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Publications
Journal articles:
In submission
2010
2009
2008
2007
Electronic documents are intended for internal use only.
Corrections are added for misprints where known.
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2010: |
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7. |
 | Spectroscopic ellipsometry characterization of SiNx antireflection films on textured
multicrystalline and monocrystalline silicon solar cells
M. F. Saenger, J. Sun, M. Schädel, J. Hilfiker, M. Schubert, and J. A. Woollam
Thin Solid Films 518, 1830 (2010) [View PDF (582 kB)] [DOI-link] |
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2009: |
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6. |
 | Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells
M. F. Saenger, M. Schädel, T. Hofmann, J. Hilfiker, J. Sun, T. Tiwald, M. Schubert, and J. A. Woollam
Mat. Res. Soc. Symp. Proc. 1123, P02-02 (2009) [View PDF (245 kB)] [DOI-link] |
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5. |
 | Characterizing antireflection coatings on textured mono-crystalline Si with spectroscopic ellipsometry
J. Sun, M. F. Saenger, M. Schubert, J. N. Hilfiker, R. Synowicki, C. M. Herzinger, and J. A. Woollam
IEEE Photovoltaic Specialists Conference ISBN 978-1-4244-2949-3, 001407-001411 (2009) [View PDF (1.5 MB)] [DOI-link] |
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2008: |
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4. |
 | Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy
V. Darakchieva, B. Monemar, A. Usui, M. F. Saenger, and M. Schubert
J. Cryst. Growth 310, 959-965 (2008) [DOI-link] |
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3. |
 | Polaron transitions in charge intercalated amorphous tungsten oxide thin films
M. F. Saenger, T. Höing, T. Hofmann, and M. Schubert
phys. stat. sol. (a) 205, 914 (2008) [View PDF (580 kB)] [DOI-link] |
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2. |
 | Dielectric and magnetic birefringence in low-chlorine-doped n-type Zn1-xMnxSe
M. F. Saenger, M. Hetterich, R. D. Kirby, D. J. Sellmyer, and M. Schubert
phys. stat. sol. (c) 5, 1007 (2008) [View PDF (493 kB)] [DOI-link] |
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1. |
 | Polaron and Phonon properties in proton intercalated amorphous tungsten oxide thin films
M. F. Saenger, T. Höing, B. W. Robertson, R. B. Billa, T. Hofmann, E. Schubert, and M. Schubert
Phys. Rev. B 75, 245205 (2008) [View PDF (987 kB)] [DOI-link] |
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generated using Sembib V0.1 © T. Hofmann (2003)
last database entry from 2025-08-14 |
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