Mathias Schubert |
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Publications
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Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons
M. Schubert
Springer Tracts in Modern Physics, Vol 209 (Springer, Heidelberg, 2004) ISBN 3-540-23249-4 -
Optical Properties of Zinc Oxide and related Compounds
C. Bundesmann, R. Schmidt-Grund, M. Schubert
In Zinc Oxide as Transparent Electronic Material and its Application in Thin Film Solar Cells edited by A. Klein and K. Ellmer
(Springer, 2006)
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Theory and Application of Generalized Ellipsometry
M. Schubert
In Handbook of Ellipsometry edited by G.E. Irene and H.G. Tompkins
(William Andrew Publishing, Norwich, N.Y., 2005) ISBN: 0-8155-1499-9
(Springer-Verlag GmbH Co. KG, Heidelberg, 2004) ISBN: 3-540-22293-6 [View PDF internal use only (2374kB)] -
Phonons and Free-Carrier Properties of Binary, Ternary, and Quaternary Group-III Nitride Layers Measured by Infrared Spectroscopic Ellipsometry
A. Kasic, M. Schubert, J. Off, B. Kuhn, F. Scholz, S. Einfeldt, T. Böttcher, D. Hommel, D. J. As, U. Koehler, A. Dadgar, A. Krost, Y. Saito, Y. Nanishi, M. R. Correia, S. Pereira, V. Darakchieva, B. Monemar, H. Amano, I. Akasaki, G. Wagner
In Group III-Nitrides and Their Heterostructures: Growth, Characterization and Applications edited by F. Bechstedt, B. K. Meyer and M. Stutzmann (Wiley-VCH, Berlin, 2003) ISBN 3-527-40475-9
[View PDF internal use only (1328kB)] -
Generalized Ellipsometry
M. Schubert
In Introduction to Complex Mediums for Optics and Electromagnetics edited by W. S. Weiglhofer and A. Lakhtakia
(SPIE, Bellingham, WA, 2003) ISBN 0819449474 [View PDF internal use only (852kB)]
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MOVPE growth, Phonons, Band-to-Band Transitions and Dielectric Functions of InGaNAs/GaAs Superlattices and Quantum Wells
G. Leibiger, V. Gottschalch, G. Benndorf, J. Šik, M. Schubert
In Compound semiconductor heterojunctions: physics and applications edited by W. Cay and others
(Research Signpost, Kerala, 2003) ISBN 8177361708
[View PDF part 1 internal use only (2049kB)] [View PDF part 2 internal use only (1946kB)] [View PDF part 3 internal use only (1842kB)] - 130.
Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints
E. Schubert, F. Frost, H. Neumann, B. Rauschenbach, B. Fuhrmann, F. Heyroth, J. Rivory, B. Gallas, M. Schubert
Adv. Phys. (2006) - 129.
Terahertz magnetooptic generalized ellipsometry using synchrotron and black-body radiation
T. Hofmann, U. Schade, W. Eberhardt, C. M. Herzinger, P. Esquinazi, M. Schubert
Rev. Sci. Inst. - 128.
Vacuum ultraviolet generalized spectroscopic ellipsometry and band-structure calculations of wurtzite ZnO
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, E. M. Kaidashev, M. Lorenz, C.M. Herzinger, M. Grundmann
- 127.
Strong increase of the electron effective mass in GaAs incorporating boron and indium
T. Hofmann, G. Leibiger, N. Ashkenov, V. Gottschalch, M. Schubert
- 126.
Refractive indices and band-gap properties of rocksalt MgxZn1-xO (0.68 .. x .. 1)
R. Schmidt-Grund, A. Carstens, B. Rheinländer, D. Spemann, H. Hochmut, G. Zimmermann, M. Lorenz, M. Grundmann, C.M. Herzinger, M. Schubert,
J. Appl. Phys. XXX, XXXX (2006) - 125.
Infrared optical properties of MgxZn1xO thin Flms (0..x..1): Long-wavelength optical phonons, dielectric constants, and effective mass parameters
C. Bundesmann, A. Rahm, D. Spemann, M. Lorenz, M. Grundmann, M. Schubert
J. Appl. Phys. XXX, XXXX (2006) - 124.
Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magneto-optic ellipsometry
T. Hofmann, U. Schade, K. C. Agarwal, B. Daniel, C. Klingshirn, M. Hetterich, C. M. Herzinger, M. Schubert
Appl. Phys. Lett. 88, 043105 (2006) [View PDF internal use only (82kB)] - 123.
Anisotropy of the Gamma-point effective mass and mobility in hexagonal InN
T. Hofmann, T. Chavdarov, V. Darakchieva, H. Lu, W. J. Schaff, M. Schubert
phys. stat. sol. c XXX, XXXX (2006) - 122.
Phonon properties and doping of ZnMnSe epilayers grown by molecular beam epitaxy
K. C. Agarwal, B. Daniel, T. Hofmann, M. Schubert, C. Klingshirn, M. Hetterich
phys. stat. sol. b 243, 914 (2006) [View PDF internal use only (82kB)] - 121.
Recrystallisation behavior in chiral silicon nanostructures
E. Schubert, J. Fahlteich, B. Rauschenbach, M. Schubert, M. Lorenz, M. Grundmann, G. Wagner
Appl. Phys. Lett. XXX, XXXX (2006) - 120.
