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2009: |
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285. |
| Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
5th Workshop Ellipsometry, March (2009)
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284. |
| Monoclinic Optical Properties of Slanted Columnar Thin Films
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
5th Workshop Ellipsometry, March (2009)
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283. |
| Talk
Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
ICMCTF 2009, April (2009)
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282. |
| THz Ellipsometry Materials Characterization
T. Hofmann, C.M. Herzinger, and M. Schubert
5th Workshop Ellipsometry, March (2009)
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281. |
| IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam
5th Workshop Ellipsometry, March (2009)
|
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280. |
| Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert
5th Workshop Ellipsometry, March (2009)
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279. |
| Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Graduate Student Poster Session, April (2009)
|
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278. |
| Materials Characterization using THz Ellipsometry.
T. Hofmann, M. Schubert, and C. M. Herzinger
MRS Spring Meeting, April (2009)
|
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277. |
| Hybridized Nanostructures
E. Montgomery, D. Schmidt, E. Schubert, and M. Schubert
E-Week, April (2009)
|
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276. |
| Characterizing AntiReflection Coatings on Textured Mono-Crystalline Silicon with Spectroscopic Ellipsometry
J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam
34th IEEE Photovoltaic Specialists Conference, June (2009)
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275. |
| Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
51st Electronic Materials Conference, June (2009) [View PDF (1.0 MB)]
|
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274. |
| Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films
D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 56th International Symposium, November (2009)
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273. |
| Research Presentation Winner
Optical and Structural Properties of Sculptured Thin Films
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
E-Week, April (2009)
|
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272. |
| Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates
D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
MRS Fall Meeting, November (2009)
|
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271. |
| Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates
D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
AVS 56th International Symposium, November (2009)
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2008: |
|
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|
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270. |
| Magnetism of Undoped and Co-Doped TiO2 Clusters
X. Wei, R. Skomski, M. Schubert, and D. Sellmyer
American Physical Society Meeting, March (2008)
|
|
| |
269. |
| Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
M. Schubert, and T. Hofmann
American Physical Society Meeting, March (2008)
|
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| |
268. |
| Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann
2008 MRS Spring Meeting, March 25 (2008) [View PDF (87 kB)]
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267. |
| THz resonances in chiral aluminum nanowires
T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
2008 MRS Spring Meeting, March (2008)
|
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266. |
| Ferroelectric thin film field-effect transistors based on ZnO/BaTiO3 heterostructures
M. Brandt, H. Frenzel, H. Hochmuth, M. Lorenz, M. Schubert, and M. Grundmann
5th International Workshop on ZnO and related materials, September (2008)
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| |
265. |
| Poster Award Winner
THz Resonances in Chiral Aluminum Nanowires
D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
E-Week Graduate Poster Session, April 25 (2008)
|
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| |
264. |
| Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT
M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert
E-Week Graduate Poster Session, April 25 (2008)
|
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263. |
| Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
E-Week Graduate Poster Session, April 25 (2008)
|
|
| |
262. |
| Epitaxial ferroelectric BTO/ZnO heterostructures
M. Brandt, H. Hochmuth, M. Lorenz, M. Schubert, V. Voora, and M. Grundmann
2nd International Symposium On Transparent Conductive Oxides, October (2008)
|
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| |
261. |
| In-situ monitoring of p- and n-type doping in AlGaInP
C. Krahmer, A. Behres, K. Streubel, and M. Schubert
14th International Conference of Metalorganic Vapor Phase Epitaxy, June (2008)
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260. |
| Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields
M. Schubert, T. Hofmann, C. M. Herzinger
National Synchrotron Light Source User Meeting, May 19 (2008)
|
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| |
259. |
| Spectroscopic ellipsometry characterization of SiNx antireflection films on textured
multicrystalline and monocrystalline silicon solar cells
M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam
17th International Materials Research Conference, August (2008)
|
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| |
258. |
| Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
The 5th International Workshop on ZnO and Related Materials, September (2008)
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257. |
| Talk
Hybrid Nanocoil Sculptured Thin Films
D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert
2008 MRS Fall Meeting, December (2008)
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256. |
| Talk
Sculptured Thin Films from Aluminum
E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
AVS 55th International Symposium, October (2008)
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255. |
| Talk
Magnetically Active Nanospirals
E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
53rd Annual Conference on Magnetism and Magnetic Materials, November (2008)
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254. |
| Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, December (2008)
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253. |
| Magnetically induced optical chirality in ZnMnSe
M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert
53rd Magnetism and Magnetic Materials Conference, November (2008)
|
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| |
252. |
| Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
MRS Fall Meeting, December (2008)
|
|
| |
251. |
| Assessment of the Surface Electron Accumulation Properties of Polar and Non-Polar InN Surfaces
W. J. Schaff, L. C. Chen, Y. Nanishi, and M. Schubert
MRS Fall Meeting, (2008)
|
|
| |
250. |
| Terahertz Ellipsometry Using Electron-Beam Based Sources
T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert
MRS Fall Meeting, (2008)
|
|
| |
249. |
| Terahertz Ellipsometry Materials Characterization
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
ISSSR, (2008)
|
|
| |
248. |
| International Conference on Electronic Materials
V. Darakchieva, T. Hofmann, and M. SChubert
IUMRS-ICEM08, (2008)
|
|
| |
247. |
| Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
T. Hofmann, and M. Schubert
APS Spring Meeting, (2008)
|
|
| |
246. |
| Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
53rd Annual Conference on Magnetism and Magnetic Materials, November (2008)
|
|
| |
245. |
| Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
MRS Fall Meeting, December (2008)
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2007: |
|
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244. |
| Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
243. |
| ICSE4 Poster Award Winner
The optical-Hall effect
T. Hofmann, and M.Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
242. |
| Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters
M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| |
241. |
| Surface electron accumulation and effective mass anisotropy in wurtzite structure InN
T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
240. |
| Terahertz ellipsometry using electron-beam based sources
T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
239. |
| Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
T. Hofmann, C. von Middendorff, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
238. |
| Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach
V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann
71. German Physical Society Spring Meeting, March (2007)
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237. |
| Poster Award Winner
Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P
E. Montgomery, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, October (2007)
|
|
| |
236. |
| Dielectric and magnetic birefringence in Zn1-xMnxSe
M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, October (2007)
|
|
| |
235. |
| THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters
M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
TMS 2007 Electronic Materials Conference, June (2007)
|
|
| |
234. |
| Polaron-phonon interaction in charge intercalated tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
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| |
233. |
| Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and non-chiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, June (2007)
|
|
| |
232. |
| Generalized Mueller matrix Ellipsometry of 3-D spherical photonic bandgap structures
H. Wang, D. Schmidt, M. Saenger, M. Schubert, and Y.F. Lu
4th International Conference on Spectroscopic Ellipsometry, June (2007)
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|
| |
231. |
| Invited
Terahertz magnetooptic ellipsometry
T. Hofmann
4th International Conference on Spectroscopic Ellipsometry, March (2007)
|
|
| |
230. |
| The optical-Hall effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert
Electronic Materials Conference, June (2007)
|
|
| |
229. |
| Polaron and phonon properties in WO3 thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
71. German Physical Society Spring Meeting, March (2007)
|
|
| |
228. |
| Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry
M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth,
M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, March (2007)
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|
| |
227. |
| Phonon and polaron properties of charge intercalated WO3
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
International Workshop on Synthesis of Functional Oxide Materials, August (2007)
|
|
| |
226. |
| Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
International Workshop on Synthesis of Functional Oxide Materials, August (2007)
|
|
| |
225. |
| Angle-resolved Generalized Ellipsometry: Form-birefringent chiral and achiral silicon sculptured thin films
D. Schmidt, E. Schubert, and M. Schubert
54th Midwest Solid State Conference, October (2007)
|
|
| |
224. |
| Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates
L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou
71. German Physical Society Spring Meeting, March (2007)
|
|
| |
223. |
| Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Electronic Materials Conference, June (2007)
|
|
| |
222. |
| Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy
V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert
2007 E-MRS Spring Meeting, May (2007)
|
|
| |
221. |
| Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN:
Evidence for a New Defect-Related Doping Mechanism
T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert
7th Int'l Conference of Nitride Semiconductors, September (2007)
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2006: |
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|
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| |
220. |
| Anisotropy of the &Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
70. German Physical Society Spring Meeting, March (2006)
|
|
| |
219. |
| Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert
70. German Physical Society Spring Meeting, March (2006)
|
|
| |
218. |
| Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert
Electronic Materials Conference, June (2006)
|
|
| |
217. |
| Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry
T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert
Electronic Materials Conference, June (2006)
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|
| |
216. |
| Conduction band effective mass anisotropy and nonparabolicity of InN
V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar
3. Workshop on Indium Nitride, November (2006)
|
|
| |
215. |
| Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Photonics West 2006, January (2006)
|
|
| |
214. |
| Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Photonics West 2006, January (2006)
|
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| |
213. |
| Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
4. Workshop "Ellipsometrie", February (2006)
|
|
| |
212. |
| Infrared optical properties of ternary MgxZn1xO: Phonons, dielectric constants, and effective mass parameters
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
4. Workshop "Ellipsometrie", February (2006)
|
|
| |
211. |
| Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann
Electronic Materials Conference, June (2006)
|
|
| |
210. |
| Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Spring MRS Meeting Symposium K: Materials Research for THz Applications, April (2006)
|
|
| |
209. |
| Phonon Modes, Dielectric Constants, and Exciton Mass Parameters in Ternary MgxZn1-xO
C. Bundesmann, R. Schmidt-Grund, D. Spemann, M. Lorenz, M. Grundmann, and M. Schubert
Spring MRS Meeting Symposium GG: Current and Future Trends of Functional Oxide Films, April (2006)
|
|
| |
208. |
| Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert
4. Workshop "Ellipsometrie", February (2006)
|
|
| |
207. |
| Temperature-dependent band-gap and excitonic properties of ZnO
R. Schmidt-Grund, N. Ashkenov, M. Schubert, W. Czakai, D. Faltermeier, G. Benndorf, H. Hochmuth, M. Lorenz, B. Gompf, and and M. Grundmann
4. Workshop "Ellipsometrie", February (2006)
|
|
| |
206. |
| Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
German Physical Society Spring Meeting, March (2006)
|
|
| |
205. |
| Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
German Physical Society Spring Meeting, March (2006)
|
|
| |
204. |
| Optical properties of colored tungsten oxide sputtered thin films
M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert
4th Ellipsometry Workshop, February (2006)
|
|
| |
203. |
| Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert
28th International Conference on the Physics of Semiconductors, July 24-28 (2006)
|
|
| |
202. |
| Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert
ICPS, July (2006)
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2005: |
|
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| |
201. |
| Polarization-dependent optical transitions at the fundamental band gap and higher critical points of wurtzite ZnO in Proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices, 2005. NUSOD '05.
