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   Home > People > Hofmann
Dr. Tino Hofmann
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Publications

Journal articles:       In submission   2016   2015   2014   2013   2012   2011   2010  
2009   2008   2007   2006   2005   2004   2003  
2002   2001   2000   1999  

Electronic documents are intended for internal use only.
Corrections are added for misprints where known.

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Thesis

        Far-infrared spectroscopic ellipsometry on AIII BV semiconductor heterostructures
T. Hofmann
Shaker Verlag
2005, Paperback
ISBN: 3-8322-3891-3
Infos and contents: http://www.shaker.de/


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Bookchapters


Detection of organic attachment onto highly ordered three-dimensional nanostructure thin films by generalized ellipsometry and quartz crystal microbalance with dissipation techniques
K.B. Rodenhausen, D. Schmidt, C. Rice, T. Hofmann, E.Schubert, M. Schubert

In Ellipsometry of Functional Organic Surfaces and Films edited by K. Hinrichs and K.-J. Eichhorn (Springer, Berlin, 2014)
ISBN 978-3-642-40127-5


THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures
T. Hofmann, D. Schmidt, M. Schubert

In Ellipsometry at the Nanoscale edited by M. Losurdo and K. Hingerl (Springer, Berlin, 2013) ISBN 978-3-642-33955-4
[View PDF (1 MB)]

      See also Research Reports of the Physics Institutes,
Universität Leipzig, M. Grundmann (Editor)
    2004 (pdf, 20 MB), ISBN 3-934178-46-4
    2003 (pdf, 19 MB), ISBN 3-934178-33-2
    2002 (pdf, 31 MB), ISBN 3-934178-25-1
    2001 (pdf, 16 MB), ISBN 3-934178-17-0


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Articles in submission:

    114. Cavity-tuning optomechanical stage for low-field terahertz optical Hall effect
S. Knight, T. Hofmann, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, and M. Schubert
Rev. Sci. Instr. , (2016)


    113. Tribrid EC-GSE-QCMD Analysis: Effects of surface topography on the electrochromic behavior of methylene blue
D. Sekora, A. J. Zaitouna, U. Kilic, T. Hofmann, R. Y. Lai, E. Schubert, and M. Schubert
ACS Appl. Mat. Int. , (2016)


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2016:

    112. Properties of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect
N. Armakavicius, J.-T. Chen, T. Hofmann, S. Knight, P. Kühne, D. Nilsson, U. Forsberg, E. Janzen, and V. Darakchieva
phys. stat. sol. C 13, 369 (2016) [DOI-link]


    111. Optical Hall effect in graphene on 3C-SiC (111)
C. Bouhafs, V. Stanishev, A. A. Zakharov, T. Hofmann, P. Kühne, T. Iakimov, R. Yakimova, M. Schubert, and V. Darakchieva
Appl. Phys. Lett. 109, 203102 (2016) [View PDF (3.6 MB)] [DOI-link]


    110. Semiconducting boron carbides with better charge extraction through the addition of pyridine moieties
M. Echeverria, B. Dong, G. Peterson, J. Silva, E. Wilson, M. Driver, Y.-S. Jun, G. Stucky, S. Knight, T. Hofmann, Z.-K. Han, N. Shao, Y. Gao, W.-N. Mei, M. Nastasi, P. Dowben, and J. Kelber
J. Phys. D. Appl. Phys. , (2016)


    109. Anisotropy, band-to-band transitions, phonon modes, and oxidation 2 properties of cobalt-oxide core-shell slanted columnar thin films
A. Mock, R. Korlacki, C. Briley, D. Sekora, T. Hofmann, P. Wilson, A. Sinitskii, E. Schubert, and M. Schubert
Appl. Phys. Lett. 108, 051905 (2016) [View PDF (2.4 MB)] [DOI-link]


    108. The optical Hall effect - model description: tutorial
M. Schubert, P. Kuehne, V. Darakchieva, and T. Hofmann
J. Opt. Soc. Am. A 33, 1553-1568 (2016) [View PDF (5.5 MB)] [DOI-link]


