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Prof. Dr. Mathias Schubert
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Conferences
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
1997
1996
1995
1994
1993
Selected Seminars
Electronic documents are intended for internal use only. Corrections are added for misprints where known.
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2008 |
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x. |
Magnetism of Undoped and Co-Doped TiO2 Clusters
X. Wei, R. Skomski, M. Schubert, D. Sellmyer
American Physical Society Meeting, New Orleans, Lousiana, March 2008 |
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x. |
Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
M. Schubert, T. Hofmann
American Physical Society Meeting, New Orleans, Lousiana, March 2008 |
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2006 |
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165. |
Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, N. Ashkenov, R. Voora, H. Hochmuth, M. Lorenz, M. Grundmann
Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June 2006 |
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164. |
Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
Spring MRS Meeting, Symposium K: Materials Research for THz Applications, San Fracisco, April 2006 |
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163. |
Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
Spring MRS Meeting, Symposium GG: Current and Future Trends of Functional Oxide Films, San Fracisco, April 2006 |
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162. |
Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006 |
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161. |
Temperature-dependent band-gap and excitonic properties of ZnO
R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and M. Grundmann
4. Workshop "Ellipsometrie", Berlin, February 2006 |
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160. |
Optical properties of colored tungsten oxide sputtered thin films
M. Saenger, T. Hofmann, T. Hoeing, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006 |
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159. |
Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006 |
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158. |
Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006 |
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157. |
Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
Photonics West 2006, San Jose, January 2006
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156. |
Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, M. Grundmann
Photonics West 2006, San Jose, January 2006
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2005 |
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155. |
Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, M. Grundmann
Workshop on Oxides at the nanoscale, Zaragoza, Spain, November 2005
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154. |
In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy
C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, K. Streubel
32nd International Symposium of Compound Semiconductors, Rust, Germany, September 2005
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153. |
Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing
T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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152. |
Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, S. Nakamura
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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151. |
Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005
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150. |
Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005
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149. |
The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005
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148. |
Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, et al.
Advanced Process Control for future oriented manufacturing, Workshop, FEP Dresden, September 2005 (confirmed)
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147. |
Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting, Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May/June 2005 (confirmed)
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146. |
Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie
M. Schubert
XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2005
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145. |
Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films
N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005
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144. |
Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005
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143. |
Brechungsindex von kubischem MgxZn1-xO
Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005
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142. |
Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005
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141. |
Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005
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140. |
Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005
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139. |
Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005
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138. |
Nickelsegregation nach Sauerstoff-Ionenimplantation in NiTi
M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, B. Rauschenbach
69. German Physical Society Spring Meeting, Berlin, March 2005
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2004 |
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137. |
Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Swedish Optical Society, Linkoping, November 2004
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136. |
Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, M. Grundmann
Int. Workshop on Oxide Electronics, WOE-11, Kanagawa, Japan, October 2004
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135. |
Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano and I. Akasaki
Int. Workshop on Nitride Semiconductors, IWN 2004, Pittsburgh, U.S.A., July 2004
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134. |
Phonon deformation potentials in hexagonal InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and B. Monemar
Int. Workshop on Nitride Semiconductors, IWN 2004, Pittsburgh, U.S.A., July 2004
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133. |
The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, C. v. Middendorf
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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132. |
Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures
M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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131. |
Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004
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130. |
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert, T. Hofmann
International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July 2004
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129. |
Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, W.J. Shaff
E-MRS 2004, Strasbourg, May 2004
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128. |
In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung
M. Schubert
Transparent Conducting Oxide (TCO) Workshop Leipzig, March 2004
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127. |
HVPE-grown free-standing GaN of high structural and optical quality
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, M. Heuken
ISBLLED-2004, Gyeongju, Korea, March 2004
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126. |
In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
M. Schubert, N. Ashkenov,
C. Bundesmann, M. Lorenz, M. Grundmann,
E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold,
German Physical Society Spring Meeting, Regensburg, March 2004
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125. |
Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, M. Heuken
German Physical Society Spring Meeting, Regensburg, March 2004
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124. |
Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates
A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, A. Krost
German Physical Society Spring Meeting, Regensburg, March 2004
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123. |
Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
German Physical Society Spring Meeting, Regensburg, March 2004
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122. |
Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, G. Wagner
German Physical Society Spring Meeting, Regensburg, March 2004
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121. |
Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen
H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004
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120. |
Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen
S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004
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119. |
Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth
N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, B. Johs
German Physical Society Spring Meeting, Regensburg, March 2004
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118. |
Temperature-dependent band-gap energies and optical constants of ZnO
N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004
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117. |
Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004
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116. |
Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004
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115. |
CuInSe2 flexible solar cell surface-heat-emittance optimization for infrared radiation
C. Bundesmann, F. Dürr, M. Schubert, K. Otte
German Physical Society Spring Meeting, Regensburg, March 2004
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114. |
Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2004
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113. |
Optische dielektrische Funktionen im Photonenenergiebereich (4,0 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004
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112. |
Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen
M. Schubert, T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004
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111. |
In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
C. Bundesmann, M. Schubert, N. Ashkenov,
G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann
3. Workshop "Ellipsometrie", Stuttgart, February 2004
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110. |
Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004
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109. |
Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, G. Wagner
3. Workshop "Ellipsometrie", Stuttgart, February 2004
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2003 |
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108. |
Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, G. Wagner
10th International Workshop on Oxide Electronics, Augsburg, Germany, September 11-13 2003
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107. |
Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and B. Monemar
ICDS 2003
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106. |
Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films
M. Schubert, A. Kasic, T. Hofmann,
N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, H. Neumann
Optical System Design 2003, St. Etienne, France, September 2003
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105. |
The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN
A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, B. Monear
5. Int. Conf. on Nitride Semiconductor Research, Nara, Japan, July 2003
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104. |
Generalized magneto-optic ellipsometry
M. Schubert, T. Hofmann, C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003 [View PDF (7761kB)]
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103. |
High temperature optical constants and band gap energies of ZnO
N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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102. |
Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures
A. Kasic, M. Schubert, B. Monemar
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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101. |
Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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100. |
Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and D. Gerthsen
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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99. |
UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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98. |
Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, K. Järrendahl
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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97. |
Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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96. |
Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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95. |
Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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94. |
Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, M. Schubert