D. Fritsch, R. Schmidt-Grund, H. Schmidt, C. M. Herzinger, and M. Grundmann
IEEE, September (2005)
|
|
| |
200. |
| Phonons in doped ZnO and ZnO based thin films grown by PLD on sapphire
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, M. Lorenz, and M. Grundmann
G/PII.25 E-MRS 2005 Spring Meeting, May/June (2005)
|
|
| |
199. |
| Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
A. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, March (2005)
|
|
| |
198. |
| Exchange polarization coupling in wurtzite-perovskite interfaces: New concepts for electronic device heterostructures
N. Ashkenov, M. Schubert, H. v. Wenckstern, H. Hochmuth, M. Lorenz, and M. Grundmann
Workshop on Oxides at the nanoscale, November (2005)
|
|
| |
197. |
| In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy
C. Krahmer, M. Phillipens, R. Butendeich, M. Schubert, and K. Streubel
32nd International Symposium of Compound Semiconductors, September (2005)
|
|
| |
196. |
| Bending in HVPE GaN free-standing films: effects of laser lift-off, polishing and high temperature annealing
T. Paskova, P.P. Paskov, V. Darakchieva, B. Monemar, T. Suski, M. Bockowski, N. Ashkenov, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, August (2005)
|
|
| |
195. |
| Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
V. Darakchieva, T. Paskova, P.P. Paskov, H. Arwin, M. Schubert, B. Monemar, S.Figge, D. Hommel, B.A. Haskell, P.T. Fini, and S. Nakamura
6. Int. Conf. on Nitride Semiconductor Research, August (2005)
|
|
| |
194. |
| Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, August (2005)
|
|
| |
193. |
| Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, and U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, June (2005)
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192. |
| The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, June (2005)
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191. |
| Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, and et al.
Advanced Process Control for future oriented manufacturing Workshop, September (2005)
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190. |
| Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert et al.
E-MRS 2005 Spring Meeting Symposium Optical and X-ray Metrology for Advanced Device Materials Characterization II, May/June (2005)
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189. |
| Moderne in-situ und in-line Verfahren für die optische Dünnschichtcharakterisierung: Aktuelle Beispiele aus Forschung und Industrie
M. Schubert
XII. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, March (2005)
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188. |
| Temperature-dependency of the fundamental band-gap properties of (0001)ZnO thin films
N. Ashkenov, R. Schmidt-Grund, D. Fritsch, W. Czakai, M. Schubert, H. Hochmuth, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, March (2005)
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187. |
| Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert
69. German Physical Society Spring Meeting, March (2005)
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186. |
| Brechungsindex von kubischem MgxZn1-xO
Anke Carstens, R. Schmidt-Grund, B. Rheinländer, M. Schubert, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
69. German Physical Society Spring Meeting, March (2005)
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185. |
| Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert
69. German Physical Society Spring Meeting, March (2005)
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184. |
| Long-wavelength bound and unbound charge excitations in doped ZnO and ZnO based alloy thin films
C. Bundesmann, M. Schubert, D. Spemann, H. v. Wenckstern, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and and M. Grundmann
69. German Physical Society Spring Meeting, March (2005)
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183. |
| Optical phonons and infrared dielectric functions of hexagonal and cubic MgZnO thin films
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, E. M. Kaidashev, M. Lorenz, and M. Grundmann
69. German Physical Society Spring Meeting, March (2005)
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182. |
| Asymmetric ferroelectric polarization loops and offset in Pt-ZnO-BaTiO3-Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, N. Barapatre, H. v. Wenckstern, H. Hochmuth, M. Lorenz, W. Grill, and M. Grundmann
69. German Physical Society Spring Meeting, March (2005)
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181. |
| Nickelsegregation nach Sauerstoff-Ionenimplantation in NiTi
M. Kitzing, J. W. Gerlach, M. Schubert, W. Assmann, S. Mandl, and B. Rauschenbach
69. German Physical Society Spring Meeting, March (2005)
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180. |
| Manufacturing of a LIGA cuvette for in-situ observation of electroplating
D. Schmidt, O. Wilhelmi, S. P. Heussler, M. Saumer, and H. O. Moser
High Aspect Ratio Micro Structure Technology Workshop (HARMST), June (2005)
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179. |
| Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen
C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert
TCOs für Dünnschichtsolarzellen und andere Anwendungen, April (2005)
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178. |
| Light and Matter: Advanced polarization spectroscopy in functional materials physics
M. Schubert
Institute colloquium, Universite Pierre et Marie Curie Paris, February 03 (2005)
|
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177. |
| Optical Spectroscopy: old spectacles for new materials and physics
M. Schubert
Laytec GmbH, February 11 (2005)
|
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176. |
| Advanced polarization spectroscopy in functional materials physics
M. Schubert
University Hamburg, April 18 (2005)
|
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175. |
| Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert
BESSY Berlin, April 21 (2005)
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2004: |
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174. |
| Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (2004)
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173. |
| CuInSe2 flexible solar cell surface-heat-emittance optimization for infrared radiation
C. Bundesmann, F. Dürr, M. Schubert, and K. Otte
German Physical Society Spring Meeting, March (2004)
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172. |
| Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
XI. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, March (2004)
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171. |
| Optische dielektrische Funktionen im Photonenenergiebereich (0.4 - 9,5) eV von (1120) ZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, March (2004)
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170. |
| Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen
M. Schubert, and T. Hofmann
3. Workshop "Ellipsometrie", February (2004)
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169. |
| In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
C. Bundesmann, M. Schubert, N. Ashkenov, G. Lippold, M. Lorenz, M. Grundmann, E. Schubert, and H. Neumann
3. Workshop "Ellipsometrie", February (2004)
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168. |
| Optische dielektrische Funktionen im Energiebereich (4.0 – 9.5) eV MgZnO untersucht mittels generalisierter spektroskopischer Ellipsometrie
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. Workshop "Ellipsometrie", February (2004)
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167. |
| Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
3. Workshop "Ellipsometrie", February (2004)
