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Internal Science Report: |
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2002
[View PDF-file] |
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2001
[View PDF-file] |
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Selected Scientific Activities: |
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07/08 2002: University Linkoping (c/o Prof. H.Arwin & Prof. B.Monemar & Prof. O.Inganäs)
Infrared dielectric function and vibrational modes of pentacene thin films
Strain related structural and vibrational properties of thin epitaxial AlN layers
Infrared properties of conductive polymer poly(3,4-ethylenedioxy thiophene) / poly(styrenesulfonate) thin films on p- and n-type silicon |
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07 2000 - 06 2003: University Leipzig (c/o Prof. W. Grill)
Generalized Magneto-optic ellipsometry for semiconductor layer structures
Infrared response of multiple component carrier plasma
Free-carrier properties and phonon modes of group-III nitride heterostructures (continued)
Phonon modes and band to band transitions in GaPN
Infrared spectroscopic ellipsometry as new tool for characterization of semiconductor heterostructures
Far-infrared dielectric anisotropy and phonon modes in spontaneously CuPt ordered GaInP
Dielectric functions, phonon modes, free-carrier properties and band-to-band transitions in MgZnO thin films
Generalized ellipsometry for biaxial absorbing materials: crystal orientation and optical constants of stibnite single crystals |
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01 1999 - 06 2000: University Lincoln-Nebraska (c/o Prof. J.A.Woollam)
Infrared anisotropy and phonon modes of sapphire
All-solid state infrared electrochromic switching devices for space craft thermal control
Free-carrier properties and phonon modes of group-III nitride heterostructures
Strain, carriers, and phonon modes in (GaAsN)/InAs superlattices
Off-axis solution for twisted biaxial dielectric films in generalized ellipsometry |
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07 1997 - 12 1998: University Leipzig (c/o Prof. B. Rheinländer)
Optical properties of spontaneous ordering in AlGaInP using generalized ellipsometry |
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1997: 04-06: University Lincoln-Nebraska (c/o Prof. J.A.Woollam)
Optical properties of arbitrary magneto-optic materials in generalized ellipsometry |
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1997: 01-03: Institute of Surface Modification e.V.(c/o Prof. F. Bigl)
Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry |
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1996: 10-12: University Lincoln-Nebraska (c/o Prof. J.A.Woollam)
Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry |
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1995 06-07: University Lincoln-Nebraska (c/o Prof. J.A.Woollam)
Generalized transmission ellipsometry for twisted biaxial dielectric media |
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1994 10-12: University Lincoln-Nebraska (Prof. J.A.Woollam)
Extension of rotating analyzer ellipsometry to generalized ellipsometry |
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1993 08-10: University Lincoln-Nebraska (c/o Prof. J.A.Woollam)
Optical constants of GaxIn1-xP lattice matched to GaAs |
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Referee for: |
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Applied Optics |
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Applied Physics Letters |
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European Physical Journal B (condensed matter) |
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IEEE Transactions on Nanotechnology |
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Journal of Applied Physics |
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Journal of Materials Research |
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Journal of Optics A: Pure and Applied Optics |
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Journal of the Optical Society of America A |
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Journal of Physics D: Applied Physics |
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Langmuir |
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Materials, Science and Engineering B |
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Measurement, Science and Technology |
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Optics Letters |
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physica status solidi |
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Surface and Interface Analysis |
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Thin Solid Films |
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