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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93. |
Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, W. Dollase
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003
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92. |
Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, I. Pietzonka
German Physical Society Spring Meeting, Dresden, March 2003
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91. |
Phonons, band gap and higher interband transitions of hexagonal InGaN
A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, Y. Nanishi
German Physical Society Spring Meeting, Dresden, March 2003
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90. |
Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten
B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert,
N. Ashkenov, P. Pfundstein, D. Gerthsen, K. Eichhorn
German Physical Society Spring Meeting, Dresden, March 2003
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89. |
Optische Übergänge und Brechungsindices von MgZnO
R. Schmidt, B. Rheinländer,
M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, M. Grundmann
German Physical Society Spring Meeting, Dresden, March 2003
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2002 |
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88. |
Phonons, excitons, band-to-band transitions and optical constants of MgZnO
R. Schmidt, C. Bundesmann,
N. Ashkenov, B. Rheinländer,
M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, C. M. Herzinger
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002
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87. |
Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002
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86. |
Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002
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85. |
Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition
M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002
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84. |
Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals
H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002
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83. |
Critical points and phonons in (B,Ga)(N,As)
G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, M. Schubert
Physics and Technology of Dilute Nitrides for Optical Communications, Istanbul, Turky, September 2002
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82. |
Critical points and phonons in BxGa1-xAs and GaNyAs1-y: a comparison
G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, M. Schubert
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002
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81. |
Optical phonons in AlxInyGa1-x-yN films
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, M. Stutzmann
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002
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80. |
Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, M. Grundmann
26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July 2002
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79. |
Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, M. Schubert
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002
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78. |
Generalized ellipsometry of complex mediums in layered systems
M. Schubert
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002
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77. |
Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic,
G. Leibiger,
T. Hofmann, C. M. Herzinger, J. A. Woollam
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002 [View PDF (9803kB)]
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76. |
Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides
T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, M. Schubert
11th International Conference on Metal-Organic Vapour Phase Epitaxy, Berlin, Germany, June 2002
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75. |
IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann,
N. Ashkenov, B. Mbenkum, B. Rheinländer,
M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann,
M. Lorenz, E. M. Kadaishev, M. Grundmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002
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74. |
Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures
M. Schubert, A. Kasic,
G. Leibiger,
T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002
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73. |
Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, C. M. Herzinger
German Physical Society Spring Meeting, Regensburg, March 2002
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72. |
Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann,
A. Kasic, E. M. Kaidashev, B. Rheinländer,
M. Lorenz, M. Schubert, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002
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71. |
Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2002
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70. |
Kritische Punkte und Phononen in BxGa1-xAs und GaNyAs1-y: Ein Vergleich
G. Leibiger, V. Gottschalch, M. Schubert, V. Riede
German Physical Society Spring Meeting, Regensburg, March 2002
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69. |
Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films
N. Ashkenov, C. Bundesmann,
A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002
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68. |
Properties of pulsed-laser-deposited Zn1-x(Al, Ga, Mg, Cd)xO compound thin films
C. Bundesmann, N. Ashkenov,
A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz,
R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002
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2001 |
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67. |
Characterization of III-Nitride optoelectronic-device heterostructures using
infrared ellipsometry
M. Schubert,
A. Kasic
1. Int.Conference on Advanced Vibrational Spectroscopy, Turku, Finnland, August 2001
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66. |
Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization
of free-carrier and crystal-structure properties of III-V semiconductor device
heterostructures
M. Schubert,
A. Kasic,
S. Einfeldt, D. Hommel, J. Off, F. Schloz,
B. Kuhn, D. J. As, J. A. Woollam, C. M. Herzinger
46. Annual SPIE Meeting, San Diego, U.S.A., August 2001
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65. |
Composition determination of InGaAsN using x-ray diffraction and
far-infrared ellipsometry
G. Leibiger,
V. Gottschalch,
M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001
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64. |
Optical properties of GaNP
G. Leibiger,
V. Gottschalch, G. Benndorf, R. Schwabe,
