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Conferences
2011
2010
2009
2008
2007
2006
2005
2004
2003
2002
2001
2000
1999
1998
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2013: |
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251. S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert, "Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping
", ICSE-VI, May (2013)
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250. S. Schöche, V. Darakchieva, P. Kühne, J.-T. Chen, U. Forsberg, E. Janzen, N.B. Sedrine, C.M. Herzinger, J.A. Woollam, M. Schubert, and T. Hofmann, " Poster Award Winner
Identification of scattering mechanisms in MOCVD-grown AlGaN/GaN high electron-mobility transistors by temperature-dependent THz optical Hall-effect and comparison with mobility calculations", UNL Graduate Research Fair and Symposium, April (2013)
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249. E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert, "Invited
Periodic nanostructured thin films", 2013 MRS Fall Meeting, December (2013)
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248. T. Hofmann, P. Kühne, S. Schöche, Jr.-Tai Chen, U. Forsberg, E. Janzen, N. Ben Sedrine, C. M. Herzinger, J. A. Woollam, M. Schubert, and V. Darakchieva, "Talk
Detection of temperature dependent electron confinement in AlGaN/GaN heterostructures by THz optical Hall-effect measurements", ICSE-VI, May (2013)
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| 247. P. Kühne, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C. R. Eddy, Jr., D. K. Gaskill, M. Schubert, and T. Hofmann, "Reflection-type optical-Hall effect measurement of Landau-level transitions in epitaxial graphene on silicon carbide", ICSE-VI, May (2013)
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| 246. A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, V. Darakchieva, R. Yakimova, and M. Schubert, "Visible to Vacuum Ultraviolet Dielectric Functions of Epitaxial Graphene on SiC: Influence of Growth, SiC Polymorph, and H-Intercalation", ICSE-VI, May (2013)
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| 245. T. Hofmann, D. Schmidt, P. Kühne, C. M. Herzinger, J. A. Woollam, M. Schubert, and E. Schubert, "THz dielectric anisotropy of metal slanted columnar thin films: Ellipsometric characterization and Sensor applications", ICSE-VI, May (2013)
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244. M.-Y. Xie, S. Schöche, N. Ben Sedrine, F. Tasnadi, B. Monemar, T. Hofmann, M. Schubert, X. Wang, A. Yoshikawa, K. Wang, Y. Nanishi, and V. Darakchieva
, "Talk
Recent progress in understanding free-charge carrier and structural properties of InN:Mg
", E-MRS 2013 SPRING MEETING, May (2013)
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243. D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert, "Talk
Anisoptropic Bruggeman Effective Medium Approaches for Slanted Columnar Thin Films", AVS 60th Annual International Symposium, October (2013)
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242. T. Hofmann, "Invited
Materials Characterization using THz Ellipsometry and THz Optical Hall Effect
", AVS 60th Annual International Symposium, October (2013)
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241. A. Boosalis, W. Li, N. Nguyen, M. Real, R. Elmquist, V. Darakchieva, R. Yakimova, R. Synowicki, T. Tiwald, R. Myers-Ward, V. Wheeler, C. Eddy, D. Gaskill, M. Schubert, and T. Hofmann, "Talk
Direct Band Structure Based Modeling of Graphene: from the THz to the UV", AVS 60th Annual International Symposium, October (2013)
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240. P. Kühne, M. Schubert, V. Darakchieva, R. Yakimova, D.K. Gaskill, R.L. Myers-Ward, C.R. Eddy Jr., J.D. Tedesco, C.M. Herzinger, J.A. Woollam, and T. Hofmann
, "Talk
Optical Hall effect – Detection of Symmetric and Anti-Symmetric Landau-Level Transitions in Multilayer Epitaxial Graphene on C-face SiC", AVS 60th Annual International Symposium, October (2013)
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| 239. P. Wilson, D. Schmidt, E. Schubert, M. Schubert, T. Hofmann, and A. Sinitskii1
, "Optical Properties of Graphene-Coated Cobalt GLAD Structures
", 2013 MRS Fall Meeting, November (2013)
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238. T. Hofmann, "Invited
Infrared spectroscopic ellipsometry characterization of complex wide-bandgap semiconductor heterostructures
", Physics Colloquium, New Mexico State University, December (2013)
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| 237. C. Rice, T. Hofmann, K.B. Rodenhausen, D. Sekora, D. Schmidt, E. Pfaunmiller, D. Hage, E. Schubert, and M. Schubert, "In-situ Quantification of Cetyltrimethylammonium Bromide Adsorption Within Metal Nanorod Arrays by Generalized Transmission Ellipsometry
", 23rd National NSF EPSCoR Conference, November (2013)
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| 236. M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, Marcel Junige, and Johann W. Bartha, "ALD von dünnen, konformen Metall- und Metalloxidschichten an GLAD Dünnfilmen", XX. Erfahrungsaustausch Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, March (2013)
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235. M. Schubert, and T. Hofmann, "Invited Institute Colloquium
The Optical Hall effect in epitaxial graphene and semiconductor heterostructures", College of Nanoscale Science, Center for Nanoscale Metrology, SUNY at Albany, October (2013)
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2012: |
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| 234. T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, C.M. Herzinger, J.A. Woollam, E. Schubert, and M. Schubert, "Metal slanted columnar thin film THz optical sensors", 7th Workshop Ellipsometry, March (2012)
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| 233. P. Kühne, T. Hofmann, A. Boosalis, S. Schöche, D. Schmidt, C. M. Herzinger, J.A. Woollam, and M. Schubert, "The Optical-Hall Effect", 7th Workshop Ellipsometry, March (2012)
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232. S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert, "Talk
Spectroscopic ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg – Indications for successful p-type doping", 7th Workshop Ellipsometry, March (2012)
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231. S. Schöche, T. Hofmann, V. Darakchieva, N. Ben Sedrine, X. Wang, A. Yoshikawa, and M. Schubert, " Poster Award Winner
Spectroscopic Ellipsometry and optical Hall-Effect study of free-charge carriers in InN:Mg - Indications for successful p-type doping", UNL Graduate Research Fair and Symposium, April (2012)
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230. T. Hofmann, "Invited
Terahertz Ellipsometry Materials Characterization", 39th ICMCTF, April (2012)
