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Conference presentations:       2016   2015   2014   2013   2012   2011   2010   2009   2008   2007   2006  
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2016:

    537. Generalized spectroscopic ellipsometry: determination of orthorhombic optical properties of bi-layer Co-FeNi slanted columnar thin films
D. Sekora, C. Briley, T. Hofmann, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June (2016)


    536. Invited
The eigen polarization model for monoclinic and triclinic symmetries: Generalized ellipsometry analysis from the far infrared to the deep ultra violet for single crystalline beta gallium oxide

A. Mock, R. Korlacki, C. Briley, S. Knight, S. Schoche, T. Hofmann, V. Darakchieva, E. Janzen, B. Monemar, D. Gogova, Q.-T. Thieu, R. Togashi, H. Murakami, Y. Kumagai, K. Goto, A. Kuramata, S. Yamakoshi, M. Higashiwaki, E. Schubert, and M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    535. Hydrogen intercalation induced anisotropy of free charge carrier mobility in epitaxial graphene revealed by THz Optical Hall effect measurements
P. Kuhne, N. Armakavicius, C. Bouhafs, V. Stanishev, T. Hofmann, R. Yakimova, C. Colleti, M. Schubert, and V. Darakchieva
ICSE-7, Berlin, Germany, June (2016)


    534. Electromagnetics at THz Frequencies: Optical Hall Effect and Form-induced Birefringence
T. Hofmann
Colloquium, Department of Physics, University of Toledo, Toledo, OH, February (2016)


    533. Tribrid EC-GSE-QCMD Analysis: Surface topography effects on the electrochromic behavior of methylene blue
D. Sekora, A. J. Zaitouna, U. Kilic, T. Hofmann, R. Y. Lai, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June (2016)


    532. Vector magneto-optical generalized ellipsometry on nanostructured magnetic thin films of complex anisotropy
C. Briley, A. Mock, R. Korlacki, T. Hofmann, E. Schubert, R. Skomski, and M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    531. In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P.Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
ICSE-7, Berlin, Germany, June (2016)


    530. THz-MIR ellipsometry characterization of chromia thin films
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, C.M. Herzinger, J.A. Woollam, M. Schubert, C. Binek, M. Street, P. Dowben, and T. Hofmann
Nebraska MRSEC Review, Lincoln, NE, March (2016)


    529. Imaging Ellipsometry of Cells Cultured on Optically Anisotropic Nanostructured Surfaces
T. Kasputis, D. Peev, A. Nguyen, A. Mantz, E. Franke-Schubert, A. K. Pannier, and M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    528. Invited
Anisotropy: A key to detection and separation in physical, chemical and biological investigations using linear optical spectroscopy and imaging

M. Schubert
Advanced Functional Materials Workshop, Linkoping University, Linkoping, Sweden, August (2016)


    527. Invited Plenary talk
Electronic materials with monoclinic and triclinic symmetries, and the anisotropy contrast microscopy imaging concept

M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    526. Invited Institute Colloquium
Nebraska Center for Nanohybrid Functional Materials

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, January (2016)


    525. Invited Seminar (Prof. Olle Inganas)
Promoting a revolution in power electronics: Characterizing anisotropy, phonons, band-to-band transitions and free charge carriers in monoclinic metaloxides

M. Schubert
Linkoping University, Linkoping, Sweden, May (2016)


    524. Invited
Ellipsometry and Nanostructures: A new paradigm in microscopy – The anisotropy contrast microscopy using glancing angle deposited nanostructured thin films

M. Schubert
Optical Interference Coatings (OIC), Loews Ventana Canyon, Tucson, Arizona, USA, June (2016)


    523. Functionalized Three-Dimensional Spatially Coherent Thin Films for Biomaterial Applications
M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, A. Pannier, D. Sekora, C. Rice, E. Schubert, M. Schubert, K.-J. Eichhorn, M. Stamm, and P. Uhlmann
MRS Fall Meeting, Boston, MA, November-December (2016)


    522. Combined Quartz Crystal Microbalance with Dissipation and Generalized Ellipsometry to Characterize the Deposition of Titanium
K. B. Rodenhausen, N. Kananizadeh, C. Rice, J. Lee, D. Sekora, M. Schubert, E. Schubert, S. Bartelt-Hunt, and Y. Li
AIChE Annual Meeting, San Francisco, C, November (2016)


    521. Invited 12th IPF Colloquium
Anisotropic Optical Contrast Microscopy and functionalized nanostructured surfaces: A new imaging modality for small molecule detection and cell-surface interactions

M. Schubert
Leibniz Institute for Polymer Research (IPF), Dresden, November (2016)


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2015:

    520. Dynamic Strain Driven Phase Transitions
U. Singh, P. Giri, L. Zhang, S. Mu, and S. Knight
Nebraska MRSEC Kick-off meeting, Lincoln, NE, April (2015)


    519. Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies
S. Knight, S. Schoeche, V. Darakchieva, P. Kuehne, C.M. Herzinger, M. Schubert, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 11 (2015)


    518. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    517. Transmission Mueller Matrix Imaging Microscope
D. Peev, C. Rice, M. Schubert, and T. Hofmann
J. A. Woollam Symposium, Lincoln, NE, June 6 (2015)


    516. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 14 (2015)


    515. Optical Anisotropy of Porous Polymer Film with Inverse Slanted Nanocolumnar Structure Revealed via Generalized Ellipsometry
D. Liang, D. Sekora, C. Rice, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April 14 (2015)


    514. Mueller Matrix Birefringence Microscopy of Mouse Fibroblasts using Anisotropic Nanostructured Surfaces
T. Kasputis, C. Rice, D. Peev, T. Hofmann, E. Schubert, A.K. Pannier, and M. Schubert
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    513. Nanostructured Columnar Thin Films Enhance Protein Adsorption and Cell-Material Interactions
T. Kasputis, A. Pieper, E. Schubert, M. Schubert, and A.K. Pannier
American Institute of Chemical Engineers Annual Meeting, Atlanta, GA, Month (2015)


    512. Invited
Combinatorial quartz crystal microbalance with dissipation and spectroscopic ellipsometry techniques to characterize organic layers at the solid-liquid interface

B. K. Rodenhausen
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    511. Direct Band Structure Based Modeling of Graphene: from the THz to the UV
A. Boosalis, W. Li, N. Nguyen, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, M. Schubert, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    510. 1st PLACE WINNER
Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-Dimensional Nanostructured Surfaces Studied by in-situ EC and Generalized Ellipsometry

D. Sekora, A. J. Zaituna, T. Hofmann, R. Y. L. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    509. Observation of a Reversible Phase Transition in the Dielectric Function Response of Si Nanostructures upon Li Intercalation using Generalized Ellipsometry
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April (2015)


    508. Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-dimensional Nanostructured Surfaces Studied by in-situ EC, QCM-D and Generalized Spectroscopic Ellipsometry
D. Sekora, A. J. Zaituna, T. Hofmann, R. L. Y. Lai, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April (2015)


    507. 3rd Place Winner (ECE Dept.) & Commendation Award (College of Engineering)
Enhanced Temperature Stability of Slanted Columnar Thin Films by ALD Overcoating

Alyssa Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    506. Record mobility of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect
N. Armakavicius, J.-T. Chen, T. Hofmann, S. Knight, P. Kühne, D. Nilsson, U. Forsberg, E. Janzen, and V. Darakchieva
11th ICNS, Beijing, China, August (2015)


    505. Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
11th ICNS, Beijing, China, August (2015)


    504. Spectroscopic Ellipsometry FT Student award winner
Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies

S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    503. Vector magneto-optical generalized ellipsometry on heat treated sculptured think films: A study of the effects of Al2O3 passivation coatings on magneto-optical properties
C. Briley, A. Mock, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    502. The Effect of Annealing and Alumina Passivation on Structural and Optical Properties of Cobalt-Oxide Core-Shell Slanted Columnar Thin Films
A. Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    501. 2nd Place Winner (ECE Dept.)
Anisotropic Plasmon Resonances in Nanostructured Thin Films: An Optical Model Approach

C. Briley, D. Sekora, T. Hofmann, E. Schubert, and and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    500. Anisotropic Magneo-Optical Hysteresis of Permalloy Slanted Columnar Thin Films Determined by Vector Magneto-Optical Generalized Ellipsometry
C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and and M. Schubert
WSE-9, Twente, Netherlands, February (2015)


    499. VMOGE on annealed Cobalt slanted columnar thin films (Co-SCTF)
C. Briley, A. Mock, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, August (2015)


    498. Cavity-enhanced THz optical Hall effect and graphene-based environmental sensing
S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
J.A. Woollam Symposium, Lincoln, NE, August (2015)


    497. AVS Graduate research award winner
Effect of aromatic compounds on semiconducting boron carbide heterojunctions

E. Echeverría, E. Wilson, R. James, F. Pasquale, B. Dong, A. Enders, S. Knight, T. Hofmann, J.A. Kelber, and P.A. Dowben
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    496. Invited Seminar (Prof. M. Stamm)
The Invisible Light

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, May (2015)


    495. Invited (hedersdoctor ceremony)
The Invisible Light

M. Schubert
Linkoping University, Linkoping, Sweden, May (2015)


    494. Anisotropy, Phonon Modes and Band-to-Band Transitions in Single-Crystal Monoclinic Beta-Ga2O3 Determined by THz to VUV Generalized Ellipsometry
M. Schubert, R. Korlacki, S. Schoeche, V. Darakchieva, B. Monemar, K. Goto, K. Nomura, H. Murakami, Q.-T. Thieu, R. Togashi, Y. Kumagai, A. Kuramata, M. Higashiwaki, A. Koukitu, S. Yamakoshi, E. Janzén, D. Gogova, M. Schmidbauer, and Z. Galazka
International Workshop on Gallium Oxide and Related Materials 2015 (IWGO 2015), Kyoto, Japan, November (2015)


    493. Invited
The Invisible Light

M. Schubert
The International Conference on Optics of Surfaces and Interfaces (OSI-11), Austin TX, USA, June-July (2015)


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2014:

    492. Progress in Spectroscopic Ellipsometry for the in-situ real-time investigation of Atomic Layer Depositions
M. Junige, V. Sharma, D. Schmidt, M. Albert, and J.W. Bartha
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    491. Combinatorial QCM-D/GE-Study of Swelling of and Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces
M. Koenig, T. Kasputis, D. Schmidt, K.B. Rodenhausen, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    490. Talk
Phonon mode behavior and free-charge carrier parameters in high-Al content AlGaN determined by IR spectroscopic Ellipsometry and optical Hall effect

S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A. Kakanakova-Georgieva, E. Janzén, and V. Darakchieva
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    489. Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations
S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzén, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    488. Permanent Magnet Based THz Optical Hall Effect on AlInN/GaN High Electron Mobility Transistor Structures
S. Knight, S. Schöche, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 (2014)


    487. Instrument Development: 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 (2014)


    486. Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer
D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2014)


    485. Generalized Ellipsometry Effective Medium Approximation Analysis Approach for Porous Slanted Columnar Thin Films Infiltrated with Polymer
D. Liang, D. Schmidt, H. Wang, E. Schubert, and M. Schubert
EPSCoR External Review Panel, Lincoln, NE, August 19 (2014)


    484. 2nd PLACE WINNER
In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation

D. Sekora, D. Schmidt, R. Y. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2014)


    483. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August (2014)


    482. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
61st AVS Symposium, Baltimore, Maryland, November (2014)


    481. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I.G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
4th Graphene, Toulouse, France, May (2014)


    480. Spectroscopic Ellipsometry FT Student award winner
Vector Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films with Forward Calculated Uniaxial Response Simulation

C. Briley, T. Hofmann, D. Schmidt, E. Schubert, and M. Schubert
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    479. Dielectric Tensor Model for Inter Landau-level Transitions in Highly Oriented Pyrolytic Graphite and Epitaxial Graphene – Symmetry Properties, Energy Conservation and Plasma Coupling
P. Kühne, T. Hofmann, M. Schubert, C.M. Herzinger, and V. Darakchieva
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    478. The Development Of Highly-Oriented 3D Nanostructures For Use With Ultra-Thin Layer Chromatography And Ellipsometry
Erika L. Pfaunmiller, Sandya Beeram, C. Rice, D. Peev, T. Hofmann, M. Schubert, and D. S. Hage
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    477. Improved Design for Highly Efficient Hybrid Photovoltaic Devices
Alyssa Mock, Cesar Rodriquez, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August (2014)


    476. Low Temperature Atomic Layer Deposition and RF Magnetron Sputtering of ZnO for use as Transparent Conductive Oxides
Cesar Rodriguez, Alyssa Mock, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August (2014)


    475. Improved Design for Highly Efficient Hybrid Photovoltaic Devices
Alyssa Mock, D. Schmidt, D. Sekora, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2014)


    474. Invited Institute Colloquium
Generalized Ellipsometry and the Optical Hall effect: Characterization of Anisotropic Materials from single crystalline to complex-structured Mediums

M. Schubert
Leibniz Institute for Crystal Growth IKZ, Berlin, Germany, March (2014)


    473. From QCM(D)-Ellipsometry combination to Birefringence Imaging Chromatography and Birefringence Microscopy using Sculptured Columnar Thin Films (SCTF)
M. Schubert
7th Workshop Ellipsometry (WSE-7), Dresden, Germany, March (2014)


    472. Infrared optical Hall effect in epitaxial graphene on 3C- and 4H-SiC
V. Stanishev, P. Kühne, T. Hofmann, M. Schubert, A. Zakharov, T. Iakimov, J. ul Hassan, E. Janzén, R. Yakimova, and V. Darakchieva
Graphene 2014, Lanzarote, Spain, February 18 – 21 (2014)


    471. Shedding light on the nature of epitaxial graphene on C-face SiC
V. Darakchieva, P. Kühne, V. Stanishev, I. G. Ivanov, C. Bouhafs, T. Iakimov, A. Zakharov, T. Hofmann, M. Schubert, and R. Yakimova
International Conference on Nanoscience + Technology , Veil, Colorado, July (2014)


    470. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I. G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
Graphene week, Gothenburg, Sweden, June 23-27 (2014)


    469. Capture of macromolecules by polymeric brushes anchored on three-dimensional spatially coherent thin films
K.B. Rodenhausen, D. Sekora, K.-J. Eichhorn, E. Schubert, M. Schubert, M. Stamm, and P. Uhlmann
8th ECNP International Conference on Nanostructured Polymers and Nanocomposites, Dresden, Germany, Sep. 16-19 (2014)


    468. Adaptive Optics
S. Knight, C. Rice, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, June (2014)


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2013:

    467. Fabrication and optical modeling of nanohybrid functional slanted columnar thin films
D. Schmidt, M. Junige, J.W. Bartha, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    466. Vector Magneto-Optical Generalized Ellipsometry Magnetization Mapping of Sculptured Thin Films
C. Briley, D. Schmidt, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    465. Talk
Sub-10 nm Cobalt Nanowires Building via Phase Separation: Synthesis, Simulation, and Characterization

Y. Tian, Z. Xu, D. Schmidt, T. Jayaraman, C. Briley, J. Shield, M. Schubert, and E. Schubert
2013 TMS Annual Meeting & Exhibition, San Antonio, TX, March (2013)


    464. Invited
Characterization of highly anisotropic 3D nanostructured surfaces

D. Schmidt
ICSE-VI, Kyoto, Japan, May (2013)


    463. Biomolecule Loading within Nanostructured Thin Films as Cell-Instructive Surfaces for Drug and Gene Delivery
T. Kasputis, D. Schmidt, K.B. Rodenhausen, D. Sekora, M. Koenig, K.-J. Eichhorn, P. Uhlmann, M. Stamm, E. Schubert, M. Schubert, and A.K. Pannier
ICSE-VI, Kyoto, Japan, May (2013)


    462. Talk
Detection of organic adsorption onto three-dimensional nanostructure layers with generalized ellipsometry

K.B. Rodenhausen, D. Schmidt, R.S. Davis, D. Sekora, R. Neupane, T. Kasputis, A.K. Pannier, E. Schubert, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    461. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    460. Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4
S. Schöche, W. Dollase, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    459. Poster Award Winner
Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations

S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzen, N.B. Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
UNL Graduate Research Fair and Symposium, Lincoln, Nebraska, April (2013)


    458. Talk
Evaluation of a metal-organic precursor with regard to a gold ALD process by utilizing in-situ spectroscopic ellipsometry

M. Junige, D. Schmidt, S.T. Barry, J.W. Bartha, and M. Schubert
ALD 2013, San Diego, CA, July (2013)


    457. Invited
Periodic nanostructured thin films

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
2013 MRS Fall Meeting, Boston, MA, December (2013)


    456. Talk
Detection of temperature dependent electron confinement in AlGaN/GaN heterostructures by THz optical Hall-effect measurements

T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva
ICSE-VI, Kyoto, Japan, May (2013)


    455. Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide
P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C. R. Eddy, Jr., D. K. Gaskill, M. Schubert, and T. Hofmann
ICSE-VI, Kyoto, Japan, May (2013)


    454. Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on SiC: Influence of Growth, SiC Polymorph, and H-Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, V. Darakchieva, R. Yakimova, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    453. THz dielectric anisotropy of metal slanted columnar thin films: Ellipsometric characterization and Sensor applications
T. Hofmann, D. Schmidt, P. Kühne, C. M. Herzinger, J. A. Woollam, M. Schubert, and E. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    452. Talk
Recent progress in understanding free-charge carrier and structural properties of InN:Mg

M.-Y. Xie, S. Schöche, N. Ben Sedrine, F. Tasnadi, B. Monemar, T. Hofmann, M. Schubert, X. Wang, A. Yoshikawa, K. Wang, Y. Nanishi, and V. Darakchieva
E-MRS 2013 SPRING MEETING, Strasbourg, France, May (2013)


    451. Combinatorial QCM-D/GE-Study of Protein Adsorption on Polymer Brushes grafted to Nanostructured Surfaces
M. Koenig, T. Kasputis, D. Schmidt, K. B. Rodenhausen, K.-J. Eichhorn, A. K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
ICSE-VI, Kyoto, Japan, May (2013)


    450. Invited
Characterization of highly anisotropic 3D nanostructured surfaces

D. Schmidt
National University of Singapore, SSLS, Singapore, June (2013)


    449. Talk
Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    448. Talk
Protein-Loaded Slanted Columnar Thin Films As Novel Biomaterials for Enhancing Cell-Surface Interactions

T. Kasputis, K.B. Rodenhausen, A. Pieper, D. Schmidt, D. Sekora, E. Schubert, M. Schubert, and A.K. Pannier
2013 AIChE Annual Meeting, San Francisco, CA, November (2013)


    447. Invited
Materials Characterization using THz Ellipsometry and THz Optical Hall Effect

T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    446. Talk
Direct Band Structure Based Modeling of Graphene: from the THz to the UV

A. Boosalis, W. Li, N. Nguyen, M. Real, R. Elmquist, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, R. Myers-Ward, V. Wheeler, C. Eddy, D. Gaskill, M. Schubert, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    445. Talk
Optical Hall effect – Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC

P. Kühne, M. Schubert, V. Darakchieva, R. Yakimova, D.K. Gaskill, R.L. Myers-Ward, C.R. Eddy Jr., J.D. Tedesco, C.M. Herzinger, J.A. Woollam, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    444. Optical Properties of Graphene-Coated Cobalt GLAD Structures
P. Wilson, D. Schmidt, E. Schubert, M. Schubert, T. Hofmann, and A. Sinitskii1
2013 MRS Fall Meeting, Boston, MA, November (2013)