    107. Editors' Suggestion
Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β-gallium oxide single crystals

M. Schubert, R. Korlacki, S. Knight, T. Hofmann, S. Schöche, V. Darakchieva, E. Janzén, B. Monemar, D. Gogova, Q.-T. Thieu, R. Togashi, H. Murakami, Y. Kumagai, K. Goto, A. Kuramata, S. Yamakoshi, and M. Higashiwaki
Phys. Rev. B 93, 125209 (1-18) (2016) [View PDF (10.3 MB)] [DOI-link][ArXiv-link]


    106. Anisotropic Optical Contrast Microscope
D. Peev, T. Hofmann, N. Kananizadeh, S. Wimer, B. Rodenhausen, C. M. Herzinger, T. Kasputis, E. Pfaunmiller, A. Nguyen, R. Korlacki, A. Pannier, Y. Li, E. Schubert, D. Hage, and M. Schubert
Rev. Sci. Instr. 87, 113701 (1-17) (2016) [View PDF (19.4 MB)] [DOI-link]


    105. Solution-Stable Anisotropic Carbon Nanotube/Graphene Hybrids Based on Slanted Columnar Thin Films for Chemical Sensing
P. Wilson, A. Zobel, A. Zaitouna, A. Lipatov, E. Schubert, T. Hofmann, M. Schubert, R. Lai, and A. Sinitskii
RSC Advances 6, 63235-63240 (2016) [View PDF (1.4 MB)] [DOI-link]


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2015:

    104. Selected for Spotlight on Optics
Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies

S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C. M. Herzinger, M. Schubert, and T. Hofmann
Opt. Lett. 40, 2688 (2015) [View PDF (1.7 MB)] [DOI-link]


    103. The retention of liquid by columnar nanostructured surfaces during quartz crystal microbalance measurements and the effects of adsorption thereon
K. B. Rodenhausen, R. S. Davis, D. Sekora, D. Liang, A. Mock, R. Neupane, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
J. Colloid Interf. Sci. 455, 226 (2015) [View PDF (1.3 MB)] [DOI-link]


    102. Anisotropic magneto-optical hysteresis of permalloy slanted columnar thin films determined by vector magneto-optical generalized ellipsometry
C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
Appl. Phys. Lett. 106, 133104 (2015) [View PDF (1.8 MB)] [DOI-link]


    101. Multilayer Graphitic Coatings for Thermal Stabilization of Metallic Nanostructures
P. Wilson, A. Zobel, A. Lipatov, E. Schubert, T. Hofmann, and A. Sinitskii
ACS Appl. Mater. Interfaces 7, 2987–2992 (2015) [View PDF (4.6 MB)] [DOI-link]


    100. Structural and Optical Properties of Cobalt Slanted Nanopillars Conformally Coated with Few-Layer Graphene
P.M. Wilson, D. Schmidt, E. Schubert, M. Schubert, A. Sinistkii, and T. Hofmann
Appl. Phys. Lett. 106, 231901 (2015) [View PDF (1.6 MB)] [DOI-link][ArXiv-link]


    99. Transient Absorption Measurements on Anisotropic Monolayer ReS2
Q. Cui, J. He, M. Z. Bellus, M. Mirzokarimov, T. Hofmann, H.-Y. Chiu, M. Antonik, D. He, Y. Wang, and H. Zhao
Small 41, 5565 (2015) [DOI-link]


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2014:

    98. Effect of Mg doping on the structural and free-charge carrier properties of InN thin films
M.-Y. Xie, N. Ben Sedrine, S. Schöche, T. Hofmann, M. Schubert, L. Hong, B. Monemar, X. Wang, A. Yoshikawa, K. Wang, T. Araki, Y. Nanishi, and V. Darakchieva
J. Appl. Phys. 115, 163504 (2014) [View PDF (2.5 MB)] [DOI-link]