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| 229. S. Schöche, T. Hofmann, V. Darakchieva, N.B. Sedrine, X.~Wang, A. Yoshikawa, and M. Schubert, "Spectroscopic Ellipsometry and optical Hall-effect study of free-charge carrier parameters in InN:Mg - Indications for succesful p-type doping", International Workshop on Nitride Semiconductors 2012, October (2012)
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228. T. Hofmann, "Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications
", E-MRS Spring Meeting, May (2012)
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227. T. Hofmann, "Invited
Terahertz Ellipsometry: Materials Characterization and Thin Film Optical Sensor Applications
", J. Kepler University, May (2012)
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| 226. A. Boosalis, T. Hofmann, R. Elmquist, M. Real, and M. Schubert, "Fano Interference Effects in Hydrogen Intercalated Graphene", AVS 59th International Symposium, October (2012)
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| 225. A. Boosalis, T. Hofmann, R. Elmquist, M. Real, N. Nguyen, and M. Schubert, "Changes in Graphene Optical Properties Induced by Hydrogen Intercalation", 2012 MRS Fall Meeting, November (2012)
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| 224. P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert, "Optical Hall effect measurement of coupled phonon mode - Landau Level transitions in epitaxial Graphene on silicon carbide", 2012 MRS Fall Meeting, November (2012)
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223. M. Schubert, E. Schubert, D. Schmidt, T. Hofmann, K. Rodenhausen, and J. Gerasimov, "Invited
New chemical, biochemical and biological sensing and separation principles based on highly ordered 3-D nanohybrid materials thin films", Leibniz Institute for Surface Modification - Erfahrungsaustausch: Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen, March (2012)
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2011: |
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222. T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert, "Talk
Hole-channel conductivity in epitaxial graphene determined by terahertz optical Hall-effect and midinfrared ellipsometry", APS, March (2011)
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221. S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann, "Talk
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures", APS, March (2011)
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220. D. Schmidt, T. Hofmann, R. Skomski, E. Schubert, and M. Schubert, "Talk
Generalized Ellipsometry on Ferromagnetic Sculptured Thin Films", APS, March (2011)
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| 219. P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger, and M. Schubert, "THz optical Hall effect in multi valley band materials", 6th Workshop Ellipsometry, Feb (2011)
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| 218. T. Hofmann, A. Boosalis, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert, "Free-Charge Carrier Properties of Graphene Layers on SiC", 6th Workshop Ellipsometry, February (2011)
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| 217. S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann, "THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures
", 6th Workshop Ellipsometry, February (2011)
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216. T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, C.M. Herzinger, J.A. Woollam, and M. Schubert
, "Talk
THz Optical Hall Effect in Epitaxial Graphene
", NCMN Grapnene Colloquium, March (2011)
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215. S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann, " Poster Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in AlGaN/GaN HEMT structures", UNL Graduate Research Symposium, April (2011)
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214. K. B. Rodenhausen, T. Kasputis, J. Y. Gerasimov, H. Wang, T. Hofmann, A. K. Pannier, R. Y. Lai, T. E. Tiwald, and M. Schubert, "Outstanding Presentation Award
Hybrid in-situ spectroscopic ellipsometry and quartz crystal microbalance to study rigid, organic, ultra-thin films", UNL E-Week Graduate Student Research Symposium, April (2011)
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213. T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert, "Talk
THz dielectric anisotropy of metal slanted columnar thin films", AVS 58th International Symposium, October (2011)
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| 212. A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr.,
D.K. Gaskill, and M. Schubert, "Optical properties of graphene on SiC polytypes determined by spectroscopic ellipsometry from the terahertz to the VUV", Nano-DDS, August (2011)
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| 211. A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, R. Yakimova, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, Jr., D.K. Gaskill, and M. Schubert
, "Optical Properties of Graphene on SiC polytypes Determined by Spectroscopic Ellipsometry
", International conference on SiC and related materials, September (2011)
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210. A. Boosalis, T. Hofmann, S. Schöche, P.A. Dowben, S. Gaddam, C. Vamala, J. Kelber, V. Darakchieva, D.K. Gaskill, and M. Schubert, "Talk
Optical Properties of Graphene on MgO and SiC Polytypes Determined by Spectroscopic Ellipsometry", AVS 58th International Symposium, October (2011)
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209. S. Schöche, A. Boosalis, C.M. Herzinger, J.A. Woollam, J. Shi, W.J. Schaff, L.F. Eastman, M. Schubert, and T. Hofmann, "Applied Surface Science Division Student Award Winner
THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in HfO2 passivated AlGaN/GaN HEMT structures", AVS 58th International Symposium, October (2011)
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| 208. S. Schöche, T. Hofmann, N.B. Sedrine, V. Darakchieva, B. Monemar, X.~Wang, A. Yoshikawa, and M. Schubert, "Spectroscopic Ellipsometry and Optical Hall-Effect Studies of Free-Charge Carriers in P-Type InN:Mg.", 2011 MRS Fall Meeting, November (2011)
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| 207. A. Boosalis, T. Hofmann, S. Schöche, P. Dowben, S. Gaddam, C. Vamala, J. Kelber, R. Yakimova, V. Darakchieva, L.O. Nyakiti, V.D. Wheeler, R.L. Myers-Ward, C.R. Eddy, D. K. Gaskill, and M. Schubert, "Optical Properties of Graphene on Multiple Substrates Determined by Spectroscopic Ellipsometry from the Terahertz to the VUV", 2011 MRS Fall Meeting, November (2011)
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| 206. T. Hofmann, D. Schmidt, A. Boosalis, P. Kühne, R. Skomski, C.M. Herzinger, J.A. Woollam, M. Schubert, and E. Schubert, "THz Dielectric Anisotropy of Metal Slanted Columnar Thin Films", 2011 MRS Fall Meeting, November (2011)
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205. R. Yakimova, V. Darakchieva, R. Yazdi, J. Jenssen, A. Boosalis, T. Hofmann, and M. Schubert, "Invited