In-situ monitoring of MOVPE growth with Reflectance Anisotropy Spectroscopy in an industrial used multi wafer reactor
C. Krahmer, M. Philippens, M. Schubert, K. Streubel
phys. stat. sol. c 3, 655 (2006) [View PDF internal use only (387kB)] - 119.
A Century of Ellipsometry
M. Schubert
Annalen der Physik XXX, XXXX (2006), Special issue on Paul Karl Ludwig Drude, M. Dressel (Guest editor) [View Proof PDF internal use only (2570kB)] - 118.
Low temperature photoluminescence and infrared dielectric functions of pulsed laser deposited ZnO thin films on silicon
S. Heitsch, C. Bundesmann, G. Wagner, G. Zimmermann, A. Rahm, H. Hochmuth, G. Benndorf, H. Schmidt, M. Schubert, M. Lorenz, and M. Grundmann
Thin Solid Films 496, 234 - 239 (2006) [View PDF internal use only (343kB)] - 117.
Composition and properties of ZnS thin films prepared by chemical bath deposition from acid and basic solutions
L. V. Mahkova, I. Konovalov, R. Szargan, N. Ashkenov, M. Schubert, T. Chassé
phys. stat. sol. c2, 1206 - 1211 (2005) - 116.
Adsorption of human serum albumin in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
phys. stat. sol. c2, 3293 - 3297 (2005) [View PDF internal use only (225kB)] - 115.
Rectifying semiconductor-ferroelectric polarization loops and offsets in Pt–BaTiO3–ZnO–Pt thin film capacitor structures
N. Ashkenov, M. Schubert, E. Twerdowski, B. N. Mbenkum, H. Hochmuth, M. Lorenz, H. v. Wenkstern, M. Grundmann
Thin Solid Films 486, 153 (2005) [View PDF internal use only (278kB)] - 114.
High pressure annealing of HVPE GaN free-standing films: redistribution of defects and stress
T. Paskova, T. Suski, M. Bockowski, P.P. Paskov, V. Darakchieva, B. Monemar, F. Tuomisto, K. Saarinen, N. Ashkenov, M. Schubert, C. Roder, D. Hommel
Mat. Res. Soc. Symp. Proc. Vol. 831, E8.18.1 [View PDF internal use only (268kB)] - 113.
Phonon mode behavior of wurtzite AlN/GaN superlattices
V. Darakchieva, E. Valcheva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, H. Amano, and I. Akasaki
Phys. Rev. B 71, 115329 (2005) [View PDF internal use only (206kB)] - 112.
Temperature-dependent dielectric and electro-optic properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
B. N. Mbenkum, N. Ashkenov, M. Schubert, M. Lorenz, H. Hochmuth, D. Michel, M. Grundmann
Appl. Phys. Lett. 86, 091904 (2005) [View PDF internal use only (120kB)] - 111.
Structural characteristics and lattice parameters of HVPE-GaN free-standing quasi-substrates
V. Darakchieva, T. Paskova, P. P. Paskov, B. Monemar, N. Ashkenov, M. Schubert
J. Appl. Phys. 97, 013517 (2005) [View PDF internal use only (97kB)] - 110.
Long-wavelength interface modes in semiconductor layer structures
M. Schubert, T. Hofmann, J. Sik
Phys. Rev. B 71, 035324 (2005) [View PDF internal use only (353kB)] - 109.
The inertial-mass scale for free-charge-carriers in semiconductor heterostructures
T. Hofmann, M. Schubert, C. von Middendorff, G. Leibiger, V. Gottschalch, C.M. Herzinger, A. Lindsay and E. O’Reily
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 455-456 [View PDF internal use only (XXXkB)] - 108.
Electro-optic Raman observation of low temperature phase transitions in ZnO-BaTiO3-ZnO heterostructures
B. N. Mbenkum, N. Ashkenov, M. Schubert, M. Lorenz
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 401-402 [View PDF internal use only (XXXkB)] - 107.
Combined Raman scattering, X-ray fluorescence and ellipsometry in-situ growth monitoring of CuInSe2-based photoabsorber layers on polyimide substrates
C. Bundesmann, M. Schubert, N. Ashkenov, M. Grundmann, G. Lippold, and J. Piltz
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 165-166 [View PDF internal use only (XXXkB)] - 106.
Band-to-band transitions and optical properties of MgxZn1-xO (0..x..1) films
R. Schmidt-Grund, D. Fritsch, M. Schubert, B. Rheinländer, H. Schmidt, H. Hochmuth, M. Lorenz, C.M. Herzinger, and M. Grundmann
In Physics of Semiconductors (J. Menéndez, C. G. Van de Walle, eds.), AIP Conference Proceedings 772, AIP, Melville, NY, U.S.A., 2005, 201-202 [View PDF internal use only (XXXkB)] - 105.
Infrared Ellipsometry and Raman Studies of hexagonal InN films: correlation between strain and vibrational properties
V. Darakchieva, P. Paskov, E. Valcheva, T. Paskova, M. Schubert, C. Bundesmann, H. Lu, W. J. Schaff, B. Monemar
Superlattices and Microstructures 36, 573 - 580 (2004) - 104.