    97. An integrated mid-infrared, far-infrared and terahertz optical Hall effect instrument
P. Kühne, C.M. Herzinger, M. Schubert, J.A. Woollam, and T. Hofmann
Rev. Sci. Instrum. 85, 071301 (2014) [View PDF (3.9 MB)] [DOI-link][ArXiv-link]


    96. Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by Infrared Spectroscopic Ellipsometry
S. Schöche, T. Hofmann, V. Darakchieva, X. Wang, A. Yoshikawa, K. Wang, T. Araki, Y. Nanishi, and M. Schubert
Thin Solid Films 571, 384-388 (2014) [DOI-link]


    95. Polarization-coupled Ferroelectric unipolar junction memory and energy storage device
M. Schubert, T. Hofmann, and V.R. Voora
U.S. Patent No. 8,711,599, (2014) [View PDF (1.0 MB)]


    94. Optical Sensing and Separation Method Based on Ordered 3-Dimensional Nanostructured Surfaces
M. M. Schubert, T. Hofmann, D. Schmidt, P. Dussault, A. Holmes, and R. Lai
U.S. Patent Application 14/054,504 2014, (2014) [View PDF (2.8 MB)]


    93. Terahertz-infrared ellipsometers system, and method of use
C. M. Herzinger, M. M. Schubert, T. Hofmann, M. M. Liphardt, and J. A. Woollam
U.S. Patent No. 8,705,032, (2014) [View PDF (2.7 MB)]


    92. Three-Dimensional Periodic Graphene Nanostructures
P.M. Wilson, G.N. Mbah, T.G. Smith, D. Schmidt, R.Y. Lai, T. Hofmann, and A. Sinitskii
J. Mat. Chem. C 2, 1879 (2014) [View PDF (1.2 MB)] [DOI-link]


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2013:

    91. A Model Dielectric Function for Graphene from the Infrared to the Ultraviolet
A. Boosalis, R. Elmquist, M. Real, N. Nguyen, M. Schubert, and T. Hofmann
Mat. Res. Soc. Symp. Proc. 1505, (2013) [View PDF (838 kB)] [DOI-link]


    90. Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC (111)
V. Darakchieva, A. Boosalis, A. A. Zakharov, T. Hofmann, M. Schubert, T. E. Tiwald, T. Iakimov, R. Vasiliauskas, and R. Yakimova
App. Phys. Lett. 102, 213116 (2013) [View PDF (1.8 MB)] [DOI-link]


    89. Polarization selection rules for inter-Landau level transitions in epitaxial graphene revealed by infrared optical Hall effect
P. Kühne, V. Darakchieva, J.D. Tedesco, R.L. Myers-Ward, C.R. Eddy Jr., D.K. Gaskill, R. Yakimova and C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
Phys. Rev. Lett. 111, 077402 (2013) [View PDF (2.0 MB)] [DOI-link][ArXiv-link]


    88. Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide - coupled phonon mode
P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, M. Schubert, and T. Hofmann
Mat. Res. Soc. Symp. Proc. 1505, w07-44 (2013) [DOI-link]


    87. Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN
S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
J. Appl. Phys. 113, 013502 (2013) [View PDF (2.3 MB)] [DOI-link]


    86. Electron effective mass in Al0.72Ga0.28N alloys determined by mid-infrared optical Hall effect
S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A. Kakanakova-Georgieva, E. Janzén, and V. Darakchieva
Appl. Phys. Lett. 103, 212107 (2013) [View PDF (605 kB)] [DOI-link]


    85. Infrared dielectric anisotropy and phonon modes of rutile TiO2
S. Schöche, T. Hofmann, R. Korlacki, T. E. Tiwald, and M. Schubert
J. Appl. Phys. 113, 164102 (2013) [View PDF (2.9 MB)] [DOI-link]


    84. Mass Sensor
M. Schubert, E. Schubert, T. Hofmann, and D. Schmidt
U.S. Patent No. 8,441,635, (2013) [View PDF (1.9 MB)]