M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001
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63. |
Generalized Infrared Ellipsometry- A novel tool for characterization of group
-III-Nitride Heterostructrues for electronic and optoelectronic device applications
M. Schubert,
A. Kasic,
S. Einfeldt, D. Hommel, J. Off, F. Schloz,
B. Kuhn, D. J. As, J. A. Woollam
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001
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62. |
Interband transitions in (GaP)1/(InP)m monolayer
superlattice structures grown on (001) InP
J. Sik,
M. Schubert,
T. Hofmann,
H. Schmidt, G. Böhm, V. Gottschalch
Spring European MRS-Meeting, Strasbourg, France, June 2001
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61. |
All-solid state electrochromic multiplayer systems for surface heat radiation control
E. Franke, M. Schubert, C. L. Trimble, J. A. Woollam
Spring European MRS-Meeting, Strasbourg, France, June 2001
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60. |
Characterization of III-Nitride optoelectronic-device heterostructures using
infrared ellipsometry
A. Kasic,
M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz
Spring European MRS-Meeting, Strasbourg, France, June 2001
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59. |
Ellipsometry on anisotropic materials- treatment of surface and interface layers
M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May 2001 [View PDF (10267kB)]
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58. |
Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen
A. Kasic, M. Schubert
German Physical Society Spring Meeting, Hamburg, March 2001
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57. |
Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten
G. Leibiger,
M. Schubert,
V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001
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56. |
Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x)
0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot
Spektralellipsometrie und Ramanspektroskopie
T. Hofmann,
M. Schubert,
G. Leibiger,
V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001
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55. |
Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001 |
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54. |
Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien
kubischer AlxGa1-xN-Filme
A. Kasic, M. Schubert, D. J. As
German Physical Society Spring Meeting, Hamburg, March 2001 |
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2000 |
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53. |
MRS Poster Award Winner
IR-VUV dielectric function of Al1-xInxN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, C. M. Herzinger
MRS 2000 Fall Meeting, Boston, U.S.A., November/December 2000 [Download zipped PS (179kB)]
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52. |
Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, M. Schubert
MRS 2000 Fall Meeting, Boston, U.S.A., November/December 2000 |
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51. |
Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, J. Sik
Int. Symposium on Compound Semiconductors, Monterey, U.S.A., October 2000 |
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50. |
Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry
A. Kasic,M. Schubert, B. Rheinländer, J. Off, F. Scholz, C.M. Herzinger
Int. Symposium on Compound Semiconductors, Monterey, U.S.A., October 2000 |
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49. |
Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer
using generalized ellipsometry
T.E.Tiwald, M. Schubert
45. Annual SPIE Meeting, San Diego, U.S.A., August 2000
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48. |
Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000
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47. |
Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000
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46. |
Generalized Ellipsometry for novel optical materials
M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000
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45. |
Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, J.A. Woollam
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000
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44. |
Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie
M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000
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43. |
Phononen in GaN/AlxGa1-xN Übergitterstrukturen
M. Schubert, A. Kasic, S. Einfeldt,
D. Hommel, B. Kuhn, J. Off, F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000
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42. |
Infrarot-optische Eigenschaften von
{(Ga,In)n/(P,As)m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000
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41. |
Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000
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40. |
Optische Eigenschaften von GaAs1-xNx (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen
G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000
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39. |
Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie
A. Kasic, M. Schubert, S. Einfeldt,
D. Hommel, B. Kuhn, J. Off, F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000
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38. |
Ellipsometry of anisotropic materials
M. Schubert
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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37. |
Optische Eigenschaften von GaNyAs1-y (0 ... y ... 0,037) Einzelschichten und Übergitterstrukturen
G. Leibiger, M. Schubert, B. Rheinländer, V. Gottschalch
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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36. |
IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen
A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt,
D. Hommel, B. Kuhn, J. Off, F. Scholz
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000
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1999 |
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35. |
Spectroscopic ellipsometry
J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, S. Zollner
Centennial Meeting of the American Physical Society, Atlanta, U.S.A , April, 1999
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34. |
In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, F. Bigl
11. Int. Conf. on Thin Films, Cancun, Mexico, August 1999
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33. |
Maximum direct-gap reduction in CuPt ordered AlxGa1-xInP (0 ... x ... 1) determined by generalized ellipsometry
M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
41. Electronic Materials Conf., Charlottesville, U.S.A., June 1999