Epitaxial graphene grown by high temperature sublimation", 3rd International Symposium on the Science and Technology of Epitaxial Graphene, October (2011)
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204. V. Darakchieva, A. Boosalis, T. Hofmann, M. Schubert, T. Iakimov, and R. Yakimova, "Talk
Application of spectroscopic ellipsometry techniques to the studies of epitaxial graphene grown by high-temperature sublimation", Workshop for Graphene Synthesis and Characterisation for Applications, November (2011)
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| 203. S. Schöche, J. Shi, A. Boosalis, P. Kühne, C. M. Herzinger, J. A. Woollam, W. J. Schaff, L. F. Eastman, V. Darakchieva, M. Schubert, and T. Hofmann, "THz optical Hall-effect and MIR-VUV ellipsometry characterization of 2DEG properties in a HfO2 passivated AlGaN/GaN HEMT structure", 9th International Conference on Nitride Semiconductors (ICNS-IV), July (2011)
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202. M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, C.M. Herzinger, J.A. Woollam, V. Darakchieva, and B. Monemar, "Invited Institute Seminar
The Optical Hall-effect in semiconductor heterostructures", United States Department of Engery - Sandia National Laboratories, March (2011)
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2010: |
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201. E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, and M. Schubert, "Invited
Optical Coatings from Sculptured Thin Films: Art and Promise", SVC 2010, April (2010)
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| 200. D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert, "Spectroscopic Ellipsometry for Metamaterials by Glancing Angle Deposition", ICSE-V, May (2010)
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199. D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert
, "Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films", ICSE-V, May (2010)
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198. D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, M. Schubert, and E. Schubert, "Research Presentation Winner "Best of Show"
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films", E-Week, April (2010)
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| 197. D. Schmidt, C. Müller, K. B. Rodenhausen, T. Hofmann, O. Inganäs, E. Schubert, and M. Schubert, "Optical Properties of Hybridized Nanostructures", ICSE-V, May (2010)
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| 196. A. Boosalis, T. Hofmann, J. Sik, and M. Schubert, "Free-Charge Carrier Profiles of Iso- and Aniso-type Si Homojunctions", ICSE-V, May (2010)
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| 195. T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert, "Free-charge carrier properties of graphene layers on SiC", ICSE-V, May (2010)
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| 194. P. Kühne, T. Hofmann, A. Boosalis, C. M. Herzinger, and M. Schubert, "THz optical Hall effect in multivalley band materials", ICSE-V, May (2010)
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| 193. E. Montgomery, M. Schubert, T. Hofmann, C. Krahmer, and K. Streubel, "Temperature dependent dielectric function of Al0.52In0.48P and Ga0.52In0.48P", ICSE-V, May (2010)
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| 192. K. B. Rodenhausen, B. A. Duensing, A. K. Pannier, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner, "Monitoring Protein Deposition on Self-Assembled Monolayers of Alkanethiols on Gold in-situ With Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry", ICSE-V, May (2010)
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| 191. K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner, "Micelle-Assisted Bilayer Formation of CTAB Thin Films Studied with Combined Spectroscopic Ellipsometry and Quartz Crystal Microbalance Techniques", ICSE-V, May (2010)
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| 190. M. F. Saenger, C. M. Herzinger, M. Schädel, J. Hilfiker, J. Sun, T. Hofmann, M. Schubert, and J. A. Woollam, "Spectroscopic Ellipsometry Analysis of Silicon Nitride Thin Films on Textured Silicon for Solar Cells", ICSE-V, May (2010)
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189. T. Hofmann, C.M. Herzinger, and M.Schubert, "Invited
Terahertz Ellipsometry", ICSE-V, May (2010)
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188. T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert
, "Talk
The influence of the SiC substrate on the free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry and optical Hall-effect ", ISSSR, June (2010)
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| 187. T. Hofmann, A. Boosalis, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert, "Free-Charge Carrier Properties of Graphene Layers on SiC", ICSE-V, May (2010)
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| 186. A. Boosalis, T. Hofmann, J. Šik, and M. Schubert, "Free-Charge Carrier Profiles of Iso- and Anisotype Si Homojunctions", ICSE-V, May (2010)
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185. D. Schmidt, K. B. Rodenhausen, S. Schöche, T. Hofmann, E. Schubert, and M. Schubert, "Applied Surface Science Division Student Award Winner
Agent-Free Bio-Chemical Sensing With Sculptured Thin Films", AVS 57th International Symposium, October (2010)
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184. E. Schubert, D. Schmidt, T. Hofmann, A. C. Kjerstad, E. Montgomery, S. Schöche, and M. Schubert
, "Talk
Optical, Magnetic, Magneto-Optical and Electrochemical Properties of Sculptured Thin Films", AVS 57th International Symposium, October (2010)
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| 183. E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May, "In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films", ICSE-V, May (2010)
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| 182. E. Montgomery, M. Schubert, T. Hofmann, E. Schubert, D. Schmidt, C. Briley, and A. May, "In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructure Films", AVS 57th International Symposium, October (2010)
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181. T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, W.J. Schaff, and M. Schubert, "Talk
Free-charge carrier properties of epitaxial graphene by terahertz and infrared ellipsometry", AVS 57th International Symposium, October (2010)
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| 180. T. Hofmann, A. Boosalis, J. T. Tedesco, R. L. Myers-Ward, P. M. Campbell, C. R. Eddy, D. K. Gaskill, V. Shields, S. Shivaraman, M. G. Spencer, W. J. Schaff, and M. Schubert, " Free-charge Carrier Properties of Epitaxial Graphene Grown on SiC Investigated by THz and Infrared Ellipsometry and THz Optical-hall Effect.", MRS Fall Meeting, December (2010)
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179. K. B. Rodenhausen, T. Kasputis, A. K. Pannier, T. Hofmann, M. Schubert, M. Solinsky, and M. Wagner, "Talk
