. Schubert Phys. Rev. B 75, 245205 (2008) [View PDF (987 kB)] [DOI-link]
	318.		Interface-charge-coupled polarization response model of Pt-BaTiO3-ZnO-Pt heterojunctions: Physical parameters variation V. M. Voora, T. Hofmann, A. C. Kjerstad, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert Mat. Res. Soc. Symp. Proc. 1074E, 1074-I01-11 (2008) [View PDF (87 kB)]
	317.		Infrared behavior of aluminum nanostructure sculptured thin films T. Hofmann, M. Schubert, D. Schmidt, and E. Schubert Mat. Res. Soc. Symp. Proc. 1080E, 1080-O04-16 (2008) [View PDF (598 kB)] [DOI-link]
	316.		Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert J. Cryst. Growth 310, 959-965 (2008) [DOI-link]
	315.		Kramers-Kronig-consistent optical functions of anisotropic crystals: generalized spectroscopic ellipsometry on pentacene M. Dressel, B. Gompf, D. Faltermeier, A. K. Tripathi, J. Pflaum, and M. Schubert Opt. Express 16, 19770 (2008) [View PDF (265 kB)] [DOI-link]
	314.		In-situ monitoring of the p- and n-type doping in AlGaInP C. Krahmer, A. Behres, M. Schubert, and K. Streubel J. Cryst. Growth 310, 4727 (2008) [DOI-link]
	313.		Characterization of an optically pumped ZnO-based 3rd order distributed feedback laser D. Hofstetter, Y. Bonetti, E. BaumannF, R. Giorgetta, A.-H. El-Shaer, A. Bakin, A. Waag, R. Schmidt-Grund, M. Grundmann, and M. Schubert SPIE Vol. 6895, 68950J (2008) [DOI-link]
	312.		Unravelling the free electron behavior in InN V. Darakchieva, T. Hofmann, M. Schubert, B.E. Sernelius, F. Giuliani, M.-Y. Xie, P.O.A. Persson, B. Monemar, W.J. Schaff, C.-L. Hsiao, L.-C. Chen, and Y. Nanishi Conference on Optoelectronic and Microelectronic Materials and Devices ISBN 978-1-4244-2716-1, 90-97 (2008) [View PDF (718 kB)] [DOI-link]
	311.		Preface: phys. stat. sol. (c) 5/5 pages 1000-1002 (4th International Conference on Spectroscopic Ellipsometry Stockholm 2007) H. Arwin, U. Beck, and M. Schubert phys. stat. sol. c 5, 1000–1002 (2008) [View PDF (269 kB)] [DOI-link]
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	2007:
	310.		Demonstration of an ultraviolet ZnO-based optically pumped third order distributed feedback laser D. Hofstetter, Y. Bonetti,, F. R. Giorgetta, A-H El-Shaer, A. Bakin, A. Waag, R. Schmidt-Grund, M. Schubert, and M. Grundmann Appl. Phys. Lett. 91, 111108 (2007) [View PDF (423 kB)] [DOI-link]
	309.		Dielectric constants and phonon modes of amorphous hafnium aluminate deposited by metal organic chemical vapor deposition C. Bundesmann, O. Buiu, S. Hall, and M. Schubert Appl. Phys. Lett. 91, 121916 (2007) [View PDF (139 kB)] [DOI-link]
	308.		Electron effective mass and phonon modes in GaAs incorporating boron and indium T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch Appl. Phys. Lett. 90, 182110 (2007) [View PDF (96 kB)] [DOI-link]
	307.		Polarization coupling in epitaxial ZnO / BaTiO3 thin film heterostructures on SrTiO3 (100) substrates M. Lorenz, M. Brandt, J. Schubert, H. Hochmuth, H. von Wenckstern, M. Schubert, and M. Grundmann SPIE Vol. 6474, 64741S (2007) [DOI-link]
	306.		Anisotropic strain and phonon deformation potentials in GaN V. Darakchieva, T. Paskova, M. Schubert, H. Arwin, P. P. Paskov, B. Monemar, D. Homme, M. Heuken, J. Off, F. Scholz, B. A. Haskell, P. T. Fini, J. S. Speck, and S. Nakamura Phys. Rev. B 75, 195217 (2007) [View PDF (850 kB)] [DOI-link]
	305.		Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints E. Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, B. Gallas, and M. Schubert Adv. Solid State Phys. 46, 309-320 (2007) [View PDF (1.1 MB)] [DOI-link]
	304.		Dielectric anisotropy and phonon modes of ordered indirect-gap Al0.52In0.48P studied by far-infrared ellipsometry T. Hofmann, V. Gottschalch, and M. Schubert Appl. Phys. Lett. 91, 121908 (2007) [View PDF (217 kB)] [DOI-link]
	303.		Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers V. Darakehieva, T. Paskova, M. Schubert, P. P. Paskov, H. Arwin, B. Monemar, D. Hommel, M. Heuken, J. Off, B. A. Haskell, P. T. Fini, J. S. Speck, and S. Nakamura J. Cryst. Growth 300, 233-238 (2007) [DOI-link]
	302.		MOVPE growth investigations of doping and ordering in AlGaAs and GaInP with reflectance anisotropy spectroscopy C. Krahmer, M. Philippens, M. Schubert, and K. Streubel J. Cryst. Growth 298, 18-22 (2007) [DOI-link]
	301.		RAPID MATERIAL OPTICAL DIAGNOSTICS METHOD M. Schubert U. S. Pat. App. Publ. 20070229826, (2007)
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	2006:
	300.		Terahertz generalized Mueller-matrix ellipsometry T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert SPIE Vol. 6120, 61200D (2006) [DOI-link]