Micro-Raman scattering profiles studies on HVPE-grown free-standing GaN
A. Kasic, D. Gogova, H. Larsson, C. Hemmingsson, I. Ivanov, B. Momenar, C. Bundesmann, M. Schubert
phys. stat. sol. (a) 201 2773 - 2775 (2004) [View PDF internal use only (249kB)] - 103.
Infrared dielectric function and phonon modes of Mg-rich cubic MgZnO thin films on sapphire
C. Bundesmann, M. Schubert, A. Rahm, D. Spemann, H. Hochmuth, M. Lorenz, M. Grundmann
Appl. Phys. Lett. 85, 905 (2004) [View PDF internal use only (73kB)] - 102.
Strain related structural and vibrational properties of thin epitaxial AlN layers
V. Darakchieva, J. Birch, M. Schubert, A. Kasic, S. Tungasmita, T. Paskova, B. Monemar
Phys. Rev. B 70, 045511 (2004) [View PDF internal use only (330kB)] - 101.
Near-band-gap dielectric function of Zn1-xMnxSe thin films determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, D. Litvinov, D. Gerthsen
Phys. Rev. B 70, 045316 (2004) [View PDF internal use only (164kB)] - 100.
Deformation potentials of the E1(TO) and E2 modes of InN
V. Darakchieva, P. P. Paskov, E. Valcheva, T. Paskova, B. Monemar, M. Schubert, H. Lu, W. J. Schaff
Appl. Phys. Lett. 84, 3636 (2004) [View PDF internal use only (58kB)] - 99.
Optical modelling of a layered photovoltaic device with a polyfluorene-copolymer as the active layer
Nils-Krister Persson, M. Schubert, O. Inganäs
Solar Energy Materials and Solar Cells 83, 169 - 186 (2004) - 98.
Optical properties of Zn1-xMnxSe epilayers determined by spectroscopic ellipsometry
J. Kvietkova, B. Daniel, M. Hetterich, M. Schubert, D. Spemann, P. Pfundstein, and D. Gerthsen
Thin Solid Films 455-456, 228 - 230 (2004) [View PDF internal use only (133kB)] - 97.
Infrared to vacuum ultraviolet optical properties of 3C, 4H and 6H silicon carbide measured by spectroscopic ellipsometry
O. P. A. Lindquist, M. Schubert, H. Arwin, K. Järrendahl
Thin Solid Films 455-456, 235 - 238 (2004) [View PDF internal use only (116kB)] - 96.
Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
L. M. Karlsson, M. Schubert, N. Ashkenov, H. Arwin
Thin Solid Films 455-456, 726 - 730 (2004) [View PDF internal use only (386kB)] - 95.
Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, N. Razek, M. Schubert
Thin Solid Films 455-456, 231 - 234 (2004) [View PDF internal use only (106kB)] - 94.
UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 < x < 0.53) thin films
R. Schmidt-Grund, M. Schubert, B. Rheinländer, D. Fritsch, H. Schmidt, E. M. Kaidashev, M. Lorenz, C. M. Herzinger, M. Grundmann
Thin Solid Films 455-456, 500 - 504 (2004) [View PDF internal use only (259kB)] - 93.
Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P
T. Hofmann, M. Schubert, V. Gottschalch
Thin Solid Films 455-456, 601 - 604 (2004) [View PDF internal use only (154kB)] - 92.
Generalized ellipsometry for orthorhombic absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S3
M. Schubert, T. Hofmann, C. M. Herzinger, W. Dollase
Thin Solid Films 455-456, 619 - 623 (2004) View PDF internal use only (282kB)] - 91.
Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry
C. Bundesmann, N. Ashkenov, M. Schubert, A. Rahm, H. v. Wenckstern, E. M. Kaidashev, M. Lorenz, M. Grundmann
Thin Solid Films 455-456, 161 - 166 (2004) [View PDF internal use only (158kB)] - 90.
Infrared ellipsometry characterization of conducting thin organic films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin, N.-C. Persson, F. Zhang, O. Inganäs
Thin Solid Films 455-456, 295 - 300 (2004) View PDF internal use only (136kB)] - 89.
Far-infrared magnetooptic generalized ellipsometry: Determination of free-charge-carrier parameters in semiconductor thin film structures
M. Schubert, T. Hofmann, C. M. Herzinger
Thin Solid Films 455-456, 563 - 570 (2004) [View PDF internal use only (239kB)] - 88.
Optical and structural characteristics of virtually unstrained bulk-like GaN
D. Gogova, A. Kasic, H. Larsson, B. Pécz, R. Yakimova, B. Magnusson, B. Monemar, F. Tuomisto, K. Saarinen, C. R. Miskys, M. Stutzmann, C. Bundesmann, M. Schubert
Jpn. J. Appl. Phys. 43, 1264 - 1268 (2004) [View PDF internal use only (162kB)] - 87.
Carrier redistribution in organic/inorganic (PEDOT/PSS - Si) heterojunction
M. Schubert, C. Bundesmann, H. v. Weckstern, G. Jakopic, A. Haase, N.-K. Persson, F. Zhang, H. Arwin, O. Inganäs
Appl. Phys. Lett. 84, 1311 - 1313 (2004) [View PDF internal use only (230kB)] - 86.
