Complex Optics Network Logo
Nebraska SkyUNL Logo
Home Contact Research Publications Press releases Search
People
Research
  - Equipment
  - Projects
Publications
Teaching
Internal
Links
News
   Home > Research
Research
  Polaritons  |   MO-Hall-effect  |   Exchange-Polarization  |   Advanced Semiconductors  |   Nanocomposites  
  Solar cells  |   Conductive organics  |   In situ monitoring  |   Low-symmetry materials  

Sculptured Thin Films
Screw  |  3-fold  |  4-fold  |  5-fold  |  Chevron
TEM of SFN 220

SEM picture of a nano-screw grown with glancing angle deposition (GLAD)

 
TEM of SFN 220

Color plots of Mueller matrix (forth row excluded) from the chiral structure in the left SEM picture versus in-plane angle j and angle of incidence F. (-1 ≤ x = sinF cosj ≤ 1; -1 ≤ y = sinF sinj ≤ 1; 375 nm ≤ l ≤ 975 nm, step = 25 nm)

back to Research