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166. |
| Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (2004)
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165. |
| Temperature-dependent band-gap energies and optical constants of ZnO
N. Ashkenov, M. Schubert, W. Chakai, G. Benndorf, H. Hochmuth, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, March (2004)
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164. |
| Real-time spectroscopic ellipsometry monitoring of a ZnO thin film pulsed laser deposition growth
N. Ashkenov, M. Schubert, H. Hochmuth, M. Lorenz, M. Grundmann, and B. Johs
German Physical Society Spring Meeting, March (2004)
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163. |
| Optische Charakterisierung von ZnO:P- und ZnO:Li,N-Dünnfilmen
S. Heitsch, C. Bundesmann, E. M. Kaidashev, H. v. Wenckstern, D. Spemann, M. Schubert, G. Benndorf, M. Lorenz, and M. Grundmann
German Physical Society Spring Meeting, March (2004)
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162. |
| Eigenschaften von Li- Sb- und P dotierten ZnO Dünnfilmen
H. v. Wenckstern, C. Bundesmann, S. Heitsch, G. Benndorf, D. Spemann, E. M. Kaidashev, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, March (2004)
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161. |
| Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
German Physical Society Spring Meeting, March (2004)
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160. |
| Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
German Physical Society Spring Meeting, March (2004)
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159. |
| Infrared and VIS/UV optical properties of GaN/AlN superlattices grown on Si substrates
A. Kasic, B. Monemar, M. Schubert, A. Dadgar, F. Schulze, and A. Krost
German Physical Society Spring Meeting, March (2004)
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158. |
| Characterization of crack-free and relaxed bulk-like GaN growth on 2" sapphire
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, C. Bundesmann, M. Schubert, and M. Heuken
German Physical Society Spring Meeting, March (2004)
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157. |
| Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
Swedish Optical Society, November (2004)
|
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156. |
| Electrical and electro-optical properties of BaTiO3-ZnO thin film heterostructures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, and M. Grundmann
Int. Workshop on Oxide Electronics WOE-11, Japan, October (2004)
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155. |
| Phonon modes in strained AlN/GaN and AlGaN/GaN superlattices: effects of period and composition
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Einfeldt, D. Hommel, H. Amano, and I. Akasaki
Int. Workshop on Nitride Semiconductors IWN 2004, July (2004)
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154. |
| Phonon deformation potentials in hexagonal InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, C. Bundesmann, M. Schubert, H. Lu, W. J. Schaff, and and B. Monemar
Int. Workshop on Nitride Semiconductors IWN 2004, July (2004)
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153. |
| The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, and C. v. Middendorf
27th International Conference on the Physics of Semiconductors, July (2004)
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152. |
| Polarization-coupling in wurtzite-perovskite (ZnO-BaTiO3-ZnO) heterostructures
M. Schubert, C. Bundesmann, N. Ashkenov, B. N. Mbenkum, M. Lorenz, H. Hochmuth, and M. Grundmann
27th International Conference on the Physics of Semiconductors, July (2004)
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151. |
| Combined In-situ Raman scattering spectroscopy and in-situ ellipsometry monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, and M. Grundmann
27th International Conference on the Physics of Semiconductors, July (2004)
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150. |
| Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures
M. Schubert, and T. Hofmann
International Conference on Low Energy Electrodynamics of Solids LEES 04, July (2004)
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149. |
| Infrared ellipsometry and Raman studies of hexagonal InN films: Correlation between strain and vibrational properties
V. Darakchieva, E. Valcheva, P.P. Paskov, T. Paskova, B. Monemar, M. Abrashev, M. Schubert, H. Lu, and W.J. Shaff
E-MRS 2004, May (2004)
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148. |
| In-situ-Charakterisierung: Ellipsometrie und Ramanstreuung
M. Schubert
Transparent Conducting Oxide (TCO) Workshop, March (2004)
|
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147. |
| HVPE-grown free-standing GaN of high structural and optical quality
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Monemar, F. Tuomisto, K. Saarinen, B. Petz, L. Dobos, C. Bundesmann, M. Schubert, C. R. Miskys, M. Stutzmann, and M. Heuken
ISBLLED-2004 Gyeongju, March (2004)
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146. |
| In situ Prozessanalytik mit Hilfe der Ramanstreuung und der spektroskopischen Ellipsometrie
M. Schubert, N. Ashkenov, C. Bundesmann, M. Lorenz, M. Grundmann, E. Schubert, H. Neumann, B. Rauschenbach, A. Braun, G. Lippold, and
German Physical Society Spring Meeting, March (2004)
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145. |
| Optische Analytikverfahren für die Dünnschichtcharakterisierung
M. Schubert
OSRAM-OPTO Semiconductors GmbH, March (2004)
|
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144. |
| In-situ process monitoring with spectroscopic ellipsometry and Raman scattering
M. Schubert
Institute colloquium, Technical University Magdeburg, May (2004)
|
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143. |
| Advanced polarization spectroscopy in functional materials physics
M. Schubert
Colorado State University, Fort Collins, May (2004)
|
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142. |
| Spectroscopic ellipsometry and Raman scattering in basic materials research and industrial applications
M. Schubert
University Tübingen, November 17 (2004)
|
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141. |
| Spectroscopic ellipsometry and Raman scattering: In situ and in line tools for process control
M. Schubert
ZSW Stuttgart, December 2 (2004)
|
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140. |
| Spectroscopic ellipsometry: From basic materials research to industrial applications
M. Schubert
University Stuttgart, November 30 (2004)
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2003: |
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139. |
| Si- and Zn-doping of InGaNAs and BInGaAs using MOVPE
G. Leibiger, C. Krahmer, V. Gottschalch, G. Benndorf, and V. Riede
Proceedings of the EW-MOVPE X, June (2003)
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138. |
| Optische Übergänge und Brechungsindices von MgZnO
R. Schmidt, B. Rheinländer, M. Schubert, E. M. Kaidashev, M. Lorenz, D. Spemann, G. Wagner, A. Rahm, C. M. Herzinger, and M. Grundmann
German Physical Society Spring Meeting, March (2003)
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137. |
| Molekularstrahlepitaxie, Charakterisierung und Kopositionseichung von ZnMnSe Schichten
B. Daniel, J. Kvietkova, M. Hetterich, H. Priller, J. Lupaca-Schomber, C. Klingshirn, M. Schubert, N. Ashkenov, P. Pfundstein, D. Gerthsen, and K. Eichhorn
German Physical Society Spring Meeting, March (2003)
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136. |
| Phonons, band gap and higher interband transitions of hexagonal InGaN
