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   Home > People > Hofmann
Dr. Tino Hofmann
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Conferences

2016   2015   2014   2013   2012   2011   2010  
2009   2008   2007   2006   2005   2004   2003  
2002   2001   2000   1999  

   

2016:

    249. Generalized spectroscopic ellipsometry: determination of orthorhombic optical properties of bi-layer Co-FeNi slanted columnar thin films
D. Sekora, C. Briley, T. Hofmann, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June (2016)


    248. Invited
The eigen polarization model for monoclinic and triclinic symmetries: Generalized ellipsometry analysis from the far infrared to the deep ultra violet for single crystalline beta gallium oxide

A. Mock, R. Korlacki, C. Briley, S. Knight, S. Schoche, T. Hofmann, V. Darakchieva, E. Janzen, B. Monemar, D. Gogova, Q.-T. Thieu, R. Togashi, H. Murakami, Y. Kumagai, K. Goto, A. Kuramata, S. Yamakoshi, M. Higashiwaki, E. Schubert, and M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    247. Hydrogen intercalation induced anisotropy of free charge carrier mobility in epitaxial graphene revealed by THz Optical Hall effect measurements
P. Kuhne, N. Armakavicius, C. Bouhafs, V. Stanishev, T. Hofmann, R. Yakimova, C. Colleti, M. Schubert, and V. Darakchieva
ICSE-7, Berlin, Germany, June (2016)


    246. Electromagnetics at THz Frequencies: Optical Hall Effect and Form-induced Birefringence
T. Hofmann
Colloquium, Department of Physics, University of Toledo, Toledo, OH, February (2016)


    245. Tribrid EC-GSE-QCMD Analysis: Surface topography effects on the electrochromic behavior of methylene blue
D. Sekora, A. J. Zaitouna, U. Kilic, T. Hofmann, R. Y. Lai, M. Schubert, and E. Schubert
ICSE-7, Berlin, Germany, June (2016)


    244. Vector magneto-optical generalized ellipsometry on nanostructured magnetic thin films of complex anisotropy
C. Briley, A. Mock, R. Korlacki, T. Hofmann, E. Schubert, R. Skomski, and M. Schubert
ICSE-7, Berlin, Germany, June (2016)


    243. In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P.Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
ICSE-7, Berlin, Germany, June (2016)


    242. THz-MIR ellipsometry characterization of chromia thin films
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, C.M. Herzinger, J.A. Woollam, M. Schubert, C. Binek, M. Street, P. Dowben, and T. Hofmann
Nebraska MRSEC Review, Lincoln, NE, March (2016)


    241. In-situ terahertz optical Hall effect measurements of ambient doping effects in epitaxial graphene
S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, and T. Hofmann
SPIE Optics+Photonics, San Diego, CA, August-September (2016)


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2015:

    240. Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies
S. Knight, S. Schoeche, V. Darakchieva, P. Kuehne, C.M. Herzinger, M. Schubert, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 11 (2015)


    239. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    238. Transmission Mueller Matrix Imaging Microscope
D. Peev, C. Rice, M. Schubert, and T. Hofmann
J. A. Woollam Symposium, Lincoln, NE, June 6 (2015)


    237. 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
UNL Graduate Research Fair, Lincoln, NE, April 14 (2015)


    236. Mueller Matrix Birefringence Microscopy of Mouse Fibroblasts using Anisotropic Nanostructured Surfaces
T. Kasputis, C. Rice, D. Peev, T. Hofmann, E. Schubert, A.K. Pannier, and M. Schubert
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    235. Direct Band Structure Based Modeling of Graphene: from the THz to the UV
A. Boosalis, W. Li, N. Nguyen, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, M. Schubert, and T. Hofmann
9th Workshop Ellipsometry WSE-9, University of Twente, the Netherlands, February 23-25th (2015)


    234. 1st PLACE WINNER
Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-Dimensional Nanostructured Surfaces Studied by in-situ EC and Generalized Ellipsometry

D. Sekora, A. J. Zaituna, T. Hofmann, R. Y. L. Lai, M. Schubert, and E. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    233. Observation of a Reversible Phase Transition in the Dielectric Function Response of Si Nanostructures upon Li Intercalation using Generalized Ellipsometry
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April (2015)


    232. Electrochemical Reduction of Methylene Blue Immobilized on Highly Ordered 3-dimensional Nanostructured Surfaces Studied by in-situ EC, QCM-D and Generalized Spectroscopic Ellipsometry
D. Sekora, A. J. Zaituna, T. Hofmann, R. L. Y. Lai, M. Schubert, and E. Schubert
42nd ICMCTF, San Diego, CA, April (2015)


    231. 3rd Place Winner (ECE Dept.) & Commendation Award (College of Engineering)
Enhanced Temperature Stability of Slanted Columnar Thin Films by ALD Overcoating