Combinatorial SE/QCM-D Approach for Studying Porous Organic Ultra-thin Film Evolution", MRS Fall Meeting, December (2010)
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| 178. P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert, "THz Optical Hall-Effect in Multi-Valley Band Materials", E-Week, April (2010)
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177. M. Schubert, T. Hofmann, A. Boosalis, P. Kühne, J.L. Tedesco, R.L. Myers-Ward, P.M. Campbell, C.R. Eddy Jr., D.K. Gaskill, V. Shields, S. Shivaraman, M.G. Spencer, and W.J. Schaff, "Invited
Generalized THz Ellipsometry characterization of novel materials towards THz electronics", THz Workshop and User Meeting, BESSY-II, December (2010)
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176. K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner, "Talk
Development of Combinatorial, in-situ Spectroscopic Ellipsometry and Quartz Crystal Microbalance", ICSE-V, May (2010)
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175. P. Kühne, T. Hofmann, A. Boosalis, C.M. Herzinger,, and M. Schubert, "Talk
THz Optical Hall-Effect in Multi-Valley Band Materials", E-week, April (2010)
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174. T. Hofmann, "Invited
Terahertz Ellipsometry materials characterization", IFM colloquium, December (2010)
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| 173. V. M. Voora, T. Hofmann, and M. Schubert, "The corrugated interface strain coupled magnetostrictive-ferroelectric piezoelectric semiconductor device", Nebraska MRSEC Symposium, October (2010)
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2009: |
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| 172. A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert, "Monitoring Organic Thin Film Growth and its Water Content With Combined Quartz Crystal Microbalance and Ellipsometry
", 5th Workshop Ellipsometry, March (2009)
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| 171. D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert, "Monoclinic Optical Properties of Slanted Columnar Thin Films", 5th Workshop Ellipsometry, March (2009)
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170. D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert, "Talk
Anisotropic Optical Properties of Sculptured Thin Films Grown by Glancing Angle Deposition", ICMCTF 2009, April (2009)
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| 169. T. Hofmann, C.M. Herzinger, and M. Schubert, "THz Ellipsometry Materials Characterization", 5th Workshop Ellipsometry, March (2009)
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| 168. M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. E. Tiwald, M. Schubert, and J. A. Woollam, "IR to UV ellipsometric characterization of silicon nitride thin films on textured Si wafers", 5th Workshop Ellipsometry, March (2009)
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| 167. A. C. Kjerstad, D. Schmidt, T. Hofmann, R. Skomski, M. Schubert, and E. Schubert, "Collective Magnetic Properties of GLAD Cobalt Needles and Nanocoils
", 5th Workshop Ellipsometry, March (2009)
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| 166. V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann, "Wurtzite-Perovskite-Wurtzite (ZnO-BaTiO3-ZnO) Interface Polarization Hysteresis Model", Graduate Student Poster Session, April (2009)
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| 165. T. Hofmann, M. Schubert, and C. M. Herzinger, "Materials Characterization using THz Ellipsometry.", MRS Spring Meeting, April (2009)
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| 164. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
, "Generalized physical model for ferroelectric properties of BaTiO3-ZnO, and ZnO-BaTiO3-ZnO thin films: Explanation for resistive switching properties.", 51st Electronic Materials Conference, June (2009)
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163. D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert, "Talk
Anisotropic Optical and Magneto-Optical Properties of Sculptured Thin Films", AVS 56th International Symposium, November (2009)
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162. D. Schmidt, B. Booso, T. Hofmann, A. Sarangan, E. Schubert, and M. Schubert
, "Research Presentation Winner
Optical and Structural Properties of Sculptured Thin Films", E-Week, April (2009)
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161. D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert, "Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates", MRS Fall Meeting, November (2009)
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160. D. Schmidt, T. Hofmann, E. Montgomery, B. Mbenkum, T. W. H. Oates, S. Facsko, A. Keller, M. Schubert, and E. Schubert, "Talk
Metal Sculptured Thin Films on Large-Scale Prepatterned Substrates", AVS 56th International Symposium, November (2009)
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| 159. V. Darakchieva, N. P. Barradas, M. Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff, "Role of impurities and dislocations for the unintentional n-type conductivity in InN", 3rd South African Conference on Photonic Materials, March (2009)
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| 158. V. Darakchieva, N. P. Barradas, M.-Y. Xie, K. Lorenz, E. Alves, M. Schubert, T. Hofmann, P.O.A. Persson, F. Giuliani, F. Munnik, C. L. Hsiao, L. W. Tu, and W. J. Schaff, "Role of impurities and dislocations for the unintentional n-type conductivity in InN", E-MRS Spring Meeting, June (2009)
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| 157. V. Darakchieva, M. Schubert, K. Lorenz, E. Alves, M.-Y. Xie, T. Hofmann, W. J. Schaff, L. C. Chen, L. W. Tu, and Y. Nanishi, "Influence of defects, dopants and surface orientation on free carrier properties of InN", MRS Fall Meeting, December (2009)
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| 156. F. Saenger, C. M. Herzinger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun andT. E. Tiwald, M. Schubert, and J. A. Woollam, "Spectroscopic ellipsometry analysis of anti-reflection coatings on textured Si wafers
", MRS Fall Meeting, December (2009)
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| 155. V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
, "ZnO-BaTiO3-ZnO: Unipolar ferroelectric transistor structures with spontaneous interface charge
coupling for non-volatile switching applications
", MRS Fall Meeting, December (2009)
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| 154. K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E.Tiwald, M. Solinsky, and M. Wagner, "Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Spectroscopic Ellipsometry", AVS 56th International Symposium, November (2009)
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| 153. T. Hofmann, C. M. Herzinger, J. A. Woollam, and M. Schubert