    443. Invited
Infrared spectroscopic ellipsometry characterization of complex wide-bandgap semiconductor heterostructures

T. Hofmann
Physics Colloquium, New Mexico State University, Las Cruces, NM, December (2013)


    442. In-situ Quantification of Cetyltrimethylammonium Bromide Adsorption Within Metal Nanorod Arrays by Generalized Transmission Ellipsometry
C. Rice, T. Hofmann, K.B. Rodenhausen, D. Sekora, D. Schmidt, E. Pfaunmiller, D. Hage, E. Schubert, and M. Schubert
23rd National NSF EPSCoR Conference, Nashville, TN, November (2013)


    441. In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries
D. Sekora, D. Schmidt, R. L. Y. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2013)


    440. In-situ Spectroscopic Ellipsometry of Nanostructured Silicon as High Capacity Electrodes for Lithium-ion Batteries
D. Sekora, D. Schmidt, R. Y Lai, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August (2013)


    439. Invited Tutorial in honor of Professor Manuel Cardona
The influence on optical spectra by phonons, plasmons, excitons, i.e., polaritons

M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    438. ALD von dünnen, konformen Metall- und Metalloxidschichten an GLAD Dünnfilmen
M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, Marcel Junige, and Johann W. Bartha
XX. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Vogtland, Germany, March (2013)


    437. Invited Institute Colloquium
Generalized Ellipsometry – from birefringence chromatography to the Optical Hall effect in epitaxial graphene

M. Schubert
Johannes Kepler University, Linz, Austria, March (2013)


    436. Invited Institute Colloquium
New Sensing and Separation Principles based on Nanohybrid Functional Materials

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, September (2013)


    435. Invited Industry Seminar
Novel concepts in Generalized Ellipsometry, Plasmonics, and Sensing Principles using anisotropic nanostructures

M. Schubert
Seagate Technologies, Minneapolis, MS , December (2013)


    434. Invited Institute Colloquium
The Optical Hall effect in epitaxial graphene and semiconductor heterostructures

M. Schubert, and T. Hofmann
College of Nanoscale Science, Center for Nanoscale Metrology, SUNY at Albany, Albany, NY, October (2013)


    433. Invited Institute Colloquium
New Sensing and Separation Principles based on Glancing Angle Deposited Nanohybrid Functional Materials and Birefringent THz-VUV Plasmonics

M. Schubert
University of Utah, Salt Lake City, UA, November (2013)


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2012:

    432. Control and switching of the interaction of model proteins with polymer brushes
P. Uhlmann, E. Bittrich, K.-J. Eichhorn, M. Müller, K. B. Rodenhausen, M. Schubert, and M. Stamm
American Chemical Society Spring Meeting, Symposium Proteins at Interfaces, San Diego, CA, March (2012)


    431. Fabrication and Characterization of GLAD Sculptured Thin Films Functionalized with Grafted-To Polymer Brushes
T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, P. Uhlmann, A. K. Pannier, M. Schubert, and M. Stamm
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    430. Talk
Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films

D. Schmidt, C. Briley, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    429. Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films
D. Schmidt, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    428. Talk
Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films

K. B. Rodenhausen, D. Schmidt, T. Kasputis, A. K. Pannier, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    427. Metal slanted columnar thin film THz optical sensors
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C.M. Herzinger, J.A. Woollam, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    426. GLAD Sculptured Thin Films Functionalized with Polymer Brushes
T. Kasputis, M. König, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    425. The Optical-Hall Effect
P. Kühne, T. Hofmann, A. Boosalis, S. Schöche, D. Schmidt, C. M. Herzinger, J.A. Woollam, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    424. Anisotropy and magnetodielectric effect in natural wolframite (Fe,Mn)WO4
S. Schöche, W. Dollase, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    423. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    422. Poster Award Winner
Spectroscopic Ellipsometry and optical Hall-Effect study of free-charge carriers in InN:Mg - Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2012)


    421. Invited
Terahertz Ellipsometry Materials Characterization

T. Hofmann
39th ICMCTF, San Diego, CA, April (2012)


    420. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2012)


    419. Talk
Slanted columnar thin films functionalized with polymer brushes

T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
AIChE Annual Meeting, Pittsburg, PA, October (2012)


    418. GLAD sculptured thin films functionalized with polymer brushes
T. Kasputis, M. Koenig, D. Schmidt, K.-J. Eichhorn, A.K. Pannier, M. Schubert, M. Stamm, and P. Uhlmann
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2012)


    417. Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films

M. Schubert
65th IUVSTA Workshop, Peckforton Castle, UK, May (2012)


    416. Invited
Ellipsometry for magnetics, metamaterials, chiral structures, and photonic crystals

M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    415. Spectroscopic Ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg - Indications for succesful p-type doping
S. Schöche, T. Hofmann, V. Darakchieva, N.B. Sedrine, X.~Wang, A. Yoshikawa, and M. Schubert
International Workshop on Nitride Semiconductors 2012, Sapporo, Japan, October (2012)


    414. Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications

T. Hofmann
E-MRS Spring Meeting, Strasbourg, France, May (2012)


    413. Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications

T. Hofmann
J. Kepler University, Linz, May (2012)


    412. Talk
Biochemical Optical Sensors Based on Highly-Ordered Slanted Columnar Thin Films

D. Schmidt, K.B. Rodenhausen, J. VanDerslice, T.E. Tiwald, E. Schubert, and M. Schubert
AVS 59th Annual International Symposium, Tampa, FL, October (2012)


    411. Fano Interference Effects in Hydrogen Intercalated Graphene
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, and M. Schubert
AVS 59th International Symposium, Tampa, FL, October (2012)


    410. Changes in Graphene Optical Properties Induced by Hydrogen Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November (2012)


    409. Smart polymer brushes investigated with combined ellipsometry and quartz crystal microbalance
M. Koenig, K. B. Rodenhausen, D. Schmidt, K.-J. Eichhorn, M. Stamm, M. Schubert, and P. Uhlmann
Makro 2012 - Smart Polymers, Mainz, Germany, October (2012)


    408. Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November (2012)


    407. Generalized ellipsometry in-situ monitoring of fibronectin protein infiltration of sculptured thin films
K. B. Rodenhausen, D. Schmidt, T. Kasputis, A.K. Pannier, E. Schubert,, and M. Schubert
Physical Chemistry of Biointerfaces II, San Sebastian, Spain, July 9-14, (2012)


    406. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August (2012)


    405. Large Scale Micro- and Nano- Prepatterning for Sculptured Thin Films
D. Sekora, D. Schmidt, S. Schöche, M. Hirtz, S. Sekula, M. Schubert, and E. Schubert
Nanoscience Symposium, Lincoln, NE, October (2012)


    404. Invited Institute Seminar
Nebraska Center for Nanohybrid Functional Materials - Progress report 2012

M. Schubert
Leibniz Institute for Polymer Research (IPF), Dresden, September (2012)


    403. Invited Industry Seminar
Nebraska Center for Nanohybrid Functional Materials - Progress report 2012

M. Schubert
LiCOR Biosciences, Lincoln, NE, December (2012)


    402. Invited Institute Seminar
New chemical, biochemical and biological sensing and separation principles based on highly ordered three-dimensional nanohybrid materials thin films

M. Schubert
Linkoping University, Linkoping, Sweden, December (2012)


    401. Invited
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
NSF-MRSEC QSPIN Industry Workshop, Lincoln, NE, March (2012)


    400. Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered 3-D nanohybrid materials thin films

M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, K. Rodenhausen, and J. Gerasimov
Leibniz Institute for Surface Modification - Erfahrungsaustausch: Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Erzgebirge, March (2012)


    399. Invited Institute Colloquium
Generalized Ellipsometry: Principles and Applications

M. Schubert
Naval Research Laboratories, Washington DC, May (2012)


    398. Invited Tutorial
In-situ Ellipsometry

M. Schubert
Naval Research Laboratories, Washington DC, May (2012)


    397. Invited Institute Colloquium
Generalized Ellipsometry: Principles and Applications

M. Schubert
United States Department of Commerce - National Institute of Standards and Technology, Gaithersburg, Maryland, May (2012)


    396. Invited
Generalized Ellipsometry: Principles and Applications

M. Schubert
Physics Department, University of Nebraska-Kearney, Kearney, NE, April (2012)


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2011:

    395. Paul Drude Medal Winner
Generalized Ellipsometry on Sculptured Thin Films made by Glancing Angle Deposition

D. Schmidt, E. Schubert, and M. Schubert
Workshop Ellipsometry, Berlin, Germany, February (2011)


    394. Talk
Hole-channel conductivity in epitaxial graphene determined by terahertz optical Hall-effect and midinfrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
APS, Dallas, March (2011)


    393. Talk
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
APS, Dallas, March (2011)


    392. Talk
Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films

D. Schmidt, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert
APS, Dallas, March (2011)


    391. THz optical Hall effect in multi valley band materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger, and M. Schubert
6th Workshop Ellipsometry, Berlin, Feb (2011)


    390. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
6th Workshop Ellipsometry, Berlin Germany, February (2011)


    389. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
6th Workshop Ellipsometry, Berlin Germany, February (2011)


    388. Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution
K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert
6th Workshop Ellipsometry, Berlin Germany, February (2011) [View PDF (619 kB)]


    387. Talk
THz Optical Hall Effect in Epitaxial Graphene

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
NCMN Grapnene Colloquium, Lincoln, NE, March (2011)


    386. Poster Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
UNL Graduate Research Symposium, Lincoln, NE, April (2011)


    385. Outstanding Presentation Award
Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic, ultra-thin films

K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, T. Hofmann, A. K. Pannier, R. Y. Lai, T. E. Tiwald, and M. Schubert
UNL E-Week Graduate Student Research Symposium, Lincoln, NE, April (2011)


    384. Combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation to study organic ultra-thin film evolution
K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, A. K. Pannier, R. Y. Lai, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2011) [View PDF (619 kB)]


    383. Talk
THz dielectric anisotropy of metal slanted columnar thin films

T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    382. Optical properties of graphene on SiC polytypes determined by spectroscopic ellipsometry from the terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
Nano-DDS, New York, NY, August (2011)


