Detection of organic attachment onto highly ordered three-dimensional nanostructure thin films by generalized ellipsometry and quartz crystal microbalance with dissipation techniques
K.B. Rodenhausen, D. Schmidt, C. Rice, T. Hofmann, E. Schubert,and M. Schubert

Coupling spectroscopic ellipsometry and quartz crystal microbalance to study organic films at the solid-liquid interface
R.P. Richter, K.B. Rodenhausen, N.B. Eisele, M. Schubert

In Ellipsometry of Functional Organic Surfaces and Films edited by K. Hinrichs and K.-J. Eichhorn (Springer, Berlin, 2014)
ISBN 978-3-642-40127-5

Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Deposition
D. Schmidt, E. Schubert, and M. Schubert [View PDF (3 MB)]

THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures
T. Hofmann, D. Schmidt, and M. Schubert [View PDF (1 MB)]

In Ellipsometry at the Nanoscale edited by M. Losurdo and K. Hingerl (Springer, Berlin, 2013) ISBN 978-3-642-33955-4

M. Lyon, M.V. Wilson, K.A. Rouhier, D.J. Symonsbergen, D.K. Bastola, I. Thapa, A.E. Holmes, S.M. Sikich, and A. Jackson
In Advances in Intelligent and Soft Computing (Springer, New York, 2012)

Mica Functionalization for Imaging of DNA and Protein-DNA Complexes with Atomic Force Microscopy
L.S. Shlyakhtenko, A.A. Gall, and Yuri L. Lyubchenko
In Cell Imaging Techniques: Methods and Protocols Second Edition, Editors: Douglas J. Taatjes and Jurgen Roth, Humana Press, (Springer Science+Business Media, New York, 2012)

Chemical Approaches to Produce Graphene Oxide and Related Material
A. Sinitskii and J.M. Tour
In Graphene Nanoelectronics: From Materials to Circuits edited by R. Murali (Springer, New York, 2013)