A. Kasic, M. Schubert, J. Off, F. Scholz, M. R. Correia, S. Pereira, Y. Saito, M. Kurouchi, and Y. Nanishi
German Physical Society Spring Meeting, March (2003)
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135. |
| Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka
German Physical Society Spring Meeting, March (2003)
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134. |
| Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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133. |
| Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, and M. Schubert
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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132. |
| Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, and O. Inganäs
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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131. |
| Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, and V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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130. |
| Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, and H. Arwin
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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129. |
| Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, and K. Järrendahl
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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128. |
| Generalized infrared ellipsometry study of thin epitaxial AlN layers with a complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, T. Paskova, A. Kasic, S. Tungasmita, and and B. Monemar
ICDS, (2003)
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127. |
| Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films
M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann
Optical System Design 2003, September (2003)
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126. |
| The influence of composition and strain on phonon modes and band-to-band transitions in hexagonal InGaN
A. Kasic, M. Schubert, Y. Saito, M. Kurouchi, Y. Nanishi, J. Off, F. Scholz, M. R. Correia, S. Pereira, and B. Monear
5. Int. Conf. on Nitride Semiconductor Research, July (2003)
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125. |
| Generalized magneto-optic ellipsometry
M. Schubert, T. Hofmann, and C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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124. |
| High temperature optical constants and band gap energies of ZnO
N. Ashkenov, C. Bundesmann, R. Schmidt-Grund, M. Schubert, M. Lorenz, H. Hochmut, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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123. |
| Infrared ellipsometry - a novel characterization method for group-III nitride device heterostructures
A. Kasic, M. Schubert, and B. Monemar
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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122. |
| Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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121. |
| Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and and D. Gerthsen
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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120. |
| UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, and M. Grundmann
3. International Conference on Spectroscopic Ellipsometry, July (2003)
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119. |
| Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner
10th International Workshop on Oxide Electronics, September 11-13 (2003)
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118. |
| Principles and Application of Generalized Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February (2003)
|
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| |
117. |
| Principles and Application of Infrared Spectroscopic Ellipsometry
M. Schubert
Applied Optics Lecture, Linköping University, February (2003)
|
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116. |
| Ellipsometrie und Raman an ZnO Dünnschichten
C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert
NFP Seminar, University Leipzig, April (2003)
|
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115. |
| Ellipsometry in functional materials physics
M. Schubert
von Ardenne Anlagenbau GmbH, November (2003)
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2002: |
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114. |
| Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und
ZnO-GaO-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, E.M. Kaidashev, B.Rheinländer, M.Lorenz, H. v. Wenkstern, A. Kasic, M.Schubert, and M.Grundmann
German Physical Society Spring Meeting, March (2002) [View PDF (625 kB)]
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113. |
| Properties of pulsed-laser-deposited Zn1-x(Al Ga and Mg and Cd)xO compound thin films
C. Bundesmann, N. Ashkenov, A. Kasic, V. Riede, M. Schubert, E. M. Kaidashev, M. Lorenz, R. Schmidt, B. Rheinländer, J. Lenzner, H. v. Wenckstern, and M. Grundmann
German Physical Society Spring Meeting, March (2002)
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112. |
| Phonon-modes and free-carrier-properties of Al- and Ga-doped ZnO and (ZnCdMg)O thin films
N. Ashkenov, C. Bundesmann, A. Kasic, B. N. Mbenkum, M. Schubert, M. Lorenz, E. M. Kaidashev, and M. Grundmann
German Physical Society Spring Meeting, March (2002)
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111. |
| Kritische Punkte und Phononen in BxGa1-xAs und GaNyAs1-y: Ein Vergleich
G. Leibiger, V. Gottschalch, M. Schubert, and V. Riede
German Physical Society Spring Meeting, March (2002) [View PDF (282 kB)]
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110. |
| Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (2002) [View PDF (628 kB)]
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109. |
| Dielektrische Funktion im Bereich der Absorptionskante von ZnO und ZnO-MgO- und ZnO-Ga2O3-Mischkristallen untersucht mittels spektroskopischer Ellipsometrie
R. Schmidt, C. Bundesmann, A. Kasic, E. M. Kaidashev, B. Rheinländer, M. Lorenz, M. Schubert, and M. Grundmann
German Physical Society Spring Meeting, March (2002)
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108. |
| Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, and C. M. Herzinger
German Physical Society Spring Meeting, March (2002)
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107. |
| Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures
M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann
2. Workshop "Ellipsometrie", Februar (2002)
|
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106. |
| IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann
2. Workshop "Ellipsometrie", Februar (2002)
|
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| |
105. |
| Towards a better understanding of in-situ reflectance transients during MOVPE growth of group-III Nitrides
T. Böttcher, S. Figge, S. Einfeldt, D. Hommel, A. Kasic, and M. Schubert
11th International Conference on Metal-Organic Vapour Phase Epitaxy, June (2002)
|
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104. |
| Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam
47. Annual SPIE Meeting, July (2002)
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103. |
| Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
47. Annual SPIE Meeting, July (2002)
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102. |
| Generalized ellipsometry of complex mediums in layered systems
M. Schubert
47. Annual SPIE Meeting, July (2002)
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101. |
| Optical phonons in AlxInyGa1-x-yN films
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, F. Scholz, A. P. Lima, O. Ambacher, and M. Stutzmann