    381. Optical Properties of Graphene on SiC polytypes Determined by Spectroscopic Ellipsometry
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
International conference on SiC and related materials, Cleveland,OH, September (2011)


    380. 2nd Prize Topical Focus Ellipsometry Session
Vector-Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films

D. Schmidt, C. Briley, E. Schubert, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    379. Talk
Manipulating the Optical Properties of Metals: Sculptured Thin Films coated by Atomic Layer Deposition

D. Schmidt, N. Ianno, E. Schubert, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    378. Talk
Optical Properties of Graphene on MgO and SiC Polytypes Determined by Spectroscopic Ellipsometry

A. Boosalis, T. Hofmann, S. Schöche, P.A. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, D.K. Gaskill, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    377. Applied Surface Science Division Student Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
AVS 58th International Symposium, Nashville, TN, October (2011)


    376. Functionalization of Sculptured Thin Films with Atomic Layer Deposition
D. Schmidt, N. Ianno, E. Schubert, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    375. Vector-Magneto-Optical Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films
D. Schmidt, C. Briley, E. Schubert, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    374. 1st Prize Topical Focus Ellipsometry Session
Real-time Spectroscopic Ellipsometry and Quartz Crystal Microbalance with Dissipation Characterization of Biomolecule Adsorption within Sculptured Thin Films

T. Kasputis, D. Schmidt, K.B. Rodenhausen, H. Wang, A.K. Pannier, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    373. Talk
Enhancing Nonviral Gene Delivery by Manipulating Cell-Material Interactions

T. Kasputis, and A.K. Pannier
AIChE Annual Meeting, Minneapolis, MN, October (2011)


    372. Talk
Real-time SE/QCM-D Characterization of Biomolecule Adsorption within Sculptured Thin Films

T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert
AIChE Annual Meeting, Minneapolis, MN, October (2011)


    371. Spectroscopic Ellipsometry and Optical Hall-Effect Studies of Free-Charge Carriers in P-Type InN:Mg.
S. Schöche, T. Hofmann, N.B. Sedrine, V. Darakchieva, B. Monemar, X.~Wang, A. Yoshikawa, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    370. Optical Properties of Graphene on Multiple Substrates Determined by Spectroscopic Ellipsometry from the Terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, R. Yakimova, V. Darakchieva, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, D. K. Gaskill, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011) [View PDF (531 kB)]


    369. THz Dielectric Anisotropy of Metal Slanted Columnar Thin Films
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    368. Invited
Epitaxial graphene grown by high temperature sublimation

R. Yakimova, V. Darakchieva, R. Yazdi, J. Jenssen, A. Boosalis, T. Hofmann, and M. Schubert
3rd International Symposium on the Science and Technology of Epitaxial Graphene, St. Augustine, FL, October (2011)


    367. Talk
Application of spectroscopic ellipsometry techniques to the studies of epitaxial graphene grown by high-temperature sublimation

V. Darakchieva, A. Boosalis, T. Hofmann, M. Schubert, T. Iakimov, and R. Yakimova
Workshop for Graphene Synthesis and Characterisation for Applications, Lake Windermere, UK, November (2011)


    366. Real-time SE/QCM-D characterization of protein adsorption within sculptured thin films
T. Kasputis, D. Schmidt, K.B. Rodenhausen, A.K. Pannier, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2011)


    365. Invited Institute Colloquium
Sensing and separation principles using 3D nanostructures

M. Schubert
Leibniz Institute for Polymer Research IPF, Dresden, Germany, October (2011)


    364. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in a HfO2 passivated AlGaN/GaN HEMT structure
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
9th International Conference on Nitride Semiconductors (ICNS-IV), Glasgow, Scotland, July (2011)


    363. Invited Department Seminar
The Optical Hall-effect in semiconductor heterostructures

M. Schubert
Physics Department, University of Nebraska-Kearney, Kearney, NE, April (2011)


    362. Invited Department Seminar
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany, December (2011)


    361. Invited Institute Colloquium
New Sensing and Separation Principles with ordered 3D Nanostructure Hybrid Materials

M. Schubert
Linkoping University, Linkoping, Sweden, December (2011)


    360. Invited Tutorial
Generalized Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, December (2011)


    359. Invited Institute Seminar
The Optical Hall-effect in semiconductor heterostructures

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, C.M. Herzinger, J.A. Woollam, V. Darakchieva, and B. Monemar
United States Department of Engery - Sandia National Laboratories, Albuquerque, New Mexico, March (2011)


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2010:

    358. Invited
Optical Coatings from Sculptured Thin Films: Art and Promise

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, and M. Schubert
SVC 2010, Orlando, FL, April (2010)


    357. Spectroscopic Ellipsometry for Metamaterials by Glancing Angle Deposition
D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    356. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    355. Research Presentation Winner "Best of Show"
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, M. Schubert, and E. Schubert
E-Week, Lincoln, NE, April (2010)


    354. Optical Properties of Hybridized Nanostructures
D. Schmidt, C. Müller, K. B. Rodenhausen, T. Hofmann, O. Inganäs, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    353. Free-Charge Carrier Profiles of Iso- and Aniso-type Si Homojunctions
A. Boosalis, T. Hofmann, J. Sik, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    352. Free-charge carrier properties of graphene layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    351. THz optical Hall effect in multivalley band materials
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    350. Temperature dependent dielectric function of Al0.52In0.48P and Ga0.52In0.48P
E. Montgomery, M. Schubert, T. Hofmann, C. Krahmer, and K. Streubel
ICSE-V, Albany, NY, May (2010)


    349. Monitoring Protein Deposition on Self-Assembled Monolayers of Alkanethiols on Gold in-situ With Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    348. Micelle-Assisted Bilayer Formation of CTAB Thin Films Studied with Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Techniques
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    347. Spectroscopic Ellipsometry Analysis of Silicon Nitride Thin Films on Textured Silicon for Solar Cells
M. F. Saenger, C. M. Herzinger, M. Schädel, J. Hilfiker, J. Sun, T. Hofmann, M. Schubert, and J. A. Woollam
ICSE-V, Albany, NY, May (2010)


    346. Spectroscopic Ellipsometry Analysis of GaAs0.9-xNxSb0.1 Alloy Films Grown on GaAs
N. B. Sedrine, C. Bouhafs, V. Darakchieva, J. C. Harmand, R. Chtourou, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    345. Invited
Terahertz Ellipsometry

T. Hofmann, C.M. Herzinger, and M.Schubert
ICSE-V, Albany, NY, May (2010)


    344. Talk
Three Dimensional Aberration Corrected Lorentz Microscopy of Magnetic Structures

C. Phatak, A. Petford-Long, E. Schubert, M. Schubert, D. Schmidt, and M. de Graef
IMC17, Rio de Janeiro, BR, September (2010)


    343. Talk
Agent-free bio-chemical sensing with sculptured thin films

D. Schmidt, K. B. Rodenhausen, S. Schöche, E. Schubert, and M. Schubert
ISSSR, Springfield, MO, June (2010)


    342. Talk
The influence of the SiC substrate on the free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry and optical Hall-effect

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ISSSR, Springfield, MO, June (2010)


    341. Invited
Terahertz Ellipsoometry and the Optical Hall effect in Materials Science, M. Schubert

M. Schubert
European Winterschool on Ellipsometry NanoCharm3, Bad Hofgastein, Austria, February (2010)


    340. Invited
Generalized THz to Ultraviolet ellipsometry in contemporary Semiconductor and Nanostructure research: Sculptured hybrid nanostructure thin films and sheet carrier characterization in InN and graphene

M. Schubert
Mini-workshop on Advanced Characterization technqiues in Materials Science, Instituto Technologico e Nuclear, Lisbon, Portugal, March (2010)


    339. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    338. Free-Charge Carrier Profiles of Iso- and Anisotype Si Homojunctions
A. Boosalis, T. Hofmann, J. Šik, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    337. Applied Surface Science Division Student Award Winner
Agent-Free Bio-Chemical Sensing With Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, E. Schubert, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    336. Talk
Optical, Magnetic, Magneto-Optical and Electrochemical Properties of Sculptured Thin Films

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, E. Montgomery, S. Schöche, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    335. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
ICSE-V, Albany, NY, May (2010)


    334. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    333. Talk
Free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    332. Talk
Monitoring protein deposition on self-assembled monolayers of alkanethiols on gold in-situ with combined quartz crystal microbalance and spectroscopic ellipsometry

K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, and M. Schubert
ICMCTF, San Diego, CA, April (2010)


    331. Talk
Monitoring Ultra-Thin Organic Film Growth, in-situ, with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry

K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, M. Schubert, M. Solinsky, and T. E. Tiwald
AVS Fall Meeting, Albuquerque, NM, October (2010)


    330. Free-charge Carrier Properties of Epitaxial Graphene Grown on SiC Investigated by THz and Infrared Ellipsometry and THz Optical-hall Effect.
T. Hofmann, A. Boosalis, J. T. Tedesco, R. L. Myers-Ward, P. M. Campbell, C. R. Eddy, D. K. Gaskill, V. Shields, S. Shivaraman, M. G. Spencer, W. J. Schaff, and M. Schubert
MRS Fall Meeting, Boston, December (2010)


    329. Talk
Combinatorial SE/QCM-D Approach for Studying Porous Organic Ultra-thin Film Evolution

K. B. Rodenhausen, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, M. Solinsky, and M. Wagner
MRS Fall Meeting, Boston, MA, December (2010)


    328. Determination of the refractive index of single crystal bulk samples and micro-structures
P. Kühne, C. Czekalla, R. Schmidt-Grund, C. Sturm, and M. Grundmann
ICSE-V, Albany, NY, May (2010)


    327. Low-Temperature Dielectric Tensor of a-plane MgxZn1?xO
D. Schumacher, R. Schmidt-Grund, P. Kühne, H. Hilmer, C. Sturm, H. Hochmuth, M. Lorenz, and M. Grundmann
ICSE-V, Albany, NY, May (2010)