Strain evolution and phonons in AlN/GaN superlattices
V. Darakchieva, P. P. Paskov, M. Schubert, E. Valcheva, T. Paskova, H. Arwin, B. Monemar, H. Amano, I. Akasaki
Mat. Res. Soc. Symp. 798, Y5.60 (2004) [View PDF internal use only (133kB)] - 85.
Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition
M. Schubert, N. Ashkenov, T. Hofmann, H. Hochmuth, M. Lorenz, M. Grundmann, G. Wagner
Ann. Phys. 13, 61 - 62 (2004) [View PDF internal use only (205kB)] - 84.
Infrared dielectric function and vibrational modes of pentacene thin films
M. Schubert, C. Bundesmann, G. Jakopic, H. Maresch, H. Arwin
Appl. Phys. Lett. 84, 200 - 202 (2004) [View PDF internal use only (54kB)] - 83.
Generalized infrared ellipsometry study of thin epitaxial AlN layers with complex strain behavior
V. Darakchieva, M. Schubert, J. Birch, A. Kasic, S. Tungasmita, T. Paskova, B. Monemar
Physica B: Condensed Matter 340-340, 416 - 420 (2003) [View PDF internal use only (555kB)] - 82.
Optical properties of undoped AlN/GaN superlattices grown by metal orgaic vapor phase epitaxy
V. Darakchieva, P. P. Paskov, M. Schubert, T. Paskova, B. Monemar, S. Kamiyama, M. Iwaya, H. Amano, I. Akasaki
phys. stat. sol. c 0, 1 - 4 (2003) [View PDF internal use only (211kB)] - 81.
Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga and Li
C. Bundesmann, N. Ashkenov, M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, M. Grundmann
Appl. Phys. Lett.83, 1974 - 1976 (2003) [View PDF internal use only (59kB)] - 80.
Interband transitions and phonon modes in GaBxAs1-x (0 <= x < 0.33) and GaNxAs1-x (0 <= x < 0.29)
G. Leibiger, V. Gottschalch, V. Riede, M. Schubert, J. N. Hilfiger, T. E. Tiwald
Phys. Rev. B 67, 195205 (2003) [View PDF internal use only (442kB)] - 79.
Optical properties of ternary MgZnO thin films
R. Schmidt, C. Bundesmann, N. Ashkenov, B. Rheinländer, M. Schubert, M. Lorenz, E. M. Kaidashev, D. Spemann, T. Butz, J. Lenzner, M. Grundmann
Proceedings of the International Conference on the Physics of Semiconductors (ICPS) 2002 [View preprint PDF (285kB)] - 78.
Far-infrared magneto-optical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, M. Grundmann, C. M. Herzinger, M. Schubert, W. Grill
Mat. Res. Soc. Symp. 744, M5.32.1 (2003) [View PDF internal use only (152kB)] - 77.
Far-infrared dielectric functions and phonon modes of spontaneously ordered AlGaInP
T. Hofmann, V. Gottschalch, M. Schubert
Mat. Res. Soc. Symp. 744, M5.33.1 (2003) [View PDF internal use only (127kB)] - 76.
Far-infrared-magneto-optic Ellipsometry characterization of free-charge-carrier properties in highly-disordered n-type Al0.19Ga0.33In0.48P
T. Hofmann, M. Schubert, C. M. Herzinger, I. Pietzonka
Appl. Phys. Lett. 82, 3463 - 3465 (2003) [View PDF internal use only (55kB)] - 75.
Residual strain in HVPE GaN free-standing and re-grown homoepitaxial layers
V. Darakchieva, T. Paskova, P.P. Paskov, B. Monemar, N. Ashkenov, M. Schubert
phys. stat. sol. (a) 195 516 - 522 (2003) [View PDF internal use only (473kB)] - 74.
Dielectric functions (1 eV to 5 eV) of wurtzite MgxZn1-xO (0 <= x < 0.29) thin films
R. Schmidt, B. Rheinländer, M. Schubert, D. Spemann, T. Butz, J. Lenzner, E. M. Kaidashev, M. Lorenz, M. Grundmann
Appl. Phys. Lett. 82, 2260 - 2262 (2003) [ View PDF internal use only (74kB)] - 73.
Infrared dielectric functions and phonon modes of high-quality ZnO films
N. Ashkenov, G. Wagner, H. Neumann, B. N. Mbenkum, C. Bundesmann, V. Riede, M. Lorenz, E. M. Kaidashev, A. Kasic, M. Schubert, M. Grundmann, V. Darakchieva, H. Arwin, B. Monemar
J. Appl. Phys. 93, 126 - 133 (2003) [View PDF internal use only (186kB)] - 72.
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: Determination of free-carrier effective mass, mobility and concentration parameters in n-type GaAs
M. Schubert, T. Hofmann, C. M. Herzinger
J. Opt. Soc. Am. A 20, 347 - 356 (2003) [View PDF internal use only (252kB)] - 71.
Optical phonons in hexagonal AlxInyGa1-x-yN (y ~ 0.12)
A. Kasic, M. Schubert, J. Off, F. Scholz, S. Einfeldt, D. Hommel
phys. stat. sol. 234, 970 - 974 (2002) [View PDF internal use only (235kB)] - 70.
Far-infrared dielectric anisotropy and phonon modes in spontaneously CuPt ordered Ga0.52In0.48P
T. Hofmann, V. Gottschalch, M. Schubert
Phys. Rev. B 66, 195204 1-10 (2002) [View PDF internal use only (249kB)] - 69.
Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb2S3
M. Schubert, W. Dollase
Opt. Lett. 27, 2073 - 2075 (2002) [View PDF internal use only (113kB)] - 68.
Infrared dielectric functions and phonon modes of wurtzite MgxZn1-xO (x <= 0.2)
C. Bundesmann, M. Schubert, D. Spemann, T. Butz, M. Lorenz, E. M. Kaidashev, M. Grundmann, N. Ashkenov, H. Neumann, G. Wagner
Appl. Phys. Lett. 81, 2376 - 2378 (2002) [View PDF internal use only (139kB)] - 67.
Far-infrared Magneto-Optical Generalized Ellipsometry determination of free-carrier parameters in semiconductor thin film structures
T. Hofmann, M. Schubert, C. M. Herzinger
In Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components (A. Duparré and B. Singh, eds.) Proc SPIE 4779, SPIE Bellingham, WA, USA, 2003, 90-97 [View PDF internal use only (717kB)] - 66.
Evolution of the optical properties of III-V Nitride alloys: Band-to-Band transitions in GaPN
G. Leibiger, M. Schubert, V. Gottschalch, G. Benndorf, R. Schwabe
Phys. Rev. B 65, 245207 1 - 6 (2002) [View PDF internal use only (96kB)] - 65.
Generalized ellipsometry of complex mediums in layered systems
M. Schubert, A. Kasic, T. Hofmann, V. Gottschalch, J. Off, F. Scholz, E. Schubert, H. Neumann, I. Hodgkinson, M. Arnold, W. Dollase, C. M. Herzinger
In Complex Mediums III: Beyond linear isotropic Dielectrics (A. Lakhtakia, G. Dewar and M. W. McCall, eds.), Proc SPIE 4806, SPIE, Bellingham, WA, U.S.A., 2002, 264-276 [View PDF internal use only (590kB)] - 64.
Optical phonon modes and interband transitions in cubic AlGaN
A. Kasic, M. Schubert, T. Frey, U. Köhler, D. J. As, C. M. Herzinger
Phys. Rev. B 65, 184302 1 - 13 (2002) [View PDF internal use only (207kB)] - 63.
Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices
E. Franke, H. Neumann, M. Schubert, C. L. Trimble, J. A. Woollam
Surf. Coat. & Techn. 151-152, 285 - 288 (2002) [View PDF internal use only (66kB)] - 62.
Infrared spectroscopic ellipsometry - a new tool for characterization of semiconductor heterostructures
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel
Vibrational Spectroscopy 179, 121 - 124 (2002) [View PDF internal use only (98kB)] - 61.
Effective carrier mass and phonon mode behavior in n-type hexagonal InN
A. Kasic, M. Schubert, Y. Saito, Y. Nanishi, G. Wagner
Phys. Rev. B 65, 115206 1 - 7 (2002) [View PDF internal use only (153kB)] - 60.
Interband transitions in [001]-(GaP)1(InP)m superlattices
M. Schubert, H. Schmidt, J. Šik, T. Hofmann, V. Gottschalch, W. Grill, G. Böhm, G. Wagner
Mat. Sci. & Eng. B 88, 125 - 128 (2002) [View PDF internal use only (298kB)] - 59.
Phonon modes of GaP1-yNy measured by mid-infrared spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, A. Kasic, M. Schubert
Appl. Phys. Lett. 79, 3407 - 3409 (2001) [View PDF internal use only (59kB)] - 58.
Optical functions, phonon properties, and composition of InGaAsN single layers derived from far - and near - infrared spectroscopic
ellipsometry
G. Leibiger, V. Gottschalch, M. Schubert
J. Appl. Phys. 90, 5951 - 5958 (2001) [View PDF internal use only (125kB)] - 57.
Ellipsometry on anisotropic materials: Bragg conditions and phonons in dielectric helical thin films
M. Schubert, C. M. Herzinger
phys. stat. sol.(a) 188, 1563 - 1575 (2001) [View PDF internal use only (339kB)] [Corrections] - 56.
Optical constants, critical points, free carrier effects, and phonon modes of GaAsN single
layers and GaAsN/InAs/GaAs superlattices
G. Leibiger, V. Gottschalch, B. Rheinländer, A. Kasic, M. Schubert, J. Sik
Proceedings of the 27th International Symposium on Compound Semiconductors (Piscataway, NJ, 2001), ISBN 0-7803-6285-6 [View PDF internal use only (1.217kB)] - 55.
Optical properties of AlxIn1-xN thin films determined by
spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, C. M. Herzinger
Proceedings of the 27th International Symposium on Compound Semiconductors (Piscataway, NJ, 2001), ISBN 0-7803-6285-6 [View PDF internal use only (931kB)] - 54.
Phonon modes and critical points of GaNP
G. Leibiger, V. Gottschalch, G. Benndorf, R. Schwabe, M. Schubert
phys. stat. sol.(a) 228, 279 - 282 (2001) [View PDF internal use only (78kB)] - 53.
Phonon modes of InGaAsN measured by far infrared spectroscopic ellipsometry
G. Leibiger, V. Gottschalch, M. Schubert
phys. stat. sol.(a) 228, 259 - 262 (2001) [View PDF internal use only (87kB)] - 52.