Alyssa Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    230. Record mobility of two-dimensional electron gas in AlGaN/GaN HEMT structures determined by cavity-enhanced THz optical Hall effect
N. Armakavicius, J.-T. Chen, T. Hofmann, S. Knight, P. Kühne, D. Nilsson, U. Forsberg, E. Janzen, and V. Darakchieva
11th ICNS, Beijing, China, August (2015)


    229. Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies
S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
11th ICNS, Beijing, China, August (2015)


    228. Spectroscopic Ellipsometry FT Student award winner
Cavity-Enhanced Optical Hall Effect in AlInN/GaN-based HEMT Structures Detected at Terahertz Frequencies

S. Knight, S. Schöche, V. Darakchieva, P. Kühne, J.-F. Carlin, N. Grandjean, C.M. Herzinger, M. Schubert, and T. Hofmann
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    227. Vector magneto-optical generalized ellipsometry on heat treated sculptured think films: A study of the effects of Al2O3 passivation coatings on magneto-optical properties
C. Briley, A. Mock, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    226. The Effect of Annealing and Alumina Passivation on Structural and Optical Properties of Cobalt-Oxide Core-Shell Slanted Columnar Thin Films
A. Mock, D. Sekora, T. Hofmann, E. Schubert, and M. Schubert
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


    225. 2nd Place Winner (ECE Dept.)
Anisotropic Plasmon Resonances in Nanostructured Thin Films: An Optical Model Approach

C. Briley, D. Sekora, T. Hofmann, E. Schubert, and and M. Schubert
UNL Graduate Research Fair, Lincoln, NE, April (2015)


    224. Anisotropic Magneo-Optical Hysteresis of Permalloy Slanted Columnar Thin Films Determined by Vector Magneto-Optical Generalized Ellipsometry
C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and and M. Schubert
WSE-9, Twente, Netherlands, February (2015)


    223. VMOGE on annealed Cobalt slanted columnar thin films (Co-SCTF)
C. Briley, A. Mock, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, August (2015)


    222. Cavity-enhanced THz optical Hall effect and graphene-based environmental sensing
S. Knight, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, S. Wimer, M. Schubert, V. Darakchieva, and T. Hofmann
J.A. Woollam Symposium, Lincoln, NE, August (2015)


    221. AVS Graduate research award winner
Effect of aromatic compounds on semiconducting boron carbide heterojunctions

E. Echeverría, E. Wilson, R. James, F. Pasquale, B. Dong, A. Enders, S. Knight, T. Hofmann, J.A. Kelber, and P.A. Dowben
AVS 62nd International Symposium and Exhibition (AVS-62), San Jose, CA, October (2015)


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2014:

    220. Talk
Phonon mode behavior and free-charge carrier parameters in high-Al content AlGaN determined by IR spectroscopic Ellipsometry and optical Hall effect

S. Schöche, P. Kühne, T. Hofmann, M. Schubert, D. Nilsson, A. Kakanakova-Georgieva, E. Janzén, and V. Darakchieva
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    219. Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations
S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzén, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and T. Hofmann
8th Workshop Ellipsometry, Dresden, Germany, March (2014)


    218. Permanent Magnet Based THz Optical Hall Effect on AlInN/GaN High Electron Mobility Transistor Structures
S. Knight, S. Schöche, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 (2014)


    217. Instrument Development: 3D-Nanostructure Ultrathin-Layer Birefringence Imaging Chromatography
D. Peev, N. Kananizadeh, C. Rice, E. Pfaunmiller, S.R. Beeram, R. Korlacki, Y. Li, E. Schubert, M. Schubert, D. Hage, and T. Hofmann
EPSCoR External Review Panel, Lincoln, NE, August 19 (2014)


    216. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
EPSCoR External Review Panel, Lincoln, NE, August (2014)


    215. In-Situ Generalized Ellipsometry Characterization of Nanostructured Silicon during Lithium-ion Intercalation
D. Sekora, R. L. Y. Lai, T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
61st AVS Symposium, Baltimore, Maryland, November (2014)


    214. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I.G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
4th Graphene, Toulouse, France, May (2014)


    213. Spectroscopic Ellipsometry FT Student award winner
Vector Magneto-Optical Generalized Ellipsometry on Sculptured Thin Films with Forward Calculated Uniaxial Response Simulation

C. Briley, T. Hofmann, D. Schmidt, E. Schubert, and M. Schubert
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    212. Dielectric Tensor Model for Inter Landau-level Transitions in Highly Oriented Pyrolytic Graphite and Epitaxial Graphene – Symmetry Properties, Energy Conservation and Plasma Coupling
P. Kühne, T. Hofmann, M. Schubert, C.M. Herzinger, and V. Darakchieva
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    211. The Development Of Highly-Oriented 3D Nanostructures For Use With Ultra-Thin Layer Chromatography And Ellipsometry
Erika L. Pfaunmiller, Sandya Beeram, C. Rice, D. Peev, T. Hofmann, M. Schubert, and D. S. Hage
AVS 61st International Symposium and Exhibition (AVS-61), Baltimoe, MA, November (2014)