    326. THz Optical Hall-Effect in Multi-Valley Band Materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-Week, Lincoln, April (2010)


    325. Invited
Generalized THz Ellipsometry characterization of novel materials towards THz electronics

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, and W.J. Schaff
THz Workshop and User Meeting, BESSY-II, Berlin, GE, December (2010)


    324. Talk
Development of Combinatorial, in-situ Spectroscopic Ellipsometry and Quartz Crystal Microbalance

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    323. Talk
THz Optical Hall-Effect in Multi-Valley Band Materials

P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-week, Lincoln, April (2010)


    322. Invited
Terahertz Ellipsometry materials characterization

T. Hofmann
IFM colloquium, Linköping, Sweden, December (2010)


    321. Talk
Dielectric function and crystal structure of BaTiO3 and BaTiO3/ZnO heterostructures

T. Böntgen, S. Schöche, R. Schmidt-Grund, C. Sturm, M. Brandt, H. Hochmuth, M. Lorenz, and M.Grundmann
ICSE-V, Albany, NY, May (2010)


    320. Talk
High- and low-frequency electro-optical properties of BaTiO3 epitaxial thin films and heterostructures

T. Böntgen, K. Brachwitz, R. Schmidt-Grund, M. Brandt, S. Schöche, C. Sturm, H. Hochmuth, M. Lorenz, and M.Grundmann
E-MRS Spring Meeting, Strasbourg, France, June (2010)


    319. Crystal structure and dielectric function of BaTiO3 single crystals and thin films
S. Schöche, R. Schmidt-Grund, C. Sturm, H. Hochmuth, M. Brandt, M. Lorenz, and M. Grundmann
MRS Spring Meeting, San Francisco, Ca, April (2010)


    318. The corrugated interface strain coupled magnetostrictive-ferroelectric piezoelectric semiconductor device
V. M. Voora, T. Hofmann, and M. Schubert
Nebraska MRSEC Symposium, Lincoln, NE, October (2010)


    317. Invited
Developments in Spectroscopic Ellipsometry for Characterization of Organic and Inorganic Surfaces, Interfaces and Complex Layered Materials

M. Schubert
AVS 57th International Symposium, Albuquerque, New Mexico, October (2010)


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2009:

    316. Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
5th Workshop Ellipsometry, Zweibrucken, March (2009)


    315. Monoclinic Optical Properties of Slanted Columnar Thin Films
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    314. Talk
Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
ICMCTF 2009, San Diego, CA, April (2009)


    313. THz Ellipsometry Materials Characterization
T. Hofmann, C.M. Herzinger, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    312. IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    311. Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    310. Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Graduate Student Poster Session, UNL, NE, April (2009)


    309. Materials Characterization using THz Ellipsometry.
T. Hofmann, M. Schubert, and C. M. Herzinger
MRS Spring Meeting, San Francisco, April (2009)


    308. Hybridized Nanostructures
E. Montgomery, D. Schmidt, E. Schubert, and M. Schubert
E-Week, UNL, NE, April (2009)


    307. Characterizing AntiReflection Coatings on Textured Mono-Crystalline Silicon with Spectroscopic Ellipsometry
J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam
34th IEEE Photovoltaic Specialists Conference, Philadelphia, PA, June (2009) [View PDF (1.5 MB)]


    306. Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
51st Electronic Materials Conference, University Park, Pennsylvania, June (2009) [View PDF (1.0 MB)]


    305. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    304. Research Presentation Winner
Optical and Structural Properties of Sculptured Thin Films

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
E-Week, UNL, NE, April (2009)


    303. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
MRS Fall Meeting, Boston, MA, November (2009)


    302. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    301. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M. Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
3rd South African Conference on Photonic Materials, Mabula, South Africa, March (2009)


    300. Structural anisotropy and free electron properties of a-plane InN
V. Darakchieva, N. Franco, M. Schubert, C.L. Hsiao, L. C. Chen, Y. Takagi, and Y. Nanishi
E-MRS Spring Meeting, Strasbourg, France, June (2009)


    299. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M.-Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
E-MRS Spring Meeting, Strasbourg, France, June (2009)


    298. Structural and free-electron properties of zinc-blende InN
M.-Y. Xie, V. Darakchieva, F. Giuliani, B. Monemar, C.L. Hsiao, L.C. Chen, and M. Schubert
E-MRS Spring Meeting, Strasbourg, France, June (2009)


    297. Hydrogen in InN
V. Darakchieva, K. Lorenz, N. Barradas, E. Alves, M. Schubert, M.-Y. Xie, B. Monemar, W.J. Schaff, C.L. Hsiao, L.C. Chen, L.W. Tu, and Y. Nanishi
8th International Conference on Nitride Semiconductors, Jeju, Korea, October (2009)


    296. Influence of defects, dopants and surface orientation on free carrier properties of InN
V. Darakchieva, M. Schubert, K. Lorenz, E. Alves, M.-Y. Xie, T. Hofmann, W. J. Schaff, L. C. Chen, L. W. Tu, and Y. Nanishi
MRS Fall Meeting, Boston, USA, December (2009)


    295. Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
F. Saenger, C. M. Herzinger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, USA, December (2009)


    294. ZnO-BaTiO3-ZnO: Unipolar ferroelectric transistor structures with spontaneous interface charge coupling for non-volatile switching applications
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
MRS Fall Meeting, Boston, USA, December (2009)


    293. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E.Tiwald, M. Solinsky, and M. Wagner
AVS 56th International Symposium, San Jose, CA, November (2009)


    292. Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry
T. Hofmann, C. M. Herzinger, J. A. Woollam, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    291. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
NSF-MRSEC QSPIN Symposium, Lincoln, NE, October (2009)


    290. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
Nano-DDS Army Research Office conference, Fort Lauderdale, FL, October (2009)


    289. Temperature dependent dielectric function of ZnO
P. Kühne, R. Schmidt-Grund, C. Sturm, M. Brandt, and M. Grundmann
SFB-Workshop, Wittenberg, September (2009)


    288. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
QCM-D Scientific Conference, USA, New York City Metro Area, NJ, November (2009)


    287. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
UNL SE/QCM-D Mini-Symposium, Lincoln, NE, November (2009)


    286. Talk
Temperature dependent dielectric function of nonpolar ZnO

P. Kühne, R. Schmidt-Grund, C. Sturm, M. Brandt, and M. Grundmann
DPG spring meeting, Dresden, March (2009)


    285. Temperature dependent dielectric function of ZnO
P. Kühne, R. Schmidt-Grund, C. Sturm, M. Brandt, and M. Grundmann
Workshop Ellipsometry , Zweibrücken, March (2009)


    284. Talk
Optische und strukturelle Untersuchungen an Bariumtitanat-Dünnfilmen

S. Schöche, R. Schmidt-Grund, C. Sturm, H. Hochmuth, M. Brandt, M. Lorenz, and M. Grundmann
DPG Spring Meeting, Dresden, Germany, March (2009)


    283. Optical and structural investigations on BaTiO3 thin films
S. Schöche, R. Schmidt-Grund, C. Sturm, H. Hochmuth, M. Brandt, M. Lorenz, and M. Grundmann
5th Workshop Ellipsometry, Zweibr\"ucken, Germany, March (2009)


    282. Invited Institute Seminar
Exploring the science of hybrid nanostructure materials by terahertz to ultraviolet genberalized ellipsometry

M. Schubert
Forschungszentrum Rossendorf, Dresden, August (2009)


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2008:

    281. Magnetism of Undoped and Co-Doped TiO2 Clusters
X. Wei, R. Skomski, M. Schubert, and D. Sellmyer
American Physical Society Meeting, New Orleans, Lousiana, March (2008)


    280. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
M. Schubert, and T. Hofmann
American Physical Society Meeting, New Orleans, Lousiana, March (2008)


    279. Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann
2008 MRS Spring Meeting, San Francisco, March 25 (2008) [View PDF (87 kB)]


    278. THz resonances in chiral aluminum nanowires
T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
2008 MRS Spring Meeting, San Francisco, March (2008)


    277. Ferroelectric thin film field-effect transistors based on ZnO/BaTiO3 heterostructures
M. Brandt, H. Frenzel, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann
5th International Workshop on ZnO and related materials, Michigan, September (2008)


    276. Poster Award Winner
THz Resonances in Chiral Aluminum Nanowires

D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    275. Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT
M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    274. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    273. Epitaxial ferroelectric BTO/ZnO heterostructures
M. Brandt, H. Hochmuth, M. Lorenz, M. Schubert, V. Voora, and M. Grundmann
2nd International Symposium On Transparent Conductive Oxides, Hersonissos, Greece, October (2008)


    272. In-situ monitoring of p- and n-type doping in AlGaInP
C. Krahmer, A. Behres, K. Streubel, and M. Schubert
14th International Conference of Metalorganic Vapor Phase Epitaxy, Metz, France, June (2008)


    271. Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
Brookhaven National Laboratory NSLS-CFN User Meeting, Brookhaven, May (2008)


    270. Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells
M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam
17th International Materials Research Conference, Cancún, Mexico, August (2008)


    269. Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
The 5th International Workshop on ZnO and Related Materials, Michigan, USA, September (2008)


    268. Talk
Hybrid Nanocoil Sculptured Thin Films

D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert
2008 MRS Fall Meeting, Boston, MA, December (2008)


    267. Talk
Sculptured Thin Films from Aluminum

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
AVS 55th International Symposium, Boston, MA, October (2008)


    266. Talk
Magnetically Active Nanospirals

E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November (2008)


    265. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, MA, December (2008) [View PDF (245 kB)]


    264. Magnetically induced optical chirality in ZnMnSe
M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert
53rd Magnetism and Magnetic Materials Conference, Austin, TX, November (2008)


    263. Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
MRS Fall Meeting, Boston, MA, December (2008)


    262. Assessment of the Surface Electron Accumulation Properties of Polar and Non-Polar InN Surfaces
W. J. Schaff, L. C. Chen, Y. Nanishi, and M. Schubert
MRS Fall Meeting, Boston, (2008)


