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Prof. Dr. Mathias Schubert


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Conferences

2006 2005 2004 2003 2002 2001 2000 1999 1998 1997 1996 1995 1994 1993 Selected Seminars
Electronic documents are intended for internal use only. Corrections are added for misprints where known.

Books


		Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons M. Schubert Springer Tracts in Modern Physics, Vol 209 (Springer, Heidelberg, 2004) ISBN 3-540-23249-4


	130.	Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints E. Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, B. Gallas, M. Schubert Adv. Phys. (2006)

2006:

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165. Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, N. Ashkenov, R. Voora, H. Hochmuth, M. Lorenz, M. Grundmann
Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June 2006

164. Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
Spring MRS Meeting, Symposium K: Materials Research for THz Applications, San Fracisco, April 2006

163. Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
Spring MRS Meeting, Symposium GG: Current and Future Trends of Functional Oxide Films, San Fracisco, April 2006

162. Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006

161. Temperature-dependent band-gap and excitonic properties of ZnO
R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and M. Grundmann
4. Workshop "Ellipsometrie", Berlin, February 2006

160. Optical properties of colored tungsten oxide sputtered thin films
M. Saenger, T. Hofmann, T. Hoeing, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006

159. Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006

158. Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
4. Workshop "Ellipsometrie", Berlin, February 2006

157. Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, M. Schubert
Photonics West 2006, San Jose, January 2006

156. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, M. Grundmann
Photonics West 2006, San Jose, January 2006

2005:

155.Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, M. Grundmann
Workshop on Oxides at the nanoscale, Zaragoza, Spain, November 2005

154. In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy
C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, K. Streubel
32nd International Symposium of Compound Semiconductors, Rust, Germany, September 2005

153. Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing
T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005

152. Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, S. Nakamura
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005

151. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August 2005

150. Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005

149. The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June 2005

148. Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, et al.
Advanced Process Control for future oriented manufacturing, Workshop, FEP Dresden, September 2005 (confirmed)

147. Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting, Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May/June 2005 (confirmed)

146. Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie
M. Schubert
XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2005

145. Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films
N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005

144. Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005

143. Brechungsindex von kubischem MgxZn1-xO
Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005

142. Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, M. Schubert
69. German Physical Society Spring Meeting, Berlin, March 2005

141. Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005

140. Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005

139. Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March 2005

138.N ickelsegregation nach Sauerstoff-Ionenimplantation in NiTi
M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, B. Rauschenbach
69. German Physical Society Spring Meeting, Berlin, March 2005

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2004:

137. Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Swedish Optical Society, Linkoping, November 2004

136. Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, M. Grundmann
Int. Workshop on Oxide Electronics, WOE-11, Kanagawa, Japan, October 2004

135. Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano and I. Akasaki
Int. Workshop on Nitride Semiconductors, IWN 2004, Pittsburgh, U.S.A., July 2004

134. Phonon deformation potentials in hexagonal InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and B. Monemar
Int. Workshop on Nitride Semiconductors, IWN 2004, Pittsburgh, U.S.A., July 2004

133. The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, C. v. Middendorf

27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004

132. Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures
M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, M. Grundmann

27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004

131. Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, M. Grundmann

27th International Conference on the Physics of Semiconductors, Flagstaff, July 2004

130. Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert, T. Hofmann

International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July 2004

129. Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, W.J. Shaff
E-MRS 2004, Strasbourg, May 2004

128.In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung
M. Schubert
Transparent Conducting Oxide (TCO) Workshop Leipzig, March 2004

127. HVPE-grown free-standing GaN of high structural and optical quality
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, M. Heuken
ISBLLED-2004, Gyeongju, Korea, March 2004

126. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
M. Schubert, N. Ashkenov, C. Bundesmann, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold,
German Physical Society Spring Meeting, Regensburg, March 2004

125. Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, M. Heuken
German Physical Society Spring Meeting, Regensburg, March 2004

124. Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates
A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, A. Krost
German Physical Society Spring Meeting, Regensburg, March 2004

123. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
German Physical Society Spring Meeting, Regensburg, March 2004

122. Electro-optical properties of ZnO-BaTiO₃-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, G. Wagner
German Physical Society Spring Meeting, Regensburg, March 2004

121. Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen
H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004

120. Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen
S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004

119. Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth
N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, B. Johs
German Physical Society Spring Meeting, Regensburg, March 2004

118. Temperature-dependent band-gap energies and optical constants of ZnO
N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004

117. Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004

116. Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2004

115. CuInSe₂ flexible solar cell surface-heat-emittance optimization for infrared radiation
C. Bundesmann, F. Dürr, M. Schubert, K. Otte
German Physical Society Spring Meeting, Regensburg, March 2004

114. Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March 2004

113. Optische dielektrische Funktionen im Photonenenergiebereich (4,0 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2004

112. Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen
M. Schubert, T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004

111. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
C. Bundesmann, M. Schubert, N. Ashkenov, G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann
3. Workshop "Ellipsometrie", Stuttgart, February 2004

110. Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
3. Workshop "Ellipsometrie", Stuttgart, February 2004

109. Electro-optical properties of ZnO-BaTiO₃-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, G. Wagner
3. Workshop "Ellipsometrie", Stuttgart, February 2004

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2003:

108. Electro-optical properties of ZnO-BaTiO₃-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, G. Wagner
10th International Workshop on Oxide Electronics, Augsburg, Germany, September 11-13 2003

107. Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and B. Monemar
ICDS 2003

106. Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films
M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, H. Neumann
Optical System Design 2003, St. Etienne, France, September 2003

105. The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN
A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, B. Monear
5. Int. Conf. on Nitride Semiconductor Research, Nara, Japan, July 2003

104. Generalized magneto-optic ellipsometry
M. Schubert, T. Hofmann, C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003 [View PDF (7761kB)]

103. High temperature optical constants and band gap energies of ZnO
N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

102. Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures
A. Kasic, M. Schubert, B. Monemar
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

101. Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

100. Optical properties of Zn_1-xMn_xSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and D. Gerthsen
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

99. UV-VUV spectroscopic ellipsometry of ternary Mg_xZn_1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

98. Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, K. Järrendahl
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

97. Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

96. Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (Al_xGa_1-x)_0.52In_0.48P
T. Hofmann, M. Schubert, V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

95. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

94. Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, M. Schubert
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

93. Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb₂S₃
M. Schubert, T. Hofmann, C. M. Herzinger, W. Dollase
3. International Conference on Spectroscopic Ellipsometry, Vienna, Austria, July 2003

92. Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, I. Pietzonka
German Physical Society Spring Meeting, Dresden, March 2003

91. Phonons, band gap and higher interband transitions of hexagonal InGaN
A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, Y. Nanishi
German Physical Society Spring Meeting, Dresden, March 2003

90. Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten
B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert, N. Ashkenov, P. Pfundstein, D. Gerthsen, K. Eichhorn
German Physical Society Spring Meeting, Dresden, March 2003

89. Optische Übergänge und Brechungsindices von MgZnO
R. Schmidt, B. Rheinländer, M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, M. Grundmann
German Physical Society Spring Meeting, Dresden, March 2003

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2002:

88. Phonons, excitons, band-to-band transitions and optical constants of MgZnO
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, C. M. Herzinger
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002

87. Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002

86. Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, Dezember 2002

85. Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition
M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002

84. Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals
H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October 2002

83. Critical points and phonons in (B,Ga)(N,As)
G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, M. Schubert
Physics and Technology of Dilute Nitrides for Optical Communications, Istanbul, Turky, September 2002

82. Critical points and phonons in B_xGa_1-xAs and GaN_yAs_1-y: a comparison
G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, M. Schubert
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002

81. Optical phonons in Al_xIn_yGa_1-x-yN films
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, M. Stutzmann
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July 2002

80. Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, M. Grundmann
26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July 2002

79. Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, M. Schubert
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002

78. Generalized ellipsometry of complex mediums in layered systems
M. Schubert
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002

77. Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, J. A. Woollam
47. Annual SPIE Meeting, Seattle, U.S.A., July 2002 [View PDF (9803kB)]

76. Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides
T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, M. Schubert
11th International Conference on Metal-Organic Vapour Phase Epitaxy, Berlin, Germany, June 2002

75. IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, M. Grundmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002

74.Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures
M. Schubert, A. Kasic, G. Leibiger, T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar 2002

73. Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, C. M. Herzinger
German Physical Society Spring Meeting, Regensburg, March 2002

72. Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, A. Kasic, E. M. Kaidashev, B. Rheinländer, M. Lorenz, M. Schubert, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002

71. Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2002

70. Kritische Punkte und Phononen in B_xGa_1-xAs und GaN_yAs_1-y: Ein Vergleich
G. Leibiger, V. Gottschalch, M. Schubert, V. Riede
German Physical Society Spring Meeting, Regensburg, March 2002

69. Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films
N. Ashkenov, C. Bundesmann, A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002

68. Properties of pulsed-laser-deposited Zn1-x(Al, Ga, Mg, Cd)xO compound thin films
C. Bundesmann, N. Ashkenov, A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz, R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, M. Grundmann
German Physical Society Spring Meeting, Regensburg, March 2002