	299.		Temperature-dependence of the refractive index and the optical transitions at the fundamental band-gap of ZnO R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann AIP Conf. Proc. 893, 271 (2006) [DOI-link]
	298.		Phonon modes, dielectric constants, and exciton mass parameters in ternary MgxZn1-xO C. Bundesmann, M. Lorenz, M. Grundmann, and M. Schubert Mat. Res. Soc. Symp. Proc. 928E, GG05-03 (2006) [View PDF (114 kB)]
	297.		Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN V. Darakchieva, T. Paskova, P. P. Paskov, H. Arwin, M. Schubert, B. Monemar, S. Figge, D. Hommel, B. A. Haskell, P. T. Fini, and S. Nakamura phys. stat. sol. b 243, 1594-1598 (2006) [View PDF (244 kB)] [DOI-link]
	296.		Refractive indices and band-gap properties of rocksalt MgxZn1-xO (0.68 < x < 1) R. Schmidt-Grund, A. Carstens, B. Rheinländer, D. Spemann, H. Hochmut, G. Zimmermann, M. Lorenz, M. Schubert, C. M. Herzinger, and M. Grundmann J. App. Phys. 99, 123701 (2006) [View PDF (183 kB)] [DOI-link]
	295.		Terahertz magnetooptic generalized ellipsometry using synchrotron and black-body radiation T. Hofmann, U. Schade, W. Eberhardt, C. M. Herzinger, P. Esquinazi, and M. Schubert Rev. Sci. Inst. 77, 063902 (2006) [View PDF (313 kB)] [DOI-link]
	294.		Infrared optical properties of MgxZn1-xO thin films: Long-wavelength optical phonons and dielectric constants C. Bundesmann, A. Rahm, M. Lorenz, M. Grundmann, and M. Schubert J. App. Phys. 99, 113504 (2006) [View PDF (339 kB)] [DOI-link]
	293.		Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magnetooptic ellipsometry T. Hofmann, U. Schade, K. C. Agarwal, B. Daniel, C. Klingshirn, M. Hetterich, C. M. Herzinger, and M. Schubert Appl. Phys. Lett. 88, 042105 (2006) [View PDF (85 kB)] [DOI-link]
	292.		Anisotropy of the Gamma-point effective mass and mobility in hexagonal InN T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert phys. stat. sol. c 3, 1854-1857 (2006) [View PDF (252 kB)] [DOI-link]
	291.		Phonon properties and doping of ZnMnSe epilayers grown by molecular beam epitaxy K. C. Agarwal, B. Daniel, T. Hofmann, M. Schubert, C. Klingshirn, and M. Hetterich phys. stat. sol. b 243, 914 (2006) [View PDF (268 kB)] [DOI-link]
	290.		Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high-pressure annealing T. Paskova, V. Darakchieva, P. P. Paskov, B. Monemar, M. Bukowski, T. Suskiand N. Ashkenov, M. Schubert, and D. Hommel phys. stat. sol. c 3, 1475 (2006) [DOI-link]
	289.		Recrystallization behavior in chiral sculptured thin films from silicon E. Schubert, J. Fahlteich, B. Rauschenbach, M. Schubert, M. Lorenz, M. Grundmann, and G. Wagner J. Appl. Phys. 100, 016107 (2006) [View PDF (217 kB)] [DOI-link]
	288.		Effect of high-temperature annealing on the residual strain and bending of freestanding GaN films grown by hydride vapor phase epitaxy T. Paskova, D. Hommel, P. P. Paskov, V. Darakchieva, B. Monemar, M. Bockowski, T. Suski, I. Grzegory, F. Tuomisto, K. Saarinen, N. Ashkenov, and M. Schubert Appl. Phys. Lett. 88, 141909 (2006) [View PDF (535 kB)] [DOI-link]
	287.		In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy in an industrial used multi wafer reactor C. Krahmer, M. Philippens, M. Schubert, and K. Streubel phys. stat. sol. c 3, 655-658 (2006) [View PDF (237 kB)] [DOI-link]
	286.		Another century of ellipsometry (Special issue on Paul Karl Ludwig Drude) M. Schubert Annalen der Physik 15, 480-497 (2006) [View PDF (1.8 MB)] [DOI-link]
	285.		Low temperature photoluminescence and infrared dielectric functions of pulsed laser deposited ZnO thin films on silicon S. Heitsch, C. Bundesmann, G. Wagner, G. Zimmermann, A. Rahm, H. Hochmuth, G. Benndorf, H. Schmid t, M. Schubert, M. Lorenz, and M. Grundmann Thin Solid Films 496, 234-239 (2006) [View PDF (351 kB)] [DOI-link]
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	2005:
	284.		Optische Bestimmung der Eigenschaften freier Ladungsträger in ZnO-Dünnfilmen mittels spektroskopischer Infrarotellipsometrie C. Bundesmann, M. Schubert, H. v. Wenckstern, M. Lorenz, and M. Grundmann Tagungsband des 3. TCO-Workshops des Forschungsverbundes Solarenergie, Freyburg/Unstrut , 34-36 (2005) [View PDF (87 kB)]
	283.		Composition and properties of ZnS thin films prepared by chemical bath deposition from acid and basic solutions L. V. Mahkova, I. Konovalov, R. Szargan, N. Ashkenov, M. Schubert, and T. Chassé phys. stat. sol. (c) 2, 1206 - 1211 (2005) [View PDF (280 kB)] [DOI-link]
	282.		Adsorption of human serum albumin in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin phys. stat. sol. (c) 2, 3293 - 3297 (2005) [View PDF (230 kB)] [DOI-link]