, "Non-destructive Determination of Spatial Distributions of Free-Charge-Carriers in Low Doped Semiconductors using THz Ellipsometry
", AVS 56th International Symposium, November (2009)
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152. M. Schubert, E. Schubert, and T. Hofmann, "Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry", NSF-MRSEC QSPIN Symposium, October (2009)
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151. M. Schubert, E. Schubert, and T. Hofmann, "Invited
Exploring the Science of Hybrid Nanostructure Materials by Terahertz to Ultraviolet Generalized Ellipsometry", Nano-DDS Army Research Office conference, October (2009)
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150. K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner, "Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry", QCM-D Scientific Conference, USA, November (2009)
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149. K. B. Rodenhausen, M. Guericke, T. Hofmann, M. Schubert, T. E. Tiwald, M. Solinsky, and M. Wagner, "Talk
Monitoring organic thin film growth in-situ with combined quartz crystal microbalance with dissipation and spectroscopic ellipsometry", UNL SE/QCM-D Mini-Symposium, November (2009)
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2008: |
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| 148. M. Schubert, and T. Hofmann, "Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures", American Physical Society Meeting, March (2008)
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| 147. V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, N. Ashkenov, M. Lorenz, and M. Grundmann, "Interface-charge-coupled ferroelectric hysteresis resistance switching in Pt-ZnO-BaTiO3-Pt heterojunctions: A physical model approach", 2008 MRS Spring Meeting, March 25 (2008)
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| 146. T. Hofmann, D. Schmidt, M. Schubert, and E. Schubert, "THz resonances in chiral aluminum nanowires", 2008 MRS Spring Meeting, March (2008)
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145. D. Schmidt, T. Hofmann, M. Schubert, and E. Schubert, "Poster Award Winner
THz Resonances in Chiral Aluminum Nanowires", E-Week Graduate Poster Session, April 25 (2008)
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| 144. M. F. Saenger, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, T. Hofmann,, and M. Schubert, "Magnetic birefringence and bandgap anisotropy in Zn1-xMnxSe at RT ", E-Week Graduate Poster Session, April 25 (2008)
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| 143. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann
, "Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures.", E-Week Graduate Poster Session, April 25 (2008)
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| 142. M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger, "Terahertz and Far Infrared Ellipsometry Studies of Charge and Lattice Dynamics in Semiconductor and Metal Nanostructures Under Strong External Fields", Brookhaven National Laboratory NSLS-CFN User Meeting, May (2008)
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| 141. V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann, "Wurtzite-Perovskite (ZnO-BaTiO3) interface polarization hysteresis model", The 5th International Workshop on ZnO and Related Materials, September (2008)
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140. D. Schmidt, T. Hofmann, A. C. Kjerstad, M. Schubert, and E. Schubert, "Talk
Hybrid Nanocoil Sculptured Thin Films", 2008 MRS Fall Meeting, December (2008)
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139. E. Schubert, D. Schmidt, T. Hofmann, and M. Schubert, "Talk
Sculptured Thin Films from Aluminum", AVS 55th International Symposium, October (2008)
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138. E. Schubert, A. C. Kjerstadt, D. Schmidt, T. Hofmann, M. Schubert, M. Chipara, A. J. Villarreal, X.H. Wei, R. Skomski, S.H. Liou, and D. J. Sellmyer
, "Talk
Magnetically Active Nanospirals", 53rd Annual Conference on Magnetism and Magnetic Materials, November (2008)
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| 137. M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam, "Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells", MRS Fall Meeting, December (2008)
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| 136. M.F. Saenger, M. Hetterich, X. Liu, J.K. Furdyna, T. Hofmann, R. Skomski, D.J. Sellmyer, and M. Schubert , "Magnetically induced optical chirality in ZnMnSe", 53rd Magnetism and Magnetic Materials Conference, November (2008)
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| 135. M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert, "Magnetooptic birefringence and bandgap anisotropy in Zn1-xMnxSe at room temperature", MRS Fall Meeting, December (2008)
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| 134. T. Hofmann, C. M. Herzinger, U. Schade, M. Mross, J. A. Woollam, and M. Schubert, "Terahertz Ellipsometry Using Electron-Beam Based Sources", MRS Fall Meeting, (2008)
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| 133. M. Schubert, E. Schubert, T. Hofmann, and C. M. Herzinger, "Terahertz Ellipsometry Materials Characterization", ISSSR, June (2008)
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| 132. V. Darakchieva, T. Hofmann, and M. SChubert, "International Conference on Electronic Materials", IUMRS-ICEM08, (2008)
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| 131. T. Hofmann, and M. Schubert, "Magnetooptic Ellipsometry: Determination of free charge carrier properties in semiconductor device structures", APS Spring Meeting, (2008)
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| 130. M. F. Saenger, X. Liu, J. C. Furdyna, M. Hetterich, D. J. Sellmyer, R. D. Kirby, R. Skomski, T. Hofmann, and M. Schubert, "Magnetooptic birefringence and bandgap anisotropy in ZnMnSe at Room Temperature", 53rd Annual Conference on Magnetism and Magnetic Materials, November (2008)
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| 129. A. Sarkar, A. Kjerstad, T. Hofmann, B. Laderian, T. Viitala, T. E.Tiwald, J. A. Woollam, and M. Schubert, "Monitoring Organic Thin Film Growth in-situ with Combined Quartz Crystal Microbalance and Ellipsometry", MRS Fall Meeting, December (2008)
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| 128. E. Schubert, T. Hofmann, and M. Schubert, "THz Resonances in Chiral Al Nanowires", ISSSR, June (2008)
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127. M. Schubert, T. Hofmann, and C. M. Herzinger, "Invited Industry Seminar
Terahertz Ellipsometry Materials Characterization", Bruker GmbH, August (2008)
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126. T. Hofmann, and M. Schubert, "Invited Department Seminar
Optical Hall effect in semiconductor heterostructures", Department of Physics, ETH Zurich, September (2008)
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125. M. Schubert, T. Hofmann, and C. M. Herzinger, "Invited Industry Seminar
