Mathias M. Schubert, Associate Professor of Electrical Engineering, received the 2006 Ludwig-Genzel-Prize for his contributions to generalized infrared spectroscopic ellipsometry and application to numerous problems in solid state science. The Ludwig-Genzel-Prize is awarded to a young scientist for exceptional contributions to the field of condensed-matter spectroscopy. The prize is awarded every two years during the International Conference on Low Energy Electrodynamics in Solids (LEES), which was held this year in Tallinn.

The Ludwig-Genzel-Prize 2006 is awarded to Professor Mathias M. Schubert for his contributions to the infrared ellipsometry. The Ludwig-Genzel-Prize is awarded to a young scientist for exceptional contributions to the field of condensed-matter spectroscopy. Related to Ludwig Genzel's scientific oeuvre the focus is on the far-infrared spectral range. Mathias Schubert has delivered main contributions to the systematic development of the spectroscopic infrared ellipsometry and he demonstrated the applicability of the method for the study of problems of various fields. He investigated complex and anisotropic materials.

Fig. 1 The Ludwig-Genzel-Preis 2006 was handed over by Professor Martin Dressel of Universität Stuttgart, Germany to Prof. Mathias Schubert (left) during the 2006 International Conference on Low Energy Electrodynamics in Solids award ceremony.

Examples are semiconductor layer structures, wurtzite zinc oxide films, organic films, and orthorhombic antimony sulphide. A very recent accomplishment is the development of magneto-optic ellipsometry in the far-infrared, THz spectral range. This technique allows for determination of free-carrier parameters in semiconductors. The study of samples at low temperature enables the direct observation of the optical Hall effect in the quantum regime. An example is the investigation of the optical Hall effect in the quantum regime by the observation of transitions between landau levels in a two-dimensional charge system as it is realized in graphite. The infrared ellipsometry represents an important extension of the Fourier infrared spectroscopy. Mathias Schubert demonstrated that this branch of infrared spectroscopy can deliver new insight in material properties. With his achievements, Mathias Schubert has become the leading scientist in the field of infrared ellipsometry.

T. Hofmann