	281.		Rectifying semiconductor-ferro electric polarization loops and offsets in Pt-BaTiO3-ZnO-Pt thin film capacitor structures N. Ashkenov, M. Schubert , E. Twerdowski , H. von Wenckstern, B. N. Mbenkum, H. Hochmuth, M. Lorenz, W. Grill, and M. Grundmann Thin Solid Films 486, 153-157 (2005) [View PDF (283 kB)] [DOI-link]
	280.		Phonon mode behavior of wurtzite AlN/GaN superlattices V. Darakchieva, E. Valcheva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, H. Amano, and I. Akasaki Phys. Rev. B 71, 115329 (2005) [View PDF (188 kB)] [DOI-link]
	279.		Temperature-dependent dielectric and electro-optic properties of a ZnO-BaTiO3-ZnO heterostructure grown by pulsed-laser deposition B. N. Mbenkum, N. Ashkenov, M. Schubert, M. Lorenz, H. Hochmuth, D. Michel, M. Grundmann, and G. Wagner Appl. Phys. Lett. 86, 091904 (2005) [View PDF (130 kB)] [DOI-link]
	278.		Structural characteristics and lattice parameters of hydride vapor phase epitaxial GaN free-standing quasisubstrates V. Darakchieva, T. Paskova, P. P. Paskov, B. Monemar, N. Ashkenov, and M. Schubert J. Appl. Phys. 97, 013517 (2005) [View PDF (98 kB)] [DOI-link]
	277.		Long-wavelength interface modes in semiconductor layer structures M. Schubert, T. Hofmann, and J. Sik Phys. Rev. B 71, 035324 (2005) [View PDF (382 kB)] [DOI-link]
	276.		The inertial-mass scale for free-charge-carriers in semiconductor heterostructures T. Hofmann, M. Schubert, C. von Middendorff, G. Leibiger, V. Gottschalch, C. M. Herzinger, A. Lindsay, and E. O'Reilly AIP Conference Proceedings 772, 455-456 (2005) [DOI-link]
	275.		Electro-optic Raman observation of low temperature phase transitions in ZnO-BaTiO3-ZnO heterostructures B. N. Mbenkum, N. Ashkenov, M. Schubert, and M. Lorenz AIP Conf. Proc. 772, 401-402 (2005) [DOI-link]
	274.		Combined Raman scattering, X-ray fluorescence and ellipsometry in-situ growth monitoring of CuInSe2-based photoabsorber layers on polyimide substrates C. Bundesmann, M. Schubert, N. Ashkenov, M. Grundmann, G. Lippold, and J. Piltz AIP Conf. Proc. 772, 165 (2005) [View PDF (594 kB)] [DOI-link]
	273.		Band-to-band transitions and optical properties of MgxZn1-xO (0 < x < 1) films R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann AIP Conf. Proc. 772, 201 (2005) [View PDF (45 kB)] [DOI-link]
	272.		Lichtstarke kompakte in-situ Ramansonde M. Schubert, C. Bundesmann, and G. Lippold Patent application , DE 10 2004 006 391 A1 (2005) [View PDF (165 kB)]
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	2004:
	271.		High pressure annealing of HVPE GaN free-standing films: redistribution of defects and stress T. Paskova, T. Suski, M. Bockowski, P.P. Paskov, V. Darakchieva, B. Monemar, F. Tuomisto, K. Saarinen, N. Ashkenov, M. Schubert, C. Roder, and D. Hommel Mat. Res. Soc. Symp. Proc. 831, E8.18.1 (2004) [View PDF (273 kB)] [DOI-link]
	270.		Infrared Ellipsometry and Raman Studies of hexagonal InN films: correlation between strain and vibrational properties V. Darakchieva, P. Paskov, E. Valcheva, T. Paskova, M. Schubert, C. Bundesmann, H. Lu, W. J. Schaff, and B. Monemar Superlattices and Microstructures 36, 573-580 (2004) [View PDF (331 kB)] [DOI-link]
	269.		Micro-Raman scattering profiling studies on HVPE-grown free-standing GaN A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, and M. Schubert phys. stat. sol. (a) 201, 2773-2776 (2004) [View PDF (123 kB)]
	268.		Infrared dielectric function and phonon modes of Mg-rich cubic MgxZn1-xO (x > 0.67) thin films on sapphire [0001] C. Bundesmann, M. Schubert, D. Spemann, A. Rahm, H. Hochmuth, M. Lorenz, and M. Grundmann Appl. Phys. Lett. 85, 905 (2004) [View PDF (74 kB)] [DOI-link]
	267.		Strain related structural and vibrational properties of thin epitaxial AlN layers V. Darakchieva, J. Birch, M. Schubert, T. Paskova , S. Tungasmita, G. Wagner, A. Kasica, and B. Monemar Phys. Rev. B 70, 045411 (2004) [View PDF (359 kB)] [DOI-link]
	266.		Near-band-gap dielectric function of Zn1-xMnxSe thin films determined by spectroscopic ellipsometry J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, D. Litvinov, and D. Gerthsen Phys. Rev. B 70, 045316 (2004) [DOI-link]
	265.		Deformation potentials of the E1(TO) and E2 modes of InN V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, B. Monemar, M. Schubert, H. Lu, and W. J. Schaff Appl. Phys. Lett. 84, 3636 (2004) [View PDF (57 kB)] [DOI-link]
	264.		Optical modelling of a layered photovoltaic device with a polyfluorene-copolymer as the active layer Nils-Krister Persson, M. Schubert, and O. Inganäs Solar Energy Materials and Solar Cells 83, 169-186 (2004) [View PDF (612 kB)] [DOI-link]