    210. Improved Design for Highly Efficient Hybrid Photovoltaic Devices
Alyssa Mock, Cesar Rodriquez, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August (2014)


    209. Low Temperature Atomic Layer Deposition and RF Magnetron Sputtering of ZnO for use as Transparent Conductive Oxides
Cesar Rodriguez, Alyssa Mock, T. Hofmann, E. Schubert, and M. Schubert
EPSCoR External Review Panel Visit, Lincoln, NE, August (2014)


    208. Infrared optical Hall effect in epitaxial graphene on 3C- and 4H-SiC
V. Stanishev, P. Kühne, T. Hofmann, M. Schubert, A. Zakharov, T. Iakimov, J. ul Hassan, E. Janzén, R. Yakimova, and V. Darakchieva
Graphene 2014, Lanzarote, Spain, February 18 – 21 (2014)


    207. Shedding light on the nature of epitaxial graphene on C-face SiC
V. Darakchieva, P. Kühne, V. Stanishev, I. G. Ivanov, C. Bouhafs, T. Iakimov, A. Zakharov, T. Hofmann, M. Schubert, and R. Yakimova
International Conference on Nanoscience + Technology , Veil, Colorado, July (2014)


    206. Infrared Optical Hall effect in epitaxial graphene
V. Darakchieva, V. Stanishev, I. G. Ivanov, A. Zakharov, T. Iakimov, R. Yakimova, P. Kühne, M. Schubert, and T. Hofmann
Graphene week, Gothenburg, Sweden, June 23-27 (2014)


    205. Adaptive Optics
S. Knight, C. Rice, T. Hofmann, E. Schubert, and M. Schubert
J.A. Woollam Symposium, Lincoln, NE, June (2014)


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2013:

    204. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    203. Poster Award Winner
Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations

S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzen, N.B. Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann
UNL Graduate Research Fair and Symposium, Lincoln, Nebraska, April (2013)


    202. Invited
Periodic nanostructured thin films

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
2013 MRS Fall Meeting, Boston, MA, December (2013)


    201. Talk
Detection of temperature dependent electron confinement in AlGaN/GaN heterostructures by THz optical Hall-effect measurements

T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva
ICSE-VI, Kyoto, Japan, May (2013)


    200. Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide
P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C. R. Eddy, Jr., D. K. Gaskill, M. Schubert, and T. Hofmann
ICSE-VI, Kyoto, Japan, May (2013)


    199. Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on SiC: Influence of Growth, SiC Polymorph, and H-Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, V. Darakchieva, R. Yakimova, and M. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    198. THz dielectric anisotropy of metal slanted columnar thin films: Ellipsometric characterization and Sensor applications
T. Hofmann, D. Schmidt, P. Kühne, C. M. Herzinger, J. A. Woollam, M. Schubert, and E. Schubert
ICSE-VI, Kyoto, Japan, May (2013)


    197. Talk
Recent progress in understanding free-charge carrier and structural properties of InN:Mg

M.-Y. Xie, S. Schöche, N. Ben Sedrine, F. Tasnadi, B. Monemar, T. Hofmann, M. Schubert, X. Wang, A. Yoshikawa, K. Wang, Y. Nanishi, and V. Darakchieva
E-MRS 2013 SPRING MEETING, Strasbourg, France, May (2013)


    196. Talk
Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    195. Invited
Materials Characterization using THz Ellipsometry and THz Optical Hall Effect

T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    194. Talk
Direct Band Structure Based Modeling of Graphene: from the THz to the UV

A. Boosalis, W. Li, N. Nguyen, M. Real, R. Elmquist, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, R. Myers-Ward, V. Wheeler, C. Eddy, D. Gaskill, M. Schubert, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    193. Talk
Optical Hall effect – Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC

P. Kühne, M. Schubert, V. Darakchieva, R. Yakimova, D.K. Gaskill, R.L. Myers-Ward, C.R. Eddy Jr., J.D. Tedesco, C.M. Herzinger, J.A. Woollam, and T. Hofmann
AVS 60th Annual International Symposium, Long Beach, CA, October (2013)


    192. Optical Properties of Graphene-Coated Cobalt GLAD Structures
P. Wilson, D. Schmidt, E. Schubert, M. Schubert, T. Hofmann, and A. Sinitskii1
2013 MRS Fall Meeting, Boston, MA, November (2013)


    191. Invited
Infrared spectroscopic ellipsometry characterization of complex wide-bandgap semiconductor heterostructures

T. Hofmann
Physics Colloquium, New Mexico State University, Las Cruces, NM, December (2013)


    190. In-situ Quantification of Cetyltrimethylammonium Bromide Adsorption Within Metal Nanorod Arrays by Generalized Transmission Ellipsometry
C. Rice, T. Hofmann, K.B. Rodenhausen, D. Sekora, D. Schmidt, E. Pfaunmiller, D. Hage, E. Schubert, and M. Schubert
23rd National NSF EPSCoR Conference, Nashville, TN, November (2013)