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2001:

67. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
M. Schubert, A. Kasic
1. Int.Conference on Advanced Vibrational Spectroscopy, Turku, Finnland, August 2001

66. Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization of free-carrier and crystal-structure properties of III-V semiconductor device heterostructures
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam, C. M. Herzinger
46. Annual SPIE Meeting, San Diego, U.S.A., August 2001

65. Composition determination of InGaAsN using x-ray diffraction and far-infrared ellipsometry
G. Leibiger, V. Gottschalch, M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001

64. Optical properties of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001

63. Generalized Infrared Ellipsometry- A novel tool for characterization of group -III-Nitride Heterostructrues for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam
4. Int. Conf. on Nitride Semiconductor Research, Denver, U.S.A., July 2001

62. Interband transitions in (GaP)₁/(InP)_m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, V. Gottschalch
Spring European MRS-Meeting, Strasbourg, France, June 2001

61. All-solid state electrochromic multiplayer systems for surface heat radiation control
E. Franke, M. Schubert, C. L. Trimble, J. A. Woollam
Spring European MRS-Meeting, Strasbourg, France, June 2001

60. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz
Spring European MRS-Meeting, Strasbourg, France, June 2001

59. Ellipsometry on anisotropic materials- treatment of surface and interface layers
M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May 2001 [View PDF (10267kB)]

58. Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen
A. Kasic, M. Schubert
German Physical Society Spring Meeting, Hamburg, March 2001

57. Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten
G. Leibiger, M. Schubert, V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001

56. Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (Al_xGa_1-x) _0.52In_0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie
T. Hofmann, M. Schubert, G. Leibiger, V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001

55. Interband transitions in (GaP)₁/(InP)_m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March 2001

54. Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien kubischer Al_xGa_1-xN-Filme
A. Kasic, M. Schubert, D. J. As
German Physical Society Spring Meeting, Hamburg, March 2001

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2000:

53. MRS Poster Award Winner
IR-VUV dielectric function of Al_1-xIn_xN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, C. M. Herzinger
MRS 2000 Fall Meeting, Boston, U.S.A., November/December 2000 [Download zipped PS (179kB)]

52. Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, M. Schubert
MRS 2000 Fall Meeting, Boston, U.S.A., November/December 2000

51. Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, J. Sik
Int. Symposium on Compound Semiconductors, Monterey, U.S.A., October 2000

50. Optical properties of Al_1-xIn_xN thin films determined by Spectroscopic Ellipsometry
A. Kasic,M. Schubert, B. Rheinländer, J. Off, F. Scholz, C.M. Herzinger
Int. Symposium on Compound Semiconductors, Monterey, U.S.A., October 2000

49. Measurement of rutile TiO₂ dielectric tensor from 0.148 to 33 mikrometer using generalized ellipsometry
T.E.Tiwald, M. Schubert
45. Annual SPIE Meeting, San Diego, U.S.A., August 2000

48. Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000

47. Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, F. Scholz
European MRS Spring Meeting, Strasbourg, France, July 2000

46. Generalized Ellipsometry for novel optical materials
M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000

45. Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, J.A. Woollam
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 2000

44.Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie
M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000

43. Phononen in GaN/Al_xGa_1-xN Übergitterstrukturen
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000

42. Infrarot-optische Eigenschaften von {(Ga,In)_n/(P,As)_m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000

41. Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 2000

40. Optische Eigenschaften von GaAs_1-xN_x (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen
G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 2000

39. Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
German Physical Society Spring Meeting, Regensburg, March 2000

38. Ellipsometry of anisotropic materials
M. Schubert
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000

37. Optische Eigenschaften von GaN_yAs_1-y (0 ... y ... 0,037) Einzelschichten und Übergitterstrukturen
G. Leibiger, M. Schubert, B. Rheinländer, V. Gottschalch
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000

36. IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen
A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
1. Workshop "Ellipsometrie", Stuttgart, Februar 2000

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1999:

35. Spectroscopic ellipsometry
J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, S. Zollner
Centennial Meeting of the American Physical Society, Atlanta, U.S.A , April, 1999

34. In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, F. Bigl
11. Int. Conf. on Thin Films, Cancun, Mexico, August 1999

33. Maximum direct-gap reduction in CuPt ordered Al_xGa_1-xInP (0 ... x ... 1) determined by generalized ellipsometry
M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
41. Electronic Materials Conf., Charlottesville, U.S.A., June 1999

