SEM picture of a nano-screw grown with glancing angle deposition (GLAD)

Color plots of Mueller matrix (forth row excluded) from the chiral structure in the left SEM picture versus in-plane angle j and angle of incidence F. (-1 ≤ x = sinF cosj ≤ 1; -1 ≤ y = sinF sinj ≤ 1; 375 nm ≤ l ≤ 975 nm, step = 25 nm)