Optical Hall effect in semiconductor heterostructures", Freiberger Compound Materials GmbH, August (2008)
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124. M. Schubert, J. A. Woollam, J. Hilfiker, M. Saenger, E. Schubert, T. Hofmann, and C. M. Herzinger, "Invited Institute Colloquium
Ellipsometry and the optical Hall effect in harnessing materials for energy conversion and efficiency", National Renewable Energy Laboratory (NREL), June (2008)
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2007: |
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| 123. V. M. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann, "Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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122. T. Hofmann, and M.Schubert, "ICSE4 Poster Award Winner
The optical-Hall effect", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| 121. M. F. Saenger, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert
, "Terahertz to UV Generalized Magnetooptic ellipsometry on ZnMnSe: Giant Kerr effect, band-to-band transitions, and charge transport parameters", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| 120. T. Hofmann, H. Lu, W.J. Schaff, V. Darakchieva, and M. Schubert
, "Surface electron accumulation and effective mass anisotropy in wurtzite structure InN", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| 119. T. Hofmann, M. Schubert, U. Schade, M. Mross, and T. Iowell, "Terahertz ellipsometry using electron-beam based sources", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| 118. T. Hofmann, C. von Middendorff, and M. Schubert, "Anomalous temperature-dependence of the free-charge-carrier concentration in modulation-doped AlGaAs/GaAs quantum well superlattices studied by fir magnetooptic generalized ellipsometry
", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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| 117. V. M. Voora, T. Hofmann, M. Brandt, M. Schubert, M. Lorenz, and M. Grundmann, "Polarization coupled response of ZnO-BaTiO3 heterojunctions: A model approach", 71. German Physical Society Spring Meeting, March (2007)
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116. E. Montgomery, T. Hofmann, and M. Schubert, "Poster Award Winner
Temperature dependent dielectric function of Al0.51In0.49P and Ga0.51In0.49P", 54th Midwest Solid State Conference, October (2007)
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| 115. M. F. Saenger, D. J. Sellmyer, R. D. Kirby, T. Hofmann, and M. Schubert, "Dielectric and magnetic birefringence in Zn1-xMnxSe", 54th Midwest Solid State Conference, October (2007)
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| 114. M. F. Saenger, L. Hartmann, H. Schmidt, B. Daniel, M. Hetterich, T. Hofmann, and M. Schubert, "THz to UV Generalized Magnetooptic Ellipsometry on Chlorine-Doped ZnMnSe: Giant Kerr Effect, Band-to-Band Transitions and Charge Transport Parameters", TMS 2007 Electronic Materials Conference, June (2007)
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| 113. M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
, "Polaron-phonon interaction in charge intercalated tungsten oxide thin films", 4th International Conference on Spectroscopic Ellipsometry, June (2007)
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112. T. Hofmann, "Invited
Terahertz magnetooptic ellipsometry ", 4th International Conference on Spectroscopic Ellipsometry, March (2007)
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| 111. T. Hofmann, V. Darakchieva, B. Monnemar, H. Lu, W. Schaff, and M. Schubert, "The optical-Hall effect in hexagonal InN", Electronic Materials Conference, June (2007)
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| 110. M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert, "Polaron and phonon properties in WO3 thin films", 71. German Physical Society Spring Meeting, March (2007)
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| 109. M. F. Saenger, L. Hartmann, H. Schmidt, M. Hetterich, M. Lorenz, H. Hochmuth,
M. Grundmann, T. Hofmann, and and M. Schubert
, "Comparison of giant Faraday effects in ZnMnSe and ZnMnO studied by magneto-optic ellipsometry", 71. German Physical Society Spring Meeting, March (2007)
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| 108. M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert, "Phonon and polaron properties of charge intercalated WO3", International Workshop on Synthesis of Functional Oxide Materials, August (2007)
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| 107. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann, "Electrooptic ellipsometry study of spontaneous polarization coupling in piezoelectric ZnO-BaTiO3 heterostructures", International Workshop on Synthesis of Functional Oxide Materials, August (2007)
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| 106. L. Hartmann, Q. Xu, H. Schmidt, H. Hochmuth, M. Lorenz, M. Grundmann, P. Esquinazi, M. F. Saenger, T. Hofmann, M. Schubert, and S. Liou, "Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates", 71. German Physical Society Spring Meeting, March (2007)
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| 105. V. Voora, T. Hofmann, M. Schubert, M. Brandt, M. Lorenz, and M. Grundmann, "Polarization coupled response of ZnO-BaTiO3 heterojunctions:a model approach", Electronic Materials Conference, June (2007)
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| 104. T. Hofmann, H. Lu, W. J. Schaff, V. Darakchieva, and M. Schubert, "Bulk and Surface Electron-Induced Infrared Magnetooptic Response in InN:
Evidence for a New Defect-Related Doping Mechanism", 7th Int'l Conference of Nitride Semiconductors, September (2007)
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2006: |
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| 103. T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert, "Anisotropy of the &Gamma-point electron effective mass in hexagonal InN", 70. German Physical Society Spring Meeting, March (2006)
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| 102. V. M. Voora, N. Ashkenov, T. Hofmann, M. Lorenz M. Grundmann, and M Schubert, "Modeling asymetric polarization hysteresis of BaTiO3-ZnO heterostructures", 70. German Physical Society Spring Meeting, March (2006)
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| 101. T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W.Schaff, and M. Schubert, "Anisotropy of the Gamma-point electron effective mass in hexagonal InN", Electronic Materials Conference, June (2006)
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| 100. T. Hofmann, K.C. Argawal, B. Daniel, C. Klingshirn, M. Hetterich, C. Herzinger, and M. Schubert , "Conduction-Band Electron Effective Mass in Zn0.87Mn0.13Se measured by Terahertz and Far-Infrared Magnetooptic Ellipsometry", Electronic Materials Conference, June (2006)