Infrared Ellipsometry- a novel tool for characterization of group-III-Nitride Heterostructrues
for electronic and optoelectronic device applications
M. Schubert, A. Kasic, S. Einfeldt, D. Hommel, U. Köhler, J. D. As, B. Kuhn, J. Off, F. Scholz, and J. A. Woollam
phys. stat. sol.(a) 228, 437 - 440 (2001) [View PDF internal use only (339kB)] - 51.
Infrared spectroscopic ellipsometry for nondestructive characterization of free-carrier and crystal-structure properties of group-III-nitride semiconductor device heterostructures
M. Schubert, A. Kasic, S. Figge, M. Diesselberg, S. Einfeldt, D. Hommel, U. Köhler, J. D. As, B. Kuhn, J. Off, F. Scholz, J. A. Woollam, and C. M. Herzinger
In Optical Metrology Roadmap for the Semiconductor, Optical and Data storage Industries II (A. Duparré and B. Singh, eds), Proc SPIE 4449, SPIE, Bellingham, WA, U.S.A., 2001, 48-58 [View PDF internal use only (881kB)] - 50.
Infrared dielectric function and phonon modes of highly disordered
(AlxGa1-x)0.52In0.48P
T. Hofmann, G. Leibiger, I. Pietzonka, V. Gottschalch, M. Schubert
Phys. Rev. B 64, 155206 1-11 (2001) [View PDF internal use only (291kB)] - 49.
Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN
A. Kasic, M. Schubert, B. Kuhn, F. Scholz, S. Einfeldt, D. Hommel
J. Appl. Phys. 87, 3720 - 3734 (2001) [View PDF internal use only (84kB)] - 48.
Infrared Ellipsometry characterization of porous silicon Bragg reflectors
S. Zangooie, M. Schubert, C. Trimble, D. W. Thompson, J. A. Woollam
Appl. Opt. 40, 906 - 912 (2001) [View PDF internal use only (296kB)] - 47.
Optical properties of amorphous and crystalline tantalum oxide thin films measured by IR-VIS-VUV (0.03eV-8.5eV) spectroscopic ellipsometry
E. Franke, M. Schubert, C.L. Trimble, J.A. Woollam
Thin Solid Films 388, 283 - 289 (2001) [View PDF internal use only (197kB)] - 46.
Band-gap energies, optical constants, phonons and free carrier properties in GaNAs/InAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry
J. Sik, M. Schubert, G. Leibiger, V. Gottschalch
J. Appl. Phys. 89, 294 - 305 (2001) [View PDF internal use only (298kB)] - 45.
Anisotropic dielectric function spectra from single crystal CuInSe2with orientation domains
A. Kreuter, K. Otte, G. Lippold, G. Wagner, A. Schindler, M. Schubert
Appl. Phys. Lett. 78, 195 - 197 (2001) [View PDF internal use only (108kB)] - 44.
IR-VUV Dielectric Function of Al1-xInxN determined by spectroscopic ellipsometry
A. Kasic, M. Schubert, B. Rheinländer, J. Off, F. Scholz, C. M. Herzinger
Mat. Res. Soc. Symp. 639, G6.13 (2001) [View PDF internal use only (105kB)] - 43.
Optical Constants, Critical Points, and Phonon Modes of GaAsN Single Layers
G. Leibiger, V. Gottschalch, A. Kasic, B. Rheinländer, J. Sik, M. Schubert
Mat. Res. Soc. Symp. 639, G6.35 (2001) [View PDF internal use only (159kB)] - 42.
Strain and composition dependence of the E1(TO) mode in hexagonal
AlxIn1-xN thin films
A. Kasic, M. Schubert, J. Off, F. Scholz
Appl. Phys. Lett. 78, 1526 - 1528 (2001) [View PDF internal use only (61kB)] - 41.
Model dielectric function spectra of GaAsN for far-infrared and near-infrared to ultra violet wavelengths
G. Leibiger, V. Gottschalch, B. Rheinländer, J. Sik, M. Schubert
J. Appl. Phys. 89, 4927 - 4938 (2001) [View PDF internal use only (191kB)] - 40.
Infrared optical properties of aged porous GaAs
S. Zangooie, T. E. Tiwald, M. Schubert, J. A. Woollam
J. Mat. Res. 16, 1241 - 1244 (2001) [View Absract (2kB)] - 39.
Infrared response of multiple component free-carrier plasma in
heavily doped p-type GaAs
S. Zangooie, M. Schubert, D. W. Thompson, J. A. Woollam
Appl. Phys. Lett. 78, 937 - 939 (2001) [View PDF internal use only (57kB)] - 38.
Phonons and free carriers in strained hexagonal GaN/AlGaN
superlattices measured by Infrared ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, J. Sik, S. Einfeldt, D. Hommel, V. Haerle, J. Off, F. Scholz
Mat. Sci. & Eng. B 82, 178 - 181 (2001) [View PDF internal use only (200kB)] - 37.
Effective carrier mass and mobility versus carrier concentration in
p- and n-type GaN determined by infrared ellipsometry and Hall
resistivity measurements
A. Kasic, M. Schubert, B. Rheinländer, V. Riede, S. Einfeldt, D. Hommel, B. Kuhn, J. Off, F. Scholz
Mat. Sci. & Eng. B 82, 74 - 76 (2001) [View PDF internal use only (78kB)] - 36.