    83. Terahertz Resonator
E. Schubert, M. M. Schubert, and T. Hofmann
U.S. Patent No. 8,507,860, (2013) [View PDF (903 kB)]


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2012:

    82. Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC
A. Boosalis, T. Hofmann, V. Darakchieva, R. Yakimova, Tom Tiwald, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1407, aa20-43 (2012) [View PDF (531 kB)] [DOI-link]


    81. Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on 3C and 4H SiC Polytypes Determined by Spectroscopic Ellipsometry
A. Boosalis, T. Hofmann, V. Darakchieva, R. Yakimova, and M. Schubert
Appl. Phys. Lett. 101, 011912 (2012) [View PDF (669 kB)] [DOI-link]


    80. Empirical Correction for Spectroscopic Measurements of Rough or Textured Surfaces
C.M. Herzinger, B.D. Jobs, M. Schubert, and T. Hofmann
U.S. Patent No. 8,248,607, (2012) [View PDF (374 kB)]


    79. Terahertz-Infrared Ellipsometer System, and Method of Use
C.M. Herzinger, M. Schubert, T. Hofmann, M.M. Liphardt, and J.A. Woollam
U.S. Patent No. 8,169,611, (2012) [View PDF (194 kB)]


    78. Metal slanted columnar thin film THz optical sensors
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C. Herzinger, J. Woollam, E. Schubert, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1409, CC13-31 (2012) [View PDF (748 kB)] [DOI-link]


    77. Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures
T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and V. Darakchieva
Appl. Phys. Lett. 101, 192102 (2012) [View PDF (508 kB)] [DOI-link]


    76. Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
S. Schöche, T. Hofmann, N. B. Sedrine, V. Darakchieva, B. Monemar, X. Wang, A. Yoshikawa, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1396, O07-27 (2012) [DOI-link]


    75. Selected for publication in
Vir. J. Nan. Sci. & Tech. Vol. 25 (10) (2012)

Nanomagnetic Skyrmions

R. Skomski, Z. Li, R. Zhang, R.D. Kirby, A. Enders, D. Schmidt, T. Hofmann, E. Schubert, and D. J. Sellmyer
J. Appl. Phys. 111, 07E116 (2012) [View PDF (503 kB)] [DOI-link]


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2011:

    74. Free-charge carrier profiles of iso- and aniso-type Si homojunctions determined by terahertz and mid-infrared ellipsometry
A. Boosalis, T. Hofmann, J. \vSik, and M. Schubert
Thin Solid Films 519, 2604 (2011) [View PDF (355 kB)] [DOI-link]


    73. Selected for publication in
Vir. J. Nan. Sci. & Tech. Vol. 23 (5) (2011)

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, D. K. Gaskill, J. L. Tedesco, and M. Schubert
Appl. Phys. Lett. 98, 041906 (2011) [View PDF (175 kB)] [DOI-link]


    72. THz dielectric anisotropy of metal slanted columnar thin films
T. Hofmann, D. Schmidt, A. Boosalis, P. Kuehne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
Appl. Phys. Lett. 99, 081903 (2011) [View PDF (543 kB)] [DOI-link]


    71. Terahertz ellipsometry and terahertz optical-Hall effect
T. Hofmann, C.M. Herzinger, J.L. Tedesco, D.K. Gaskill, J.A. Woollam, and M. Schubert
Thin Solid Films 519, 2593 (2011) [View PDF (972 kB)] [DOI-link]


    70. Terahertz frequency optical-Hall effect in multiple valley band materials
P. Kühne, T. Hofmann, C. M. Herzinger, and M. Schubert
Thin Solid Films 519, 2613 (2011) [View PDF (582 kB)] [DOI-link]


    69. Temperature dependent model dielectric function of highly disordered Ga0.52In0.48P
E. Montgomery, C. Krahmer, K. Streubel, T. Hofmann, E. Schubert, and M. Schubert
Thin Solid Films 519, 2859 (2011) [View PDF (532 kB)] [DOI-link]