    189. ALD von dünnen, konformen Metall- und Metalloxidschichten an GLAD Dünnfilmen
M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, Marcel Junige, and Johann W. Bartha
XX. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Vogtland, Germany, March (2013)


    188. Invited Institute Colloquium
The Optical Hall effect in epitaxial graphene and semiconductor heterostructures

M. Schubert, and T. Hofmann
College of Nanoscale Science, Center for Nanoscale Metrology, SUNY at Albany, Albany, NY, October (2013)


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2012:

    187. Metal slanted columnar thin film THz optical sensors
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C.M. Herzinger, J.A. Woollam, E. Schubert, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    186. The Optical-Hall Effect
P. Kühne, T. Hofmann, A. Boosalis, S. Schöche, D. Schmidt, C. M. Herzinger, J.A. Woollam, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    185. Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
7th Workshop Ellipsometry, Leipzig, Germany, March (2012)


    184. Poster Award Winner
Spectroscopic Ellipsometry and optical Hall-Effect study of free-charge carriers in InN:Mg - Indications for successful p-type doping

S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert
UNL Graduate Research Fair and Symposium, Lincoln, NE, April (2012)


    183. Invited
Terahertz Ellipsometry Materials Characterization

T. Hofmann
39th ICMCTF, San Diego, CA, April (2012)


    182. Spectroscopic Ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg - Indications for succesful p-type doping
S. Schöche, T. Hofmann, V. Darakchieva, N.B. Sedrine, X.~Wang, A. Yoshikawa, and M. Schubert
International Workshop on Nitride Semiconductors 2012, Sapporo, Japan, October (2012)


    181. Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications

T. Hofmann
E-MRS Spring Meeting, Strasbourg, France, May (2012)


    180. Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications

T. Hofmann
J. Kepler University, Linz, May (2012)


    179. Fano Interference Effects in Hydrogen Intercalated Graphene
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, and M. Schubert
AVS 59th International Symposium, Tampa, FL, October (2012)


    178. Changes in Graphene Optical Properties Induced by Hydrogen Intercalation
A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November (2012)


    177. Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
2012 MRS Fall Meeting, Boston, MA, November (2012)


    176. Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered 3-D nanohybrid materials thin films

M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, K. Rodenhausen, and J. Gerasimov
Leibniz Institute for Surface Modification - Erfahrungsaustausch: Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, Mühlleithen/Erzgebirge, March (2012)


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2011:

    175. Talk
Hole-channel conductivity in epitaxial graphene determined by terahertz optical Hall-effect and midinfrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
APS, Dallas, March (2011)


    174. Talk
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
APS, Dallas, March (2011)


    173. Talk
Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films

D. Schmidt, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert
APS, Dallas, March (2011)


    172. THz optical Hall effect in multi valley band materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger, and M. Schubert
6th Workshop Ellipsometry, Berlin, Feb (2011)


    171. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
6th Workshop Ellipsometry, Berlin Germany, February (2011)


    170. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
6th Workshop Ellipsometry, Berlin Germany, February (2011)


    169. Talk
THz Optical Hall Effect in Epitaxial Graphene

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
NCMN Grapnene Colloquium, Lincoln, NE, March (2011)


    168. Poster Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures

S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
UNL Graduate Research Symposium, Lincoln, NE, April (2011)


    167. Outstanding Presentation Award
Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic, ultra-thin films

K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, T. Hofmann, A. K. Pannier, R. Y. Lai, T. E. Tiwald, and M. Schubert
UNL E-Week Graduate Student Research Symposium, Lincoln, NE, April (2011)


    166. Talk
THz dielectric anisotropy of metal slanted columnar thin films

T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    165. Optical properties of graphene on SiC polytypes determined by spectroscopic ellipsometry from the terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
Nano-DDS, New York, NY, August (2011)


    164. Optical Properties of Graphene on SiC polytypes Determined by Spectroscopic Ellipsometry
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
International conference on SiC and related materials, Cleveland,OH, September (2011)


    163. Talk
Optical Properties of Graphene on MgO and SiC Polytypes Determined by Spectroscopic Ellipsometry

A. Boosalis, T. Hofmann, S. Schöche, P.A. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, D.K. Gaskill, and M. Schubert
AVS 58th International Symposium, Nashville, TN, October (2011)


    162. Applied Surface Science Division Student Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures

S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann
AVS 58th International Symposium, Nashville, TN, October (2011)