    261. Terahertz Ellipsometry Using Electron-Beam Based Sources
T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, (2008)


    260. Terahertz Ellipsometry Materials Characterization
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
ISSSR, Hoboken, NJ, June (2008)


    259. International Conference on Electronic Materials
V. Darakchieva, T. Hofmann, and M. SChubert
IUMRS-ICEM08, Sydney, Australia, (2008)


    258. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
T. Hofmann, and M. Schubert
APS Spring Meeting, Denver, (2008)


    257. Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November (2008)


    256. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, MA, December (2008)


    255. THz Resonances in Chiral Al Nanowires
E. Schubert, T. Hofmann, and M. Schubert
ISSSR, Hoboken, NJ, June (2008)


    254. Invited Industry Seminar
Terahertz Ellipsometry Materials Characterization

M. Schubert, T. Hofmann, and C. M. Herzinger
Bruker GmbH, Leipzig, August (2008)


    253. Invited Industry Seminar
The UNL Ellipsometry group

M. Schubert
Proctor and Gamble, Dayton, OH, October (2008)


    252. Invited Department Seminar
Optical Hall effect in semiconductor heterostructures

T. Hofmann, and M. Schubert
Department of Physics, ETH Zurich, Zurich, Switzerland, September (2008)


    251. Invited Industry Seminar
Optical Hall effect in semiconductor heterostructures

M. Schubert, T. Hofmann, and C. M. Herzinger
Freiberger Compound Materials GmbH, Freiberg, Sachsen, August (2008)


    250. Invited Department Seminar
Funktionale GLAD-Nanoarchitekturen und multiferroische Metalloxid-Heterostrukturen

M. Schubert
Halbleiterphysik, Universitat Leipzig, Leipzig, August (2008)


    249. Invited Institute Colloquium
Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency

M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger
National Renewable Energy Laboratory (NREL), Golden, Colorado, June (2008)


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2007:

    248. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    247. ICSE4 Poster Award Winner
The optical-Hall effect

T. Hofmann, and M.Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    246. Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters
M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    245. Surface electron accumulation and effective mass anisotropy in wurtzite structure InN
T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    244. Terahertz ellipsometry using electron-beam based sources
T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    243. Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
T. Hofmann, C. von Middendorff, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    242. Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach
V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    241. Poster Award Winner
Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P

E. Montgomery, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, October (2007)


    240. Dielectric and magnetic birefringence in Zn1-xMnxSe
M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, NE, October (2007)


    239. THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters
M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
TMS 2007 Electronic Materials Conference, Notre Dame, IN, June (2007)


    238. Polaron-phonon interaction in charge intercalated tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    237. Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and non-chiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    236. Generalized Mueller matrix Ellipsometry of 3-D spherical photonic bandgap structures
H. Wang, D. Schmidt, M. Saenger, M. Schubert, and Y.F. Lu
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    235. Invited
Terahertz magnetooptic ellipsometry

T. Hofmann
4th International Conference on Spectroscopic Ellipsometry, Stockholm, March (2007)


    234. The optical-Hall effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert
Electronic Materials Conference, Notre Dame, June (2007)


    233. Polaron and phonon properties in WO3 thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    232. Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry
M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth, M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    231. Phonon and polaron properties of charge intercalated WO3
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, CA, August (2007)


    230. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, August (2007)


    229. Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and achiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
54th Midwest Solid State Conference, Lincoln, October (2007)


    228. Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates
L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    227. Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Notre Dame, June (2007)


    226. Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy
V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert
2007 E-MRS Spring Meeting, Strasbourg, France, May (2007)


    225. Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN: Evidence for a New Defect-Related Doping Mechanism
T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert
7th Int'l Conference of Nitride Semiconductors, Las Vegas, September (2007)


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2006:

    224. Anisotropy of the &Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
70. German Physical Society Spring Meeting, Dresden, March (2006)


    223. Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert
70. German Physical Society Spring Meeting, Dresden, March (2006)


    222. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June (2006)


    221. Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry
T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June (2006)


    220. Conduction band effective mass anisotropy and nonparabolicity of InN
V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar
3. Workshop on Indium Nitride, Brazil, November (2006)


    219. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Photonics West 2006, San Jose, January (2006)


    218. Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Photonics West 2006, San Jose, January (2006)


    217. Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February (2006)


    216. Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February (2006)


    215. Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June (2006)


    214. Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Spring MRS Meeting Symposium K: Materials Research for THz Applications, San Francisco, April (2006)


    213. Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
Spring MRS Meeting Symposium GG: Current and Future Trends of Functional Oxide Films, San Fracisco, April (2006)


    212. Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February (2006)


    211. Temperature-dependent band-gap and excitonic properties of ZnO
R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and and M. Grundmann
4. Workshop "Ellipsometrie", Berlin, February (2006)


    210. Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
German Physical Society Spring Meeting, Dresden, March (2006)


    209. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
German Physical Society Spring Meeting, Dresden, March (2006)


    208. Optical properties of colored tungsten oxide sputtered thin films
M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert
4th Ellipsometry Workshop, Berlin, February (2006)


    207. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert
28th International Conference on the Physics of Semiconductors, Vienna, Austria, July 24-28 (2006)


    206. Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert
ICPS, , July (2006)


    205. Invited Institute Colloquium
Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes

M. Schubert
IBM Research Laboratory, Rüschlikon, Switzerland, September (2006)


    204. Invited
Terhertz Magnetooptic Ellipsometry: Optical studies of semiconductors in Quantum regimes

M. Schubert
International Conference on Low Energy Electrodynamics of Solids LEES 06, Tallinn, Estonia, July (2006)


    203. Invited
Generalized Ellipsometry on sculptured thin films: Birefringence and chirality

M. Schubert, E. Schubert, H. Wang, Y. Lu, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, J. Rivory, and B. Gallas
Photon06, Manchester, United Kingdom, September (2006)


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2005:

    202. Polarization-dependent optical transitions at the fundamental band gap and higher critical points of wurtzite ZnO in Proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices, 2005. NUSOD '05.
D. Fritsch, R. Schmidt-Grund, H. Schmidt, C. M. Herzinger, and M. Grundmann
IEEE, , September (2005)


    201. Phonons in doped ZnO and ZnO based thin films grown by PLD on sapphire
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, M. Lorenz, and M. Grundmann
G/PII.25 E-MRS 2005 Spring Meeting, Strasbourg, May/June (2005)


    200. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
A. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Berlin, March (2005)


    199. Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Workshop on Oxides at the nanoscale, Zaragoza Spain, November (2005)


    198. In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy
C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, and K. Streubel
32nd International Symposium of Compound Semiconductors, Rust, Germany, September (2005)


    197. Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing
T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August (2005)


    196. Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, and S. Nakamura
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August (2005)


    195. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August (2005)


    194. Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, and U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June (2005)


    193. The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June (2005)


    192. Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, and et al.
Advanced Process Control for future oriented manufacturing Workshop, FEP Dresden, September (2005)


    191. Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, Strasbourg, May/June (2005)


    190. Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie
M. Schubert
XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March (2005)


    189. Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films
N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March (2005)


    188. Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March (2005)


    187. Brechungsindex von kubischem MgxZn1-xO
Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March (2005)


    186. Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March (2005)


    185. Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March (2005)


    184. Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March (2005)


    183. Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, and M. Grundmann
69. German Physical Society Spring Meeting, Berlin, March (2005)


    182. Nickelsegregation nach Sauerstoff-Ionenimplantation in NiTi
M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, and B. Rauschenbach
69. German Physical Society Spring Meeting, Berlin, March (2005)


    181. Manufacturing of a LIGA cuvette for in-situ observation of electroplating
D. Schmidt, O. Wilhelmi, S. P. Heussler, M. Saumer, and H. O. Moser
High Aspect Ratio Micro Structure Technology Workshop (HARMST), Gyenogju, Korea, June (2005)


    180. Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen
C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert
TCOs für Dünnschichtsolarzellen und andere Anwendungen, Freyburg, April (2005)


    179. Invited Institute Colloquium
Light and Matter: Advanced polarization spectroscopy in functional materials physics

M. Schubert
Universite Pierre et Marie Curie (Prof. Y. Rivory, Prof. J. Lafait), Paris, February 03 (2005)


    178. Invited Industry Seminar
Optical Spectroscopy: old spectacles for new materials and physics

M. Schubert
Laytec GmbH, (Dr. Th. Zettler), February 11 (2005)


    177. Invited Department Seminar
Advanced polarization spectroscopy in functional materials physics

M. Schubert
University Hamburg, (Prof. Dr. M. Rübhausen), April 18 (2005)


    176. Invited Institute Seminar
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures

M. Schubert
BESSY Berlin, (Prof. Dr. W. Eberhardt, Dr. U. Schade), April 21 (2005)


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2004:

    175. Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2004)


    174. CuInSe2 flexible solar cell surface-heat-emittance optimization for infrared radiation
C. Bundesmann, F. Dürr, M. Schubert, and K. Otte
German Physical Society Spring Meeting, Regensburg, March (2004)


    173. Invited
Optische Analytikverfahren für die Dünnschichtcharakterisierung

M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen, March (2004)


    172. Optische dielektrische Funktionen im Photonenenergiebereich (0.4 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2004)


    171. Invited
Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen

M. Schubert, and T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    170. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
C. Bundesmann, M. Schubert, N. Ashkenov, G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, and H. Neumann
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    169. Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    168. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    167. Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2004)


    166. Temperature-dependent band-gap energies and optical constants of ZnO
N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2004)


    165. Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth
N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, and B. Johs
German Physical Society Spring Meeting, Regensburg, March (2004)


    164. Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen
S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2004)


    163. Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen
H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2004)


    162. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
German Physical Society Spring Meeting, Regensburg, March (2004)


    161. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
German Physical Society Spring Meeting, Regensburg, March (2004)


    160. Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates
A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, and A. Krost
German Physical Society Spring Meeting, Regensburg, March (2004)