International Workshop on Nitride Semiconductors (IWN 2002), July (2002) [View PDF (449 kB)]
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100. |
| Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann
26. International Conference on the Physics of Semiconductors, July (2002)
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99. |
| Critical points and phonons in BxGa1-xAs and GaNyAs1-y: a comparison
G. Leibiger, V. Gottschalch, V. Riede, A. Kasic, and M. Schubert
International Workshop on Nitride Semiconductors (IWN 2002), July (2002)
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98. |
| Critical points and phonons in (B,Ga)(N,As)
G. Leibiger, V. Gottschalch, G. Benndorf, V. Riede, and M. Schubert
Physics and Technology of Dilute Nitrides for Optical Communications, September (2002)
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97. |
| Electrical properties of ZnO:(Ga,Al,Cd) thin films on c- and r-plane sapphire substrates and of ZnO single crystals
H. von Wenckstern, R. Pickenhain, G. Biehne, M. Lorenz, E. M. Kaidashev, C. Bundesmann, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, October (2002)
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96. |
| Structural, optical, and electrical properties of epitaxial (Mg,Cd)ZnO, ZnO, and ZnO:(Ga,Al) thin films on sapphire grown by pulsed laser deposition
M. Lorenz, E. M. Kaidashev, H. von Wenckstern, V. Riede, C. Bundesmann, D. Spemann, G. Benndorf, H. Hochmuth, A. Rahm, H.-C. Semmelhack, M. Schubert, and M. Grundmann
2002 MRS Workshop Series: 2nd International Workshop on Zinc Oxide, October (2002)
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95. |
| Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, and M. Schubert
Materials Research Society Fall Meeting, Dezember (2002)
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94. |
| Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
Materials Research Society Fall Meeting, Dezember (2002)
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93. |
| Phonons, excitons, band-to-band transitions and optical constants of MgZnO
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, G. Wagner, H.v. Wenckstern, M. Grundmann, and C. M. Herzinger
Materials Research Society Fall Meeting, Dezember (2002)
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92. |
| Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger
L.O.T.-Seminar, October (2002)
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2001: |
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91. |
| Optical properties of AlxIn1-xN thin films determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
2000 IEEE 27th Int. Symp. on Compound Semiconductors, (2001)
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90. |
| Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Šik, and M. Schubert
2000 IEEE 27th Int. Symp. on Compound Semiconductors, (2001)
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89. |
| Ellipsometrie und optische Konstanten von SiNx und SiOy für Bragg-Reflektoren
R.Schmidt, D.Pudis, B.Rheinländer , V.Riede, S.Hardt, V.Gottschalch, and J.Kvietková
German Physical Society Spring Meeting, March (2001) [View PDF (444 kB)]
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88. |
| Ellipsometrische Untersuchungen von Gitterschwingungen und Bandlückenenergien kubischer AlxGa1-xN-Filme
A. Kasic, M. Schubert, and D. J. As
German Physical Society Spring Meeting, March (2001) [View PDF (584 kB)]
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87. |
| Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
German Physical Society Spring Meeting, March (2001)
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86. |
| Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie
T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch
German Physical Society Spring Meeting, March (2001) [View PDF (640 kB)]
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85. |
| Optische Konstanten, Phononen-Eigenschaften und Zusammensetzung von InGaAsN Einzelschichten
G. Leibiger, M. Schubert, and V. Gottschalch
German Physical Society Spring Meeting, March (2001) [View PDF (910 kB)]
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84. |
| Verallgemeinerte Infrarot-Ellipsometrie - eine neue Charakterisierungsmethode für Halbleiter-Heterostrukturen
A. Kasic, and M. Schubert
German Physical Society Spring Meeting, March (2001)
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83. |
| Ellipsometry on anisotropic materials- treatment of surface and interface layers
M. Schubert
256. Heraeus Seminar, Optical Spectrocopy at Interfaces (OSI), May (2001)
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82. |
| Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, J. Off, and F. Scholz
Spring European MRS-Meeting, June (2001)
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81. |
| All-solid state electrochromic multiplayer systems for surface heat radiation control
E. Franke, M. Schubert, C. L. Trimble, and J. A. Woollam
Spring European MRS-Meeting, June (2001) [View PDF (247 kB)]
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80. |
| Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
Spring European MRS-Meeting, June (2001)
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79. |
| Optical properties of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, July (2001) [View PDF (910 kB)]
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78. |
| Generalized Infrared Ellipsometry- A novel tool for characterization of group -III-Nitride Heterostructrues for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, and J. A. Woollam
4. Int. Conf. on Nitride Semiconductor Research, July (2001)
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77. |
| Composition determination of InGaAsN using x-ray diffraction and far-infrared ellipsometry
G. Leibiger, V. Gottschalch, and M. Schubert
4. Int. Conf. on Nitride Semiconductor Research, July (2001) [View PDF (625 kB)]
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76. |
| Spectroscopic Ellipsometry from 2 mm to 50 mm for nondestructive characterization of free-carrier and crystal-structure properties of III-V semiconductor device heterostructures
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, J. Off, F. Schloz, B. Kuhn, D. J. As, J. A. Woollam, and C. M. Herzinger
46. Annual SPIE Meeting, August (2001)
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75. |
| Characterization of III-Nitride optoelectronic-device heterostructures using infrared ellipsometry
M. Schubert, and A. Kasic
1. Int.Conference on Advanced Vibrational Spectroscopy, August (2001) [View PDF (129 kB)]
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74. |
| The light and the lattice
M. Schubert
Technical University Berlin, September (2001)
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2000: |
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73. |
| IR-Ellipsometrie an Gruppe III - Nitrid - Verbindungen zur Bestimmung der Eigenschaften freier Ladungsträger sowie der optischen Gitterabsorptionen
A. Kasic, M. Schubert, B. Rheinländer, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
1. Workshop "Ellipsometrie", Februar (2000)
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72. |
| Ellipsometry of anisotropic materials
M. Schubert
1. Workshop "Ellipsometrie", Februar (2000)
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71. |
| Optische Eigenschaften von GaNyAs1-y (0 ... y ... 0.37) Einzelschichten und Übergitterstrukturen
G. Leibiger, M. Schubert, B. Rheinländer, and V. Gottschalch
1. Workshop "Ellipsometrie", Februar (2000)
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70. |