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32. |
Lattice modes and free-carrier response of AlxGa1-xN and InxGa1-xN heterostructures measured by infrared ellipsometry
M. Schubert, T. E. Tiwald,
J.A. Woollam, A. Kasic, J. Off, B. Kuhn, F. Scholz
MRS Fall Meeting, Boston, U.S.A., December 1999
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31. |
Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE
M. Schubert, J.A. Woollam,
A. Kasic, B. Rheinländer, J. Off, F. Scholz
3. Int. Conf. on Nitride Semiconductor Research, Montpellier, France, July 1999
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30. |
In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie
J.-D. Hecht, E. Franke, M. Schubert, H. Neumann
German Physical Society Spring Meeting, Münster, March 1999
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29. |
Bestimmung des Tensors der Dielektrischen Funktion von a-Al2O3 für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie
J.-D. Hecht, M. Schubert, C.M. Herzinger, J.A. Woollam
German Physical Society Spring Meeting, Münster, March 1999
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28. |
Optical constants of nearly disordered AlxGa1-xInP2
G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999
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27. |
Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999
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26. |
Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie
A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Münster, March 1999
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25. |
Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry
M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, F. Scholz
German Physical Society Spring Meeting, Münster, March 1999
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24. |
Near-band-gap CuPt order-birefringence in AlxGa1-xInP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999
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1998 |
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23. |
Ordering induced optical properties of AlGaInP alloys
M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
40. Electronic Materials Conf., Charlottesville, U.S.A., June 1998
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22. |
Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 1998
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21. |
Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, G. Krauss V. Krämer
German Physical Society Spring Meeting, Regensburg, March 1998
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20. |
Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, T. Welzel
German Physical Society Spring Meeting, Regensburg, March 1998
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19. |
Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren
A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1998
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18. |
Explicit solutions for magneto-optic materials in generalized ellipsometry
M. Schubert, T. E. Tiwald, J. A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1998
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1997 |
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17. |
Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert,
H. Schmidt
Heterostructure Epitaxy and Devices, Smolenice Castle, Slovakia, Oktober 1997
|
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16. |
Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry
E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, J. Hahn
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 1997
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15. |
Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, J. Hahn
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston, U.S.A., Mai 1997
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14. |
Generalized ellipsometry and complex optical systems
M. Schubert
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston, U.S.A., Mai 1997
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13. |
Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter
4. c-BN Expertentreffen, Konstanz, Juni 1997
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12. |
Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter
German Physical Society Spring Meeting, Münster, March 1997
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11. |
Direct-gap reduction and valence band splitting of CuPtB-type ordered (AlGa)InP2 studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1997
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1996 |
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10. |
Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering
M. Schubert, B. Rheinländer,
E. Franke, H. Neumann, J. Hahn, M. Röder, F. Richter
43. Symp. of the American Vacuum Society, Philadelphia, U.S.A., Oktober 1996
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9. |
Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer,B. Johs, J.A. Woollam
Int. Conf. on Polarimetry and Ellipsometry, SPIE, Warszaw, Poland, Mai 1996
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8. |
Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, J.A. Woollam
23. Int. Conf. on the Physics of Semiconductors, Berlin, Juli 1996
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7. |
Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert, B. Rheinländer,B. Johs, J.A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1996
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6. |
Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung
H. Schmidt, B. Rheinländer,V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996
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5. |
Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen
B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996
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1995 |
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4. |
Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO2mittels generalisierter Rotating-Analyzer-Ellipsometry
M. Schubert, B. Johs, C. M. Herzinger, J. A. Woollam
German Physical Society Spring Meeting, Berlin, March 1995
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Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie
M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Berlin, March 1995
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1994 |
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Dark-field spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, V. Gottschalch
Int. Workshop on Optical Charact. of Electronic Materials, Halle/Saale, Oktober 1994
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1993 |
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Optical constants of highly excited AlGaAs
B. Rheinländer, M. Schubert, K. Unger, H. Fieseler