    159. Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, and M. Heuken
German Physical Society Spring Meeting, Regensburg, March (2004)


    158. Invited
Spectroscopic ellipsometry: From basic materials research to industrial applications

M. Schubert
Swedish Optical Society Meeting, Linkoping, Sweden, November (2004)


    157. Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, and M. Grundmann
Int. Workshop on Oxide Electronics WOE-11, Kanagawa, Japan, October (2004)


    156. Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano, and I. Akasaki
Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July (2004)


    155. Phonon deformation potentials in hexagonal InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and and B. Monemar
Int. Workshop on Nitride Semiconductors IWN 2004, Pittsburgh U.S.A., July (2004)


    154. The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, and C. v. Middendorf
27th International Conference on the Physics of Semiconductors, Flagstaff, July (2004)


    153. Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures
M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, and M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July (2004)


    152. Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, and M. Grundmann
27th International Conference on the Physics of Semiconductors, Flagstaff, July (2004)


    151. Invited
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures

M. Schubert, and T. Hofmann
International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July (2004)


    150. Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, and W.J. Shaff
E-MRS 2004, Strasbourg, May (2004)


    149. Invited
In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung

M. Schubert
Transparent Conducting Oxide (TCO) Workshop, Leipzig, March (2004)


    148. HVPE-grown free-standing GaN of high structural and optical quality
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, and M. Heuken
ISBLLED-2004 Gyeongju, Korea, March (2004)


    147. In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
M. Schubert, N. Ashkenov, C. Bundesmann, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold, and
German Physical Society Spring Meeting, Regensburg, March (2004)


    146. Invited Industry Seminar
Optische Analytikverfahren für die Dünnschichtcharakterisierung

M. Schubert
OSRAM-OPTO Semiconductors GmbH, Regensburg (Dr. K. Streubel), March (2004)


    145. Invited Institute Seminar
In-situ process monitoring with spectroscopic ellipsometry and Raman scattering

M. Schubert
Technical University Magdeburg, (Prof. Krost, Prof. Christen), May (2004)


    144. Invited Department Seminar
Advanced polarization spectroscopy in functional materials physics

M. Schubert
Colorado State University, Fort Collins, (Prof. Hochheimer), May (2004)


    143. Invited Department Seminar
Spectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications

M. Schubert
University Tübingen, (Prof. Dr. Th. Chassé), November 17 (2004)


    142. Invited Institute Seminar
Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control

M. Schubert
Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, (Dr. Springer), December 2 (2004)


    141. Invited Department Seminar
Spectroscopic ellipsometry: From basic materials research to industrial applications

M. Schubert
University Stuttgart, (Prof. Dr. M. Dressel, Dr. B. Gompf), November 30 (2004)


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2003:

    140. Si- and Zn-doping of InGaNAs and BInGaAs using MOVPE
G. Leibiger, C. Krahmer, V. Gottschalch, G. Benndorf, and V. Riede
Proceedings of the EW-MOVPE X, Lecce, Italy, June (2003)


    139. Optische Übergänge und Brechungsindices von MgZnO
R. Schmidt, B. Rheinländer, M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, Dresden, March (2003)


    138. Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten
B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert, N. Ashkenov, P. Pfundstein, D. Gerthsen, and K. Eichhorn
German Physical Society Spring Meeting, Dresden, March (2003)


    137. Phonons, band gap and higher interband transitions of hexagonal InGaN
A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, and Y. Nanishi
German Physical Society Spring Meeting, Dresden, March (2003)


    136. Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka
German Physical Society Spring Meeting, Dresden, March (2003)


    135. Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    134. Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, and M. Schubert
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    133. Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    132. Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, and V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    131. Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    130. Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, and K. Järrendahl
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    129. Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and and B. Monemar
ICDS, , (2003)


    128. Invited
Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films

M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann
Optical System Design 2003, St. Etienne, France, September (2003)


    127. The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN
A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, and B. Monear
5. Int. Conf. on Nitride Semiconductor Research, Nara, July (2003)


    126. Invited
Generalized magneto-optic ellipsometry

M. Schubert, T. Hofmann, and C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    125. High temperature optical constants and band gap energies of ZnO
N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    124. Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures
A. Kasic, M. Schubert, and B. Monemar
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    123. Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    122. Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and and D. Gerthsen
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    121. UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    120. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner
10th International Workshop on Oxide Electronics, Augsburg, Germany, September 11-13 (2003)


    119. Invited Applied Optics Lecture
Principles and Application of Generalized Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, February (2003)


    118. Invited Applied Optics Lecture
Principles and Application of Infrared Spectroscopic Ellipsometry

M. Schubert
Linkoping University, Linkoping, Sweden, February (2003)


    117. Invited Department Seminar
Ellipsometrie und Raman an ZnO Dünnschichten

C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert
Nukleare Festkörperphysik, University Leipzig, Leipzig, April (2003)


    116. Invited Industry Seminar
Ellipsometry in functional materials physics

M. Schubert
von Ardenne Anlagenbau GmbH, (Hr. M. Kammer), November (2003)


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2002:

    115. Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-GaO-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, E.M. Kaidashev, B.Rheinländer, M.Lorenz, H. v. Wenkstern, A. Kasic, M.Schubert, and M.Grundmann
German Physical Society Spring Meeting, Regensburg, March (2002) [View PDF (625 kB)]


    114. Properties of pulsed-laser-deposited Zn1-x(Al Ga and Mg and Cd)xO compound thin films
C. Bundesmann, N. Ashkenov, A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz, R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2002)


    113. Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films
N. Ashkenov, C. Bundesmann, A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2002)


    112. Kritische Punkte und Phononen in BxGa1-xAs und GaNyAs1-y: Ein Vergleich
G. Leibiger, V. Gottschalch, M. Schubert, and V. Riede
German Physical Society Spring Meeting, Regensburg, March (2002) [View PDF (282 kB)]


    111. Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2002) [View PDF (628 kB)]


    110. Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, A. Kasic, E. M. Kaidashev, B. Rheinländer, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, Regensburg, March (2002)


    109. Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, and C. M. Herzinger
German Physical Society Spring Meeting, Regensburg, March (2002)


    108. Invited
Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures

M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar (2002)


    107. IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann
2. Workshop "Ellipsometrie", Berlin, Februar (2002)


    106. Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides
T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, and M. Schubert
11th International Conference on Metal-Organic Vapour Phase Epitaxy, Berlin, June (2002)


    105. Invited
Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures

M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle U.S.A., July (2002)


    104. Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle, U.S.A., July (2002)


    103. Invited
Generalized ellipsometry of complex mediums in layered systems

M. Schubert
47. Annual SPIE Meeting, Complex Mediums III, Seattle, U.S.A., July (2002)


    102. Optical phonons in AlxInyGa1-x-yN films
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, and M. Stutzmann
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July (2002) [View PDF (449 kB)]


    101. Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann
26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July (2002)


    100. Critical points and phonons in BxGa1-xAs and GaNyAs1-y: a comparison
G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, and M. Schubert
International Workshop on Nitride Semiconductors (IWN 2002), Aachen, Germany, July (2002)


    99. Critical points and phonons in (B,Ga)(N,As)
G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, and M. Schubert
Physics and Technology of Dilute Nitrides for Optical Communications, Istanbul, September (2002)


    98. Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals
H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October (2002)


    97. Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition
M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, Dayton, USA, October (2002)


    96. Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December (2002)


    95. Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December (2002)


    94. Phonons, excitons, band-to-band transitions and optical constants of MgZnO
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, and C. M. Herzinger
Materials Research Society Fall Meeting, Boston, U.S.A, December (2002)


    93. Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger
L.O.T.-Seminar, Darmstadt, October (2002)


    92. Invited Department Seminar
Infrared Spectroscopic Ellipsometry

M. Schubert, V. Darakchieva, H. Arwin, N.-C. Persson, O. Inganäs, Y. Fengling, and B. Monemar
Linkoping University, Linkoping, Sweden, September (2002)


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2001:

    91. Optical properties of AlxIn1-xN thin films determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 513, (2001)


    90. Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Šik, and M. Schubert
2000 IEEE 27th Int. Symp. on Compound Semiconductors, Piscataway, NJ, p. 7, (2001)


    89. Ellipsometrie und optische Konstanten von SiNx und SiOy für Bragg-Reflektoren
R.Schmidt, D.Pudis, B.Rheinländer , V.Riede, S.Hardt, V.Gottschalch, and J.Kvietková
German Physical Society Spring Meeting, Regensburg, March (2001) [View PDF (444 kB)]


    88. Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien kubischer AlxGa1-xN-Filme
A. Kasic, M. Schubert, and D. J. As
German Physical Society Spring Meeting, Hamburg, March (2001) [View PDF (584 kB)]


    87. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March (2001)


    86. Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie
T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March (2001) [View PDF (640 kB)]


    85. Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten
G. Leibiger, M. Schubert, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March (2001) [View PDF (910 kB)]


    84. Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen
A. Kasic, and M. Schubert
German Physical Society Spring Meeting, Hamburg, March (2001)


    83. Invited
Ellipsometry on anisotropic materials- treatment of surface and interface layers

M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), Bad Honnef, May (2001)


    82. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, and F. Scholz
Spring European MRS-Meeting, Strasbourg, France, June (2001)


    81. All-solid state electrochromic multiplayer systems for surface heat radiation control
E. Franke, M. Schubert, C. L. Trimble, and J. A. Woollam
Spring European MRS-Meeting, Strasbourg, France, June (2001) [View PDF (247 kB)]


    80. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
Spring European MRS-Meeting, Strasbourg, France, June (2001)


    79. Optical properties of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July (2001) [View PDF (910 kB)]


    78. Generalized Infrared Ellipsometry- A novel tool for characterization of group -III-Nitride Heterostructrues for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, and J. A. Woollam
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July (2001)


    77. Composition determination of InGaAsN using x-ray diffraction and far-infrared ellipsometry
G. Leibiger, V. Gottschalch, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, Denver U.S.A., July (2001) [View PDF (625 kB)]