    161. Spectroscopic Ellipsometry and Optical Hall-Effect Studies of Free-Charge Carriers in P-Type InN:Mg.
S. Schöche, T. Hofmann, N.B. Sedrine, V. Darakchieva, B. Monemar, X.~Wang, A. Yoshikawa, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    160. Optical Properties of Graphene on Multiple Substrates Determined by Spectroscopic Ellipsometry from the Terahertz to the VUV
A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, R. Yakimova, V. Darakchieva, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, D. K. Gaskill, and M. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    159. THz Dielectric Anisotropy of Metal Slanted Columnar Thin Films
T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert
2011 MRS Fall Meeting, Boston, MA, November (2011)


    158. Invited
Epitaxial graphene grown by high temperature sublimation

R. Yakimova, V. Darakchieva, R. Yazdi, J. Jenssen, A. Boosalis, T. Hofmann, and M. Schubert
3rd International Symposium on the Science and Technology of Epitaxial Graphene, St. Augustine, FL, October (2011)


    157. Talk
Application of spectroscopic ellipsometry techniques to the studies of epitaxial graphene grown by high-temperature sublimation

V. Darakchieva, A. Boosalis, T. Hofmann, M. Schubert, T. Iakimov, and R. Yakimova
Workshop for Graphene Synthesis and Characterisation for Applications, Lake Windermere, UK, November (2011)


    156. THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in a HfO2 passivated AlGaN/GaN HEMT structure
S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann
9th International Conference on Nitride Semiconductors (ICNS-IV), Glasgow, Scotland, July (2011)


    155. Invited Institute Seminar
The Optical Hall-effect in semiconductor heterostructures

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, C.M. Herzinger, J.A. Woollam, V. Darakchieva, and B. Monemar
United States Department of Engery - Sandia National Laboratories, Albuquerque, New Mexico, March (2011)


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2010:

    154. Invited
Optical Coatings from Sculptured Thin Films: Art and Promise

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, and M. Schubert
SVC 2010, Orlando, FL, April (2010)


    153. Spectroscopic Ellipsometry for Metamaterials by Glancing Angle Deposition
D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    152. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    151. Research Presentation Winner "Best of Show"
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, M. Schubert, and E. Schubert
E-Week, Lincoln, NE, April (2010)


    150. Optical Properties of Hybridized Nanostructures
D. Schmidt, C. Müller, K. B. Rodenhausen, T. Hofmann, O. Inganäs, E. Schubert, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    149. Free-Charge Carrier Profiles of Iso- and Aniso-type Si Homojunctions
A. Boosalis, T. Hofmann, J. Sik, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    148. Free-charge carrier properties of graphene layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    147. THz optical Hall effect in multivalley band materials
P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    146. Temperature dependent dielectric function of Al0.52In0.48P and Ga0.52In0.48P
E. Montgomery, M. Schubert, T. Hofmann, C. Krahmer, and K. Streubel
ICSE-V, Albany, NY, May (2010)


    145. Monitoring Protein Deposition on Self-Assembled Monolayers of Alkanethiols on Gold in-situ With Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    144. Micelle-Assisted Bilayer Formation of CTAB Thin Films Studied with Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Techniques
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    143. Spectroscopic Ellipsometry Analysis of Silicon Nitride Thin Films on Textured Silicon for Solar Cells
M. F. Saenger, C. M. Herzinger, M. Schädel, J. Hilfiker, J. Sun, T. Hofmann, M. Schubert, and J. A. Woollam
ICSE-V, Albany, NY, May (2010)


    142. Invited
Terahertz Ellipsometry

T. Hofmann, C.M. Herzinger, and M.Schubert
ICSE-V, Albany, NY, May (2010)


    141. Talk
The influence of the SiC substrate on the free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry and optical Hall-effect

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ISSSR, Springfield, MO, June (2010)


    140. Free-Charge Carrier Properties of Graphene Layers on SiC
T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    139. Free-Charge Carrier Profiles of Iso- and Anisotype Si Homojunctions
A. Boosalis, T. Hofmann, J. Šik, and M. Schubert
ICSE-V, Albany, NY, May (2010)


    138. Applied Surface Science Division Student Award Winner
Agent-Free Bio-Chemical Sensing With Sculptured Thin Films

D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, E. Schubert, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    137. Talk
Optical, Magnetic, Magneto-Optical and Electrochemical Properties of Sculptured Thin Films

E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, E. Montgomery, S. Schöche, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    136. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
ICSE-V, Albany, NY, May (2010)


    135. In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films
E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    134. Talk
Free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry

T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
AVS 57th International Symposium, Albuquerque, NM, October (2010)


    133. Free-charge Carrier Properties of Epitaxial Graphene Grown on SiC Investigated by THz and Infrared Ellipsometry and THz Optical-hall Effect.
T. Hofmann, A. Boosalis, J. T. Tedesco, R. L. Myers-Ward, P. M. Campbell, C. R. Eddy, D. K. Gaskill, V. Shields, S. Shivaraman, M. G. Spencer, W. J. Schaff, and M. Schubert
MRS Fall Meeting, Boston, December (2010)