German Physical Society Spring Meeting, Regensburg, March 1993
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Selected Seminars |
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Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert
BESSY Berlin, 21.04.2005 (Prof. Dr. W. Eberhardt, Dr. U. Schade)
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Advanced polarization spectroscopy in functional materials physics
M. Schubert
University Hamburg, 18.04.2005 (Prof. Dr. M. Rübausen)
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Optical Spectroscopy: old spectacles for new materials and physics
M. Schubert
Laytec GmbH, 11.02.2005 (Dr. Th. Zettler)
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Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert
Institute colloquium, Universite Pierre et Marie Curie Paris, 03.02.2005 (Prof. Y. Rivory, Prof. J. Lafait)
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Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control
M. Schubert
Seminar, ZSW Stuttgart, December 2, 2004 (Dr. Springer)
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Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Institute seminar, University Stuttgart, Novemerb 30, 2004 (Prof. Dr. M. Dressel, Dr. B. Gompf)
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SSpectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications
M. Schubert
Institute seminar, University Tübingen, November 17, 2004 (Prof. Dr. Th. Chassé)
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Advanced polarization spectroscopy in functional materials physics
M. Schubert
Seminar, Colorado State University, Fort Collins, May 2004 (Prof. Hochheimer)
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In-situ process monitoring with spectroscopic ellipsometry and Raman scattering
M. Schubert
Institute colloquium, Technical University Magdeburg, May 2004 (Prof. Krost, Prof. Christen)
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Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
Seminar, OSRAM-OPTO Semiconductors GmbH, Regensburg, March 2004 (Dr. K. Streubel)
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Ellipsometry in functional materials physics
M. Schubert
Seminar, von Ardenne Anlagenbau GmbH, November 2003 (Hr. M. Kammer)
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Ellipsometrie und Raman an ZnO Dünnschichten
C. Bundesmann, N. Ashkenov, T. Hofmann, M. Schubert
NFP Seminar, University Leipzig, April 2003 [View PDF (7933kB)]
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Principles and Application of Infrared Spectroscopic Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February 2003 [View PDF (3220kB)]
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Principles and Application of Generalized Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February 2003 [View PDF (3891kB)]
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Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann,
C. Bundesmann, N. Ashkenov, G. Leibiger
L.O.T.-Seminar, Darmstadt, October 2002 [View PDF (15081kB)]
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The light and the lattice
M. Schubert
Seminar, Technical University Berlin, September 2001 (Prof. Richter)
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The light and the lattice
M. Schubert
Physics colloquium, University of Leipzig, September 2000 (Prof. Grundmann)
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Phonon modes and infrared anisotropy of rutile and sapphire
M. Schubert
L.O.T.-Seminar, Darmstadt, October 1999
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Spectroscopic ellipsometry for novel optical materials
M. Schubert
Physics colloquium, University of Lincoln-Nebraska, September 1999 (Prof. J.A.Woollam)
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Infrared dielectric anisotropy and phonon modes of sappphire
M. Schubert
Seminar, University of Lincoln-Nebraska, May 1999 (Prof. J.A.Woollam)
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Spectroscopic ellipsometry on complex optical systems
M. Schubert
Seminar, MPI for Microstructure Physics, Halle, February 1998 (Prof. Gösele)
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Verallgemeinerte Ellipsometrie an magnetischen Schichten
M. Schubert
Seminar, University of Leipzig, December 1997 (Prof. Esquinazi)
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Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen
M. Schubert
Graduiertenkolleg, University of Chemnitz, December 1997 (Prof. Richter, Dr. Welzel)
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Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry
M. Schubert
L.O.T.-Seminar, Darmstadt, October 1997
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Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
M. Schubert
Seminar, University of Lincoln-Nebraska, June 1997 (Prof. J.A.Woollam)
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Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry
M. Schubert
Institute Seminar, Forschungszentrum Rossendorf, March 1997 (Prof. Moeller)
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Generalized Ellipsometry on chiral liquid crystals
M. Schubert
Seminar, ROLIC AG, Basel, February 1997 (Dr. Schadt, Dr. Bennecke)
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Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert
Institute Seminar, University of Leipzig, January 1997 (Prof. Grill)
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Atomic order in III-V alloys
M. Schubert
Seminar, University of Lincoln-Nebraska, October 1996 (Prof. J.A.Woollam)
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Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
Institute seminar, University of Chemnitz, June 1996 (Prof. Richter)
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Moderne Ellipsometrie an spontan geordnetem AlGaInP
M. Schubert
Institute seminar, University of Stuttgart, June 1996 (Prof. Pilkuhn)
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Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert
Seminar, Sentech GmbH, Berlin, March 1996
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Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
Seminar, University of Kassel, April 1996 (Prof. Kassing)
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Generalized Ellipsometry and complex optical systems
M. Schubert
L.O.T.-Seminar, Dresden, February 1996
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Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium
M. Schubert
Seminar, University of Lincoln-Nebraska, June 1995 (Prof. J.A.Woollam)
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Polarization-dependent parameters of arbitrarily anisotropic epitaxial systems
M. Schubert
Seminar, University of Lincoln-Nebraska, October 1994 (Prof. J.A.Woollam)
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