	263.		Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and D. Gerthsen Thin Solid Films 455-456, 228-230 (2004) [View PDF (133 kB)] [DOI-link]
	262.		Infrared to Vacuum Ultraviolet Optical Properties of 3C, 4H and 6H Silicon Carbide Measured by Spectroscopic Ellipsometry O. P. A. Lindquist, M. Schubert, H. Arwin, and K. Järrendahl Thin Solid Films 455-456, 235-238 (2004) [View PDF (116 kB)] [DOI-link]
	261.		Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin Thin Solid Films 455-456, 726-730 (2004) [View PDF (386 kB)] [DOI-link]
	260.		Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry G. Leibiger, V. Gottschalch, N. Razek, A. Schindler, and M. Schubert Thin Solid Films 455-456, 231-234 (2004) [View PDF (106 kB)] [DOI-link]
	259.		UV-VUV Spectroscopic ellipsometry of ternary MgxZn1-xO (x<0.53) thin films R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann Thin Solid Films 455-456, 500-504 (2004) [View PDF (259 kB)]
	258.		Far-Infrared Dielectric Function and Phonon Modes of Sponateously Ordered (AlxGa1-x)0.52In0.48P T. Hofmann, M. Schubert, and V. Gottschalch Thin Solid Films 455-456, 601-604 (2004) [View PDF (154 kB)] [DOI-link]
	257.		Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes, and band-to-band transitions of Sb2S3 M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase Thin Solid Films 455-456, 619-623 (2004) [View PDF (282 kB)] [DOI-link]
	256.		Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, and M. Grundmann Thin Solid Films 455-456, 161-166 (2004) [View PDF (158 kB)] [DOI-link]
	255.		Infrared ellipsometry characterization of conducting thin organic films M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs Thin Solid Films 455-456, 295-300 (2004) [View PDF (136 kB)] [DOI-link]
	254.		Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures M. Schubert, T. Hofmann, and C. M. Herzinger Thin Solid Films 455-456, 563-570 (2004) [View PDF (239 kB)] [DOI-link]
	253.		Optical and structural characteristics of virtually unstrained bulk-like GaN D. Gogova, A. Kasic, H. Larsson, B. Pécz, R. Yakimova, B. Magnusson, B. Monemar, F. Tuomisto, K. Saarinen, C. R. Miskys, M. Stutzmann, C. Bundesmann, and M. Schubert Jpn. J. Appl. Phys. 43, 1264 (2004) [DOI-link]
	252.		Carrier redistribution in organic/inorganic (poly(3,4-ethylenedioxy thiophene/poly(styrenesulfonate)polymer)-Si) heterojunction determined from infrared ellipsometry M. Schubert, C. Bundesmann, H. v. Wenckstern, G. Jakopic, A. Haase, N.-K. Persson, F. Zhang, H. Arwin, and O. Inganäs Appl. Phys. Lett. 84, 1311-1313 (2004) [View PDF (63 kB)]
	251.		Strain evolution and phonons in AlN/GaN superlattices V. Darakchieva, P. P. Paskov, M. Schubert, E. Valcheva, T. Paskova, H. Arwin, B. Monemar, H. Amano, and I. Akasaki Mat. Res. Soc. Symp. 798, Y5.60 (2004) [DOI-link]
	250.		Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition M. Schubert, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner Ann. Phys. 13, 61-62 (2004) [View PDF (213 kB)] [DOI-link]
	249.		Infrared dielectric function and vibrational modes of pentacene thin films M. Schubert, C. Bundesmann, G. Jakopic, and H. Arwin Appl. Phys. Lett. 84, 200-202 (2004) [View PDF (54 kB)]
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	2003:
	248.		Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon A. Dadgar, A. Strittmatter, J. Bläsing, M. Poschenrieder, O. Contreras, P. Veit, T. Riemann, F. Bertram, A. Reiher, A. Krtschil, A. Diez, T. Hempel, T. Finger, A. Kasic, M. Schubert, D. Bimberg, F. A. Ponce, J. Christen, and A. Krost phys. stat. sol. (c) 0, 1583-1606 (2003) [View PDF (3.1 MB)]
	247.		Phonons and free-carrier properties of binary, ternary, and quaternary group-III nitride layers measured by Infrared Spectroscopic Ellipsometry A. Kasic, M. Schubert, J. Off, B. Kuhn, F. Scholz, S. Einfeldt, T. Böttcher, D. Hommel, D. J. As, U. Köhler, A. Dadgar, A. Krost, Y. Saito, Y. Nanishi, M. R. Correia, S. Pereira, V. Darakchieva, B. Monemar, H. Amano, I. Akasaki, and G. Wagner phys. stat. sol. (c) 0, 1750 (2003) [View PDF (1.3 MB)]
	246.		Phonons and polaritons in semiconductor layer structures M. Schubert , and T. Hofmann SPIE Vol. 5218, 210-222 (2003) [DOI-link]
	245.		Generalized infrared ellipsometry study of thin epitaxial AlN layers with complex strain behavior V. Darakchieva, M. Schubert, J. Birch, A. Kasic, S. Tungasmita, T. Paskova, and B. Monemar Physica B 340-342, 416 (2003) [View PDF (568 kB)]
