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Scientific Activities
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Research focus:
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Contactless, optical investigation of free-charge carrier properties in group-III nitride-based
heterostructures by THz-FIR-MIR & NIR-VIS-VUV spectroscopic ellipso- metry
and optical Hall effect (generalized ellipsometry with applied magnetic fields):
o Phonon modes, effective mass and free-charge carrier properties in high-Al AlGaN:Si films
o Buried p-type conductive layers in InN:Mg films
o 2D electron gases in high-electron mobility transistor structures
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Additional research activities:
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o generalized ellipsometry on arbitrarily anisotropic samples (natural, form-induced, and magnetic-field-
induced birefringence) from THz to VUV
o glancing angle deposition (GLAD) of 3D nanostructures
o Atomic layer deposition (ALD) with in-situ ellipsometry process monitoring
o NIR-Vis-VUV ellipsometry on single-layer and multilayer graphene
o diblock-copolymer micelle-assisted nanolithography
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