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| 99. V. Darakchieva, T. Hofmann, M. Schubert, H. Lu, W.J. Schaff, and B. Monemar, "Conduction band effective mass anisotropy and nonparabolicity of InN", 3. Workshop on Indium Nitride, November (2006)
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| 98. T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert, "Teraherz generalized Mueller-matrix ellipsometry", Photonics West 2006, January (2006)
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| 97. T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert, "Terahertz Ellipsometry", 4. Workshop "Ellipsometrie", February (2006)
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| 96. M. Schubert, T. Hofmann, N. Ashkenov, V. M. Voora, H. Hochmuth, M. Lorenz, and M. Grundmann, "Switchable interface charges in Zinkoxide-Bariumtitanite heterostructures: Concepts for new oxide-based electronic device structures", Electronic Materials Conference, June (2006)
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| 95. T. Hofmann, U. Schade, C. M. Herzinger, and M. Schubert, "Teraherz magnetooptic generalized Mueller-matrix ellipsometry", Spring MRS Meeting Symposium K: Materials Research for THz Applications, April (2006)
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| 94. T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W. J. Schaff, and M. Schubert, "Anisotropy of the G-point electron effective mass in hexagonal InN", 4. Workshop "Ellipsometrie", February (2006)
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| 93. V. M. Voora, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, and M. Schubert
, "Exchange polarization coupling in wurtzite-perovskite oxide interfaces: New concepts for electronic device heterostructures
", German Physical Society Spring Meeting, March (2006)
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| 92. T. Chavdarov, T. Hofmann, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert, "Anisotropy of the Gamma-point electron effective mass in hexagonal InN", German Physical Society Spring Meeting, March (2006)
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| 91. M. F. Saenger, T. Hofmann, T. Höing, and M. Schubert, "Optical properties of colored tungsten oxide sputtered thin films", 4th Ellipsometry Workshop, February (2006)
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| 90. T. Hofmann, V. Darakchieva, H. Lu, B. Monemar, W.J. Schaff, and M. Schubert, "Anisotropy of the Gamma-point electron effective mass in hexagonal InN", 28th International Conference on the Physics of Semiconductors, July 24-28 (2006)
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| 89. T. Hofmann, V. Darakchieva, B. Monemar, T. Chavdarov, H. Lu, W. J. Schaff, and M. Schubert, "Anisotropy of the Gamma-point ellecttrron efective mass in hexagonal InN", ICPS, July (2006)
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2005: |
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| 88. T. Hofmann, D. Fritsch, T. Chavdarov, H. Schmidt, V. Darakchieva, H. Lu, W.J. Schaff, and M. Schubert, "Anisotropy of the Gamma-point electron effective mass in hexagonal InN", 6. Int. Conf. on Nitride Semiconductor Research, August (2005)
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| 87. M. Schubert, T. Hofmann, and U. Schade, "Far-IR and THz Magneto-Optic Generalized Ellipsometry: Phonons, Plasmons and Polaritons in low-dimensional Systems", International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, June (2005)
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| 86. T. Hofmann, U. Schade, M. Schubert, P. Esquinazi, and D. N. Basov, "The Terahertz effective mass scale for free-charge-carriers: Landau level splitting in graphite", International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, June (2005)
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| 85. M. Schubert, C. Bundesmann, T. Hofmann, and et al., "Optische in-situ und in-line Charakterisierung funktioneller Schichten ", Advanced Process Control for future oriented manufacturing Workshop, September (2005)
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| 84. T. Hofmann, C. v. Middendorff, G. Leibiger, and M. Schubert, "Anomalous temperature-dependence of free-charge-carrier concentration in modulation-doped AlxGa1-xAs/GaAs quantum well superlattices studied by far-infrared magnetooptic Mueller-matrix ellipsometry", 69. German Physical Society Spring Meeting, March (2005)
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| 83. T. Hofmann, B. Daniel, Kapil Chandra Agarwal, M. Hetterich, and M. Schubert, "Phonon and free-charge-carrier properties in ZnMnSe", 69. German Physical Society Spring Meeting, March (2005)
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| 82. C. Bundesmann, M. Saenger, T. Hofmann, and M. Schubert, "Optische Bestimmung der Eigenschaften freier Ladungsträger in TCO-Dünnfilmen", TCOs für Dünnschichtsolarzellen und andere Anwendungen, April (2005)
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2004: |
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| 81. T. Hofmann, C. Middendorf, G. Leibiger, V. Gottschalch, and M. Schubert, "Strong increase of the electron effective mass in GaAs incorporating boron and indium", German Physical Society Spring Meeting, March (2004)
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80. M. Schubert, and T. Hofmann, "Invited
Verallgemeinerte Infrarot Ellipsometrie im Magnetfeld: Eine neues Instrument zur Bestimmung von Eigenschaften Freier-Ladungs-Träger in Halbleiterschichtstrukturen ", 3. Workshop "Ellipsometrie", February (2004)
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| 79. N. Ashkenov, M. Schubert, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner, "Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition", 3. Workshop "Ellipsometrie", February (2004)
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| 78. C. Middendorf, T. Hofmann, G. Leibiger, V. Gottschalch, and M. Schubert, "Free-charge-carrier properties in AlGaAs/GaAs superlattices investigated by magnetooptic ellipsometry", German Physical Society Spring Meeting, March (2004)
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| 77. M. Schubert, N. Ashkenov, T. Hofmann, M. Lorenz, H. v. Wenckstern, M. Grundmann, and G. Wagner, "Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition", German Physical Society Spring Meeting, March (2004)
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| 76. T. Hofmann, M. Schubert, and C. v. Middendorf, "The inertial-mass scale for free charge carriers in semiconductor heterostructures", 27th International Conference on the Physics of Semiconductors, July (2004)
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75. M. Schubert, and T. Hofmann, "Invited
Far-infrared magneto-optic generalized ellipsometry of free charge carrier excitations in solid state layer structures", International Conference on Low Energy Electrodynamics of Solids LEES 04, July (2004)
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2003: |