	244.		Optical properties of undoped AlN/GaN superlattices grown by metal orgaic vapor phase epitaxy V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Kamiyama, M. Iwaya, H. Amano, and I. Akasaki phys. stat. sol. c 0, 2614–2617 (2003) [View PDF (191 kB)] [DOI-link]
	243.		Raman scattering in ZnO thin films doped with Fe, Sb, Ga and Li C. Bundesmann, N. Ashkenov, M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, and M. Grundmann Appl. Phys. Lett. 83, 1974-1976 (2003) [View PDF (59 kB)]
	242.		Interband transitions and phonon modes in GaBxAs1-x (0 <= x < 0.33) and GaNxAs1-x (0 <= x < 0.29) G. Leibiger, V. Gottschalch, V. Riede, M. Schubert, J. N. Hilfiker, and T. E. Tiwald Phys. Rev. B 67, 195205 (2003) [View PDF (120 kB)] [DOI-link]
	241.		Optical properties of ternary MgZnO thin films R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, J. Lenzner, and M. Grundmann IoP Conf. Series 171, P11 (2003) [View PDF (291 kB)]
	240.		Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures T. Hofmann, M. Grundmann, C. M. Herzinger, M. Schubert, and W. Grill Mat. Res. Soc. Symp. Proc. 744, M5.32.1-6 (2003) [View PDF (154 kB)]
	239.		Far-Infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P T. Hofmann, V. Gottschalch, and M. Schubert Mat. Res. Soc. Symp. Proc. 744, M5.33.1-6 (2003) [View PDF (129 kB)]
	238.		Far-infrared-magneto-optic Ellipsometry characterization of free-charge-carrier properties in highly disordered n-type Al0.19Ga0.33In0.48P T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka Appl. Phys. Lett. 82, 3463-3465 (2003) [View PDF (55 kB)] [DOI-link]
	237.		Residual strain in HVPE GaN free-standing and re-grown homoepitaxial layers V. Darakchieva, T. Paskova, P.P. Paskov, B. Monemar, N. Ashkenov, and M. Schubert phys. stat. sol. (a) 195, 516-522 (2003) [View PDF (484 kB)]
	236.		Dielectric functions (1 to 5 eV) of wurtzite MgxZn1-xO (x<0.29) thin films R. Schmidt, B. Rheinländer, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, A. Rahm, H. C. Semmelhack, and M. Grundmann Appl. Phys. Lett. 82, 2260-2262 (2003) [View PDF (75 kB)]
	235.		Infrared dielectric functions and phonon modes of high-quality ZnO films N. Ashkenov, B. N. Mbenkum, C. Bundesmann, V. Riede, M. Lorenz, E. M. Kaidashev, A. Kasic, M. Schubert, M. Grundmann, G. Wagner, and H. Neumann J. Appl. Phys. 93, 126 (2003) [View PDF (189 kB)]
	234.		Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: Determination of free-carrier effective mass, mobility and concentration parameters in n-type GaAs M. Schubert, T. Hofmann, and C. M. Herzinger J. Opt. Soc. Am. A 20, 347-356 (2003) [View PDF (257 kB)] [DOI-link]
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	2002:
	233.		Optical phonons in hexagonal AlxInyGa1-x-yN (y ~ 0.12) A. Kasic, M. Schubert, J. Off, F. Scholz, S. Einfeldt, and D. Hommel phys. stat. sol. (b) 234, 970 (2002) [View PDF (239 kB)]
	232.		Far-Infrared dielectric anisotropy and phonon modes in spontaneously CuPt-ordered Ga0.52In0.48P T. Hofmann, V. Gottschalch, and M. Schubert Phys. Rev. B 66, 195204 1-10 (2002) [View PDF (255 kB)] [DOI-link]
	231.		Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb2S3 M. Schubert, and W. Dollase Opt. Lett. 27, 2073 - 2075 (2002) [View PDF (115 kB)]
	230.		Infrared dielectric functions and phonon modes of wurtzite MgxZn1-xO (x <= 0.2) C. Bundesmann, M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, M. Grundmann, N. Ashkenov, H. Neumann, and G. Wagner Appl. Phys. Lett. 81, 2376 - 2378 (2002) [View PDF (142 kB)]
	229.		Far-infrared Magneto-Optical Generalized Ellipsometry determination of free-carrier parameters in semiconductor thin film structures T. Hofmann, M. Schubert, and C. M. Herzinger SPIE Vol. 4779, 90-97 (2002) [DOI-link]
	228.		Evolution of the optical properties of III-V Nitride alloys: Band-to-Band transitions in GaPN G. Leibiger, M. Schubert, V. Gottschalch, G. Benndorf, and R. Schwabe Phys. Rev. B 65, 245207 1-6 (2002) [View PDF (98 kB)] [DOI-link]
	227.		Generalized ellipsometry of complex mediums in layered systems M. Schubert, A. Kasic, T. Hofmann, V. Gottschalch, J. Off, F. Scholz, E. Schubert, H. Neumann, I. Hodgkinson, M. Arnold, W. Dollase, and C. M. Herzinger SPIE Vol. 4806, 264 (2002) [View PDF (608 kB)] [DOI-link]
	226.		Optical phonon modes and interband transitions in cubic AlxGa1-xN films A. Kasic, M. Schubert, T. Frey, U. Köhler, D. J. As, and C. M. Herzinger Phys. Rev. B 65, 184302 (2002) [View PDF (210 kB)] [DOI-link]
	225.		Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices E. Franke, H. Neumann, M. Schubert, C. L. Trimble, and J. A. Woollam Surf. Coat. Techn. 151-152, 285 - 288 (2002) [View PDF (141 kB)] [DOI-link]