32. Lattice modes and free-carrier response of Al_xGa_1-xN and In_xGa_1-xN heterostructures measured by infrared ellipsometry
M. Schubert, T. E. Tiwald, J.A. Woollam, A. Kasic, J. Off, B. Kuhn, F. Scholz
MRS Fall Meeting, Boston, U.S.A., December 1999

31. Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE
M. Schubert, J.A. Woollam, A. Kasic, B. Rheinländer, J. Off, F. Scholz
3. Int. Conf. on Nitride Semiconductor Research, Montpellier, France, July 1999

30. In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie
J.-D. Hecht, E. Franke, M. Schubert, H. Neumann
German Physical Society Spring Meeting, Münster, March 1999

29. Bestimmung des Tensors der Dielektrischen Funktion von a-Al₂O₃ für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie
J.-D. Hecht, M. Schubert, C.M. Herzinger, J.A. Woollam
German Physical Society Spring Meeting, Münster, March 1999

28. Optical constants of nearly disordered Al_xGa_1-xInP₂
G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999

27. Cross-polarized reflectance difference spectroscopy on CuPt ordered Al_xGa_1-xInP₂
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999

26. Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie
A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Münster, March 1999

25. Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry
M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, F. Scholz
German Physical Society Spring Meeting, Münster, March 1999

24. Near-band-gap CuPt order-birefringence in Al_xGa_1-xInP₂
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1999

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1998:

23. Ordering induced optical properties of AlGaInP alloys
M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
40. Electronic Materials Conf., Charlottesville, U.S.A., June 1998

22. Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March 1998

21. Birefringence and reflectivity of single crystal CdAl₂Se₄ by generalized ellipsometry
J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, G. Krauss V. Krämer
German Physical Society Spring Meeting, Regensburg, March 1998

20. Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, T. Welzel
German Physical Society Spring Meeting, Regensburg, March 1998

19. Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren
A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1998

18. Explicit solutions for magneto-optic materials in generalized ellipsometry
M. Schubert, T. E. Tiwald, J. A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1998

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1997:

17. Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert, H. Schmidt
Heterostructure Epitaxy and Devices, Smolenice Castle, Slovakia, Oktober 1997

16. Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry
E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, J. Hahn
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April 1997

15. Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, J. Hahn
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston, U.S.A., Mai 1997

14. Generalized ellipsometry and complex optical systems
M. Schubert
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston, U.S.A., Mai 1997

13. Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter
4. c-BN Expertentreffen, Konstanz, Juni 1997

12. Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, F. Richter
German Physical Society Spring Meeting, Münster, March 1997

11. Direct-gap reduction and valence band splitting of CuPt_B-type ordered (AlGa)InP₂ studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, V. Gottschalch
German Physical Society Spring Meeting, Münster, March 1997

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1996:

10. Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, F. Richter
43. Symp. of the American Vacuum Society, Philadelphia, U.S.A., Oktober 1996

9. Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer,B. Johs, J.A. Woollam
Int. Conf. on Polarimetry and Ellipsometry, SPIE, Warszaw, Poland, Mai 1996

8. Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, J.A. Woollam
23. Int. Conf. on the Physics of Semiconductors, Berlin, Juli 1996

7. Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert, B. Rheinländer,B. Johs, J.A. Woollam
German Physical Society Spring Meeting, Regensburg, March 1996

6. Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung
H. Schmidt, B. Rheinländer,V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996

5. Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen
B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, M. Schubert
German Physical Society Spring Meeting, Regensburg, March 1996

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1995:

4. Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO₂mittels generalisierter Rotating-Analyzer-Ellipsometry
M. Schubert, B. Johs, C. M. Herzinger, J. A. Woollam
German Physical Society Spring Meeting, Berlin, March 1995

3. Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie
M. Schubert, B. Rheinländer, V. Gottschalch
German Physical Society Spring Meeting, Berlin, March 1995

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1994:

2. Dark-field spectroscopy on spontaneously ordered GaInP₂
B. Rheinländer, M. Schubert, V. Gottschalch
Int. Workshop on Optical Charact. of Electronic Materials, Halle/Saale, Oktober 1994

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1993:

1. Optical constants of highly excited AlGaAs
B. Rheinländer, M. Schubert, K. Unger, H. Fieseler
German Physical Society Spring Meeting, Regensburg, March 1993

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Selected Seminars

Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert
BESSY Berlin, 21.04.2005 (Prof. Dr. W. Eberhardt, Dr. U. Schade)

Advanced polarization spectroscopy in functional materials physics
M. Schubert
University Hamburg, 18.04.2005 (Prof. Dr. M. Rübausen)

Optical Spectroscopy: old spectacles for new materials and physics
M. Schubert
Laytec GmbH, 11.02.2005 (Dr. Th. Zettler)

Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert
Institute colloquium, Universite Pierre et Marie Curie Paris, 03.02.2005 (Prof. Y. Rivory, Prof. J. Lafait)

Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control
M. Schubert
Seminar, ZSW Stuttgart, December 2, 2004 (Dr. Springer)

Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Institute seminar, University Stuttgart, Novemerb 30, 2004 (Prof. Dr. M. Dressel, Dr. B. Gompf)

SSpectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications
M. Schubert
Institute seminar, University Tübingen, November 17, 2004 (Prof. Dr. Th. Chassé)

Advanced polarization spectroscopy in functional materials physics
M. Schubert
Seminar, Colorado State University, Fort Collins, May 2004 (Prof. Hochheimer)

In-situ process monitoring with spectroscopic ellipsometry and Raman scattering
M. Schubert
Institute colloquium, Technical University Magdeburg, May 2004 (Prof. Krost, Prof. Christen)

Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
Seminar, OSRAM-OPTO Semiconductors GmbH, Regensburg, March 2004 (Dr. K. Streubel)

Ellipsometry in functional materials physics
M. Schubert
Seminar, von Ardenne Anlagenbau GmbH, November 2003 (Hr. M. Kammer)

Ellipsometrie und Raman an ZnO Dünnschichten
C. Bundesmann, N. Ashkenov, T. Hofmann, M. Schubert
NFP Seminar, University Leipzig, April 2003 [View PDF (7933kB)]

Principles and Application of Infrared Spectroscopic Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February 2003 [View PDF (3220kB)]

Principles and Application of Generalized Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February 2003 [View PDF (3891kB)]

Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, G. Leibiger
L.O.T.-Seminar, Darmstadt, October 2002 [View PDF (15081kB)]

The light and the lattice
M. Schubert
Seminar, Technical University Berlin, September 2001 (Prof. Richter)

The light and the lattice
M. Schubert
Physics colloquium, University of Leipzig, September 2000 (Prof. Grundmann)

Phonon modes and infrared anisotropy of rutile and sapphire
M. Schubert
L.O.T.-Seminar, Darmstadt, October 1999

Spectroscopic ellipsometry for novel optical materials
M. Schubert
Physics colloquium, University of Lincoln-Nebraska, September 1999 (Prof. J.A.Woollam)

Infrared dielectric anisotropy and phonon modes of sappphire
M. Schubert
Seminar, University of Lincoln-Nebraska, May 1999 (Prof. J.A.Woollam)

Spectroscopic ellipsometry on complex optical systems
M. Schubert
Seminar, MPI for Microstructure Physics, Halle, February 1998 (Prof. Gösele)

Verallgemeinerte Ellipsometrie an magnetischen Schichten
M. Schubert
Seminar, University of Leipzig, December 1997 (Prof. Esquinazi)

Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen
M. Schubert
Graduiertenkolleg, University of Chemnitz, December 1997 (Prof. Richter, Dr. Welzel)

Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry
M. Schubert
L.O.T.-Seminar, Darmstadt, October 1997

Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
M. Schubert
Seminar, University of Lincoln-Nebraska, June 1997 (Prof. J.A.Woollam)

Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry
M. Schubert
Institute Seminar, Forschungszentrum Rossendorf, March 1997 (Prof. Moeller)

Generalized Ellipsometry on chiral liquid crystals
M. Schubert
Seminar, ROLIC AG, Basel, February 1997 (Dr. Schadt, Dr. Bennecke)

Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert
Institute Seminar, University of Leipzig, January 1997 (Prof. Grill)

Atomic order in III-V alloys
M. Schubert
Seminar, University of Lincoln-Nebraska, October 1996 (Prof. J.A.Woollam)

Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
Institute seminar, University of Chemnitz, June 1996 (Prof. Richter)

Moderne Ellipsometrie an spontan geordnetem AlGaInP
M. Schubert
Institute seminar, University of Stuttgart, June 1996 (Prof. Pilkuhn)

Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert
Seminar, Sentech GmbH, Berlin, March 1996

Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
Seminar, University of Kassel, April 1996 (Prof. Kassing)

Generalized Ellipsometry and complex optical systems
M. Schubert
L.O.T.-Seminar, Dresden, February 1996

Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium
M. Schubert
Seminar, University of Lincoln-Nebraska, June 1995 (Prof. J.A.Woollam)

Polarization-dependent parameters of arbitrarily anisotropic epitaxial systems
M. Schubert
Seminar, University of Lincoln-Nebraska, October 1994 (Prof. J.A.Woollam)

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Books

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Selected Seminars