    68. Also selected for publication in
Vir. J. Biol. Phys. Res. Vol. 24 (20) (2011)
Vir. J. Nan. Sci. & Tech. Vol. 23 (5) (2011)
Combined Optical and Acoustical Method for Determination of Thickness and Porosity of Tranparent Organic Layers Below the Ultra-thin Film Limit

K. B. Rodenhausen, T. Kasputis, A. K. Pannier, J. Y. Gerasimov, R. Y. Lai, M. Solinsky, T. E. Tiwald, H. Wang, A. Sarkar, T. Hofmann, N. Ianno, and M. Schubert
Rev. Sci. Instrum. 82, 103111 (2011) [View PDF (793 kB)] [DOI-link]


    67. Micelle-assisted bilayer formation of cetyltrimethlyammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques
K. B. Rodenhausen, M. Guericke, A. Sarkar, T. Hofmann, N. Ianno, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
Thin Solid Films 519, 2821-2824 (2011) [View PDF (457 kB)] [DOI-link]


    66. In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques
K. B. Rodenhausen, B. A. Duensing, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
Thin Solid Films 519, 2817-2820 (2011) [View PDF (547 kB)] [DOI-link]


    65. Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer
D. Schmidt, C. Müller, T. Hofmann, O. Inganäs, H. Arwin, E. Schubert, and M. Schubert
Thin Solid Films 519, 2645 (2011) [View PDF (734 kB)] [DOI-link]


    64. Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam and W. J. Schaff, L. F. Eastman, M. Schubert, and T. Hofmann
Appl. Phys. Lett. 98, 092103 (2011) [View PDF (153 kB)] [DOI-link]


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2010:

    63. Protein adsorption on and swelling of polyelectrolyte brushes: a simultaneous ellipsometry-quartz crystal microbalance study
E. Bittrich, K. B. Rodenhausen, K. Eichhorn, T. Hofmann, M. Schubert, M. Stamm, and P. Uhlmann
Biointerphases 5, 159 (2010) [View PDF (761 kB)] [DOI-link]


    62. Variable-wavelength frequency-domain THz ellipsometry
T. Hofmann, C.M. Herzinger, A. Boosalis, T.E. Tiwald, J.A. Woollam, and M. Schubert
Rev. Sci. Instrum. 81, 023101 (2010) [View PDF (303 kB)] [DOI-link]


    61. Magneto-optical Properties of Cobalt Slanted Columnar Thin Films
D. Schmidt, T. Hofmann, C. M. Herzinger, E. Schubert, and M. Schubert
Appl. Phys. Lett. 96, 091906 (2010) [View PDF (262 kB)] [DOI-link]


    60. Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures
V.M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, H. Schmidt, N. Ianno, and M. Schubert
Phys. Rev. B 81, 195307 (2010) [View PDF (703 kB)] [DOI-link]


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2009:

    59. Annealing effects on the optical properties of semiconducting boron carbide
R.B. Billa, T. Hofmann, M. Schubert, and B.W. Robertson
J. Appl. Phys. 106, 033515 (2009) [View PDF (239 kB)] [DOI-link]


    58. Free electron behavior in InN: on the role of dislocations and surface electron accumulation
V. Darakchieva, T. Hofmann, M. Schubert, B. E. Sernelius, B. Monemar, P. O. A. Persson, F. Giuliani, E. Alves, H. Lu, and W. J. Schaff
Appl. Phys. Lett. 94, 022109 (2009) [View PDF (200 kB)] [DOI-link]


    57. Electron accumulation at nonpolar and semi-polar surfaces of wurtzite InN from generalized infrared ellipsometry
V. Darakchieva, M. Schubert, T. Hofmann, B. Monemar, Y. Takagi, and Y. Nanishi
Appl. Phys. Lett. 95, 202103 (2009) [View PDF (569 kB)] [DOI-link]