| Bestimmung von freien Ladungsträger-Parametern und Phononen-Eigenschaften dünner a-GaN-Filme mittels IR-Ellipsometrie
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, March (2000) [View PDF (2.3 MB)]
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69. |
| Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, and M. Schubert
German Physical Society Spring Meeting, March (2000)
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68. |
| Optische Eigenschaften von GaAs1-xNx (0 ... x ... 0.33) Einzelschichten und Übergitterstrukturen
G. Leibiger, J. Sik, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, March (2000)
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67. |
| Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, March (2000)
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66. |
| Phononen in GaN/AlxGa1-xN Übergitterstrukturen
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
German Physical Society Spring Meeting, March (2000)
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65. |
| Untersuchung optischer Eigenschaften von Halbleiterschichten mittels Verallgemeinerter Infrarot Ellipsometrie
M. Schubert
German Physical Society Spring Meeting, March (2000)
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64. |
| Generalized Ellipsometry for novel optical materials
M. Schubert
Int. Conf. on Metallurgical Coatings and Thin Films, April (2000)
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63. |
| Optical properties of amorphous tantalum oxide thin films from 0.01 eV to 8.5 eV
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, F. Frost, and J.A. Woollam
Int. Conf. on Metallurgical Coatings and Thin Films, April (2000)
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62. |
| Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Šik, S. Einfeldt, D. Hommel, V. Härle, J. Off, and F. Scholz
European MRS Spring Meeting, July (2000)
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61. |
| Effective carrier mass and mobility versus carrier concentration in p- and n-type hexagonal GaN determined by infrared ellipsometry and Hall resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, and F. Scholz
European MRS Spring Meeting, July (2000)
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60. |
| Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer using generalized ellipsometry
T.E.Tiwald, and M. Schubert
45. Annual SPIE Meeting, August (2000)
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59. |
| Optical properties of Al1-xInxN thin films determined by Spectroscopic Ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, and C.M. Herzinger
Int. Symposium on Compound Semiconductors, October (2000)
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58. |
| Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, and J. Sik
Int. Symposium on Compound Semiconductors, October (2000)
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57. |
| Optical properties of GaAsN single layers and GaAsN/InAs/GaAs superlattices studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, J. Sik, and M. Schubert
MRS 2000 Fall Meeting, November/December (2000) [View PDF (1.6 MB)]
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56. |
| MRS Poster Award Winner
IR-VUV dielectric function of Al1-xInxN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert B. Rheinländer, J. Off, F. Scholz, and C. M. Herzinger
MRS 2000 Fall Meeting, November/December (2000) [View PDF (936 kB)]
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55. |
| The light and the lattice
M. Schubert
Physics colloquium, University of Leipzig, September (2000)
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1999: |
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54. |
| Near-band-gap CuPt order-birefringence in AlxGa1-xInP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, March (1999)
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53. |
| Characterization of free-carrier and crystal structure properties of group III-Nitride heterostructures by generalized infrared ellipsometry
M. Schubert, B. Rheinländer, C.M. Herzinger, J.Off, and F. Scholz
German Physical Society Spring Meeting, March (1999)
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52. |
| Dielektrische Funktion für den Quantum-Confined Stark-Effekt eines AlGaAs/GaAs-Mikroresonators gewonnen mittels spektroskopischer Ellipsometrie
A. Singer, S. Nassauer, J. Borgulova, B. Rheinländer, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (1999)
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51. |
| Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, March (1999) [View PDF (296 kB)]
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50. |
| Optical constants of nearly disordered AlxGa1-xInP2
G. Leibiger, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, March (1999) [View PDF (160 kB)]
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49. |
| Bestimmung des Tensors der Dielektrischen Funktion von a-Al2O3 für l = 30mm ... 0.27mm mittels Verallgemeinerter Ellipsometrie
J.-D. Hecht, M. Schubert, C.M. Herzinger, and J.A. Woollam
German Physical Society Spring Meeting, March (1999)
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48. |
| Free-carrier and crystal structure properties of group III-nitride heterostructures by IR-SE
M. Schubert, J.A. Woollam, A. Kasic, B. Rheinländer, J. Off, and F. Scholz
3. Int. Conf. on Nitride Semiconductor Research, July (1999)
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47. |
| In-situ Kontrolle der ionengestützten BN-Dünnschichtabscheidung mittels VIS-Ellipsometrie
J.-D. Hecht, E. Franke, M. Schubert, and H. Neumann
German Physical Society Spring Meeting, March (1999)
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46. |
| Lattice modes and free-carrier response of AlxGa1-xN and InxGa1-xN heterostructures measured by infrared ellipsometry
M. Schubert, T. E. Tiwald, J.A. Woollam, A. Kasic, J. Off, B. Kuhn, and F. Scholz
MRS Fall Meeting, December (1999) [View PDF (447 kB)]
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45. |
| Maximum direct-gap reduction in CuPt ordered AlxGa1-xInP (0 ... x ... 1) determined by generalized ellipsometry
M. Schubert, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
41. Electronic Materials Conf., June (1999)
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44. |
| In-situ ellipsometry growth investigation of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J.A. Woollam, J.-D. Hecht, G. Wagner, H. Neumann, and F. Bigl
11. Int. Conf. on Thin Films, August (1999)
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43. |
| Spectroscopic ellipsometry
J.A. Woollam, X. Gao, M. Schubert, T.E. Tiwald, J. Hilfiker, B. Johs, C.M. Herzinger, and S. Zollner
Centennial Meeting of the American Physical Society, April (1999)
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42. |
| Infrared dielectric anisotropy and phonon modes of sappphire
M. Schubert
University of Lincoln-Nebraska, May (1999)
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41. |
| Spectroscopic ellipsometry for novel optical materials
M. Schubert
University of Lincoln-Nebraska, September (1999)
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40. |
| Phonon modes and infrared anisotropy of rutile and sapphire
M. Schubert
L.O.T.-Seminar, October (1999)
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1998: |
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39. |
| Explicit solutions for magneto-optic materials in generalized ellipsometry
M. Schubert, T. E. Tiwald, and J. A. Woollam
German Physical Society Spring Meeting, March (1998)
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38. |
| Optische Polarisationsspektroskopie des anomalen quantum-confined Stark-Effektes in AlGaAs/GaAs-Mikroresonatoren