    132. Talk
Combinatorial SE/QCM-D Approach for Studying Porous Organic Ultra-thin Film Evolution

K. B. Rodenhausen, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, M. Solinsky, and M. Wagner
MRS Fall Meeting, Boston, MA, December (2010)


    131. THz Optical Hall-Effect in Multi-Valley Band Materials
P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-Week, Lincoln, April (2010)


    130. Invited
Generalized THz Ellipsometry characterization of novel materials towards THz electronics

M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, and W.J. Schaff
THz Workshop and User Meeting, BESSY-II, Berlin, GE, December (2010)


    129. Talk
Development of Combinatorial, in-situ Spectroscopic Ellipsometry and Quartz Crystal Microbalance

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
ICSE-V, Albany, NY, May (2010)


    128. Talk
THz Optical Hall-Effect in Multi-Valley Band Materials

P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert
E-week, Lincoln, April (2010)


    127. Invited
Terahertz Ellipsometry materials characterization

T. Hofmann
IFM colloquium, Linköping, Sweden, December (2010)


    126. The corrugated interface strain coupled magnetostrictive-ferroelectric piezoelectric semiconductor device
V. M. Voora, T. Hofmann, and M. Schubert
Nebraska MRSEC Symposium, Lincoln, NE, October (2010)


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2009:

    125. Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
5th Workshop Ellipsometry, Zweibrucken, March (2009)


    124. Monoclinic Optical Properties of Slanted Columnar Thin Films
D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    123. Talk
Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
ICMCTF 2009, San Diego, CA, April (2009)


    122. THz Ellipsometry Materials Characterization
T. Hofmann, C.M. Herzinger, and M. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    121. IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    120. Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert
5th Workshop Ellipsometry, Zweibrücken, Germany, March (2009)


    119. Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Graduate Student Poster Session, UNL, NE, April (2009)


    118. Materials Characterization using THz Ellipsometry.
T. Hofmann, M. Schubert, and C. M. Herzinger
MRS Spring Meeting, San Francisco, April (2009)


    117. Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
51st Electronic Materials Conference, University Park, Pennsylvania, June (2009)


    116. Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films

D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    115. Research Presentation Winner
Optical and Structural Properties of Sculptured Thin Films

D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
E-Week, UNL, NE, April (2009)


    114. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
MRS Fall Meeting, Boston, MA, November (2009)


    113. Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates

D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    112. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M. Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
3rd South African Conference on Photonic Materials, Mabula, South Africa, March (2009)


    111. Role of impurities and dislocations for the unintentional n-type conductivity in InN
V. Darakchieva, N. P. Barradas, M.-Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff
E-MRS Spring Meeting, Strasbourg, France, June (2009)


    110. Influence of defects, dopants and surface orientation on free carrier properties of InN
V. Darakchieva, M. Schubert, K. Lorenz, E. Alves, M.-Y. Xie, T. Hofmann, W. J. Schaff, L. C. Chen, L. W. Tu, and Y. Nanishi
MRS Fall Meeting, Boston, USA, December (2009)


    109. Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
F. Saenger, C. M. Herzinger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, USA, December (2009)


    108. ZnO-BaTiO3-ZnO: Unipolar ferroelectric transistor structures with spontaneous interface charge coupling for non-volatile switching applications
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
MRS Fall Meeting, Boston, USA, December (2009)


    107. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry
K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E.Tiwald, M. Solinsky, and M. Wagner
AVS 56th International Symposium, San Jose, CA, November (2009)


    106. Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry
T. Hofmann, C. M. Herzinger, J. A. Woollam, and M. Schubert
AVS 56th International Symposium, San Jose, CA, November (2009)


    105. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
NSF-MRSEC QSPIN Symposium, Lincoln, NE, October (2009)


    104. Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry

M. Schubert, E. Schubert, and T. Hofmann
Nano-DDS Army Research Office conference, Fort Lauderdale, FL, October (2009)


    103. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
QCM-D Scientific Conference, USA, New York City Metro Area, NJ, November (2009)


    102. Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry

K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner
UNL SE/QCM-D Mini-Symposium, Lincoln, NE, November (2009)


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2008:

    101. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
M. Schubert, and T. Hofmann
American Physical Society Meeting, New Orleans, Lousiana, March (2008)


    100. Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann
2008 MRS Spring Meeting, San Francisco, March 25 (2008)


    99. THz resonances in chiral aluminum nanowires
T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert
2008 MRS Spring Meeting, San Francisco, March (2008)


    98. Poster Award Winner
THz Resonances in Chiral Aluminum Nanowires

D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    97. Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT
M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    96. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures.
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
E-Week Graduate Poster Session, Lincoln, NE, April 25 (2008)


    95. Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
Brookhaven National Laboratory NSLS-CFN User Meeting, Brookhaven, May (2008)