    56. Terahertz Ellipsometry Using Electron-Beam Based Sources
T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert
Mat. Res. Soc. Symp. 1108, A08-04 (2009) [View PDF (109 kB)] [DOI-link]


    55. Hole diffusion profile in a p-p+ Silicon homojunction determined by terahertz and mid-infrared spectroscopic ellipsometry
T. Hofmann, C.M. Herzinger, T.E. Tiwald, J.A. Woollam, and M. Schubert
Appl. Phys. Lett. 95, 032102 (2009) [View PDF (230 kB)] [DOI-link]


    54. Materials Characterization using THz Ellipsometry
T. Hofmann, C.M. Herzinger, J.A. Woollam, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1163E, 1163-K08-04 (2009) [View PDF (106 kB)] [DOI-link]


    53. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
Mat. Res. Soc. Symp. Proc. 1123, P02-02 (2009) [View PDF (245 kB)] [DOI-link]


    52. Monitoring Organic Thin Film Growth in Aqueous Solution In-situ with a Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, T. Viitala, T. Hofmann, T.E. Tiwald, J.A. Woollam, A. Kjerstad, B. Laderian, and M. Schubert
Mat. Res. Soc. Symp. 1146E, 1146-NN09-02 (2009) [View PDF (216 kB)] [DOI-link]


    51. Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert
Appl. Phys. Lett. 94, 011914 (2009) [View PDF (381 kB)] [DOI-link]


    50. Optical and magnetic properties of Co nanostructure thin films
D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert
Mat. Res. Soc. Symp. Proc. 1142, 1142-JJ09-04 (2009) [View PDF (502 kB)]


    49. Optical, structural, and magnetic properties of cobalt nanostructure thin films
D. Schmidt, A. C. Kjerstad, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert
J. Appl. Phys. 105, 113508 (2009) [View PDF (656 kB)] [DOI-link]


    48. Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films
D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert
Opt. Lett. 34, 992 (2009) [View PDF (300 kB)] [DOI-link]


    47. Interface-charge-coupled polarization response of Pt-ZnO-BaTiO3-ZnO-Pt heterostructures: Three-layer model expansion
V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1110, 1110-C06-14 (2009) [View PDF (177 kB)] [DOI-link]


    46. Resistive hysteresis and interface charge coupling in BaTiO3-ZnO heterostructures
V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert
Appl. Phys. Lett. 94, 142904 (2009) [View PDF (536 kB)] [DOI-link]


    45. Electrical properties of ZnO-BaTiO3-ZnO heterostructures with asymmetric interface charge distribution
V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert
Appl. Phys. Lett. 95, 082902 (2009) [View PDF (595 kB)] [DOI-link]


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2008:

    44. Unravelling the free electron behavior in InN
V. Darakchieva, T. Hofmann, M. Schubert, B.E. Sernelius, F. Giuliani, M.-Y. Xie, P.O.A. Persson, B. Monemar, W.J. Schaff, C.-L. Hsiao, L.-C. Chen, and Y. Nanishi
Conference on Optoelectronic and Microelectronic Materials and Devices ISBN 978-1-4244-2716-1, 90-97 (2008) [View PDF (718 kB)] [DOI-link]


    43. Optical Hall-effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, H. Lu, W. J. Schaff, and M. Schubert
J. Electron. Mater 37, 611-615 (2008) [View PDF (420 kB)] [DOI-link]


    42. Infrared behavior of aluminum nanostructure sculptured thin films
T. Hofmann, M. Schubert, D. Schmidt, and E. Schubert
Mat. Res. Soc. Symp. Proc. 1080E, 1080-O04-16 (2008) [View PDF (598 kB)] [DOI-link]


    41. The optical Hall effect
T. Hofmann, C.M. Herzinger, C. Krahmer, K. Streubel, and M. Schubert
phys. stat. sol. (a) 205, 779 (2008) [View PDF (2.7 MB)] [DOI-link]


