4th International Conference on Spectroscopic Ellipsometry : H. Arwin, U. Beck, and M. Schubert (Wiley, Berlin, 2008)
			Infrared Ellipsometry on semiconductor layer structures: Phonons, Plasmons, and Polaritons Reihe: Springer Tracts in Modern Physics, Band 209 Schubert, Mathias 2004, XI, 193 p. 77 illus., Hardcover ISBN: 3-540-23249-4 Infos and contents: www.spingeronline.de