Measurement of rutile TiO2 dielectric tensor from 0.148 to 33 mikrometer
using generalized ellipsometry
T.E.Tiwald, M. Schubert
In Optical Diagnostics Methods for Inorganic Materials II (L. M. Hanssen, ed ), Proc SPIE 4103, SPIE, Bellingham, WA, U.S.A., 2000, 19-29 [View PDF (662kB)] - 35.
Optical properties of GaAs1-yNy
G. Leibiger, B. Rheinländer, V. Gottschalch, M. Schubert; J. Sik, G. Lippold
Proceedings of the International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM), 171 - 174 (2000) [View INSPEC (2kB)] - 34.
Infrared switching electrochromic devices based on tungsten oxide
E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, J.A. Woollam
J. Appl. Phys. 88, 5777 - 5784 (2000) [View PDF internal use only (108kB)] - 33.
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry
E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, J.A. Woollam, F. Frost
J. Appl. Phys. 88, 5166 - 5174 (2000) [View PDF internal use only (239kB)] - 32.
Nitrogen dependence of the GaAsN interband-critical points E1 and E1+D1 determined by spectroscopic ellipsometry
G. Leibiger, B. Rheinländer, M. Schubert, J. Sik, V. Gottschalch, J. Humlicek
Appl. Phys. Lett. 77, 1650 - 1652 (2000) [View PDF internal use only (62kB)] - 31.
All-Solid state electrochromic device for emittance modulation in the infrared spectral region
E. Franke, C.L. Trimble, J.S. Hale, M. Schubert, J. A. Woollam
Appl. Phys. Lett. 77, 930 - 932 (2000) [View PDF internal use only (40kB)] - 30.
Near-band-gap optical functions spectra and band-gap energies of
GaNAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry
J. Sik, M. Schubert, G. Leibiger, G. Kirpal, V. Gottschalch, J. Humlicek
Appl. Phys. Lett. 76, 2859 - 2861 (2000) [View PDF internal use only (119kB)] - 29.
Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry
J. Sik, M. Schubert, T. Hofmann, V. Gottschalch
MRS Internet J. Nitride Semicond. Res. 5, 3 (2000) [View PDF internal use only (100kB)] - 28.
Phonons and free carriers in a strained hexagonal GaN-AlN
superlattice measured by Infrared Ellipsometry and Raman spectroscopy
M. Schubert, A. Kasic, T.E. Tiwald, J.A. Woollam, V. Härle, F. Scholz
MRS Internet J. Nitride Semicond. Res. 5, W11.39 (2000) [View PDF internal use only (106kB)] - 27.
Free-carrier and phonon properties of p- and n-type hexagonal GaN films measured by infrared ellipsometry
A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, T. E. Tiwald
Phys. Rev. B 62, 7365 - 7377 (2000) [View PDF internal use only (183kB)] - 26.
In-situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films
E. Franke, M. Schubert, J. A. Woollam, J.-D. Hecht, H. Neumann, G. Wagner, F. Bigl
J. Appl. Phys. 87, 2593 - 2599 (2000) [View PDF internal use only (618kB)] - 25.
Infrared dielectric anisotropy and phonon modes of sapphire
M. Schubert, T. E. Tiwald, C. M. Herzinger
Phys. Rev. B 61, 8187 - 8201 (2000) [View PDF internal use only (288kB)] - 24.
Optical phonons and free-carrier effects in MOVPE grown AlxGa1-xN measured by infrared ellipsometry
M. Schubert, A. Kasic, T. E. Tiwald, J. Off, B. Kuhn, F. Scholz
MRS Internet J. Nitride Semicond. Res. 4, 11 (1999) [View PDF internal use only (302kB)] - 23.
Isotropic optical constants of highly disordered AlxGa1-xInP lattice matched to GaAs
M. Schubert, J.A. Woollam, G. Leibiger, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch
J. Appl. Phys. 86, 2025 - 2034 (1999) [View PDF internal use only (143kB)] - 22.
Free-carrier response and lattice modes of group III-nitride heterostructures by infrared ellipsometry
M. Schubert, J. A. Woollam, A. Kasic, B. Rheinländer, J. Off, B. Kuhn, F. Scholz
phys. stat. sol.(b) 216, 655 - 658 (1999) [View PDF internal use only (172kB)] - 21.
Near-band-gap CuPt order birefringence in Al0.48Ga0.52InP
M. Schubert, T. Hofmann, B. Rheinländer, I. Pietzonka, T. Saß, V. Gottschalch, J. A. Woollam
Phys. Rev. B 60, 16618 - 16634 (1999) [View PDF internal use only (330kB)] - 20.
Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry
M. Schubert, T.E. Tiwald, J.A. Woollam
Applied Optics 38, 177 - 187 (1999) [View PDF internal use only (1569kB)] [Corrections] - 19.
Spectroscopic ellipsometry: Application to complex optoelectronic layer systems
B. Rheinländer, M. Schubert, H. Schmidt
in Heterostructure Epitaxy and Devices - HEAD'97 , P. Kordoš and J. Novák (Eds.), 151 - 154 (Kluwer Academic Publishers, Netherland, 1998) - 18.