    94. Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
The 5th International Workshop on ZnO and Related Materials, Michigan, USA, September (2008)


    93. Talk
Hybrid Nanocoil Sculptured Thin Films

D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert
2008 MRS Fall Meeting, Boston, MA, December (2008)


    92. Talk
Sculptured Thin Films from Aluminum

E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert
AVS 55th International Symposium, Boston, MA, October (2008)


    91. Talk
Magnetically Active Nanospirals

E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November (2008)


    90. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
MRS Fall Meeting, Boston, MA, December (2008)


    89. Magnetically induced optical chirality in ZnMnSe
M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert
53rd Magnetism and Magnetic Materials Conference, Austin, TX, November (2008)


    88. Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
MRS Fall Meeting, Boston, MA, December (2008)


    87. Terahertz Ellipsometry Using Electron-Beam Based Sources
T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, (2008)


    86. Terahertz Ellipsometry Materials Characterization
M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger
ISSSR, Hoboken, NJ, June (2008)


    85. International Conference on Electronic Materials
V. Darakchieva, T. Hofmann, and M. SChubert
IUMRS-ICEM08, Sydney, Australia, (2008)


    84. Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures
T. Hofmann, and M. Schubert
APS Spring Meeting, Denver, (2008)


    83. Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature
M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert
53rd Annual Conference on Magnetism and Magnetic Materials, Austin, TX, November (2008)


    82. Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry
A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert
MRS Fall Meeting, Boston, MA, December (2008)


    81. THz Resonances in Chiral Al Nanowires
E. Schubert, T. Hofmann, and M. Schubert
ISSSR, Hoboken, NJ, June (2008)


    80. Invited Industry Seminar
Terahertz Ellipsometry Materials Characterization

M. Schubert, T. Hofmann, and C. M. Herzinger
Bruker GmbH, Leipzig, August (2008)


    79. Invited Department Seminar
Optical Hall effect in semiconductor heterostructures

T. Hofmann, and M. Schubert
Department of Physics, ETH Zurich, Zurich, Switzerland, September (2008)


    78. Invited Industry Seminar
Optical Hall effect in semiconductor heterostructures

M. Schubert, T. Hofmann, and C. M. Herzinger
Freiberger Compound Materials GmbH, Freiberg, Sachsen, August (2008)


    77. Invited Institute Colloquium
Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency

M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger
National Renewable Energy Laboratory (NREL), Golden, Colorado, June (2008)


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2007:

    76. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    75. ICSE4 Poster Award Winner
The optical-Hall effect

T. Hofmann, and M.Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    74. Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters
M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    73. Surface electron accumulation and effective mass anisotropy in wurtzite structure InN
T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    72. Terahertz ellipsometry using electron-beam based sources
T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    71. Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
T. Hofmann, C. von Middendorff, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, June (2007)


    70. Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach
V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    69. Poster Award Winner
Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P

E. Montgomery, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, October (2007)


    68. Dielectric and magnetic birefringence in Zn1-xMnxSe
M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert
54th Midwest Solid State Conference, Lincoln, NE, October (2007)


    67. THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters
M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
TMS 2007 Electronic Materials Conference, Notre Dame, IN, June (2007)


    66. Polaron-phonon interaction in charge intercalated tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
4th International Conference on Spectroscopic Ellipsometry, Stockholm, June (2007)


    65. Invited
Terahertz magnetooptic ellipsometry

T. Hofmann
4th International Conference on Spectroscopic Ellipsometry, Stockholm, March (2007)


    64. The optical-Hall effect in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert
Electronic Materials Conference, Notre Dame, June (2007)


    63. Polaron and phonon properties in WO3 thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    62. Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry
M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth, M. Grundmann, T. Hofmann, and and M. Schubert
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    61. Phonon and polaron properties of charge intercalated WO3
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, CA, August (2007)


    60. Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
International Workshop on Synthesis of Functional Oxide Materials, Santa Barbara, August (2007)


    59. Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates
L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou
71. German Physical Society Spring Meeting, Regensburg, March (2007)


    58. Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach
V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Notre Dame, June (2007)


    57. Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN: Evidence for a New Defect-Related Doping Mechanism
T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert
7th Int'l Conference of Nitride Semiconductors, Las Vegas, September (2007)


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2006:

    56. Anisotropy of the &Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
70. German Physical Society Spring Meeting, Dresden, March (2006)


    55. Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert
70. German Physical Society Spring Meeting, Dresden, March (2006)


    54. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June (2006)


    53. Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry
T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert
Electronic Materials Conference, Pennsylvania State University, June (2006)


    52. Conduction band effective mass anisotropy and nonparabolicity of InN
V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar
3. Workshop on Indium Nitride, Brazil, November (2006)