	224.		Infrared spectroscopic ellipsometry - a new tool for characterization of semiconductor heterostructures A. Kasic, M. Schubert, S. Einfeldt, and D. Hommel Vib. Spectrosc. 29, 121 (2002) [View PDF (100 kB)] [DOI-link]
	223.		Effective electron mass and phonon modes in n-type hexagonal InN A. Kasic, M. Schubert, Y. Saito, Y. Nanishi, and G. Wagner Phys. Rev. B 65, 115206 (2002) [View PDF (156 kB)] [DOI-link]
	222.		Interband transitions in [001]-(GaP)1(InP)m superlattices M. Schubert, H. Schmi dt, J. \vSik, T. Hofmann, V. Gottschalch, W. Grill, G. Böhm, and G. Wagner Mat. Sci. Eng. B 88, 125 - 128 (2002) [View PDF (144 kB)] [DOI-link]
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	2001:
	221.		Phonon modes of GaP1-yNy measured by mid-infrared spectroscopic ellipsometry G. Leibiger, V. Gottschalch, A. Kasic, and M. Schubert Appl. Phys. Lett. 79, 3407 (2001) [View PDF (60 kB)]
	220.		Optical functions, phonon properties, and composition of InGaAsN single layers derived from far - and near - infrared spectroscopic ellipsometry G. Leibiger, V. Gottschalch, and M. Schubert J. Appl. Phys 90, 5951 - 5958 (2001) [View PDF (127 kB)]
	219.		Ellipsometry on anisotropic materials: Bragg conditions and phonons in dielectric helical thin films M. Schubert, and C. M. Herzinger phys. stat. sol. (a) 188, 1563 - 1575 (2001) [View PDF (365 kB)]
	218.		Phonon modes and critical points of GaNP G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, and M. Schubert phys. stat. sol. (a) 228, 279 - 282 (2001) [View PDF (79 kB)]
	217.		Phonon modes of InGaAsN measured by far infrared spectroscopic ellipsometry G. Leibiger, V. Gottschalch, and M. Schubert phys. stat. sol. (a) 228, 259 - 262 (2001) [View PDF (88 kB)]
	216.		Infrared Ellipsometry- a novel tool for characterization of group-III-Nitride Heterostructrues for optoelectronic device applications M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, U. Köhler, D. J. As, J. Off, B. Kuhn, F. Scholz, and J. A. Woollam phys. stat. sol. (a) 228, 437 (2001) [View PDF (462 kB)]
	215.		Infrared Spectroscopic Ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures M. Schubert, A. Kasic, S. Figge, M. Diesselberg, S. Einfeldt, D. Hommel, U. Köhler, D. J. As, J. Off, B. Kuhn, F. Scholz, J. A. Woollam, and C. M. Herzinger SPIE Vol. 4449, -8 (2001) [View PDF (901 kB)]
	214.		Infrared dielectric function and phonon modes of highly disordered (AlxGa1-x)0.52In0.48P T. Hofmann, G. Leibiger, V. Gottschalch, Ines Pietzonka, and M. Schubert Phys. Rev. B 64, 155206 (2001) [View PDF (297 kB)] [DOI-link]
	213.		Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN A. Kasic, M. Schubert, B. Kuhn, F. Scholz, S. Einfeldt, and D. Hommel J. Appl. Phys. 87, 3720 (2001) [View PDF (85 kB)]
	212.		Infrared Ellipsometry characterization of porous silicon Bragg reflectors S. Zangooie, M. Schubert, C. Trimble, D. W. Thompson, and J. A. Woollam Appl. Opt. 40, 906-912 (2001) [View PDF (302 kB)] [DOI-link]
	211.		Optical properties of amorphous and crystalline tantalum oxide thin films measured by IR-VIS-VUV (0.03eV-8.5eV) spectroscopic ellipsometry E. Franke, M. Schubert, C.L. Trimble, and J.A. Woollam Thin Solid Films 388, 283-289 (2001) [View PDF (201 kB)] [DOI-link]
	210.		Band-gap energies, optical constants, phonons and free carrier properties in GaNAs/InAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry J. Sik, M. Schubert, G. Leibiger, and V. Gottschalch J. Appl. Phys. 89, 294-305 (2001) [View PDF (321 kB)]
	209.		Anisotropic dielectric function spectra from single crystal CuInSe2with orientation domains A. Kreuter, K. Otte, G. Lippold, G. Wagner, A. Schindler, and M. Schubert Appl. Phys. Lett. 78, 195-197 (2001) [View PDF (109 kB)]
	208.		IR-VUV Dielectric Function of Al1-xInxN determined by spectroscopic ellipsometry A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger Mat. Res. Soc. Symp. 639, G6.13 (2001) [View PDF (106 kB)]
	207.		Optical Constants, Critical Points, and Phonon Modes of GaAsN Single Layers G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Sik, and M. Schubert Mat. Res. Soc. Symp. 639, G6.35 (2001) [View PDF (162 kB)]
	206.		Strain and composition dependence of the E1(TO) mode in hexagonal AlxIn1-xN thin films A. Kasic, M. Schubert, J. Off, and F. Scholz Appl. Phys. Lett. 78, 1526 (2001) [View PDF (61 kB)]
	205.		Model dielectric function spectra of GaAsN for far-infrared and near-infrared to ultra violet wavelengths G. Leibiger, V. Gottschalch, B. Rheinländer, J. Sik, and M. Schubert J. Appl. Phys. 89, 4927-4938 (2001) [View PDF (194 kB)]