In-situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures
E. Franke, M. Schubert, J.-D. Hecht, H. Neumann, T. E. Tiwald, H. Yao, J. A. Woollam, J. Hahn
J. Appl. Phys. 84, 526 - 532 (1998) [View PDF internal use only (156kB)] - 17.
Birefringence and reflectivity of single crystal CdAl2Se4 by generalized ellipsometry
J.-D. Hecht, A. Eifler, V. Riede, M. Schubert, G. Krauß, V. Krämer
Phys. Rev. B 57, 7037 - 7042 (1998) [View PDF internal use only (156kB)] - 16.
Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry
M. Schubert, E. Franke, H. Neumann, T. E. Tiwald, D. Thompson, J. A. Woollam, J. Hahn
Thin Solid Films 313-314, 692 - 696 (1998) [View PDF internal use only (241kB)] - 15.
Generalized Ellipsometry and complex optical systems
M. Schubert
Thin Solid Films 313-314, 323 - 332 (1998) [View PDF internal use only (276kB)] - 14.
Phase and Microstructure investigations of boron nitride thin
films by spectroscopic ellipsometry in the visible and infrared spectral range
E. Franke, M. Schubert, H. Neumann, T.E. Tiwald, D. Thompson, J.A. Woollam, J. Hahn, F. Richter
J. Appl. Phys. 82, 2906 - 2911 (1997) [View PDF internal use only (151kB)] - 13.
Infrared optical properties of mixed-phase thin films studied
by spectroscopic ellipsometry and boron nitride as an example
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T.E. Tiwald, J.A. Woollam, J. Hahn, F. Richter
Phys. Rev. B 56, 13306 - 13313 (1997) [View PDF internal use only (205kB)] [Corrections] - 12.
Infrared-ellipsometry on hexagonal and cubic boron nitride thin films
E. Franke, H. Neumann, M. Schubert, T.E. Tiwald, J.A. Woollam, J. Hahn
Appl. Phys. Lett. 70, 1668 - 1670 (1997) [View PDF internal use only (100kB)] - 11.
Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry
M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, F. Richter
Appl. Phys. Lett. 70, 1819 - 1821 (1997) [View PDF internal use only (120kB)] - 10.
Application of generalized ellipsometry to complex optical systems
M. Schubert, B. Rheinländer, B. Johs, J. A. Woollam
In Polarimetry and Ellipsometry (M. Pluta and T. R. Wolinski, eds.), Proc SPIE 3094, SPIE, Bellingham, WA, U.S.A., 1997, 255-265 [View PDF internal use only (528kB)] - 9.
Band-gap reduction and valence-band splitting in spontaneously ordered (Al,Ga)InP studied by dark-field spectroscopy and generalized ellipsometry
M. Schubert, B. Rheinländer, V. Gottschalch, J. A. Woollam
in The Physics of Semiconductors (M. Scheffler and R. Zimmerman, eds.), Vol. 1, World Scientific, Singapore, 1996, 473 - 8.
Direct-gap reduction and valence-band splitting in
spontaneously ordered indirect-gap AlInP studied by dark-field spectroscopy
M. Schubert, B. Rheinländer, E. Franke, I. Pietzonka, J. Škriniarová, V. Gottschalch
Phys. Rev. B 54, 17616 -17620 (1996) [View PDF internal use only (154kB)] - 7.
Optical properties of microconfined liquid crystals
C. Cramer, H. Binder, M. Schubert, B. Rheinländer, H. Schmiedel
Mol. Cryst. Liq. Cryst. 282, 395 - 405 (1996) - 6.
Generalized Transmission Ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals
M. Schubert, B. Rheinländer,C. Cramer, H. Schmiedel, B. Johs, C. M. Herzinger, J.A.Woollam
J. Opt. Soc. Am. A 13, 1930 - 1940 (1996) [View PDF internal use only (1648kB)] [Corrections] - 5.
Extension of Rotating Analyzer Ellipsometry to Generalized
Ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2
M. Schubert, B. Rheinländer, B. Johs, C. M. Herzinger, J. A. Woollam
J. Opt. Soc. Am. A 13, 875 - 883 (1996) [View PDF internal use only (1367kB)] - 4.
Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
M. Schubert
Phys. Rev. B 53, 4265 - 4274 (1996) [View PDF internal use only (184kB)] [Corrections] - 3.
Dark-field-spectroscopy on spontaneously ordered GaInP2
B. Rheinländer, M. Schubert, V. Gottschalch
phys. stat. sol. (a) 152, 287 - 292 (1995) - 2.
Band-gap reduction and valence band splitting in spontaneously
ordered GaInP2 studied by Dark-field-spectroscopy
M. Schubert, B. Rheinländer, V. Gottschalch
Solid State Commun. 95, 723 - 726 (1995) - 1.
Optical constants of GaxIn1-xP lattice matched to GaAs
M. Schubert, V. Gottschalch, C. M. Herzinger, H. Yao, P. G. Snyder, J. A. Woollam
J. Appl. Phys. 77, 3416 - 3419 (1995) [View PDF internal use only (205kB)] - M. Schubert's scientific output parameter h according to Hirsch
based on ISI (20.09.2005): 18
(Defined as the number of papers with citation number higher or equal to h.)
request