    51. Teraherz generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Photonics West 2006, San Jose, January (2006)


    50. Terahertz Ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February (2006)


    49. Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures
M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann
Electronic Materials Conference, Pennsylvania State University, Pennsylvania, June (2006)


    48. Teraherz magnetooptic generalized Mueller-matrix ellipsometry
T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert
Spring MRS Meeting Symposium K: Materials Research for THz Applications, San Francisco, April (2006)


    47. Anisotropy of the G-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert
4. Workshop "Ellipsometrie", Berlin, February (2006)


    46. Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
German Physical Society Spring Meeting, Dresden, March (2006)


    45. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
German Physical Society Spring Meeting, Dresden, March (2006)


    44. Optical properties of colored tungsten oxide sputtered thin films
M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert
4th Ellipsometry Workshop, Berlin, February (2006)


    43. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert
28th International Conference on the Physics of Semiconductors, Vienna, Austria, July 24-28 (2006)


    42. Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN
T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert
ICPS, , July (2006)


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2005:

    41. Anisotropy of the Gamma-point electron effective mass in hexagonal InN
T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert
6. Int. Conf. on Nitride Semiconductor Research, Bremen, Germany, August (2005)


    40. Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems
M. Schubert, T. Hofmann, and U. Schade
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June (2005)


    39. The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite
T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov
International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, Rathen, Germany, June (2005)


    38. Optische in-situ und in-line Charakterisierung funktioneller Schichten
M. Schubert, C. Bundesmann, T. Hofmann, and et al.
Advanced Process Control for future oriented manufacturing Workshop, FEP Dresden, September (2005)


    37. Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry
T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March (2005)


    36. Phonon and free-charge-carrier properties in ZnMnSe
T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert
69. German Physical Society Spring Meeting, Berlin, March (2005)


    35. Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen
C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert
TCOs für Dünnschichtsolarzellen und andere Anwendungen, Freyburg, April (2005)


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2004:

    34. Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2004)


    33. Invited
Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen

M. Schubert, and T. Hofmann
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    32. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
3. Workshop "Ellipsometrie", Stuttgart, February (2004)


    31. Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry
C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2004)


    30. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner
German Physical Society Spring Meeting, Regensburg, March (2004)


    29. The inertial-mass scale for free charge carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, and C. v. Middendorf
27th International Conference on the Physics of Semiconductors, Flagstaff, July (2004)


    28. Invited
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures

M. Schubert, and T. Hofmann
International Conference on Low Energy Electrodynamics of Solids LEES 04, Kloster Banz, July (2004)


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2003:

    27. Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP
T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka
German Physical Society Spring Meeting, Dresden, March (2003)


    26. Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    25. Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, and V. Gottschalch
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    24. Invited
Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films

M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann
Optical System Design 2003, St. Etienne, France, September (2003)


    23. Invited
Generalized magneto-optic ellipsometry

M. Schubert, T. Hofmann, and C. M. Herzinger
3. International Conference on Spectroscopic Ellipsometry, Vienna, July (2003)


    22. Invited Department Seminar
Ellipsometrie und Raman an ZnO Dünnschichten

C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert
Nukleare Festkörperphysik, University Leipzig, Leipzig, April (2003)


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2002:

    21. Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P
T. Hofmann, V. Gottschalch, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2002)


    20. Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen
T. Hofmann, M. Schubert, and C. M. Herzinger
German Physical Society Spring Meeting, Regensburg, March (2002)


    19. Invited
Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures

M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann
2. Workshop "Ellipsometrie", Berlin, Februar (2002)


    18. IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann
2. Workshop "Ellipsometrie", Berlin, Februar (2002)


    17. Invited
Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures

M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle U.S.A., July (2002)


    16. Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, Seattle, U.S.A., July (2002)


    15. Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann
26. International Conference on the Physics of Semiconductors, Edinburgh, GB, July (2002)


    14. Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December (2002)


    13. Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures
T. Hofmann, C. M. Herzinger, and M. Schubert
Materials Research Society Fall Meeting, Boston, U.S.A, December (2002)


    12. Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures
M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger
L.O.T.-Seminar, Darmstadt, October (2002)


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2001:

    11. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March (2001)


    10. Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie
T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch
German Physical Society Spring Meeting, Hamburg, March (2001)


    9. Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP
J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch
Spring European MRS-Meeting, Strasbourg, France, June (2001)


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2000:

    8. Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen
T. Hofmann, and M. Schubert
German Physical Society Spring Meeting, Regensburg, March (2000)


    7. Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen
T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March (2000)


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1999:

    6. Near-band-gap CuPt order-birefringence in AlxGa1-xInP2
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1999)


    5. Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2
T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch
German Physical Society Spring Meeting, Münster, March (1999)


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1998:

    4. Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch
German Physical Society Spring Meeting, Regensburg, March (1998)


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generated using Sembib V0.1 © T. Hofmann (2003) last database entry from 2017-10-21