	204.		Infrared optical properties of aged porous GaAs S. Zangooie, T. E. Tiwald, M. Schubert, and J. A. Woollam J. Mat. Res. 16, 1241-1244 (2001) [View PDF (84 kB)] [DOI-link]
	203.		Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs S. Zangooie, M. Schubert, D.W. Thompson, and J.A. Woollam Appl. Phys. Lett. 78, 937 (2001) [View PDF (58 kB)]
	202.		Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy M. Schubert, A. Kasic, J. Sik, S. Einfeldt, D. Hommel, V. Haerle, J. Off, and F. Scholz Mat. Sci. Eng. B 82, 178 (2001) [View PDF (204 kB)]
	201.		Effective carrier mass and mobility versus carrier concentration in p- and n-type α-GaN determined by infrared ellipsometry and Hall resistivity measurements A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz Mat. Sci. Eng. B 82, 74 (2001) [View PDF (79 kB)]
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	2000:
	200.		Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, and J. Sik IEEE International Symposium on Compound Semiconductors , 7-12 (2000) [View PDF (317 kB)] [DOI-link]
	199.		Optical properties of AlxIn1-xN thin films determined by spectroscopic ellipsometry A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger IEEE International Symposium on Compound Semiconductors , 513-518 (2000) [View PDF (367 kB)] [DOI-link]
	198.		Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 \mum using generalized ellipsometry T. E. Tiwald, and M. Schubert SPIE Vol. 4103, 19-29 (2000) [View PDF (677 kB)]
	197.		Optical properties of GaAs1-yNy G. Leibiger, B. Rheinländer, V. Gottschalch, M. Schubert, J. Sik, and G. Lippold Advanced Semiconductor Devices and Microsystems ISBN 0-7803-5939-9, 171-174 (2000) [DOI-link]
	196.		Infrared switching electrochromic devices based on tungsten oxide E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, and J.A. Woollam J. Appl. Phys. 88, 5777-5784 (2000) [View PDF (126 kB)]
	195.		Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, J.A. Woollam, and F. Frost J. Appl. Phys. 88, 5166-5174 (2000) [View PDF (255 kB)]
	194.		Nitrogen dependence of the GaAsN interband critical points E1 and E1 + Δ1 determined by spectroscopic ellipsomety G. Leibiger, V. Gottschalch, B. Rheinländer, J. Sik, and M. Schubert Appl. Phys. Lett. 77, 1650-1652 (2000) [View PDF (62 kB)]
	193.		All-Solid state electrochromic device for emittance modulation in the infrared spectral region E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, and J. A. Woollam Appl. Phys. Lett. 77, 930-932 (2000) [View PDF (46 kB)]
	192.		Near-band-gap optical functions spectra and band-gap energies of GaNAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry J. Sik, M. Schubert, G. Leibiger, G. Kirpal, V. Gottschalch, and J. Humli\vcek Appl. Phys. Lett. 76, 2859-2861 (2000) [View PDF (121 kB)]
	191.		Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry J. \v Sik, M. Schubert, T. Hofmann, and V. Gottschalch MRS Internet J. Nitride Semicond. Res. 5, 3 (2000)
	190.		Phonons and free carriers in a strained hexagonal GaN-AlN superlattice measured by Infrared Ellipsometry and Raman spectroscopy M. Schubert, A. Kasic, T.E. Tiwald, J.A. Woollam, V. Härle, and F. Scholz MRS Internet J. Nitride Semicond. Res. 5S1, W11.39 (2000) [View PDF (108 kB)]
	189.		Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald Phys. Rev. B 62, 7365 (2000) [View PDF (187 kB)] [DOI-link]
	188.		In-situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films E. Franke, M. Schubert, J. A. Woollam, J.-D. Hecht, H. Neumann, G. Wagner, and F. Bigl J. Appl. Phys. 87, 2593-2599 (2000) [View PDF (632 kB)]
	187.		Infrared dielectric anisotropy and phonon modes of sapphire M. Schubert, Tiwald, T. E., and Herzinger, C. M. Phys. Rev. B 61, 8187-8201 (2000) [View PDF (294 kB)] [DOI-link]
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	1999:
	186.		Optical phonons and free-carrier effects in MOVPE grown AlxGa1-xN measured by infrared ellipsometry M. Schubert, A. Kasic, T. E. Tiwald, J. Off, B. Kuhn, and F. Scholz MRS Internet J. Nitride Semicond. Res. 4, 11 (1999) [View PDF (309 kB)]
	185.		Isotropic dielectric functions of highly disordered AlxGa1-xInP (0 < x < 1) lattice matched to GaAs M. Schubert, Woollam, J. A., Leibiger, G., Rheinländer, B., Pietzonka, I., Saß, T., and Gottschalch, V. J. Appl. Phys. 86, 2025-2033 (1999) [View PDF (146 kB)]
	184.		Free-carrier response and lattice modes of group III-nitride heterostructures measured by infrared ellipsometry M. Schubert, J. A. Woollam, A. Kasic, B. Rheinländer, J. Off, B. Kuhn, and F. Scholz phys. stat. sol. (b) 216, 655 (1999) [View PDF (175 kB)]
