SEM picture of a nano-chevron structure grown with glancing angle deposition (GLAD)

Color plots of Mueller matrix (forth row excluded) from the nano structure in the left SEM picture versus in-plane angle j and angle of incidence F. (-1 ≤ x = sinF cosj ≤ 1; -1 ≤ y = sinF sinj ≤ 1; 400 nm ≤ l ≤ 900 nm, step = 100 nm)