    40. Optical Hall effect studies on modulation-doped AlxGa1-xAs:Si/GaAs quantum wells
T. Hofmann, C. von Middendorff, V. Gottschalch, and M. Schubert
phys. stat. sol. (c) 5, 1386 - 1390 (2008) [View PDF (400 kB)] [DOI-link]


    39. Polaron transitions in charge intercalated amorphous tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
phys. stat. sol. (a) 205, 914 (2008) [View PDF (580 kB)] [DOI-link]


    38. Polaron and Phonon properties in proton intercalated amorphous tungsten oxide thin films
M. F. Saenger, T. Höing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, and M. Schubert
Phys. Rev. B 75, 245205 (2008) [View PDF (987 kB)] [DOI-link]


    37. Epitaxial Deposition of SiC onto 4H SiC using a Hollow Cathode
R. J. Soukup, N. J. Ianno, J. L. Huguenin-Love, N. T. Lauer, T. Hofmann, and Z. Hubicka
ECS Transactions 16, 201 - 210 (2008) [DOI-link]


    36. Interface-charge-coupled polarization response of Pt-BaTiO3-ZnO-Pt heterojunctions: A physical model approach
V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, N. Ashkenov, and M. Schubert
J. Electron. Mater 37, 1029-1034 (2008) [View PDF (397 kB)] [DOI-link]


    35. Interface-charge-coupled polarization response model of Pt-BaTiO3-ZnO-Pt heterojunctions: Physical parameters variation
V. M. Voora, T. Hofmann, A. C. Kjerstad, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert
Mat. Res. Soc. Symp. Proc. 1074E, 1074-I01-11 (2008) [View PDF (87 kB)]


    34. Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures
V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, and M. Schubert
phys. stat. sol. (c) 5, 1328 (2008) [View PDF (424 kB)] [DOI-link]


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2007:

    33. Electron effective mass and phonon modes in GaAs incorporating boron and indium
T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch
Appl. Phys. Lett. 90, 182110 (2007) [View PDF (96 kB)] [DOI-link]


    32. Dielectric anisotropy and phonon modes of ordered indirect-gap Al0.52In0.48P studied by far-infrared ellipsometry
T. Hofmann, V. Gottschalch, and M. Schubert
Appl. Phys. Lett. 91, 121908 (2007) [View PDF (217 kB)] [DOI-link]


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2006:

    31. Phonon properties and doping of ZnMnSe epilayers grown by molecular beam epitaxy
K. C. Agarwal, B. Daniel, T. Hofmann, M. Schubert, C. Klingshirn, and M. Hetterich
phys. stat. sol. b 243, 914 (2006) [View PDF (268 kB)] [DOI-link]


    30. Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magnetooptic ellipsometry
T. Hofmann, U. Schade, K. C. Agarwal, B. Daniel, C. Klingshirn, M. Hetterich, C. M. Herzinger, and M. Schubert
Appl. Phys. Lett. 88, 042105 (2006) [View PDF (85 kB)] [DOI-link]


    29. Terahertz magnetooptic generalized ellipsometry using synchrotron and black-body radiation
T. Hofmann, U. Schade, W. Eberhardt, C. M. Herzinger, P. Esquinazi, and M. Schubert
Rev. Sci. Inst. 77, 063902 (2006) [View PDF (313 kB)] [DOI-link]


    28. Anisotropy of the Gamma-point effective mass and mobility in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
phys. stat. sol. c 3, 1854-1857 (2006) [View PDF (252 kB)] [DOI-link]


    27. Terahertz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, P. Esquinazi, and M. Schubert
SPIE Vol. 6120, 61200D (2006) [DOI-link]


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2005:

    26. The inertial-mass scale for free-charge-carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, C. von Middendorff, G. Leibiger, V. Gottschalch, C. M. Herzinger, A. Lindsay, and E. O'Reilly
AIP Conference Proceedings 772, 455-456 (2005) [DOI-link]