	183.		Near-band-gap CuPt order birefringence in Al0.48Ga0.52InP2 M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch, and J. A. Woollam Phys. Rev. B 60, 16618 - 16634 (1999) [View PDF (337 kB)] [DOI-link]
	182.		Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry M. Schubert, T.E. Tiwald, and J.A. Woollam Appl. Opt. 38, 177-187 (1999) [View PDF (1.6 MB)] [DOI-link]
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	1998:
	181.		Spectroscopic ellipsometry: Application to complex optoelectronic layer systems B. Rheinländer, M. Schubert, and H. Schmidt Heterostructure Epitaxy and Devices ISBN 978-0-7923-5012-5, 151-154 (1998)
	180.		In-situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, H. Yao, J. A. Woollam, and J. Hahn J. Appl. Phys. 84, 526-532 (1998) [View PDF (158 kB)]
	179.		Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry J.-D. Hecht, A. Eifler, V. Riede, M. Schubert, G. Krauß, and V. Krämer Phys. Rev. B 57, 7037-7042 (1998) [View PDF (159 kB)] [DOI-link]
	178.		Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, D. Thompson, J. A. Woollam, and J. Hahn Thin Solid Films 313-314, 692-696 (1998) [View PDF (246 kB)] [DOI-link]
	177.		Generalized ellipsometry and complex optical systems M. Schubert Thin Solid Films 313-314, 323-332 (1998) [View PDF (282 kB)] [DOI-link]
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	1997:
	176.		Phase and Microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range E. Franke, M. Schubert, H. Neumann, T.E. Tiwald, D. Thompson, J.A. Woollam, J. Hahn, and F. Richter J. Appl. Phys. 82, 2906-2911 (1997) [View PDF (154 kB)]
	175.		Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry and boron nitride as an example M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and F. Richter Phys. Rev. B 56, 13306-13313 (1997) [View PDF (209 kB)]
	174.		Infrared-ellipsometry on hexagonal and cubic boron nitride thin films E. Franke, H. Neumann, M. Schubert, T.E. Tiwald, J.A. Woollam, and J. Hahn Appl. Phys. Lett. 70, 1668-1670 (1997) [View PDF (101 kB)]
	173.		Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, and F. Richter Appl. Phys. Lett. 70, 1819-1821 (1997) [View PDF (122 kB)]
	172.		Application of generalized ellipsometry to complex optical systems M. Schubert, B. Rheinländer, B. Johs, and J. A. Woollam SPIE Vol. 3094, 255-265 (1997)
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	1996:
	171.		Direct-gap reduction and valence-band splitting of ordered indirect-gap AlInP2 studied by dark-field spectroscopy M. Schubert, B. Rheinländer, E. Franke, I. Pietzonka, J. \vSkriniarova, and V. Gottschalch Phys. Rev. B 54, 17616-17619 (1996) [View PDF (147 kB)] [DOI-link]
	170.		Optical properties of microconfined liquid crystals C. Cramer, H. Binder, M. Schubert, B. Rheinländer, and H. Schmiedel Molecular Crystals and Liquid Crystals 282, 395-405 (1996) [DOI-link]
	169.		Generalized Transmission Ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals M. Schubert, B. Rheinländer, C. Cramer, H. Schmiedel, B. Johs, C. M. Herzinger, and J.A.Woollam J. Opt. Soc. Am. A 13, 1930-1940 (1996) [View PDF (2.5 MB)] [DOI-link]
	168.		Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2 M. Schubert, B. Rheinländer, J.A. Woollam, B. Johs, and C.M. Herzinger J. Opt. Soc. Am. A 13, 875-883 (1996) [View PDF (1.3 MB)] [DOI-link]
	167.		Polarization-dependent optical parameters of arbitarily anisotropic homogeneous layered systems M. Schubert Phys. Rev. B 53, 4265-4274 (1996) [View PDF (187 kB)] [DOI-link]
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	1995:
	166.		Dark-field-spectroscopy on spontaneously ordered GaInP2 B. Rheinländer, M. Schubert, and V. Gottschalch phys. stat. sol. (a) 152, 287-292 (1995) [DOI-link]
	165.		Band-gap reduction and valence band splitting in spontaneously ordered GaInP2 studied by Dark-field-spectroscopy M. Schubert, B. Rheinländer, and V. Gottschalch Solid State Commun. 95, 723-726 (1995) [View PDF (515 kB)] [DOI-link]
	164.		Optical constants of GaxIn1-xP lattice matched to GaAs M. Schubert, V. Gottschalch, C. M. Herzinger, H. Yao, P. G. Snyder, and J. A. Woollam J. Appl. Phys. 77, 3416-3419 (1995) [View PDF (850 kB)] [DOI-link]
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	h-index
			M. Schubert's scientific output parameter h according to Hirsch based on ISI (9-13-2013; Defined as the number of papers with citation number higher or equal to h.): 29
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generated using Sembib V0.1 © T. Hofmann (2003) last database entry from 2025-01-19