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Foundation of the "Arbeitskreis Ellipsometrie - Paul Drude e.V. (BAM Berlin, 27.09.2005) |
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4. International Conference on Spectroscopic Ellipsometry ICSE-4
(Stockholm, June 2007) |
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LEES06, July 2006 Tallinn, Estonia |
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4th Workshop Ellipsometry, 20.-22. February 2006 Berlin Deutsches Forum Ellipsometrie des Arbeitskreises Ellipsometrie (AKE) |
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Photonics West 2006, January 2006 San Jose, CA |
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New address effective Nov. 1, 2005: Department of Electrical Engineering, University of Nebraska-Lincoln, 209 W.S.E.N., Lincoln, NE 68588-0511 |
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Optical Systems Design, 12.-16. September 2005 Jena The International Society for Optical Engineering |
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6. International Conference on Nitride Semiconductors August 2005 Bremen |
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International Workshop on Infrared Microscopy and Spectroscopy with Accelerator Based Sources, 26.-29. June 2005 Rathen, Germany |
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E-MRS 2005 Spring Meeting, May 31 - June 3, 2005 Strasbourg European Materials Research Society |
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FVS-Workshop TCO III "TCOs für Dünnschichtsolarzellen und andere Anwendungen", 10.-12. April 2005 Freyburg |
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Workshop "Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen" Mühlleiten, 16.-18. March 2005 |
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69. Jahrestagung, 04. - 09. March 2005 Berlin Deutsche Physikalische Gesellschaft (DPG) |
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Optics in Sweden 2004 conference, 09.-10. November 2004 Linkoping Swedish Optical Society |
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International Conference on Low Energy Electrodynamics of Solids LEES, 04 18.-23. July 2004 Kloster Banz |
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E-MRS 2004 Spring Meeting, 24. - 28. May 2004 StrasbourgEuropean Materials Research Society |
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Hannovermesse, 19. - 24. April 2004 Hannover |
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Polarisations- und Laserspektroskopie für die in-situ Prozessanalytik
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Transparent Conducting Oxide (TCO) Workshop Leipzig, 29.-30. March 2004 |
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Workshop "Oberflächentechnologie mit Plasma- und Ionenstrahlprozessen" Mühlleiten, 2.-4. March 2004 |
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3. German Workshop Ellipsometry Stuttgart, 23.-25. February 2004 |
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Materials Research Society Bulletin April 2003 |
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MRS Workshop explored Zinc Oxide Research
[View PDF (746kB)] |
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Materials Research Society Bulletin March 2003 |
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Ellipsometry achieves determination of optical constants and crystal orientation for biaxial absorbing materials (by Rosalia Serna)
[View PDF (94kB)] |
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DPG Meeting Dresden, March 2003 - Late News - |
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Raman scattering in ZnO thin films doped with Fe, Sb, Ga and Li (C. Bundesmann et al.)
[View PDF (280kB)] |
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