    25. Long-wavelength interface modes in semiconductor layer structures
M. Schubert, T. Hofmann, and J. Sik
Phys. Rev. B 71, 035324 (2005) [View PDF (382 kB)] [DOI-link]


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2004:

    24. Far-Infrared Dielectric Function and Phonon Modes of Sponateously Ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, and V. Gottschalch
Thin Solid Films 455-456, 601-604 (2004) [View PDF (154 kB)] [DOI-link]


    23. Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes, and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase
Thin Solid Films 455-456, 619-623 (2004) [View PDF (282 kB)] [DOI-link]


    22. Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures
M. Schubert, T. Hofmann, and C. M. Herzinger
Thin Solid Films 455-456, 563-570 (2004) [View PDF (239 kB)] [DOI-link]


    21. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and G. Wagner
Ann. Phys. 13, 61-62 (2004) [View PDF (213 kB)] [DOI-link]


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2003:

    20. Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, M. Grundmann, C. M. Herzinger, M. Schubert, and W. Grill
Mat. Res. Soc. Symp. Proc. 744, M5.32.1-6 (2003) [View PDF (154 kB)]


    19. Far-Infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
Mat. Res. Soc. Symp. Proc. 744, M5.33.1-6 (2003) [View PDF (129 kB)]


    18. Far-infrared-magneto-optic Ellipsometry characterization of free-charge-carrier properties in highly disordered n-type Al0.19Ga0.33In0.48P
T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka
Appl. Phys. Lett. 82, 3463-3465 (2003) [View PDF (55 kB)] [DOI-link]


    17. Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: Determination of free-carrier effective mass, mobility and concentration parameters in n-type GaAs
M. Schubert, T. Hofmann, and C. M. Herzinger
J. Opt. Soc. Am. A 20, 347-356 (2003) [View PDF (257 kB)] [DOI-link]


    16. Phonons and polaritons in semiconductor layer structures
M. Schubert , and T. Hofmann
SPIE Vol. 5218, 210-222 (2003) [DOI-link]


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2002:

    15. Far-infrared Magneto-Optical Generalized Ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, M. Schubert, and C. M. Herzinger
SPIE Vol. 4779, 90-97 (2002) [DOI-link]


    14. Far-Infrared dielectric anisotropy and phonon modes in spontaneously CuPt-ordered Ga0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
Phys. Rev. B 66, 195204 1-10 (2002) [View PDF (255 kB)] [DOI-link]


    13. Generalized ellipsometry of complex mediums in layered systems
M. Schubert, A. Kasic, T. Hofmann, V. Gottschalch, J. Off, F. Scholz, E. Schubert, H. Neumann, I. Hodgkinson, M. Arnold, W. Dollase, and C. M. Herzinger
SPIE Vol. 4806, 264 (2002) [View PDF (608 kB)] [DOI-link]


    12. Interband transitions in [001]-(GaP)1(InP)m superlattices
M. Schubert, H. Schmi dt, J. \vSik, T. Hofmann, V. Gottschalch, W. Grill, G. Böhm, and G. Wagner
Mat. Sci. Eng. B 88, 125 - 128 (2002) [View PDF (144 kB)] [DOI-link]


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2001:

    11. Infrared dielectric function and phonon modes of highly disordered (AlxGa1-x)0.52In0.48P
T. Hofmann, G. Leibiger, V. Gottschalch, Ines Pietzonka, and M. Schubert
Phys. Rev. B 64, 155206 (2001) [View PDF (297 kB)] [DOI-link]


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2000:

    10. Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry
J. \v Sik, M. Schubert, T. Hofmann, and V. Gottschalch
MRS Internet J. Nitride Semicond. Res. 5, 3 (2000)


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1999:

    9. Near-band-gap CuPt order birefringence in Al0.48Ga0.52InP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch, and J. A. Woollam
Phys. Rev. B 60, 16618 - 16634 (1999) [View PDF (337 kB)] [DOI-link]


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