A. Singer, J. Borgulová, M. Gasovic, B. Rheinländer, J. Kovác, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (1998)
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37. |
| Reversible moisture absorption in mixed-phase boron nitride thin films by spectroscopic ellipsometry
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, and T. Welzel
German Physical Society Spring Meeting, March (1998)
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36. |
| Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
German Physical Society Spring Meeting, March (1998)
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35. |
| Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, M. Schubert, A. Eifler, V. Riede, and G. Krauss V. Krämer
German Physical Society Spring Meeting, March (1998)
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34. |
| Ordering induced optical properties of AlGaInP alloys
M. Schubert, H. Schmidt, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
40. Electronic Materials Conf., June (1998)
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33. |
| Spectroscopic ellipsometry on complex optical systems
M. Schubert
MPI for Microstructure Physics, February (1998)
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1997: |
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32. |
| Phasen und Strukturanalyse von kubischen und hexagonalen Bornitrid-Dünnschichtsystemen mittels Spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
4. c-BN Expertentreffen, Juni (1997)
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31. |
| Phasen- und Strukturanalyse von kubischem und hexagonalem Bornitrid-Dünnschichtsystemen mittels spektroskopischer Ellipsometrie im Sichtbaren und fernen Infrarot
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter
German Physical Society Spring Meeting, March (1997)
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30. |
| Direct-gap reduction and valence band splitting of CuPtB-type ordered (AlGa)InP2 studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, March (1997)
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29. |
| Generalized ellipsometry and complex optical systems
M. Schubert
2. Int. Conf. on Spectroscopic Ellipsometry, Mai (1997)
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28. |
| Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T.E. Tiwald, D.W. Thompson, J.A. Woollam, and J. Hahn
2. Int. Conf. on Spectroscopic Ellipsometry, Mai (1997)
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27. |
| Phase and microstructure investigations of boron nitride thin films by infrared ellipsometry
E. Franke, H. Neumann, M. Schubert, B. Rheinländer, T. E. Tiwald, J. A. Woollam, and J. Hahn
Int. Conf. on Metallurgical Coatings and Thin Films, April (1997)
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26. |
| Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert, and H. Schmidt
Heterostructure Epitaxy and Devices, Oktober (1997)
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25. |
| Infrared optical properties of hexagonal and cubic boron nitride thin films studied by spectroscopic ellipsometry
M. Schubert
University of Leipzig, January (1997)
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24. |
| Generalized Ellipsometry on chiral liquid crystals
M. Schubert
ROLIC AG Basel, February (1997)
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23. |
| Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
M. Schubert
University of Lincoln-Nebraska, June (1997)
|
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22. |
| Characterization of mixed-phase boron nitride thin films by spectroscopic ellipsometry
M. Schubert
L.O.T., October (1997)
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21. |
| Verallgemeinerte Ellipsometrie an optisch komplexen Dünnschicht-Systemen
M. Schubert
Graduiertenkolleg, University of Chemnitz, December (1997)
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20. |
| Verallgemeinerte Ellipsometrie an magnetischen Schichten
M. Schubert
University of Leipzig, December (1997)
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19. |
| Infrared optical properties of polymorph-polycrystalline III-nitride thin films by spectroscopic ellipsometry
M. Schubert
Forschungszentrum Rossendorf, March (1997)
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1996: |
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18. |
| Generalized ellipsometric characterization of cubic and hexagonal boron nitride thin films deposited by magnetron sputtering
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, and F. Richter
43. Symp. of the American Vacuum Society, Oktober (1996)
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17. |
| Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, and J.A. Woollam
23. Int. Conf. on the Physics of Semiconductors, Juli (1996)
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16. |
| Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
Int. Conf. on Polarimetry and Ellipsometry, Warszaw, Poland, Mai (1996)
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15. |
| Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert, B. Rheinländer andB. Johs, and J.A. Woollam
German Physical Society Spring Meeting, March (1996)
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14. |
| Optische Eigenschaften von dünnen AlAs- und InAs-Schichten (1-12 Monolagen) in GaAs-Umgebung
H. Schmidt, B. Rheinländer, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (1996)
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13. |
| Ellipsometrie an dünnen Infrarot-Absorber-Schichten in Halbleiter-Resonator-Schichtstrukturen
B. Rheinländer, R. Pickenhain, F. Uherek, J. Kovac, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, March (1996)
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12. |
| Generalized Ellipsometry and complex optical systems
M. Schubert
L.O.T.-Seminar, February (1996)
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11. |
| Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
University of Kassel, April (1996)
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10. |
| Atomic order in III-V alloys
M. Schubert
University of Lincoln-Nebraska, October (1996)
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9. |
| Moderne Ellipsometrie an kubischem und hexagonalem Bornitrid
M. Schubert
University of Chemnitz, June (1996)
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8. |
| Moderne Ellipsometrie an spontan geordnetem AlGaInP
M. Schubert
University of Stuttgart, June (1996)
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7. |
| Moderne Ellipsometrie an optisch komplexen Dünnschichtsystemen
M. Schubert
Sentech GmbH, March (1996)
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1995: |
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6. |
| Bestimmung des anisotropen Reflexionsvermögens von uniaxialem TiO2mittels generalisierter Rotating-Analyzer-Ellipsometry
M. Schubert, B. Johs, C. M. Herzinger, and J. A. Woollam
German Physical Society Spring Meeting, March (1995)
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5. |
| Untersuchung der spontanen Ordnung in AlGaInP mittels Dunkel-Feld-Spektroskopie und Spektral-Ellipsometrie
M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, March (1995)
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4. |
| Application of generalized transmission ellipsometry to liquid crystals: Determination of the director optical constants of a continuously twisted medium
M. Schubert
University of Lincoln-Nebraska, June (1995)
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generated using Sembib V0.1 © T. Hofmann (2003)
last database entry from 2009-11-05 |
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