    76. Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization of free-carrier and crystal-structure properties of III-V semiconductor device heterostructures
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam, and C. M. Herzinger
46. Annual SPIE Meeting, San Diego U.S.A., August (2001)


    75. Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
M. Schubert, and A. Kasic
1. Int.Conference on Advanced Vibrational Spectroscopy, Turku, Finnland, August (2001) [View PDF (129 kB)]


    74. Invited Department Seminar
The light and the lattice

M. Schubert
Technical University Berlin, (Prof. Richter), September (2001)


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2000:

    73. IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen
A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
1. Workshop "Ellipsometrie", Stuttgart, Februar (2000)


    72. Invited
Ellipsometry of anisotropic materials

M. Schubert
1. Workshop "Ellipsometrie", Stuttgart, Februar (2000)


    71. Optische Eigenschaften von GaNyAs1-y (0 ... y ... 0.37) Einzelschichten und Übergitterstrukturen
G. Leibiger, M. Schubert, B. Rheinländer, and V. Gottschalch
1. Workshop "Ellipsometrie", Stuttgart, Februar (2000)


    70. Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, Regensburg, March (2000) [View PDF (2.3 MB)]


    69. Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2000)


    68. Optische Eigenschaften von GaAs1-xNx (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen
G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March (2000)


    67. Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March (2000)


    66. Phononen in GaN/AlxGa1-xN Übergitterstrukturen
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, Regensburg, March (2000)


    65. Invited Hauptvortrag
Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie

M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2000)


    64. Invited
Generalized Ellipsometry for novel optical materials

M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April (2000)


    63. Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, and J.A. Woollam
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego, U.S.A., April (2000)


    62. Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, and F. Scholz
European MRS Spring Meeting, Strasbourg, France, July (2000)


    61. Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
European MRS Spring Meeting, Strasbourg, France, July (2000)


    60. Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer using generalized ellipsometry
T.E.Tiwald, and M. Schubert
45. Annual SPIE Meeting, San Diego U.S.A., August (2000)


    59. Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C.M. Herzinger
Int. Symposium on Compound Semiconductors, Monterey U.S.A., October (2000)


    58. Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, and J. Sik
Int. Symposium on Compound Semiconductors, Monterey U.S.A., October (2000)


    57. Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, and M. Schubert
MRS 2000 Fall Meeting, Boston U.S.A., November/December (2000) [View PDF (1.6 MB)]


    56. MRS Poster Award Winner
IR-VUV dielectric function of Al1-xInxN determined by spectroscopic ellipsometry

A. Kasic, M. Schubert B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
MRS 2000 Fall Meeting, Boston U.S.A., November/December (2000) [View PDF (936 kB)]


    55. Invited Department Seminar
The light and the lattice

M. Schubert
Physics colloquium, University of Leipzig, (Prof. Grundmann), September (2000)


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1999:

    54. Near-band-gap CuPt order-birefringence in AlxGa1-xInP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1999)


    53. Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry
M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, and F. Scholz
German Physical Society Spring Meeting, Münster, March (1999)


    52. Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie
A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Münster, March (1999)


    51. Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1999) [View PDF (296 kB)]


    50. Optical constants of nearly disordered AlxGa1-xInP2
G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1999) [View PDF (160 kB)]


    49. Bestimmung des Tensors der Dielektrischen Funktion von a-Al2O3 für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie
J.-D. Hecht, M. Schubert, C.M. Herzinger, and J.A. Woollam
German Physical Society Spring Meeting, Münster, March (1999)


    48. Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE
M. Schubert, J.A. Woollam, A. Kasic, B. Rheinländer, J. Off, and F. Scholz
3. Int. Conf. on Nitride Semiconductor Research, Montpellier, France, July (1999)


    47. In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie
J.-D. Hecht, E. Franke, M. Schubert, and H. Neumann
German Physical Society Spring Meeting, Münster, March (1999)


    46. Lattice modes and free-carrier response of AlxGa1-xN and InxGa1-xN heterostructures measured by infrared ellipsometry
M. Schubert, T. E. Tiwald, J.A. Woollam, A. Kasic, J. Off, B. Kuhn, and F. Scholz
MRS Fall Meeting, Boston U.S.A., December (1999) [View PDF (447 kB)]


    45. Maximum direct-gap reduction in CuPt ordered AlxGa1-xInP (0 ... x ... 1) determined by generalized ellipsometry
M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
41. Electronic Materials Conf., Charlottesville U.S.A., June (1999)


    44. In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl
11. Int. Conf. on Thin Films, Cancun, Mexico, August (1999)


    43. Invited
Spectroscopic ellipsometry

J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, and S. Zollner
Centennial Meeting of the American Physical Society, Atlanta U.S.A, April (1999)


    42. Invited Department Seminar
Infrared dielectric anisotropy and phonon modes of sappphire

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), May (1999)


    41. Invited Department Seminar
Spectroscopic ellipsometry for novel optical materials

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), September (1999)


    40. Phonon modes and infrared anisotropy of rutile and sapphire
M. Schubert
L.O.T.-Seminar, Darmstadt, October (1999)


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1998:

    39. Explicit solutions for magneto-optic materials in generalized ellipsometry
M. Schubert, T. E. Tiwald, and J. A. Woollam
German Physical Society Spring Meeting, Regensburg, March (1998)


    38. Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren
A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (1998)


    37. Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and T. Welzel
German Physical Society Spring Meeting, Regensburg, March (1998)


    36. Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March (1998)


    35. Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, and G. Krauss V. Krämer
German Physical Society Spring Meeting, Regensburg, March (1998)


    34. Ordering induced optical properties of AlGaInP alloys
M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
40. Electronic Materials Conf., Charlottesville, U.S.A., June (1998)


    33. Invited Institute Seminar
Spectroscopic ellipsometry on complex optical systems

M. Schubert
MPI for Microstructure Physics, Halle (Prof. Gösele), February (1998)


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1997:

    32. Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
4. c-BN Expertentreffen, Konstanz, Juni (1997)


    31. Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
German Physical Society Spring Meeting, Münster, March (1997)


    30. Direct-gap reduction and valence band splitting of CuPtB-type ordered (AlGa)InP2 studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1997)


    29. Invited
Generalized ellipsometry and complex optical systems

M. Schubert
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai (1997)


    28. Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, and J. Hahn
2. Int. Conf. on Spectroscopic Ellipsometry, Charleston U.S.A., Mai (1997)


    27. Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry
E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, and J. Hahn
Int. Conf. on Metallurgical Coatings and Thin Films, San Diego U.S.A., April (1997)


    26. Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert, and H. Schmidt
Heterostructure Epitaxy and Devices, Smolenice Castle, Slovakia, Oktober (1997)


    25. Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert
University of Leipzig, (Prof. Grill), January (1997)


    24. Invited Industry Seminar
Generalized Ellipsometry on chiral liquid crystals

M. Schubert
ROLIC AG Basel, (Dr. Schadt, Dr. Bennecke), February (1997)


    23. Invited Department Seminar
Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), June (1997)


    22. Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry
M. Schubert
L.O.T., Darmstadt, October (1997)


    21. Invited Colloquium
Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen

M. Schubert
Graduiertenkolleg, University of Chemnitz, (Prof. Richter, Dr. Welzel), December (1997)


    20. Invited Department Seminar
Verallgemeinerte Ellipsometrie an magnetischen Schichten

M. Schubert
University of Leipzig, (Prof. Esquinazi), December (1997)


    19. Invited Institute Colloquium
Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry

M. Schubert
Forschungszentrum Rossendorf, (Prof. Moeller), March (1997)


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1996:

    18. Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, and F. Richter
43. Symp. of the American Vacuum Society, Philadelphia U.S.A., Oktober (1996)


    17. Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, and J.A. Woollam
23. Int. Conf. on the Physics of Semiconductors, Berlin, Juli (1996)


    16. Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
Int. Conf. on Polarimetry and Ellipsometry, SPIE, Warszaw, Poland, Mai (1996)


    15. Invited Hauptvortrag
Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen

M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
German Physical Society Spring Meeting, Regensburg, March (1996)


    14. Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung
H. Schmidt, B. Rheinländer, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (1996)


    13. Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen
B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (1996)


    12. Generalized Ellipsometry and complex optical systems
M. Schubert
L.O.T.-Seminar, Dresden, February (1996)


    11. Invited Department Seminar
Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid

M. Schubert
University of Kassel, (Prof. Kassing), April (1996)


    10. Invited Department Seminar
Atomic order in III-V alloys

M. Schubert
University of Lincoln-Nebraska, (Prof. J.A.Woollam), October (1996)


    9. Invited Department Seminar
Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid

M. Schubert
University of Chemnitz, (Prof. Richter), June (1996)


    8. Invited Department Seminar
Moderne Ellipsometrie an spontan geordnetem AlGaInP

M. Schubert
University of Stuttgart, (Prof. Pilkuhn), June (1996)


    7. Invited Industry Seminar
Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen

M. Schubert
Sentech GmbH, Berlin, March (1996)


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1995:

    6. Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO2mittels generalisierter Rotating-Analyzer-Ellipsometry
M. Schubert, B. Johs, C. M. Herzinger, and J. A. Woollam
German Physical Society Spring Meeting, Berlin, March (1995)


    5. Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie
M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Berlin, March (1995)


    4. Invited Department Seminar
Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium

M. Schubert
Department of Electrical Engineering, University of Lincoln-Nebraska, June (1995)


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1994:

    3. Dark-field spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, and V. Gottschalch
Int. Workshop on Optical Charact. of Electronic Materials, Halle/Saale, Oktober (1994)


    2. Invited Department Seminar
Polarization-dependent parameters of arbitrarily anisotropic epitaxial systems

M. Schubert
Department of Electrical Engineering, University of Nebraska-Lincoln, October (1994)


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1993:

    1. Optical constants of highly excited AlGaAs
B. Rheinländer, M. Schubert, K. Unger, and H. Fieseler
German Physical Society Spring Meeting, Regensburg, March (1993)


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