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| 74. T. Hofmann, M. Schubert, C. M. Herzinger, and I. Pietzonka, " Far infrared magnetooptic Ellipsometry characterization of free carrier properties in highly disordered n-type AlGaInP", German Physical Society Spring Meeting, March (2003)
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| 73. M. Schubert, T. Hofmann, C. M. Herzinger, and W. Dollase, " Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3", 3. International Conference on Spectroscopic Ellipsometry, July (2003)
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| 72. T. Hofmann, M. Schubert, and V. Gottschalch, " Far-infrared dielectric fucntion and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P", 3. International Conference on Spectroscopic Ellipsometry, July (2003)
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71. M. Schubert, A. Kasic, T. Hofmann, N. Ashkenov, W. Grill, M. Grundmann, E. Schubert, and H. Neumann, "Invited
Advances in Spectroscopic Ellipsometry Characterization of Optical Thin Films ", Optical System Design 2003, September (2003)
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70. M. Schubert, T. Hofmann, and C. M. Herzinger, "Invited
Generalized magneto-optic ellipsometry", 3. International Conference on Spectroscopic Ellipsometry, July (2003)
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69. C. Bundesmann, N. Ashkenov, T. Hofmann, and M. Schubert, "Invited Department Seminar
Ellipsometrie und Raman an ZnO Dünnschichten", Nukleare Festkörperphysik, University Leipzig, April (2003)
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2002: |
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| 68. T. Hofmann, V. Gottschalch, and M. Schubert, "Infrarot-dielektrische Funktion und Phononenmoden in spontan geordnetem (AlxGa1-x)0.52In0.48P", German Physical Society Spring Meeting, March (2002)
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| 67. T. Hofmann, M. Schubert, and C. M. Herzinger, " Magneto-optische Ferninfrarot-Spektralellipsometrie: Bestimmung freier Ladungsträger Parameter in Halbleiterheterostrukturen", German Physical Society Spring Meeting, March (2002)
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66. M. Schubert, A. Kasic, G. Leibiger, and T. Hofmann, "Invited
Generalized Infrared Ellipsometry and polaritons in III-V semiconductor heterostructures ", 2. Workshop "Ellipsometrie", Februar (2002)
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| 65. R. Schmidt, C. Bundesmann, N. Ashkenov, B. Mbenkum, B. Rheinländer, M. Schubert, H. v. Wenkstern, A. Kasic, T. Hofmann, M. Lorenz, E. M. Kadaishev, and M. Grundmann, " IR- and UV-VIS-Ellipsometry of ZnO, ZnMgO, ZnO-GaO thin films", 2. Workshop "Ellipsometrie", Februar (2002)
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64. M. Schubert, A. Kasic, G. Leibiger, T. Hofmann, C. M. Herzinger, and J. A. Woollam, "Invited
Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures ", 47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, July (2002)
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| 63. T. Hofmann, C. M. Herzinger, and M. Schubert, " Far-infrared magneto-optic generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures ", 47. Annual SPIE Meeting, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, July (2002)
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| 62. R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kadaishev, A. Kasic, T. Hofmann, D. Spemann, G. Wagner, and M. Grundmann, "Optical properties of ternary MgZnO thin films", 26. International Conference on the Physics of Semiconductors, July (2002)
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| 61. T. Hofmann, V. Gottschalch, and M. Schubert, "Far infrared dielectric function and and phonon modes of spontaneously ordered AlGaInP", Materials Research Society Fall Meeting, December (2002)
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| 60. T. Hofmann, C. M. Herzinger, and M. Schubert, "Far infrared magneto-optical generalized ellipsometry determination of free carrier parameters in semiconductor thin film structures", Materials Research Society Fall Meeting, December (2002)
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| 59. M. Schubert, A. Kasic, T. Hofmann, C. Bundesmann, N. Ashkenov, and G. Leibiger, "Spectroscopic Ellipsometry of phonon-plasmon-polaritons in III-V-Nitride compound heterostructures", L.O.T.-Seminar, October (2002)
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2001: |
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| 58. J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch, "Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP", German Physical Society Spring Meeting, March (2001)
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| 57. T. Hofmann, M. Schubert, G. Leibiger, and V. Gottschalch , " Untersuchung der Phononeneigenschaften von hochgradig ungeordnetem (AlxGa1-x) 0.52In0.48P (0 .. x .. 1) mittels Ferninfrarot Spektralellipsometrie und Ramanspektroskopie ", German Physical Society Spring Meeting, March (2001)
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| 56. J. Sik, M. Schubert, T. Hofmann, H. Schmidt, G. Böhm, and V. Gottschalch , " Interband transitions in (GaP)1/(InP)m monolayer superlattice structures grown on (001) InP ", Spring European MRS-Meeting, June (2001)
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2000: |
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| 55. T. Hofmann, and M. Schubert, "Der Berreman Effekt zweiter Ordnung in homoepitaktischen III-V Strukturen ", German Physical Society Spring Meeting, March (2000)
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| 54. T. Hofmann, M. Schubert, B. Rheinländer, and V. Gottschalch, "Infrarot-optische Eigenschaften von (Ga,In)n/(P,As)m Übergitterstrukturen ", German Physical Society Spring Meeting, March (2000)
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1999: |
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| 53. M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch, " Near-band-gap CuPt order-birefringence in AlxGa1-xInP2 ", German Physical Society Spring Meeting, March (1999)
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| 52. T. Hofmann, M. Schubert, B. Rheinländer, I. Pietzonka, and V. Gottschalch, " Cross-polarized reflectance difference spectroscopy on CuPt ordered AlxGa1-xInP2 ", German Physical Society Spring Meeting, March (1999)
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1998: |
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| 51. M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, and V. Gottschalch, " Modulation dark-field spectroscopy on spontaneously ordered (AlGa)InP ", German Physical Society Spring Meeting, March (1998)
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generated using Sembib V0.1 © T. Hofmann (2003)
last database entry from 2025-01-19 |
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